KR880700321A - 이온 빔 및 전자 빔 석판 인쇄용 폴리실록산 내식막 - Google Patents

이온 빔 및 전자 빔 석판 인쇄용 폴리실록산 내식막

Info

Publication number
KR880700321A
KR880700321A KR1019860700770A KR860700770A KR880700321A KR 880700321 A KR880700321 A KR 880700321A KR 1019860700770 A KR1019860700770 A KR 1019860700770A KR 860700770 A KR860700770 A KR 860700770A KR 880700321 A KR880700321 A KR 880700321A
Authority
KR
South Korea
Prior art keywords
polysiloxane
corrosion resistant
resistant film
electron beam
ion beam
Prior art date
Application number
KR1019860700770A
Other languages
English (en)
Other versions
KR900005404B1 (ko
Inventor
로버트 지. 브롤트
Original Assignee
휴우즈 에어크라프트 캄파니
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 휴우즈 에어크라프트 캄파니 filed Critical 휴우즈 에어크라프트 캄파니
Publication of KR880700321A publication Critical patent/KR880700321A/ko
Application granted granted Critical
Publication of KR900005404B1 publication Critical patent/KR900005404B1/ko

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/075—Silicon-containing compounds
    • G03F7/0757—Macromolecular compounds containing Si-O, Si-C or Si-N bonds
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/094—Multilayer resist systems, e.g. planarising layers
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/075—Silicon-containing compounds

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Architecture (AREA)
  • Structural Engineering (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Silicon Polymers (AREA)
KR1019860700770A 1985-03-07 1986-02-28 이온 빔 및 전자 빔 석판 인쇄용 폴리실록산 내식막 KR900005404B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US70901985A 1985-03-07 1985-03-07
US709019 1985-03-07
PCT/US1986/000425 WO1986005284A1 (en) 1985-03-07 1986-02-28 Polysiloxane resist for ion beam and electron beam lithography

Publications (2)

Publication Number Publication Date
KR880700321A true KR880700321A (ko) 1988-02-22
KR900005404B1 KR900005404B1 (ko) 1990-07-28

Family

ID=24848156

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019860700770A KR900005404B1 (ko) 1985-03-07 1986-02-28 이온 빔 및 전자 빔 석판 인쇄용 폴리실록산 내식막

Country Status (6)

Country Link
US (1) US4981778A (ko)
EP (1) EP0215069B1 (ko)
JP (1) JPS62502071A (ko)
KR (1) KR900005404B1 (ko)
DE (1) DE3678652D1 (ko)
WO (1) WO1986005284A1 (ko)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3760030D1 (en) * 1986-02-07 1989-02-02 Nippon Telegraph & Telephone Photosensitive and high energy beam sensitive resin composition containing substituted polysiloxane
JPH01118126A (ja) * 1987-10-31 1989-05-10 Fujitsu Ltd パターン形成方法
FR2656617A1 (fr) * 1989-12-28 1991-07-05 Thomson Csf Procede de synthese de polysilsesquioxanes et applications des produits contenus.
JPH0443361A (ja) * 1990-06-11 1992-02-13 Fujitsu Ltd 有機硅素重合体レジストとその製造方法
TW434458B (en) * 1995-04-04 2001-05-16 Shinetsu Chemical Co Chemically amplified positive resist compositions
JP2697680B2 (ja) * 1995-05-31 1998-01-14 日本電気株式会社 珪素含有高分子化合物および感光性樹脂組成物
JP2000169585A (ja) * 1998-12-07 2000-06-20 Dow Corning Asia Ltd 水素シルセスキオキサン樹脂及び変性された水素シルセスキオキサン樹脂の製造方法
US6136511A (en) * 1999-01-20 2000-10-24 Micron Technology, Inc. Method of patterning substrates using multilayer resist processing
FR2872503B1 (fr) * 2004-07-05 2006-09-22 Commissariat Energie Atomique Procede de fabrication d'une ebauche de biopuce, ebauche et biopuce
US8901268B2 (en) * 2004-08-03 2014-12-02 Ahila Krishnamoorthy Compositions, layers and films for optoelectronic devices, methods of production and uses thereof
US8026040B2 (en) * 2007-02-20 2011-09-27 Az Electronic Materials Usa Corp. Silicone coating composition
JP2010519398A (ja) * 2007-02-27 2010-06-03 エイゼット・エレクトロニック・マテリアルズ・ユーエスエイ・コーポレイション ケイ素に基づく反射防止膜用組成物
US8557877B2 (en) 2009-06-10 2013-10-15 Honeywell International Inc. Anti-reflective coatings for optically transparent substrates
US8864898B2 (en) 2011-05-31 2014-10-21 Honeywell International Inc. Coating formulations for optical elements
US9394166B1 (en) * 2012-02-24 2016-07-19 The United States Of America As Represented By The Secretary Of The Navy Increased plasmon resonance frequency stability drawn from a refractive index gradient spanning negative and positive values
US10544329B2 (en) 2015-04-13 2020-01-28 Honeywell International Inc. Polysiloxane formulations and coatings for optoelectronic applications
US10597495B2 (en) 2016-02-19 2020-03-24 Dow Silicones Corporation Aged polymeric silsesquioxanes
KR102471220B1 (ko) * 2018-08-17 2022-11-25 와커 헤미 아게 가교성 오르가노실록산 조성물

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6046826B2 (ja) * 1979-06-21 1985-10-18 富士通株式会社 半導体装置
EP0031463B1 (en) * 1979-12-26 1984-06-13 International Business Machines Corporation Process for depositing a pattern of material on a substrate and use of this process for forming a patterned mask structure on a semiconductor substrate
JPS5760330A (en) * 1980-09-27 1982-04-12 Fujitsu Ltd Resin composition
JPS57141641A (en) * 1981-02-26 1982-09-02 Fujitsu Ltd Formation of positive pattern
JPS57141642A (en) * 1981-02-26 1982-09-02 Fujitsu Ltd Formation of pattern
JPS57146141A (en) * 1981-03-04 1982-09-09 Kenseishiya:Kk Air bubble detector
JPS57168247A (en) * 1981-04-09 1982-10-16 Fujitsu Ltd Formation of negative pattern
JPS57168246A (en) * 1981-04-09 1982-10-16 Fujitsu Ltd Formation of negative pattern
DE3278567D1 (en) * 1981-10-03 1988-07-07 Japan Synthetic Rubber Co Ltd Solvent-soluble organopolysilsesquioxanes, processes for producing the same, and compositions and semiconductor devices using the same
JPS6025061B2 (ja) * 1981-12-02 1985-06-15 日立化成工業株式会社 感光性シリコ−ン樹脂組成物
US4507384A (en) * 1983-04-18 1985-03-26 Nippon Telegraph & Telephone Public Corporation Pattern forming material and method for forming pattern therewith
EP0163538B1 (en) * 1984-05-30 1989-11-23 Fujitsu Limited Pattern-forming material and its production and use
JPS60254132A (ja) * 1984-05-31 1985-12-14 Fujitsu Ltd パタ−ン形成材料
JPS60262150A (ja) * 1984-06-11 1985-12-25 Nippon Telegr & Teleph Corp <Ntt> 三層レジスト用中間層材料及びそれを用いた三層レジストパタン形成方法

Also Published As

Publication number Publication date
DE3678652D1 (de) 1991-05-16
US4981778A (en) 1991-01-01
EP0215069A1 (en) 1987-03-25
JPS62502071A (ja) 1987-08-13
KR900005404B1 (ko) 1990-07-28
WO1986005284A1 (en) 1986-09-12
EP0215069B1 (en) 1991-04-10

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