MX2017014819A - Fuentes opticas para analisis de tiempo de vida fluorescente. - Google Patents
Fuentes opticas para analisis de tiempo de vida fluorescente.Info
- Publication number
- MX2017014819A MX2017014819A MX2017014819A MX2017014819A MX2017014819A MX 2017014819 A MX2017014819 A MX 2017014819A MX 2017014819 A MX2017014819 A MX 2017014819A MX 2017014819 A MX2017014819 A MX 2017014819A MX 2017014819 A MX2017014819 A MX 2017014819A
- Authority
- MX
- Mexico
- Prior art keywords
- optical sources
- fluorescent lifetime
- lifetime analysis
- short
- optical
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title abstract 5
- 239000012472 biological sample Substances 0.000 abstract 1
- 238000003384 imaging method Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0428—Electrical excitation ; Circuits therefor for applying pulses to the laser
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J3/4406—Fluorescence spectrometry
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/026—Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
- H01S5/0265—Intensity modulators
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/062—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
- H01S5/06209—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes in single-section lasers
- H01S5/06216—Pulse modulation or generation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
- H01S5/3086—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure doping of the active layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/0601—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium comprising an absorbing region
- H01S5/0602—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium comprising an absorbing region which is an umpumped part of the active layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
Abstract
Se describen fuentes ópticas compactas y métodos para producir pulsos ópticos cortos y ultracortos; un láser semiconductor o LED (2-423) se puede impulsar con una forma de onda bipolar para generar pulsos ópticos con duraciones de FWHM tan cortas como aproximadamente 85 ps habiendo suprimido la emisión de cola; las fuentes ópticas pulsadas se pueden usar para análisis de vida útil fluorescente de muestras biológicas y formación de imágenes de tiempo de vuelo, entre otras aplicaciones.
Applications Claiming Priority (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201562164485P | 2015-05-20 | 2015-05-20 | |
US201562164506P | 2015-05-20 | 2015-05-20 | |
US201562164464P | 2015-05-20 | 2015-05-20 | |
US14/821,656 US9759658B2 (en) | 2014-08-08 | 2015-08-07 | Integrated device for temporal binning of received photons |
US201662296546P | 2016-02-17 | 2016-02-17 | |
US201662310398P | 2016-03-18 | 2016-03-18 | |
PCT/US2016/033585 WO2016187566A2 (en) | 2015-05-20 | 2016-05-20 | Optical sources for fluorescent lifetime analysis |
Publications (1)
Publication Number | Publication Date |
---|---|
MX2017014819A true MX2017014819A (es) | 2018-05-01 |
Family
ID=57320813
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2017014819A MX2017014819A (es) | 2015-05-20 | 2016-05-20 | Fuentes opticas para analisis de tiempo de vida fluorescente. |
MX2022001620A MX2022001620A (es) | 2015-05-20 | 2017-11-17 | Fuentes opticas para analisis de tiempo de vida fluorescente. |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2022001620A MX2022001620A (es) | 2015-05-20 | 2017-11-17 | Fuentes opticas para analisis de tiempo de vida fluorescente. |
Country Status (11)
Country | Link |
---|---|
EP (2) | EP4050886A1 (es) |
JP (2) | JP7078398B2 (es) |
KR (1) | KR102516593B1 (es) |
CN (1) | CN107851965B (es) |
AU (2) | AU2016264739B2 (es) |
BR (1) | BR112017024605B1 (es) |
CA (1) | CA2986155A1 (es) |
HK (1) | HK1252482A1 (es) |
MX (2) | MX2017014819A (es) |
TW (1) | TWI709743B (es) |
WO (1) | WO2016187566A2 (es) |
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CN108352393B (zh) | 2015-07-23 | 2022-09-16 | 光程研创股份有限公司 | 高效宽光谱传感器 |
US10761599B2 (en) | 2015-08-04 | 2020-09-01 | Artilux, Inc. | Eye gesture tracking |
US10707260B2 (en) | 2015-08-04 | 2020-07-07 | Artilux, Inc. | Circuit for operating a multi-gate VIS/IR photodiode |
