KR970006021B1 - 컴퓨터 시스템 - Google Patents

컴퓨터 시스템 Download PDF

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Publication number
KR970006021B1
KR970006021B1 KR1019870000839A KR870000839A KR970006021B1 KR 970006021 B1 KR970006021 B1 KR 970006021B1 KR 1019870000839 A KR1019870000839 A KR 1019870000839A KR 870000839 A KR870000839 A KR 870000839A KR 970006021 B1 KR970006021 B1 KR 970006021B1
Authority
KR
South Korea
Prior art keywords
test
address
line
computer system
microprocessor
Prior art date
Application number
KR1019870000839A
Other languages
English (en)
Korean (ko)
Other versions
KR870009286A (ko
Inventor
자이벨 베르트홀트
호르벨트 미하엘
Original Assignee
로베르트 보쉬 게엠베하
크라우스 보스 디터 비트마이어
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 로베르트 보쉬 게엠베하, 크라우스 보스 디터 비트마이어 filed Critical 로베르트 보쉬 게엠베하
Publication of KR870009286A publication Critical patent/KR870009286A/ko
Application granted granted Critical
Publication of KR970006021B1 publication Critical patent/KR970006021B1/ko

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/14—Error detection or correction of the data by redundancy in operation
    • G06F11/1497—Details of time redundant execution on a single processing unit
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03G—CONTROL OF AMPLIFICATION
    • H03G3/00—Gain control in amplifiers or frequency changers
    • H03G3/02—Manually-operated control
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/14—Error detection or correction of the data by redundancy in operation

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Detection And Correction Of Errors (AREA)
KR1019870000839A 1986-03-14 1987-02-03 컴퓨터 시스템 KR970006021B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3608547.2 1986-03-14
DE3608547A DE3608547C2 (de) 1986-03-14 1986-03-14 Rechnersystem mit einem externen Speicher

Publications (2)

Publication Number Publication Date
KR870009286A KR870009286A (ko) 1987-10-24
KR970006021B1 true KR970006021B1 (ko) 1997-04-23

Family

ID=6296359

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019870000839A KR970006021B1 (ko) 1986-03-14 1987-02-03 컴퓨터 시스템

Country Status (3)

Country Link
JP (1) JPS62226238A (ja)
KR (1) KR970006021B1 (ja)
DE (1) DE3608547C2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7446569B2 (en) 2005-06-10 2008-11-04 Hynix Semiconductor Inc. Line driving circuit of semiconductor device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016009893A (ja) * 2014-06-23 2016-01-18 Ｎｅｃエンジニアリング株式会社 データ不正検出装置及びデータ不正検出方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5185340A (ja) * 1975-01-23 1976-07-26 Mitsubishi Electric Corp

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7446569B2 (en) 2005-06-10 2008-11-04 Hynix Semiconductor Inc. Line driving circuit of semiconductor device

Also Published As

Publication number Publication date
DE3608547A1 (de) 1987-09-17
KR870009286A (ko) 1987-10-24
JPS62226238A (ja) 1987-10-05
DE3608547C2 (de) 1995-03-30

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