DE69124138T2 - Temperaturdetektionsschaltung zur Benutzung in einer Temperaturprotektionsschaltung - Google Patents

Temperaturdetektionsschaltung zur Benutzung in einer Temperaturprotektionsschaltung

Info

Publication number
DE69124138T2
DE69124138T2 DE69124138T DE69124138T DE69124138T2 DE 69124138 T2 DE69124138 T2 DE 69124138T2 DE 69124138 T DE69124138 T DE 69124138T DE 69124138 T DE69124138 T DE 69124138T DE 69124138 T2 DE69124138 T2 DE 69124138T2
Authority
DE
Germany
Prior art keywords
temperature
circuit
detection circuit
protection circuit
temperature detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69124138T
Other languages
English (en)
Other versions
DE69124138D1 (de
Inventor
Hitoshi Kinoshita
Masaru Hashimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Toshiba AVE Co Ltd
Toshiba Electronic Device Solutions Corp
Original Assignee
Toshiba Corp
Toshiba Microelectronics Corp
Toshiba AVE Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Toshiba Microelectronics Corp, Toshiba AVE Co Ltd filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE69124138D1 publication Critical patent/DE69124138D1/de
Publication of DE69124138T2 publication Critical patent/DE69124138T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
    • G01K7/14—Arrangements for modifying the output characteristic, e.g. linearising
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is dc
    • G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/30—Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K3/00—Thermometers giving results other than momentary value of temperature
    • G01K3/005—Circuits arrangements for indicating a predetermined temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Nonlinear Science (AREA)
  • Power Engineering (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Amplifiers (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Control Of Electrical Variables (AREA)
  • Measurement Of Current Or Voltage (AREA)
DE69124138T 1990-05-24 1991-05-23 Temperaturdetektionsschaltung zur Benutzung in einer Temperaturprotektionsschaltung Expired - Lifetime DE69124138T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2134940A JP2598154B2 (ja) 1990-05-24 1990-05-24 温度検出回路

Publications (2)

Publication Number Publication Date
DE69124138D1 DE69124138D1 (de) 1997-02-27
DE69124138T2 true DE69124138T2 (de) 1997-06-05

Family

ID=15140115

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69124138T Expired - Lifetime DE69124138T2 (de) 1990-05-24 1991-05-23 Temperaturdetektionsschaltung zur Benutzung in einer Temperaturprotektionsschaltung

Country Status (5)