EP3709362B1 (en) | 2015-08-04 | 2021-07-14 | Artilux Inc. | Germanium-silicon light sensing method |
US10861888B2 (en) | 2015-08-04 | 2020-12-08 | Artilux, Inc. | Silicon germanium imager with photodiode in trench |
CN115824395B (zh) | 2015-08-27 | 2023-08-15 | 光程研创股份有限公司 | 宽频谱光学传感器 |
US10739443B2 (en) | 2015-11-06 | 2020-08-11 | Artilux, Inc. | High-speed light sensing apparatus II |
US10886309B2 (en) | 2015-11-06 | 2021-01-05 | Artilux, Inc. | High-speed light sensing apparatus II |
US10418407B2 (en) | 2015-11-06 | 2019-09-17 | Artilux, Inc. | High-speed light sensing apparatus III |
US10254389B2 (en) | 2015-11-06 | 2019-04-09 | Artilux Corporation | High-speed light sensing apparatus |
US10741598B2 (en) | 2015-11-06 | 2020-08-11 | Atrilux, Inc. | High-speed light sensing apparatus II |
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JP7064315B2 (ja) * | 2017-11-07 | 2022-05-10 | オリンパス株式会社 | 光検出装置およびレーザ走査型顕微鏡 |
DE102018103518B3 (de) * | 2018-02-16 | 2019-07-11 | Forschungsverbund Berlin E.V. | Schaltung, System zur Entfernungsbestimmung und ein Fahrzeug |
US11482553B2 (en) | 2018-02-23 | 2022-10-25 | Artilux, Inc. | Photo-detecting apparatus with subpixels |
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US11105928B2 (en) | 2018-02-23 | 2021-08-31 | Artilux, Inc. | Light-sensing apparatus and light-sensing method thereof |
JP7212062B2 (ja) | 2018-04-08 | 2023-01-24 | アーティラックス・インコーポレイテッド | 光検出装置 |
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US10854770B2 (en) | 2018-05-07 | 2020-12-01 | Artilux, Inc. | Avalanche photo-transistor |
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CN112424587A (zh) * | 2018-06-15 | 2021-02-26 | 宽腾矽公司 | 用于具有脉冲光源的先进分析仪器的数据采集控制 |
TWI816830B (zh) | 2018-07-08 | 2023-10-01 | 美商光程研創股份有限公司 | 發光裝置 |
CN112771736A (zh) * | 2018-09-26 | 2021-05-07 | Asml荷兰有限公司 | 在光刻系统中提供高精度延迟的装置和方法 |
TWI687898B (zh) | 2018-11-23 | 2020-03-11 | 宏碁股份有限公司 | 影像正規化方法及影像處理裝置 |
US11652184B2 (en) | 2019-08-28 | 2023-05-16 | Artilux, Inc. | Photo-detecting apparatus with low dark current |
TWI811877B (zh) * | 2020-12-07 | 2023-08-11 | 中央研究院 | 雙功能電光矽場效電晶體分子感測器 |
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-
2016
- 2016-05-20 WO PCT/US2016/033585 patent/WO2016187566A2/en active Application Filing
- 2016-05-20 CA CA2986155A patent/CA2986155A1/en not_active Abandoned
- 2016-05-20 TW TW105115897A patent/TWI709743B/zh active
- 2016-05-20 KR KR1020177036581A patent/KR102516593B1/ko active IP Right Grant
- 2016-05-20 AU AU2016264739A patent/AU2016264739B2/en active Active
- 2016-05-20 MX MX2017014819A patent/MX2017014819A/es unknown
- 2016-05-20 BR BR112017024605-8A patent/BR112017024605B1/pt active IP Right Grant
- 2016-05-20 JP JP2017560257A patent/JP7078398B2/ja active Active
- 2016-05-20 CN CN201680043129.8A patent/CN107851965B/zh active Active
- 2016-05-20 EP EP21217400.7A patent/EP4050886A1/en active Pending
- 2016-05-20 EP EP16727903.3A patent/EP3298666B1/en active Active
-
2017
- 2017-11-17 MX MX2022001620A patent/MX2022001620A/es unknown
-
2018
- 2018-09-13 HK HK18111790.9A patent/HK1252482A1/zh unknown
-
2021
- 2021-12-09 AU AU2021282505A patent/AU2021282505A1/en not_active Abandoned
-
2022
- 2022-05-19 JP JP2022082311A patent/JP2022126643A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
JP2018518670A (ja) | 2018-07-12 |
TW201723466A (zh) | 2017-07-01 |
CN107851965A (zh) | 2018-03-27 |
JP7078398B2 (ja) | 2022-05-31 |
WO2016187566A2 (en) | 2016-11-24 |
JP2022126643A (ja) | 2022-08-30 |
MX2022001620A (es) | 2022-03-02 |
EP4050886A1 (en) | 2022-08-31 |
KR102516593B1 (ko) | 2023-04-03 |
AU2016264739B2 (en) | 2021-09-09 |
AU2021282505A1 (en) | 2022-01-06 |
CN107851965B (zh) | 2021-01-05 |
KR20180008778A (ko) | 2018-01-24 |
EP3298666A2 (en) | 2018-03-28 |
WO2016187566A3 (en) | 2016-12-29 |
EP3298666B1 (en) | 2021-12-29 |
BR112017024605A2 (pt) | 2018-07-31 |
BR112017024605B1 (pt) | 2022-11-16 |
HK1252482A1 (zh) | 2019-05-24 |
CA2986155A1 (en) | 2016-11-24 |
AU2016264739A1 (en) | 2017-12-14 |
TWI709743B (zh) | 2020-11-11 |
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