MX2020006757A - Sistema y metodo para la configuracion de la inspeccion de la linea de produccion. - Google Patents

Sistema y metodo para la configuracion de la inspeccion de la linea de produccion.

Info

Publication number
MX2020006757A
MX2020006757A MX2020006757A MX2020006757A MX2020006757A MX 2020006757 A MX2020006757 A MX 2020006757A MX 2020006757 A MX2020006757 A MX 2020006757A MX 2020006757 A MX2020006757 A MX 2020006757A MX 2020006757 A MX2020006757 A MX 2020006757A
Authority
MX
Mexico
Prior art keywords
same
images
items
type
production line
Prior art date
Application number
MX2020006757A
Other languages
English (en)
Spanish (es)
Inventor
Yonatan Hyatt
Joel Koenka
Harel Boren
Original Assignee
Inspekto A M V Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inspekto A M V Ltd filed Critical Inspekto A M V Ltd
Publication of MX2020006757A publication Critical patent/MX2020006757A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/845—Objects on a conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/8893—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a video image and a processed signal for helping visual decision
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
MX2020006757A 2017-12-29 2018-12-27 Sistema y metodo para la configuracion de la inspeccion de la linea de produccion. MX2020006757A (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201762611551P 2017-12-29 2017-12-29
IL257256A IL257256A (en) 2018-01-30 2018-01-30 System and method for establishing production line tests
PCT/IL2018/051398 WO2019130307A1 (en) 2017-12-29 2018-12-27 System and method for set up of production line inspection

Publications (1)

Publication Number Publication Date
MX2020006757A true MX2020006757A (es) 2020-09-28

Family

ID=66624720

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2020006757A MX2020006757A (es) 2017-12-29 2018-12-27 Sistema y metodo para la configuracion de la inspeccion de la linea de produccion.

Country Status (9)

Country Link
US (2) US11562480B2 (enExample)
EP (1) EP3732464A4 (enExample)
JP (1) JP2021509716A (enExample)
KR (1) KR20200100086A (enExample)
CN (1) CN111527396A (enExample)
CA (1) CA3084917A1 (enExample)
IL (1) IL257256A (enExample)
MX (1) MX2020006757A (enExample)
WO (1) WO2019130307A1 (enExample)

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IL259285B2 (en) * 2018-05-10 2023-07-01 Inspekto A M V Ltd A system and method for detecting defects on objects in an image
IL261733B (en) * 2018-09-13 2022-09-01 Inspekto A M V Ltd Streamlining an automatic visual inspection process
IL263097B2 (en) * 2018-11-18 2024-01-01 Inspekto A M V Ltd Optimizing a set-up stage in an automatic visual inspection process
WO2020105679A1 (ja) * 2018-11-21 2020-05-28 ソニー株式会社 ワーク判別システム、ワーク判別装置及びワーク判別方法
GB2597857B (en) * 2019-03-15 2023-05-17 Invista Textiles Uk Ltd Yarn quality control
IL267563A (en) * 2019-06-20 2019-11-28 HYATT Yonatan Establishing a process for visual inspection
EP4038374A4 (en) 2019-09-30 2023-10-25 Musashi AI North America Inc. System and method for ai visual inspection
IT201900021645A1 (it) * 2019-11-19 2021-05-19 Sacmi Apparato per l’ispezione ottica di sanitari
US20230351582A1 (en) * 2020-10-07 2023-11-02 Crest Solutions Limited A line clearance system
US12066388B2 (en) * 2020-10-21 2024-08-20 Wit Co., Ltd. Inspection system
CN112261302A (zh) * 2020-10-23 2021-01-22 创新奇智(广州)科技有限公司 一种多角度目标对象拍摄的方法、装置以及系统
JP7604190B2 (ja) * 2020-11-25 2024-12-23 キヤノン株式会社 検査システム、管理装置、検査方法、プログラム、記録媒体および物品の製造方法
JP7509033B2 (ja) * 2020-12-25 2024-07-02 新東工業株式会社 検査装置、検査方法、機械学習装置、及び機械学習方法
FR3120721B1 (fr) * 2021-03-10 2023-02-10 Airbus Helicopters Procédé de test d’un dispositif électroportatif
US20230011330A1 (en) * 2021-07-09 2023-01-12 At&T Intellectual Property I, L.P. Device condition determination
CN114283269A (zh) * 2021-12-30 2022-04-05 深圳志涯科技有限公司 基于图像识别技术实现自动抓取检测衣服标签信息的方法
KR102907591B1 (ko) * 2023-01-04 2026-01-02 한양대학교 에리카산학협력단 사후 보정이 가능한 비지도 학습기반 불량 검사 방법 및 장치
CN115931905B (zh) * 2023-02-02 2023-09-26 北京百度网讯科技有限公司 Poy产品的检测方法、装置、电子设备和存储介质
CN118980694B (zh) * 2024-09-26 2024-12-20 无锡市广泰诚机械制造有限公司 一种涡轮蜗壳加工缺陷在线检测方法

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CN106018426A (zh) * 2016-07-20 2016-10-12 武汉大学 印刷品质量在线检测系统
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IL257256A (en) * 2018-01-30 2018-03-29 HYATT Yonatan System and method for establishing production line tests

Also Published As

Publication number Publication date
WO2019130307A1 (en) 2019-07-04
US20210012475A1 (en) 2021-01-14
EP3732464A4 (en) 2021-12-29
KR20200100086A (ko) 2020-08-25
CA3084917A1 (en) 2019-07-04
US12169924B2 (en) 2024-12-17
EP3732464A1 (en) 2020-11-04
US11562480B2 (en) 2023-01-24
RU2020120935A (ru) 2022-01-31
IL257256A (en) 2018-03-29
BR112020012932A2 (pt) 2020-12-01
US20230162347A1 (en) 2023-05-25
CN111527396A (zh) 2020-08-11
JP2021509716A (ja) 2021-04-01

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