IT201900021645A1 - Apparato per l’ispezione ottica di sanitari - Google Patents

Apparato per l’ispezione ottica di sanitari

Info

Publication number
IT201900021645A1
IT201900021645A1 IT102019000021645A IT201900021645A IT201900021645A1 IT 201900021645 A1 IT201900021645 A1 IT 201900021645A1 IT 102019000021645 A IT102019000021645 A IT 102019000021645A IT 201900021645 A IT201900021645 A IT 201900021645A IT 201900021645 A1 IT201900021645 A1 IT 201900021645A1
Authority
IT
Italy
Prior art keywords
healthcare
optical inspection
inspection
optical
Prior art date
Application number
IT102019000021645A
Other languages
English (en)
Inventor
Sanzio Caroli
Original Assignee
Sacmi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sacmi filed Critical Sacmi
Priority to IT102019000021645A priority Critical patent/IT201900021645A1/it
Priority to JP2022529019A priority patent/JP7450032B2/ja
Priority to PCT/IB2020/060847 priority patent/WO2021099949A1/en
Priority to US17/756,131 priority patent/US20230008574A1/en
Priority to MX2022006028A priority patent/MX2022006028A/es
Priority to EP20811453.8A priority patent/EP4062156A1/en
Priority to CN202080080662.8A priority patent/CN114729902A/zh
Priority to BR112022009760A priority patent/BR112022009760A2/pt
Publication of IT201900021645A1 publication Critical patent/IT201900021645A1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G01N2021/9518—Objects of complex shape, e.g. examined with use of a surface follower device using a surface follower, e.g. robot
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Geometry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
IT102019000021645A 2019-11-19 2019-11-19 Apparato per l’ispezione ottica di sanitari IT201900021645A1 (it)

Priority Applications (8)

Application Number Priority Date Filing Date Title
IT102019000021645A IT201900021645A1 (it) 2019-11-19 2019-11-19 Apparato per l’ispezione ottica di sanitari
JP2022529019A JP7450032B2 (ja) 2019-11-19 2020-11-18 衛生陶器の光学検査のための装置
PCT/IB2020/060847 WO2021099949A1 (en) 2019-11-19 2020-11-18 Apparatus for optical inspection of sanitaryware
US17/756,131 US20230008574A1 (en) 2019-11-19 2020-11-18 Apparatus for optical inspection of sanitaryware
MX2022006028A MX2022006028A (es) 2019-11-19 2020-11-18 Aparato para la inspección óptica de loza sanitaria.
EP20811453.8A EP4062156A1 (en) 2019-11-19 2020-11-18 Apparatus for optical inspection of sanitaryware
CN202080080662.8A CN114729902A (zh) 2019-11-19 2020-11-18 用于卫生洁具的光学检查的设备
BR112022009760A BR112022009760A2 (pt) 2019-11-19 2020-11-18 Aparelho e método para inspeção óptica de louças sanitárias

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102019000021645A IT201900021645A1 (it) 2019-11-19 2019-11-19 Apparato per l’ispezione ottica di sanitari

Publications (1)

Publication Number Publication Date
IT201900021645A1 true IT201900021645A1 (it) 2021-05-19

Family

ID=69811796

Family Applications (1)

Application Number Title Priority Date Filing Date
IT102019000021645A IT201900021645A1 (it) 2019-11-19 2019-11-19 Apparato per l’ispezione ottica di sanitari

Country Status (8)

Country Link
US (1) US20230008574A1 (it)
EP (1) EP4062156A1 (it)
JP (1) JP7450032B2 (it)
CN (1) CN114729902A (it)
BR (1) BR112022009760A2 (it)
IT (1) IT201900021645A1 (it)
MX (1) MX2022006028A (it)
WO (1) WO2021099949A1 (it)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118067621B (zh) * 2024-04-17 2024-06-25 常州旭焱光电科技有限公司 一种精密陶瓷件的生产设备及生产工艺

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2262339A (en) * 1991-12-13 1993-06-16 Honda Motor Co Ltd Method of inspecting the surface of a workpiece
JPH06148093A (ja) * 1992-10-31 1994-05-27 Inax Corp 衛生陶器の自動検査方法
US20030184740A1 (en) 2000-03-14 2003-10-02 Francois Paradis Device and method for optical control of crockery items such as enamelled plates or and enamelled ceramic product
WO2015011782A1 (ja) * 2013-07-23 2015-01-29 株式会社安川電機 検査装置
WO2018042399A1 (en) * 2016-09-02 2018-03-08 Sacmi Cooperativa Meccanici Imola Società Cooperativa Plant and relevant process to enamel sanitary fixtures
EP3540414A1 (en) * 2018-03-13 2019-09-18 OMRON Corporation Image inspection device, image inspection method and image inspection program
WO2019197981A1 (en) * 2018-04-10 2019-10-17 Scuola Superiore Di Studi Universitari E Di Perfezionamento Sant'anna System for the detection of defects on a surface of at least a portion of a body and method thereof

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6792140B2 (en) 2001-04-26 2004-09-14 Mitsubish Electric Research Laboratories, Inc. Image-based 3D digitizer
JP2007115038A (ja) 2005-10-20 2007-05-10 Sharp Corp プリント基板品質情報管理システム
US9167226B2 (en) 2009-10-02 2015-10-20 Koninklijke Philips N.V. Selecting viewpoints for generating additional views in 3D video
US20140300729A1 (en) 2010-05-03 2014-10-09 United Technologies Corporation Probe for Inspection System
JP5764093B2 (ja) 2012-06-04 2015-08-12 株式会社日立パワーソリューションズ 検査システムおよび検査方法
JP6444027B2 (ja) 2013-12-09 2018-12-26 キヤノン株式会社 情報処理装置、情報処理装置の制御方法、情報処理システムおよびプログラム
CN108369159B (zh) 2015-12-16 2021-05-25 倍耐力轮胎股份公司 用于分析轮胎的装置和方法
KR20180002227A (ko) * 2016-06-29 2018-01-08 세메스 주식회사 반도체 소자 검사 방법
JP7045721B2 (ja) 2017-02-24 2022-04-01 国立研究開発法人理化学研究所 写真画像に映ったトンネル内の壁面の位置を同定する同定装置、同定方法、ならびに、プログラム
JP2018181235A (ja) 2017-04-21 2018-11-15 古河電気工業株式会社 報告書作成装置、風力発電設備点検システム、プログラム、及び風力発電設備の点検報告書の作成方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2262339A (en) * 1991-12-13 1993-06-16 Honda Motor Co Ltd Method of inspecting the surface of a workpiece
JPH06148093A (ja) * 1992-10-31 1994-05-27 Inax Corp 衛生陶器の自動検査方法
US20030184740A1 (en) 2000-03-14 2003-10-02 Francois Paradis Device and method for optical control of crockery items such as enamelled plates or and enamelled ceramic product
WO2015011782A1 (ja) * 2013-07-23 2015-01-29 株式会社安川電機 検査装置
WO2018042399A1 (en) * 2016-09-02 2018-03-08 Sacmi Cooperativa Meccanici Imola Società Cooperativa Plant and relevant process to enamel sanitary fixtures
EP3540414A1 (en) * 2018-03-13 2019-09-18 OMRON Corporation Image inspection device, image inspection method and image inspection program
WO2019197981A1 (en) * 2018-04-10 2019-10-17 Scuola Superiore Di Studi Universitari E Di Perfezionamento Sant'anna System for the detection of defects on a surface of at least a portion of a body and method thereof

Also Published As

Publication number Publication date
BR112022009760A2 (pt) 2022-08-16
JP7450032B2 (ja) 2024-03-14
EP4062156A1 (en) 2022-09-28
JP2023503426A (ja) 2023-01-30
MX2022006028A (es) 2022-09-12
CN114729902A (zh) 2022-07-08
WO2021099949A1 (en) 2021-05-27
US20230008574A1 (en) 2023-01-12

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