KR910003949A - 신호원 장치 및 디지탈-아날로그 변환기 - Google Patents

신호원 장치 및 디지탈-아날로그 변환기 Download PDF

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Publication number
KR910003949A
KR910003949A KR1019900010124A KR900010124A KR910003949A KR 910003949 A KR910003949 A KR 910003949A KR 1019900010124 A KR1019900010124 A KR 1019900010124A KR 900010124 A KR900010124 A KR 900010124A KR 910003949 A KR910003949 A KR 910003949A
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KR
South Korea
Prior art keywords
signal
signal source
unit
digital
period
Prior art date
Application number
KR1019900010124A
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English (en)
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KR100202355B1 (ko
Inventor
보우테르 요한네스 그뢰네벨트 디르크
요한네스 쉬오우베나르스 헨드리쿠스
Original Assignee
프레데릭 얀 스미트
엔.브이.필립스 글로아이람펜파브리켄
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication of KR910003949A publication Critical patent/KR910003949A/ko
Application granted granted Critical
Publication of KR100202355B1 publication Critical patent/KR100202355B1/ko

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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0643—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the spatial domain
    • H03M1/0648—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the spatial domain by arranging the quantisation value generators in a non-sequential pattern layout, e.g. symmetrical
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1004—Calibration or testing without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

내용 없음.

Description

신호원 장치 및 디지털-아날로그 변환기
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제9도는 본 발명에 따른 전류원 배열을 구비한 디지털-아날로그 변환기 도시도.

Claims (2)

  1. 거의 동일한 유닛 신호 발생용 신호원 그룹과, 특정 주기를 가지고 순환하는 눈금 패턴과 일치하여 상기 신호원 눈금에 의해 신호원으로부터 유닛 신호내의 상호 변형을 감소하기 위한 교정 수단을 구비하며, 유닛에서 발생하는 신호는 상기 주기를 가지고 순환하는 유사한 형태의 위신호를 구비하며, 출력 신호를 형성하기 위해 이용 가능한 유닛 신호의 다수의 유닛 신호 조합용 조합 수단을 구비하는 신호원 장치에 있어서, 상기 선택된 유닛 신호중 하나의 위신호에 관계하여 상기 선택된 유닛 신호의 위신호가 시간 시프트를 나타내며 상기 평균값은 가능하면 근접하게 주기의 반에 근접하고 상기 절대값은 최고 익스탠트에 서로 다르게 구성되도록 출력 신호용으로 유닛 신호를 선택하기 위해 구성된 최소한 하나의 교정 수단을 특징으로 하는 신호원 장치.
  2. 제1항에서 청구된 바와같은 신호원 장치를 구비하는 것을 특징으로 하는 디지털-아날로그 변환기.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019900010124A 1989-07-10 1990-07-05 신호원 장치 및 디지털-아날로그 변환기 KR100202355B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8901755 1989-07-10
NL8901755 1989-07-10

Publications (2)

Publication Number Publication Date
KR910003949A true KR910003949A (ko) 1991-02-28
KR100202355B1 KR100202355B1 (ko) 1999-06-15

Family

ID=19855000

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019900010124A KR100202355B1 (ko) 1989-07-10 1990-07-05 신호원 장치 및 디지털-아날로그 변환기

Country Status (6)

Country Link
US (1) US5021784A (ko)
EP (1) EP0408115B1 (ko)
JP (1) JP3033988B2 (ko)
KR (1) KR100202355B1 (ko)
DE (1) DE69013084T2 (ko)
HK (1) HK41196A (ko)

Families Citing this family (16)

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Publication number Priority date Publication date Assignee Title
US5444446A (en) * 1993-07-01 1995-08-22 Texas Instruments Incorporated Apparatus and method for duplicating currents
JP3062035B2 (ja) * 1995-03-31 2000-07-10 インターナショナル・ビジネス・マシーンズ・コーポレ−ション Ｄ／ａコンバータ
US5646619A (en) * 1995-04-26 1997-07-08 Lucent Technologies Inc. Self-calibrating high speed D/A converter
US5760726A (en) * 1996-08-23 1998-06-02 Motorola, Inc. Digital-to-analog converter with dynamic matching and bit splitting
US5955980A (en) * 1997-10-03 1999-09-21 Motorola, Inc. Circuit and method for calibrating a digital-to-analog converter
US6583740B2 (en) * 2001-11-21 2003-06-24 Analog Devices, Inc. Calibrated current source
US7187316B1 (en) * 2006-02-06 2007-03-06 Brookhaven Science Associates, Llc Method and apparatus for clockless analog-to-digital conversion and peak detection
JP4464418B2 (ja) * 2007-03-20 2010-05-19 株式会社日立製作所 ランプ波形発生回路及びそれを用いた回路パターン検査装置
US7576667B1 (en) 2007-04-10 2009-08-18 Marvell International Ltd. Hierarchied calibration circuit
US7804433B1 (en) 2009-04-14 2010-09-28 Texas Instruments Incorporated Methods and apparatus for error cancelation in calibrated current sources
TW201128961A (en) * 2010-02-04 2011-08-16 Nat Univ Chung Cheng Current-mode digital-to-analog converter with prospective correction mechanism
US8193960B2 (en) 2010-02-10 2012-06-05 Advantest Corporation Output apparatus and test apparatus
US8325072B2 (en) * 2011-01-10 2012-12-04 Intel Mobile Communications GmbH Calibration circuit and method for calibrating capacitive compensation in digital-to-analog converters
CN103176150B (zh) 2011-12-21 2015-08-26 通用电气公司 梯度放大器系统及其控制方法
US8912939B2 (en) * 2012-12-14 2014-12-16 Analog Devices Technology String DAC leakage current cancellation
EP3249375A1 (en) * 2016-05-27 2017-11-29 Xieon Networks S.à r.l. Otdr with increased precision and reduced dead zone using superposition of pulses with varying clock signal delay

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4272760A (en) * 1979-04-10 1981-06-09 Burr-Brown Research Corporation Self-calibrating digital to analog conversion system and method
DE3279017D1 (en) * 1981-03-25 1988-10-13 Hitachi Ltd Digital-to-analog converter
US4591828A (en) * 1981-05-07 1986-05-27 Cambridge Consultants Limited Digital-to-analog converter
CA1203318A (en) * 1981-09-16 1986-04-15 Brooktree Corporation Apparatus for converting data between analog and digital values
FR2529412A1 (fr) * 1982-06-25 1983-12-30 Thomson Csf Convertisseur numerique-analogique de haute resolution a auto-etalonnage
US4607250A (en) * 1985-05-08 1986-08-19 Burr-Brown Corporation Bit adjustment and filter circuit for digital-to-analog converter
FR2620836B1 (fr) * 1987-09-21 1990-01-19 Thomson Semiconducteurs Source d e courant ajustable et convertisseur numerique/analogique a auto-calibration utilisant une telle source
NL8703128A (nl) * 1987-12-24 1989-07-17 Philips Nv Digitaal-analoog-omzetter.
US4967140A (en) * 1988-09-12 1990-10-30 U.S. Philips Corporation Current-source arrangement
US4958155A (en) * 1989-01-31 1990-09-18 Zdzislaw Gulczynski Ultra fast digital-to-analog converter with independent bit current source calibration

Also Published As

Publication number Publication date
DE69013084D1 (de) 1994-11-10
DE69013084T2 (de) 1995-04-13
JP3033988B2 (ja) 2000-04-17
US5021784A (en) 1991-06-04
KR100202355B1 (ko) 1999-06-15
JPH0369213A (ja) 1991-03-25
EP0408115B1 (en) 1994-10-05
EP0408115A1 (en) 1991-01-16
HK41196A (en) 1996-03-15

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