KR950003946B1 - 전계효과트랜지스터 - Google Patents
전계효과트랜지스터 Download PDFInfo
- Publication number
- KR950003946B1 KR950003946B1 KR1019920007044A KR920007044A KR950003946B1 KR 950003946 B1 KR950003946 B1 KR 950003946B1 KR 1019920007044 A KR1019920007044 A KR 1019920007044A KR 920007044 A KR920007044 A KR 920007044A KR 950003946 B1 KR950003946 B1 KR 950003946B1
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- field effect
- effect transistor
- composition ratio
- layers
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/80—FETs having rectifying junction gate electrodes
- H10D30/801—FETs having heterojunction gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
- H10D62/213—Channel regions of field-effect devices
- H10D62/221—Channel regions of field-effect devices of FETs
Landscapes
- Junction Field-Effect Transistors (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP91-96857 | 1991-04-26 | ||
| JP3096858A JPH04326735A (ja) | 1991-04-26 | 1991-04-26 | 電界効果トランジスタ |
| JP91-96858 | 1991-04-26 | ||
| JP3096857A JPH04326734A (ja) | 1991-04-26 | 1991-04-26 | 電界効果トランジスタ |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR950003946B1 true KR950003946B1 (ko) | 1995-04-21 |
Family
ID=26438021
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019920007044A Expired - Fee Related KR950003946B1 (ko) | 1991-04-26 | 1992-04-25 | 전계효과트랜지스터 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5331410A (https=) |
| EP (1) | EP0510705A2 (https=) |
| KR (1) | KR950003946B1 (https=) |
| CA (1) | CA2067048A1 (https=) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3226069B2 (ja) * | 1993-10-04 | 2001-11-05 | キヤノン株式会社 | 半導体積層構造および半導体光素子 |
| JP2674539B2 (ja) * | 1994-12-21 | 1997-11-12 | 日本電気株式会社 | 電界効果トランジスタ |
| US5856684A (en) * | 1996-09-12 | 1999-01-05 | Motorola, Inc. | High power HFET with improved channel interfaces |
| JP3601649B2 (ja) * | 1996-12-25 | 2004-12-15 | 株式会社村田製作所 | 電界効果トランジスタ |
| US5701020A (en) * | 1997-01-31 | 1997-12-23 | National Science Council | Pseudomorphic step-doped-channel field-effect transistor |
| JP3751398B2 (ja) * | 1997-03-13 | 2006-03-01 | 富士通株式会社 | 化合物半導体装置 |
| TW319913B (en) * | 1997-05-06 | 1997-11-11 | Nat Science Council | InGaP/GaAs modulation compositioned channel Exhibit high current |
| JP3159198B2 (ja) * | 1999-02-19 | 2001-04-23 | 住友電気工業株式会社 | 電界効果トランジスタ |
| JP3421306B2 (ja) * | 2000-07-19 | 2003-06-30 | 富士通カンタムデバイス株式会社 | 化合物半導体装置 |
| JP4586547B2 (ja) * | 2005-01-24 | 2010-11-24 | 住友電気工業株式会社 | 接合型電界効果トランジスタ |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4163237A (en) * | 1978-04-24 | 1979-07-31 | Bell Telephone Laboratories, Incorporated | High mobility multilayered heterojunction devices employing modulated doping |
| US4691215A (en) * | 1985-01-09 | 1987-09-01 | American Telephone And Telegraph Company | Hot electron unipolar transistor with two-dimensional degenerate electron gas base with continuously graded composition compound emitter |
| JP2645993B2 (ja) * | 1986-06-12 | 1997-08-25 | 富士通株式会社 | 電界効果型半導体装置及びその製造方法 |
| US4994866A (en) * | 1988-01-07 | 1991-02-19 | Fujitsu Limited | Complementary semiconductor device |
| US5091759A (en) * | 1989-10-30 | 1992-02-25 | Texas Instruments Incorporated | Heterostructure field effect transistor |
| JP2501627B2 (ja) * | 1988-09-27 | 1996-05-29 | 沖電気工業株式会社 | 化合物半導体の構造体及びその形成方法 |
| JPH02192739A (ja) * | 1989-01-20 | 1990-07-30 | Sanyo Electric Co Ltd | ヘテロ接合電界効果トランジスタ |
| US5060030A (en) * | 1990-07-18 | 1991-10-22 | Raytheon Company | Pseudomorphic HEMT having strained compensation layer |
| US5206527A (en) * | 1990-11-09 | 1993-04-27 | Sumitomo Electric Industries, Ltd. | Field effect transistor |
-
1992
- 1992-04-21 US US07/871,706 patent/US5331410A/en not_active Expired - Fee Related
- 1992-04-24 CA CA002067048A patent/CA2067048A1/en not_active Abandoned
- 1992-04-25 KR KR1019920007044A patent/KR950003946B1/ko not_active Expired - Fee Related
- 1992-04-26 EP EP92107120A patent/EP0510705A2/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| CA2067048A1 (en) | 1992-10-27 |
| EP0510705A3 (https=) | 1995-05-24 |
| EP0510705A2 (en) | 1992-10-28 |
| US5331410A (en) | 1994-07-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0133342B1 (en) | A superlattice type semiconductor structure having a high carrier density | |
| EP0397987A1 (en) | Germanium channel silicon mosfet | |
| EP0114962A2 (en) | Double heterojunction field effect transistors | |
| KR19980034078A (ko) | 핫 전자 장치(Hot Electron Device) 및 공진 터널링 핫 전자 장치 | |
| US5323020A (en) | High performance MESFET with multiple quantum wells | |
| EP0165798B1 (en) | Semiconductor device comprising n-channel and p-channel transistors and production method | |
| US5952672A (en) | Semiconductor device and method for fabricating the same | |
| US4772925A (en) | High speed switching field effect transistor | |
| KR950003946B1 (ko) | 전계효과트랜지스터 | |
| EP0130676B1 (en) | Semiconductor device having a hetero junction | |
| JPH0624208B2 (ja) | 半導体装置 | |
| US20010005016A1 (en) | Field effect transistor | |
| US5493136A (en) | Field effect transistor and method of manufacturing the same | |
| US5351128A (en) | Semiconductor device having reduced contact resistance between a channel or base layer and a contact layer | |
| US5981986A (en) | Semiconductor device having a heterojunction | |
| US5381027A (en) | Semiconductor device having a heterojunction and a two dimensional gas as an active layer | |
| US5258631A (en) | Semiconductor device having a two-dimensional electron gas as an active layer | |
| EP0246700A1 (en) | Hot Charge-carrier transistors | |
| JP2500459B2 (ja) | ヘテロ接合電界効果トランジスタ | |
| JPH09237889A (ja) | 半導体結晶積層体及びそれを用いた半導体装置 | |
| KR910006698B1 (ko) | 반도체 장치 | |
| JP3054216B2 (ja) | 半導体装置 | |
| GB2239557A (en) | High electron mobility transistors | |
| JP4347919B2 (ja) | 半導体装置 | |
| JP2655594B2 (ja) | 集積型半導体装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| G160 | Decision to publish patent application | ||
| PG1605 | Publication of application before grant of patent |
St.27 status event code: A-2-2-Q10-Q13-nap-PG1605 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 19980422 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 19980422 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |