KR890017383A - 스파터링 타겟(sputtering target) - Google Patents

스파터링 타겟(sputtering target) Download PDF

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Publication number
KR890017383A
KR890017383A KR1019890006544A KR890006544A KR890017383A KR 890017383 A KR890017383 A KR 890017383A KR 1019890006544 A KR1019890006544 A KR 1019890006544A KR 890006544 A KR890006544 A KR 890006544A KR 890017383 A KR890017383 A KR 890017383A
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South Korea
Prior art keywords
target
thin sheet
sputtering target
target according
substrate
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KR1019890006544A
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English (en)
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KR920001274B1 (ko
Inventor
요시하루 후까사와
사또시 야마구찌
히데오 이시하라
Original Assignee
아오이 죠이찌
가부시끼가이샤 도시바
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Publication of KR890017383A publication Critical patent/KR890017383A/ko
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Publication of KR920001274B1 publication Critical patent/KR920001274B1/ko

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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

내용 없음

Description

스파터링 타겟(sputtering target)
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제 1도는 본 발명의 한예에 따른 스파터링 타겟의 단면도이다, 제 2도는 본 발명의 한예에 따른 스파터링타겟의 사시도이다, 제 3도 내지 제 6도는 종래형의 스파터링 타겟의 구성을 나타내는 사시도이다.

Claims (11)

  1. 기판(6)상에 복합물로 벤치된 두가지 이상의 타겟요소(2)(3)로 분할되고, 한가지 이상의 타겟 요소물질로 구성되어 있는 얇은 시트(7)사 상기기판(6)과 타겟요소(2)(3) 사이에 삽입되어 있으며, 상기 얇은 시트(7)가 적에도 하나의 금속물질로 구성되어 있는 것을 특징으로 하는 스파터링 타겟(1).
  2. 제 1항에 있어서, 타겟요소(2)(3)의 구성물질은 Mo,W,Ta,Nb,Ti.Ni.V,Cr,Al과 그들의 화합물로 부터 선택되어지는 것을 특징으로 하는 스파터링타겟.
  3. 제 1항에 있어서, 타겟요소(2)(3)는 Mo와 Ta로 구성되어있는 복합 타겟을 구성하고 있고, 그리고 얇은 시트(7)의 물질은 Mo와 Ta로 부터 선택되어지는 것을 특징으로 하는 스파터링 타겟.
  4. 제 1항에 있어서, 얇은 시트(7) 두께는 악 0.05내지 0.6mm인 것을 특징으로 하는 스파터링 타겟.
  5. 제 1항에 있어서, 얇은 시트(7)의 두께는 약 0.1내지 0.55mm인 것을 특징으로 하는 스파터링 타겟.
  6. 기관(6), 기판(6)에 배치된 다수개의 타겟요소(2)(3), 그리고 기판(6)의 타겟요소(2)(3) 사이에 삽입되어 있고 타겟요소(2)(3)의 물질중 적어도 한 물질로 구성되어 있는 적어도 하나의 금속물질로 이루어진 얇은 시트(7)로 구성되어 있는 것을 특징으로 하는 스파터링 타겟(1).
  7. 제 6항에 있어서, 얇은 시트(7)는 고순도의 고융점 금속으로 구성되어 있는 것을 특징으로 하는 스파터링 타겟.
  8. 제 6항에 있어서, 얇은 시트(7)의 물질은 Mo,W,Ta,Nb,Ti,Ni,V,Gr,Al 그리고 그들의 화합물로 부터 선택되어지는 것을 특징으로 하는 스파터링 타겟.
  9. 제 6항에 있어서, 타겟요소(2)(3)는 Mo와 Ta로 구성되어 있고 그리고 얇은 시트(7)의 물질은 Mo와 Ta로 부터 선택되어 지는 것을 특징으로 하는 스파터링 타겟.
  10. 제 6항에 있어서, 얇은 시트(7)의 두께는 약 0.05내지 0.6mm인 것을 특징으로 하는 스파터링 타겟.
  11. 제 6항에 있어서, 얇은 시트(7)의 두께는 약 0.1내지 0.5mm인 것을 특징으로 하는 스파터링 타겟.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019890006544A 1988-05-16 1989-05-15 스파터링 타겟(sputtering targer) KR920001274B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP63-118429 1988-05-16
JP88-118429 1988-05-16
JP63118429A JPH01290765A (ja) 1988-05-16 1988-05-16 スパッタリングターゲット

Publications (2)

Publication Number Publication Date
KR890017383A true KR890017383A (ko) 1989-12-15
KR920001274B1 KR920001274B1 (ko) 1992-02-10

Family

ID=14736428

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890006544A KR920001274B1 (ko) 1988-05-16 1989-05-15 스파터링 타겟(sputtering targer)

Country Status (5)

Country Link
US (1) US4966676A (ko)
EP (2) EP0618306B1 (ko)
JP (1) JPH01290765A (ko)
KR (1) KR920001274B1 (ko)
DE (2) DE68928189T2 (ko)

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US9595655B2 (en) 2011-09-07 2017-03-14 Toyota Jidosha Kabushiki Kaisha Semiconductor device and method of manufacturing the same

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Publication number Priority date Publication date Assignee Title
US9595655B2 (en) 2011-09-07 2017-03-14 Toyota Jidosha Kabushiki Kaisha Semiconductor device and method of manufacturing the same

Also Published As

Publication number Publication date
EP0618306A3 (en) 1994-10-26
DE68928189D1 (de) 1997-08-28
EP0342894A1 (en) 1989-11-23
DE68928189T2 (de) 1997-11-13
EP0618306A2 (en) 1994-10-05
DE68928421D1 (de) 1997-12-04
US4966676A (en) 1990-10-30
JPH01290765A (ja) 1989-11-22
EP0342894B1 (en) 1997-07-23
EP0618306B1 (en) 1997-10-29
DE68928421T2 (de) 1998-02-26
KR920001274B1 (ko) 1992-02-10

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