KR910020420A - 온도검출회로 - Google Patents
온도검출회로 Download PDFInfo
- Publication number
- KR910020420A KR910020420A KR1019910008153A KR910008153A KR910020420A KR 910020420 A KR910020420 A KR 910020420A KR 1019910008153 A KR1019910008153 A KR 1019910008153A KR 910008153 A KR910008153 A KR 910008153A KR 910020420 A KR910020420 A KR 910020420A
- Authority
- KR
- South Korea
- Prior art keywords
- current
- detection circuit
- temperature detection
- source
- supplies
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/30—Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
- G01K7/14—Arrangements for modifying the output characteristic, e.g. linearising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K3/00—Thermometers giving results other than momentary value of temperature
- G01K3/005—Circuits arrangements for indicating a predetermined temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electromagnetism (AREA)
- Nonlinear Science (AREA)
- Power Engineering (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Amplifiers (AREA)
- Semiconductor Integrated Circuits (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Control Of Electrical Variables (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 따른 온도검출회로의 1실시 예를 나타낸 회로도, 제2도는 제1도의 회로의 온도 검출 특성을 나타낸 특성도.
Claims (2)
- 밴드갭형 전압원의 밴드갭 전압에 관계하는 정(正)의 온도계수를 갖는 전류를 공급하는 제1전류원 (Q3)과, 0또는 부(負)의 온도계수를 갖는 전류를 공급하는 제2전류원 (Q8,Q9) 및, 이들 2개의 전류원의 전류량을 비교해서 전류량의 대소관계를 검출하는 비교회로 (Q5∼ Q7, Q10, Q11)를 구비한 것을 특징으로 하는 온도 검출회로.
- 제1항에 있어서, 상기 비교회로 ( Q5∼Q7, Q10, Q11)는 2개의 전류원의 전류량이 소정의 값으로 된 때를 검출해서 상기 제2전류원 (Q8, Q9)의 전류량을 변화시키도록 된 것을 특징으로 하는 온도 검출회로.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP02134940 | 1990-05-24 | ||
JP2134940A JP2598154B2 (ja) | 1990-05-24 | 1990-05-24 | 温度検出回路 |
JP134940 | 1990-05-24 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR910020420A true KR910020420A (ko) | 1991-12-20 |
KR930006304B1 KR930006304B1 (ko) | 1993-07-12 |
Family
ID=15140115
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019910008153A KR930006304B1 (ko) | 1990-05-24 | 1991-05-20 | 온도검출회로 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5149199A (ko) |
EP (1) | EP0458332B1 (ko) |
JP (1) | JP2598154B2 (ko) |
KR (1) | KR930006304B1 (ko) |
DE (1) | DE69124138T2 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101489104B1 (ko) * | 2010-10-04 | 2015-02-02 | 가부시키가이샤 리코 | 전기 소자 |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA2066929C (en) * | 1991-08-09 | 1996-10-01 | Katsuji Kimura | Temperature sensor circuit and constant-current circuit |
US5359236A (en) * | 1993-05-25 | 1994-10-25 | Harris Corporation | Integrated circuit thermal sensor |
JP2540753B2 (ja) * | 1993-09-01 | 1996-10-09 | 日本電気株式会社 | 過熱検出回路 |
US7216064B1 (en) | 1993-09-21 | 2007-05-08 | Intel Corporation | Method and apparatus for programmable thermal sensor for an integrated circuit |
US5394078A (en) * | 1993-10-26 | 1995-02-28 | Analog Devices, Inc. | Two terminal temperature transducer having circuitry which controls the entire operating current to be linearly proportional with temperature |
JP3348576B2 (ja) * | 1995-11-10 | 2002-11-20 | ソニー株式会社 | 温度検出装置、これを搭載した半導体素子およびこれを用いたオートフォーカスシステム |
US6055489A (en) * | 1997-04-15 | 2000-04-25 | Intel Corporation | Temperature measurement and compensation scheme |
JP3338632B2 (ja) * | 1997-05-15 | 2002-10-28 | モトローラ株式会社 | 温度検出回路 |
US6363490B1 (en) | 1999-03-30 | 2002-03-26 | Intel Corporation | Method and apparatus for monitoring the temperature of a processor |
US6789037B2 (en) * | 1999-03-30 | 2004-09-07 | Intel Corporation | Methods and apparatus for thermal management of an integrated circuit die |
US6393374B1 (en) | 1999-03-30 | 2002-05-21 | Intel Corporation | Programmable thermal management of an integrated circuit die |
EP1081477B1 (en) * | 1999-08-31 | 2006-10-18 | STMicroelectronics S.r.l. | CMOS Temperature sensor |
GB2355552A (en) | 1999-10-20 | 2001-04-25 | Ericsson Telefon Ab L M | Electronic circuit for supplying a reference current |
US7263567B1 (en) | 2000-09-25 | 2007-08-28 | Intel Corporation | Method and apparatus for lowering the die temperature of a microprocessor and maintaining the temperature below the die burn out |
