KR970008388A - 망간산화물을 함유하는 슬러리(slurry) 및 이를 사용한 반도체 장치의 제조방법 - Google Patents
망간산화물을 함유하는 슬러리(slurry) 및 이를 사용한 반도체 장치의 제조방법 Download PDFInfo
- Publication number
- KR970008388A KR970008388A KR1019960027066A KR19960027066A KR970008388A KR 970008388 A KR970008388 A KR 970008388A KR 1019960027066 A KR1019960027066 A KR 1019960027066A KR 19960027066 A KR19960027066 A KR 19960027066A KR 970008388 A KR970008388 A KR 970008388A
- Authority
- KR
- South Korea
- Prior art keywords
- solvent
- semiconductor device
- slurry
- layer
- polishing
- Prior art date
Links
- 239000002002 slurry Substances 0.000 title claims abstract 14
- 239000004065 semiconductor Substances 0.000 title claims abstract 13
- 238000004519 manufacturing process Methods 0.000 title claims abstract 10
- AMWRITDGCCNYAT-UHFFFAOYSA-L hydroxy(oxo)manganese;manganese Chemical compound [Mn].O[Mn]=O.O[Mn]=O AMWRITDGCCNYAT-UHFFFAOYSA-L 0.000 title abstract 6
- 238000000034 method Methods 0.000 title 1
- 239000002245 particle Substances 0.000 claims abstract 3
- 238000005498 polishing Methods 0.000 claims description 11
- JVTAAEKCZFNVCJ-UHFFFAOYSA-N lactic acid Chemical compound CC(O)C(O)=O JVTAAEKCZFNVCJ-UHFFFAOYSA-N 0.000 claims 12
- 239000002904 solvent Substances 0.000 claims 12
- 239000006061 abrasive grain Substances 0.000 claims 9
- 239000000654 additive Substances 0.000 claims 6
- 230000000996 additive effect Effects 0.000 claims 6
- RWZYAGGXGHYGMB-UHFFFAOYSA-N anthranilic acid Chemical compound NC1=CC=CC=C1C(O)=O RWZYAGGXGHYGMB-UHFFFAOYSA-N 0.000 claims 6
- 235000014655 lactic acid Nutrition 0.000 claims 6
- 239000004310 lactic acid Substances 0.000 claims 6
- XNGIFLGASWRNHJ-UHFFFAOYSA-N o-dicarboxybenzene Natural products OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 claims 5
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 claims 4
- 239000004020 conductor Substances 0.000 claims 4
- 150000004767 nitrides Chemical class 0.000 claims 4
- GUBGYTABKSRVRQ-XLOQQCSPSA-N Alpha-Lactose Chemical compound O[C@@H]1[C@@H](O)[C@@H](O)[C@@H](CO)O[C@H]1O[C@@H]1[C@@H](CO)O[C@H](O)[C@H](O)[C@H]1O GUBGYTABKSRVRQ-XLOQQCSPSA-N 0.000 claims 2
- 239000005711 Benzoic acid Substances 0.000 claims 2
- GUBGYTABKSRVRQ-QKKXKWKRSA-N Lactose Natural products OC[C@H]1O[C@@H](O[C@H]2[C@H](O)[C@@H](O)C(O)O[C@@H]2CO)[C@H](O)[C@@H](O)[C@H]1O GUBGYTABKSRVRQ-QKKXKWKRSA-N 0.000 claims 2
- CHCFOMQHQIQBLZ-UHFFFAOYSA-N azane;phthalic acid Chemical compound N.N.OC(=O)C1=CC=CC=C1C(O)=O CHCFOMQHQIQBLZ-UHFFFAOYSA-N 0.000 claims 2
- 235000010233 benzoic acid Nutrition 0.000 claims 2
- GOMCKELMLXHYHH-UHFFFAOYSA-L dipotassium;phthalate Chemical compound [K+].[K+].[O-]C(=O)C1=CC=CC=C1C([O-])=O GOMCKELMLXHYHH-UHFFFAOYSA-L 0.000 claims 2
- 239000008101 lactose Substances 0.000 claims 2
- PTWDXXHXJMNYSP-UHFFFAOYSA-N 2-aminobenzoic acid;benzoic acid Chemical compound OC(=O)C1=CC=CC=C1.NC1=CC=CC=C1C(O)=O PTWDXXHXJMNYSP-UHFFFAOYSA-N 0.000 claims 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims 1
- PVNIIMVLHYAWGP-UHFFFAOYSA-N Niacin Chemical compound OC(=O)C1=CC=CN=C1 PVNIIMVLHYAWGP-UHFFFAOYSA-N 0.000 claims 1
- 229910004298 SiO 2 Inorganic materials 0.000 claims 1
- 229910002808 Si–O–Si Inorganic materials 0.000 claims 1
- 150000001298 alcohols Chemical class 0.000 claims 1
- 235000001968 nicotinic acid Nutrition 0.000 claims 1
- 239000011664 nicotinic acid Substances 0.000 claims 1
- 229960003512 nicotinic acid Drugs 0.000 claims 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims 1
- -1 phthalic acid compound Chemical class 0.000 claims 1
- 238000007517 polishing process Methods 0.000 abstract 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/31051—Planarisation of the insulating layers
- H01L21/31053—Planarisation of the insulating layers involving a dielectric removal step
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/34—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups H01L21/0405, H01L21/0445, H01L21/06, H01L21/16 and H01L21/18 with or without impurities, e.g. doping materials
- H01L21/46—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428
- H01L21/461—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/463—Mechanical treatment, e.g. grinding, ultrasonic treatment
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
슬러리는 연마입자의 주성분으로서 MnO2또는 다른 망간 산화물을 함유한다. 더우기, 이러한 망간 산화물을 사용하는 연마공정과 연마공정을 사용하는 반도체장치의 제조방법이 제공된다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제4도는 본 발명에 사용된 연마장치의 구성을 개략적으로 도시한 도.
Claims (17)
- MnO2의 연마입자, 상기 연마입자를 분산시키는 용매, 및 벤젠링을 포함하고 상기 용매에 첨가되는 첨가제로 구성되는 슬러리.
- 제1항에 있어서, 상기 용매가 H20이고, 상기 첨가제가 프탈산 화합물로 구성되는 슬러리.
- 제1항에 있어서, 상기 용매가 H20이고, 상기 첨가제가 안트라닐레이트와 안트라닐리산으로 구성되는 슬러리.
- 제1항에 있어서, 상기 용매가 H20와 저급알콜로부터 선택되고 상기 첨가제가 프탈산과 벤조산으로부터 선택되는 슬러리.
- MnO2의 연마입자, 상기 연마입자를 분산시키는 H20용매, 및 상기 용매에 첨가되고 락트산과 락토즈로부터 선택되는 첨가제로 구성되는 슬러리.
- 슬러리에 의해 대상물체를 연마하는 단계로 구성되고, 상기 슬러리가 MnO2의 연마입자, 이 연마입자를 분산시키는 용매, 및 이 용매에 첨가되고 프탈산 칼륨, 프탈산 암모늄, 프탈산 벤조산, 안트라닐레이트, 안트라닐리산, 락트산 및 락토즈로 이루어지는 군에서 선택되는, 대상물체를 연마하는 연마방법.
- 절연층상에 비절연층을 형성하고, 이 절연층이 노출될때까지 비절연층을 연마하는 단계로 구성되고, 상기 연마단계는 슬러리에 의해 행해지며, 이 슬러리는 MnO2의 연마입자, 이 연마입자를 분산시키는 용매, 이 용매에 첨가되는 첨가제를 포함하고, 상기 용매는 프탈산 칼륨, 프탈산 암모늄, 프탈산, 벤조산, 안트라닐레이트, 안트라닐리산, 락트산, 및 락토즈로 이루어지는 군에서 선택되는 반도체장치의 제조방법.
- 제7항에 있어서, 상기 비절연층이 도전체층으로 구성되는 반도체장치의 제조방법.
- 제7항에 있어서, 상기 비절연층이 반도체층으로 구성되는 반도체장치의 제조방법.
- 제1층상에 내화원소의 질화막을 형성하고, 상기 질화막에 제2층을 형성하며, 상기 질화막을 연마정지기로서 사용하면서 MnO2의 연마입자를 함유하는 슬러리에 의해 상기 제2층을 연마하는 단계로 구성되는 반도체장치의 제조방법.
- 제10항에 있어서, 상기 제2층이 도전체층으로 구성되는 반도체장치의 제조방법.
- 제10항에 있어서, 상기 제2층이 절연층으로 구성되는 반도체장치의 제조방법.
- 제10항에 있어서, SiO2와 Al2O3에서 선택되는 연마입자로 더 첨가된 상기의 슬러리를 사용함으로써, 상기 질화막을 연마하여 제거하는 단계로 더 구성되는 반도체장치의 제조방법.
- Si와 O를 함유하는 절연막을 연마하는 단계로 구성되고, 이 연마단계가 연마입자로서 MnO2입자를 함유하는 슬러리에 의해 행해지는 반도체장치의 제조방법.
- 제14항에 있어서, 상기 절연막이 Si-O-Si망상을 포함하는 반도체장치의 제조방법.
- 제14항에 있어서, 상기 연마단계가 상기 절연막상에 형성된 단차구조를 상기 슬러리에 의해 그 일부로서 평탄화하는 반도체장치의 제조방법.
- 제14항에 있어서, 상기 단차구조가 도전체 패턴을 더 포함하고, 상기 연마단계가 상기 절연막과 상기 도전체막 양쪽에 대해 동시에 행해지는 반도체장치의 제조방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP96-000220 | 1995-01-05 | ||
JP16904895A JP3495143B2 (ja) | 1995-07-04 | 1995-07-04 | 研磨剤、研磨方法および半導体装置の製造方法 |
JP95-169048 | 1995-07-04 | ||
JP95-169057 | 1995-07-04 | ||
JP22495595A JP3531079B2 (ja) | 1995-09-01 | 1995-09-01 | 研磨方法および半導体装置の製造方法 |
JP95-224955 | 1995-09-01 | ||
JP00022096A JP3529926B2 (ja) | 1996-01-05 | 1996-01-05 | 研磨方法および半導体装置の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970008388A true KR970008388A (ko) | 1997-02-24 |
KR100206663B1 KR100206663B1 (ko) | 1999-07-01 |
Family
ID=27274352
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019960027066A KR100206663B1 (ko) | 1995-01-05 | 1996-07-04 | 망간산화물을 함유하는 슬러리 및 이를 사용한 반도체 장치의 제조방법 |
Country Status (3)
Country | Link |
---|---|
US (2) | US5763325A (ko) |
KR (1) | KR100206663B1 (ko) |
TW (1) | TW389954B (ko) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5763325A (en) * | 1995-07-04 | 1998-06-09 | Fujitsu Limited | Fabrication process of a semiconductor device using a slurry containing manganese oxide |
US6159858A (en) * | 1995-07-04 | 2000-12-12 | Fujitsu Limited | Slurry containing manganese oxide and a fabrication process of a semiconductor device using such a slurry |
JPH1071571A (ja) * | 1996-06-27 | 1998-03-17 | Fujitsu Ltd | 研磨布、研磨布の表面処理方法、及び研磨布の洗浄方法 |
JPH10163138A (ja) * | 1996-11-29 | 1998-06-19 | Fujitsu Ltd | 半導体装置の製造方法および研磨装置 |
US6126853A (en) * | 1996-12-09 | 2000-10-03 | Cabot Microelectronics Corporation | Chemical mechanical polishing slurry useful for copper substrates |
US6022400A (en) * | 1997-05-22 | 2000-02-08 | Nippon Steel Corporation | Polishing abrasive grains, polishing agent and polishing method |
US6261158B1 (en) | 1998-12-16 | 2001-07-17 | Speedfam-Ipec | Multi-step chemical mechanical polishing |
DE10163570A1 (de) * | 2001-12-21 | 2003-07-10 | Solvay Barium Strontium Gmbh | Neue Verwendung für Erdalkalimetallsalze |
KR100979071B1 (ko) * | 2002-02-22 | 2010-08-31 | 에이저 시스템즈 인크 | 이중 배향 다결정성 재료의 화학 기계적 연마 |
JP2003338469A (ja) * | 2002-05-21 | 2003-11-28 | Fujitsu Ltd | 研磨剤、研磨方法および洗浄方法 |
US7071105B2 (en) * | 2003-02-03 | 2006-07-04 | Cabot Microelectronics Corporation | Method of polishing a silicon-containing dielectric |
JP5935531B2 (ja) | 2012-06-14 | 2016-06-15 | 富士通株式会社 | 研磨剤及び研磨剤の製造方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5228886A (en) * | 1990-10-09 | 1993-07-20 | Buehler, Ltd. | Mechanochemical polishing abrasive |
US5498565A (en) * | 1991-11-29 | 1996-03-12 | Sony Corporation | Method of forming trench isolation having polishing step and method of manufacturing semiconductor device |
US5244534A (en) * | 1992-01-24 | 1993-09-14 | Micron Technology, Inc. | Two-step chemical mechanical polishing process for producing flush and protruding tungsten plugs |
US5308438A (en) * | 1992-01-30 | 1994-05-03 | International Business Machines Corporation | Endpoint detection apparatus and method for chemical/mechanical polishing |
US5445996A (en) * | 1992-05-26 | 1995-08-29 | Kabushiki Kaisha Toshiba | Method for planarizing a semiconductor device having a amorphous layer |
US5312512A (en) * | 1992-10-23 | 1994-05-17 | Ncr Corporation | Global planarization using SOG and CMP |
US5395801A (en) * | 1993-09-29 | 1995-03-07 | Micron Semiconductor, Inc. | Chemical-mechanical polishing processes of planarizing insulating layers |
US5763325A (en) * | 1995-07-04 | 1998-06-09 | Fujitsu Limited | Fabrication process of a semiconductor device using a slurry containing manganese oxide |
US5593919A (en) * | 1995-09-05 | 1997-01-14 | Motorola Inc. | Process for forming a semiconductor device including conductive members |
-
1996
- 1996-07-02 US US08/674,507 patent/US5763325A/en not_active Expired - Lifetime
- 1996-07-04 TW TW085108081A patent/TW389954B/zh not_active IP Right Cessation
- 1996-07-04 KR KR1019960027066A patent/KR100206663B1/ko not_active IP Right Cessation
-
1998
- 1998-01-27 US US09/014,246 patent/US5877089A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5763325A (en) | 1998-06-09 |
US5877089A (en) | 1999-03-02 |
KR100206663B1 (ko) | 1999-07-01 |
TW389954B (en) | 2000-05-11 |
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