Country Link
US (1) US5149199A (de)
EP (1) EP0458332B1 (de)
JP (1) JP2598154B2 (de)
KR (1) KR930006304B1 (de)
DE (1) DE69124138T2 (de)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2066929C (en) * 1991-08-09 1996-10-01 Katsuji Kimura Temperature sensor circuit and constant-current circuit
US5359236A (en) * 1993-05-25 1994-10-25 Harris Corporation Integrated circuit thermal sensor
JP2540753B2 (ja) * 1993-09-01 1996-10-09 日本電気株式会社 過熱検出回路
US7216064B1 (en) 1993-09-21 2007-05-08 Intel Corporation Method and apparatus for programmable thermal sensor for an integrated circuit
US5394078A (en) * 1993-10-26 1995-02-28 Analog Devices, Inc. Two terminal temperature transducer having circuitry which controls the entire operating current to be linearly proportional with temperature
JP3348576B2 (ja) * 1995-11-10 2002-11-20 ソニー株式会社 温度検出装置、これを搭載した半導体素子およびこれを用いたオートフォーカスシステム
US6055489A (en) * 1997-04-15 2000-04-25 Intel Corporation Temperature measurement and compensation scheme
JP3338632B2 (ja) * 1997-05-15 2002-10-28 モトローラ株式会社 温度検出回路
US6363490B1 (en) 1999-03-30 2002-03-26 Intel Corporation Method and apparatus for monitoring the temperature of a processor
US6789037B2 (en) * 1999-03-30 2004-09-07 Intel Corporation Methods and apparatus for thermal management of an integrated circuit die
US6393374B1 (en) 1999-03-30 2002-05-21 Intel Corporation Programmable thermal management of an integrated circuit die
DE69933670D1 (de) * 1999-08-31 2006-11-30 St Microelectronics Srl Temperaturfühler in Cmos-Technologie
GB2355552A (en) 1999-10-20 2001-04-25 Ericsson Telefon Ab L M Electronic circuit for supplying a reference current
US7263567B1 (en) 2000-09-25 2007-08-28 Intel Corporation Method and apparatus for lowering the die temperature of a microprocessor and maintaining the temperature below the die burn out
KR100772594B1 (ko) * 2001-06-30 2007-11-02 매그나칩 반도체 유한회사 온도 센서
US6679628B2 (en) * 2001-08-14 2004-01-20 Schneider Automation Inc. Solid state temperature measuring device and method
US6724665B2 (en) 2001-08-31 2004-04-20 Matrix Semiconductor, Inc. Memory device and method for selectable sub-array activation
US6735546B2 (en) * 2001-08-31 2004-05-11 Matrix Semiconductor, Inc. Memory device and method for temperature-based control over write and/or read operations
GB2393867B (en) * 2002-10-01 2006-09-20 Wolfson Ltd Temperature sensing apparatus and methods
JP2004146576A (ja) * 2002-10-24 2004-05-20 Renesas Technology Corp 半導体温度測定回路
US6954394B2 (en) * 2002-11-27 2005-10-11 Matrix Semiconductor, Inc. Integrated circuit and method for selecting a set of memory-cell-layer-dependent or temperature-dependent operating conditions
FR2857456B1 (fr) * 2003-07-07 2006-01-13 St Microelectronics Sa Cellule de detection de temperature et procede de determination du seuil de detection d'une telle cellule
US7057958B2 (en) * 2003-09-30 2006-06-06 Sandisk Corporation Method and system for temperature compensation for memory cells with temperature-dependent behavior
US7218570B2 (en) * 2004-12-17 2007-05-15 Sandisk 3D Llc Apparatus and method for memory operations using address-dependent conditions
US7332952B2 (en) * 2005-11-23 2008-02-19 Standard Microsystems Corporation Accurate temperature measurement method for low beta transistors
US7283414B1 (en) 2006-05-24 2007-10-16 Sandisk 3D Llc Method for improving the precision of a temperature-sensor circuit
US7896545B2 (en) * 2008-03-19 2011-03-01 Micron Technology, Inc. Apparatus and methods for temperature calibration and sensing
WO2012046638A1 (en) * 2010-10-04 2012-04-12 Ricoh Company, Ltd. Electric element
KR102533348B1 (ko) * 2018-01-24 2023-05-19 삼성전자주식회사 온도 감지 장치 및 온도-전압 변환기
US11460428B2 (en) 2018-11-16 2022-10-04 Minebea Mitsumi Inc. Humidity detecting device and method of determining malfunction
JP7173661B2 (ja) * 2018-11-16 2022-11-16 ミネベアミツミ株式会社 湿度検出装置
JP7167396B2 (ja) * 2018-11-16 2022-11-09 ミネベアミツミ株式会社 湿度検出装置及び故障判定方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4350904A (en) * 1980-09-22 1982-09-21 Bell Telephone Laboratories, Incorporated Current source with modified temperature coefficient
JPS58221507A (ja) * 1982-06-18 1983-12-23 Toshiba Corp トランジスタ回路
US4698655A (en) * 1983-09-23 1987-10-06 Motorola, Inc. Overvoltage and overtemperature protection circuit
JPS6170806A (ja) * 1984-09-14 1986-04-11 Matsushita Electric Ind Co Ltd 熱保護回路
JPS6170805A (ja) * 1984-09-14 1986-04-11 Matsushita Electric Ind Co Ltd 熱保護回路
US4736125A (en) * 1986-08-28 1988-04-05 Applied Micro Circuits Corporation Unbuffered TTL-to-ECL translator with temperature-compensated threshold voltage obtained from a constant-current reference voltage
US4789819A (en) * 1986-11-18 1988-12-06 Linear Technology Corporation Breakpoint compensation and thermal limit circuit
JP2748414B2 (ja) * 1988-07-20 1998-05-06 日本電気株式会社 電圧源回路
GB2222884A (en) * 1988-09-19 1990-03-21 Philips Electronic Associated Temperature sensing circuit

Also Published As

Publication number Publication date
JPH0430609A (ja) 1992-02-03
US5149199A (en) 1992-09-22
EP0458332A3 (en) 1992-07-22
KR930006304B1 (ko) 1993-07-12
JP2598154B2 (ja) 1997-04-09
EP0458332A2 (de) 1991-11-27
EP0458332B1 (de) 1997-01-15
KR910020420A (ko) 1991-12-20
DE69124138D1 (de) 1997-02-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition