KR20200100086A - 생산 라인 검사의 설정을 위한 시스템 및 방법 - Google Patents

생산 라인 검사의 설정을 위한 시스템 및 방법 Download PDF

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Publication number
KR20200100086A
KR20200100086A KR1020207018497A KR20207018497A KR20200100086A KR 20200100086 A KR20200100086 A KR 20200100086A KR 1020207018497 A KR1020207018497 A KR 1020207018497A KR 20207018497 A KR20207018497 A KR 20207018497A KR 20200100086 A KR20200100086 A KR 20200100086A
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KR
South Korea
Prior art keywords
item
image
processor
same type
inspection
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Ceased
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KR1020207018497A
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English (en)
Korean (ko)
Inventor
요나탄 하얏트
요엘 코엔카
하렐 보렌
Original Assignee
인스펙토 에이.엠.브이 리미티드
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Publication of KR20200100086A publication Critical patent/KR20200100086A/ko
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/845—Objects on a conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/8893—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a video image and a processed signal for helping visual decision
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
KR1020207018497A 2017-12-29 2018-12-27 생산 라인 검사의 설정을 위한 시스템 및 방법 Ceased KR20200100086A (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201762611551P 2017-12-29 2017-12-29
US62/611,551 2017-12-29
IL257256A IL257256A (en) 2018-01-30 2018-01-30 System and method for establishing production line tests
IL257256 2018-01-30
PCT/IL2018/051398 WO2019130307A1 (en) 2017-12-29 2018-12-27 System and method for set up of production line inspection

Publications (1)

Publication Number Publication Date
KR20200100086A true KR20200100086A (ko) 2020-08-25

Family

ID=66624720

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020207018497A Ceased KR20200100086A (ko) 2017-12-29 2018-12-27 생산 라인 검사의 설정을 위한 시스템 및 방법

Country Status (9)

Country Link
US (2) US11562480B2 (enExample)
EP (1) EP3732464A4 (enExample)
JP (1) JP2021509716A (enExample)
KR (1) KR20200100086A (enExample)
CN (1) CN111527396A (enExample)
CA (1) CA3084917A1 (enExample)
IL (1) IL257256A (enExample)
MX (1) MX2020006757A (enExample)
WO (1) WO2019130307A1 (enExample)

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US12066388B2 (en) * 2020-10-21 2024-08-20 Wit Co., Ltd. Inspection system
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JP7604190B2 (ja) * 2020-11-25 2024-12-23 キヤノン株式会社 検査システム、管理装置、検査方法、プログラム、記録媒体および物品の製造方法
JP7509033B2 (ja) * 2020-12-25 2024-07-02 新東工業株式会社 検査装置、検査方法、機械学習装置、及び機械学習方法
FR3120721B1 (fr) * 2021-03-10 2023-02-10 Airbus Helicopters Procédé de test d’un dispositif électroportatif
US20230011330A1 (en) * 2021-07-09 2023-01-12 At&T Intellectual Property I, L.P. Device condition determination
CN114283269A (zh) * 2021-12-30 2022-04-05 深圳志涯科技有限公司 基于图像识别技术实现自动抓取检测衣服标签信息的方法
KR102907591B1 (ko) * 2023-01-04 2026-01-02 한양대학교 에리카산학협력단 사후 보정이 가능한 비지도 학습기반 불량 검사 방법 및 장치
CN115931905B (zh) * 2023-02-02 2023-09-26 北京百度网讯科技有限公司 Poy产品的检测方法、装置、电子设备和存储介质
CN118980694B (zh) * 2024-09-26 2024-12-20 无锡市广泰诚机械制造有限公司 一种涡轮蜗壳加工缺陷在线检测方法

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Also Published As

Publication number Publication date
WO2019130307A1 (en) 2019-07-04
US20210012475A1 (en) 2021-01-14
EP3732464A4 (en) 2021-12-29
CA3084917A1 (en) 2019-07-04
US12169924B2 (en) 2024-12-17
EP3732464A1 (en) 2020-11-04
US11562480B2 (en) 2023-01-24
RU2020120935A (ru) 2022-01-31
IL257256A (en) 2018-03-29
MX2020006757A (es) 2020-09-28
BR112020012932A2 (pt) 2020-12-01
US20230162347A1 (en) 2023-05-25
CN111527396A (zh) 2020-08-11
JP2021509716A (ja) 2021-04-01

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