KR100772594B1 (ko) * | 2001-06-30 | 2007-11-02 | 매그나칩 반도체 유한회사 | 온도 센서 |
US6679628B2 (en) | 2001-08-14 | 2004-01-20 | Schneider Automation Inc. | Solid state temperature measuring device and method |
US6735546B2 (en) * | 2001-08-31 | 2004-05-11 | Matrix Semiconductor, Inc. | Memory device and method for temperature-based control over write and/or read operations |
US6724665B2 (en) | 2001-08-31 | 2004-04-20 | Matrix Semiconductor, Inc. | Memory device and method for selectable sub-array activation |
GB2393867B (en) | 2002-10-01 | 2006-09-20 | Wolfson Ltd | Temperature sensing apparatus and methods |
JP2004146576A (ja) * | 2002-10-24 | 2004-05-20 | Renesas Technology Corp | 半導体温度測定回路 |
US6954394B2 (en) * | 2002-11-27 | 2005-10-11 | Matrix Semiconductor, Inc. | Integrated circuit and method for selecting a set of memory-cell-layer-dependent or temperature-dependent operating conditions |
FR2857456B1 (fr) * | 2003-07-07 | 2006-01-13 | St Microelectronics Sa | Cellule de detection de temperature et procede de determination du seuil de detection d'une telle cellule |
US7057958B2 (en) * | 2003-09-30 | 2006-06-06 | Sandisk Corporation | Method and system for temperature compensation for memory cells with temperature-dependent behavior |
US7218570B2 (en) * | 2004-12-17 | 2007-05-15 | Sandisk 3D Llc | Apparatus and method for memory operations using address-dependent conditions |
US7332952B2 (en) * | 2005-11-23 | 2008-02-19 | Standard Microsystems Corporation | Accurate temperature measurement method for low beta transistors |
US7283414B1 (en) | 2006-05-24 | 2007-10-16 | Sandisk 3D Llc | Method for improving the precision of a temperature-sensor circuit |
US7896545B2 (en) * | 2008-03-19 | 2011-03-01 | Micron Technology, Inc. | Apparatus and methods for temperature calibration and sensing |
KR102533348B1 (ko) * | 2018-01-24 | 2023-05-19 | 삼성전자주식회사 | 온도 감지 장치 및 온도-전압 변환기 |
US11460428B2 (en) | 2018-11-16 | 2022-10-04 | Minebea Mitsumi Inc. | Humidity detecting device and method of determining malfunction |
JP7167396B2 (ja) * | 2018-11-16 | 2022-11-09 | ミネベアミツミ株式会社 | 湿度検出装置及び故障判定方法 |
JP7173661B2 (ja) * | 2018-11-16 | 2022-11-16 | ミネベアミツミ株式会社 | 湿度検出装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4350904A (en) * | 1980-09-22 | 1982-09-21 | Bell Telephone Laboratories, Incorporated | Current source with modified temperature coefficient |
JPS58221507A (ja) * | 1982-06-18 | 1983-12-23 | Toshiba Corp | トランジスタ回路 |
US4698655A (en) * | 1983-09-23 | 1987-10-06 | Motorola, Inc. | Overvoltage and overtemperature protection circuit |
JPS6170806A (ja) * | 1984-09-14 | 1986-04-11 | Matsushita Electric Ind Co Ltd | 熱保護回路 |
JPS6170805A (ja) * | 1984-09-14 | 1986-04-11 | Matsushita Electric Ind Co Ltd | 熱保護回路 |
US4736125A (en) * | 1986-08-28 | 1988-04-05 | Applied Micro Circuits Corporation | Unbuffered TTL-to-ECL translator with temperature-compensated threshold voltage obtained from a constant-current reference voltage |
US4789819A (en) * | 1986-11-18 | 1988-12-06 | Linear Technology Corporation | Breakpoint compensation and thermal limit circuit |
JP2748414B2 (ja) * | 1988-07-20 | 1998-05-06 | 日本電気株式会社 | 電圧源回路 |
GB2222884A (en) * | 1988-09-19 | 1990-03-21 | Philips Electronic Associated | Temperature sensing circuit |
-
1990
- 1990-05-24 JP JP2134940A patent/JP2598154B2/ja not_active Expired - Lifetime
-
1991
- 1991-05-20 KR KR1019910008153A patent/KR930006304B1/ko not_active IP Right Cessation
- 1991-05-21 US US07/703,833 patent/US5149199A/en not_active Expired - Lifetime
- 1991-05-23 EP EP91108353A patent/EP0458332B1/en not_active Expired - Lifetime
- 1991-05-23 DE DE69124138T patent/DE69124138T2/de not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101489104B1 (ko) * | 2010-10-04 | 2015-02-02 | 가부시키가이샤 리코 | 전기 소자 |
Also Published As
Publication number | Publication date |
---|---|
EP0458332B1 (en) | 1997-01-15 |
EP0458332A3 (en) | 1992-07-22 |
US5149199A (en) | 1992-09-22 |
DE69124138T2 (de) | 1997-06-05 |
JP2598154B2 (ja) | 1997-04-09 |
JPH0430609A (ja) | 1992-02-03 |
EP0458332A2 (en) | 1991-11-27 |
DE69124138D1 (de) | 1997-02-27 |
KR930006304B1 (ko) | 1993-07-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20030701 Year of fee payment: 11 |
|
LAPS | Lapse due to unpaid annual fee |