KR960001189B1 - 광배선식 반도체 집적회로 - Google Patents

광배선식 반도체 집적회로 Download PDF

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Publication number
KR960001189B1
KR960001189B1 KR1019870010631A KR870010631A KR960001189B1 KR 960001189 B1 KR960001189 B1 KR 960001189B1 KR 1019870010631 A KR1019870010631 A KR 1019870010631A KR 870010631 A KR870010631 A KR 870010631A KR 960001189 B1 KR960001189 B1 KR 960001189B1
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KR
South Korea
Prior art keywords
semiconductor substrate
pulse signal
photoelectric conversion
optical
opening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1019870010631A
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English (en)
Korean (ko)
Other versions
KR880004584A (ko
Inventor
시게루 오호
가즈지 야마다
시게끼 쯔찌따니
Original Assignee
가부시기가이샤 히다찌세이사꾸쇼
미다 가쓰시게
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 가부시기가이샤 히다찌세이사꾸쇼, 미다 가쓰시게 filed Critical 가부시기가이샤 히다찌세이사꾸쇼
Publication of KR880004584A publication Critical patent/KR880004584A/ko
Application granted granted Critical
Publication of KR960001189B1 publication Critical patent/KR960001189B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/103Integrated devices the at least one element covered by H10F30/00 having potential barriers, e.g. integrated devices comprising photodiodes or phototransistors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/30Coatings
    • H10F77/306Coatings for devices having potential barriers
    • H10F77/331Coatings for devices having potential barriers for filtering or shielding light, e.g. multicolour filters for photodetectors
    • H10F77/334Coatings for devices having potential barriers for filtering or shielding light, e.g. multicolour filters for photodetectors for shielding light, e.g. light blocking layers or cold shields for infrared detectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/40Optical elements or arrangements
    • H10F77/413Optical elements or arrangements directly associated or integrated with the devices, e.g. back reflectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16152Cap comprising a cavity for hosting the device, e.g. U-shaped cap

Landscapes

  • Light Receiving Elements (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)
  • Optical Communication System (AREA)
  • Optical Couplings Of Light Guides (AREA)
KR1019870010631A 1986-09-25 1987-09-25 광배선식 반도체 집적회로 Expired - Fee Related KR960001189B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP?86-224907 1986-09-25
JP22490786A JPH0815211B2 (ja) 1986-09-25 1986-09-25 光配線式半導体集積回路
JP224907 1986-09-25

Publications (2)

Publication Number Publication Date
KR880004584A KR880004584A (ko) 1988-06-07
KR960001189B1 true KR960001189B1 (ko) 1996-01-19

Family

ID=16821025

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019870010631A Expired - Fee Related KR960001189B1 (ko) 1986-09-25 1987-09-25 광배선식 반도체 집적회로

Country Status (4)

Country Link
US (1) US4835595A (enExample)
JP (1) JPH0815211B2 (enExample)
KR (1) KR960001189B1 (enExample)
DE (1) DE3731865A1 (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4884243A (en) * 1988-02-19 1989-11-28 California Institute Of Technology Multi-port, optically addressed RAM
JPH088624B2 (ja) * 1988-03-14 1996-01-29 株式会社日立製作所 完全密着型読取センサ及び読取センサアセンブリ
EP0364163A3 (en) * 1988-10-14 1991-11-21 AT&T Corp. Electro-optic device including opaque protective regions
US5182623A (en) * 1989-11-13 1993-01-26 Texas Instruments Incorporated Charge coupled device/charge super sweep image system and method for making
JPH0410664A (ja) * 1990-04-27 1992-01-14 Nec Corp 受光素子アレイ
US5237185A (en) * 1991-04-19 1993-08-17 Canon Kabushiki Kaisha Image pickup apparatus with different gate thicknesses
GB2326277A (en) * 1997-06-11 1998-12-16 Lsi Logic Corp Low skew signal distribution for integrated circuits
US6380527B1 (en) * 1997-06-23 2002-04-30 Frank Davis Method and apparatus for reading from and writing to a stationary optical storage device
US6303967B1 (en) 1998-02-05 2001-10-16 Integration Associates, Inc. Process for producing an isolated planar high speed pin photodiode
US6548878B1 (en) 1998-02-05 2003-04-15 Integration Associates, Inc. Method for producing a thin distributed photodiode structure
US6458619B1 (en) 1998-02-05 2002-10-01 Integration Associates, Inc. Process for producing an isolated planar high speed pin photodiode with improved capacitance
US6027956A (en) * 1998-02-05 2000-02-22 Integration Associates, Inc. Process for producing planar dielectrically isolated high speed pin photodiode
US6753586B1 (en) 1998-03-09 2004-06-22 Integration Associates Inc. Distributed photodiode structure having majority dopant gradient and method for making same
AU7115398A (en) * 1998-04-13 1999-11-01 Intel Corporation Method and apparatus for distributing an optical clock in an integrated circuit
GB2340996B (en) * 1998-08-26 2003-07-09 Lsi Logic Corp Low skew signal distribution circuits
US6690078B1 (en) 1999-08-05 2004-02-10 Integration Associates, Inc. Shielded planar dielectrically isolated high speed pin photodiode and method for producing same
JP4797221B2 (ja) * 2000-02-21 2011-10-19 ソニー株式会社 光電子集積回路装置
DE102004011548B4 (de) * 2004-03-08 2015-02-12 Giesecke & Devrient Gmbh Tragbarer Datenträger mit optischem Sensor und geeigneter Sensor und Verfahren zur Herstellung
FR2887369B1 (fr) * 2005-06-17 2007-08-31 Trixell Sas Sa Detecteur de rayonnement
JP5022795B2 (ja) * 2007-07-09 2012-09-12 株式会社東芝 半導体受光素子およびその製造方法
US20120019695A1 (en) * 2010-07-26 2012-01-26 Omnivision Technologies, Inc. Image sensor having dark sidewalls between color filters to reduce optical crosstalk
GB2485998A (en) * 2010-11-30 2012-06-06 St Microelectronics Res & Dev A single-package optical proximity detector with an internal light baffle
GB2485996A (en) 2010-11-30 2012-06-06 St Microelectronics Res & Dev A combined proximity and ambient light sensor
GB2486000A (en) 2010-11-30 2012-06-06 St Microelectronics Res & Dev Optical proximity detectors with arrangements for reducing internal light propagation from emitter to detector
JP2014050037A (ja) * 2012-09-03 2014-03-17 International Business Maschines Corporation 大規模ニューラルネットワークシステムのためのハイブリッド相互接続(HybridInterconnectStrategyforLarge−ScaleNeuralNetworkSystems)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1172887B (it) * 1978-04-14 1987-06-18 Cselt Centro Studi Lab Telecom Foto rivelatore a valanga ad alta responsivita' e procedimento per la sua realizzazione
US4270135A (en) * 1979-12-12 1981-05-26 Westinghouse Electric Corp. High-frequency phototransistor operated with multiple light sources
JPS57124485A (en) * 1981-01-27 1982-08-03 Nec Corp Solid image pickup element
JPS58111444A (ja) * 1981-12-24 1983-07-02 Hitachi Ltd デイジタル通信用光受信器
JPS5917286A (ja) * 1982-07-20 1984-01-28 Fujitsu Ltd 光導電ポテンシヨメ−タ
US4513305A (en) * 1982-12-06 1985-04-23 Gte Laboratories Incorporated Multi-wavelength demultiplexer for fiber optical communication
JPS59127879A (ja) * 1983-01-12 1984-07-23 Semiconductor Energy Lab Co Ltd 光電変換装置およびその作製方法
JPS59134872A (ja) * 1983-01-23 1984-08-02 Rohm Co Ltd フオトセンサ−用ic
JPS60153184A (ja) * 1984-01-21 1985-08-12 Sumitomo Electric Ind Ltd 受光素子
JPS60191548A (ja) * 1984-03-12 1985-09-30 Hitachi Ltd イメ−ジセンサ

Also Published As

Publication number Publication date
DE3731865A1 (de) 1988-04-07
JPH0815211B2 (ja) 1996-02-14
JPS6381869A (ja) 1988-04-12
DE3731865C2 (enExample) 1991-05-08
US4835595A (en) 1989-05-30
KR880004584A (ko) 1988-06-07

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