KR900019269A - 이미지 센서로서의 포토다이오드 및 그 제조방법 - Google Patents

이미지 센서로서의 포토다이오드 및 그 제조방법 Download PDF

Info

Publication number
KR900019269A
KR900019269A KR1019890007437A KR890007437A KR900019269A KR 900019269 A KR900019269 A KR 900019269A KR 1019890007437 A KR1019890007437 A KR 1019890007437A KR 890007437 A KR890007437 A KR 890007437A KR 900019269 A KR900019269 A KR 900019269A
Authority
KR
South Korea
Prior art keywords
layer
photodiode
image sensor
manufacturing
depositing
Prior art date
Application number
KR1019890007437A
Other languages
English (en)
Other versions
KR0134627B1 (ko
Inventor
박병우
Original Assignee
이헌조
주식회사 금성사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 이헌조, 주식회사 금성사 filed Critical 이헌조
Priority to KR1019890007437A priority Critical patent/KR0134627B1/ko
Publication of KR900019269A publication Critical patent/KR900019269A/ko
Application granted granted Critical
Publication of KR0134627B1 publication Critical patent/KR0134627B1/ko

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Light Receiving Elements (AREA)

Abstract

내용 없음

Description

이미지 센서로서의 포토다이오드 및 그 제조방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제3도는 본 발명의 포토다이오드 단면도.

Claims (2)

  1. 유리기판(G)과 그 위에 크롬층과 ITO층 및 i-a-Si : H, p-a-Si : H층을 갖는 이미지 센서로서의 포토다이오드에 있어서, ITO층과 Cr층간 부도체로서의 SiO2층과, 상기 ITO층에서 상기 i-a-Si : H층으로 인듐 침투억제를 위해 형성되는 Si3N4층을 포함하고, 상기 i-a-Si : H, p-a-Si : H층 및 Al 전극은 상기 Si3N4층상에 연이어 적층되는 것을 특징으로 하는 이미지 센서로서의 포토다이오드.
  2. 이미지 센서로서의 포토다이오드 제조방법에 있어서, 유리기판(G)상에 Cr을 증착, 패터닝하고 부도체인 SiO2층을 스퍼터링 증착하는 단계와, 상기 형상체상에 ITO층을 증착, 패터닝하고 Si3N4층을 증착하는 단계와, i-a-Si : H, p-a-Si : H 및 Al전극층을 연이어 증착 형성되는 단계를포함하여 형성되는 이미지 센서로서의 포토다이오드 제조방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019890007437A 1989-05-31 1989-05-31 이미지 센서로서의 포토다이오드 및 그 제조방법 KR0134627B1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019890007437A KR0134627B1 (ko) 1989-05-31 1989-05-31 이미지 센서로서의 포토다이오드 및 그 제조방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019890007437A KR0134627B1 (ko) 1989-05-31 1989-05-31 이미지 센서로서의 포토다이오드 및 그 제조방법

Publications (2)

Publication Number Publication Date
KR900019269A true KR900019269A (ko) 1990-12-24
KR0134627B1 KR0134627B1 (ko) 1998-04-20

Family

ID=19286681

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890007437A KR0134627B1 (ko) 1989-05-31 1989-05-31 이미지 센서로서의 포토다이오드 및 그 제조방법

Country Status (1)

Country Link
KR (1) KR0134627B1 (ko)

Also Published As

Publication number Publication date
KR0134627B1 (ko) 1998-04-20

Similar Documents

Publication Publication Date Title
CA2156571A1 (en) Coated Substrate and Process for Its Formation
KR920008982A (ko) 박막 el표시소자의 제조방법 및 구조
KR930022255A (ko) 투명도전막 배선기판의 제조방법
KR950003842A (ko) 표시소자용 전극기판 및 그 제조방법
KR900019269A (ko) 이미지 센서로서의 포토다이오드 및 그 제조방법
KR890001168A (ko) 반도체 장치에서의 절연산화물 형성방법 및 그 방법에 따라 제조된 반도체 장치
KR950020952A (ko) 압전형 애널로그 터치 패널
JPS5689701A (en) Half mirror
KR930018759A (ko) 포토다이오드의 제조방법
JPS575372A (en) Thin film diode and manufacture thereof
KR920014161A (ko) 밀착형 일차원 이미지센서
KR910001885A (ko) 팩시밀리 장착용 이미지센서의 포토다이오드
KR910002014A (ko) 밀착형 이미지센서 및 그 제조방법
KR970017843A (ko) 폴리이미드를 이용한 전계방출 표시소자의 스페이서 제조방법
KR920003811A (ko) 박막 el표시소자 및 그 제조방법
KR930022919A (ko) 박막 el 소자
JPH0369899U (ko)
JPS5632102A (en) 4-layer nonreflecting coat
KR910019202A (ko) Ni-Co 박막의 제조방법
KR970053595A (ko) 공통 전극 기판 및 그 제조 방법
KR920008979A (ko) 박막 el에지 에미터
KR880007965A (ko) 엘렉트로 루미네슨스 표시소자의 절연층
KR910013487A (ko) 비정질 실리콘 tft제조방법
KR970047959A (ko) 초전형 적외선센서 및 그 제조방법
KR930001342A (ko) 위상쉬프트 마스크 제조방법

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
LAPS Lapse due to unpaid annual fee