KR850007132A - 화상 처리장치 - Google Patents

화상 처리장치 Download PDF

Info

Publication number
KR850007132A
KR850007132A KR1019850001928A KR850001928A KR850007132A KR 850007132 A KR850007132 A KR 850007132A KR 1019850001928 A KR1019850001928 A KR 1019850001928A KR 850001928 A KR850001928 A KR 850001928A KR 850007132 A KR850007132 A KR 850007132A
Authority
KR
South Korea
Prior art keywords
dimensional
contour
dimensional position
boundary line
image
Prior art date
Application number
KR1019850001928A
Other languages
English (en)
Other versions
KR900002509B1 (ko
Inventor
다구시(외 3) 오가다
Original Assignee
미쓰다 가쓰시게
가부시기 가이샤 히다찌세이사꾸쇼
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 미쓰다 가쓰시게, 가부시기 가이샤 히다찌세이사꾸쇼 filed Critical 미쓰다 가쓰시게
Publication of KR850007132A publication Critical patent/KR850007132A/ko
Application granted granted Critical
Publication of KR900002509B1 publication Critical patent/KR900002509B1/ko

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/60—Type of objects
    • G06V20/64—Three-dimensional objects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)

Abstract

내용 없음

Description

화상 처리장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제3도는 본 발명에 관한 화상처리장치의 1실시예의 구성도. 제4도는 본 장치에 있어서의 3차원 위치 측정장치의 1실시예의 설명도. 제5도는 본 장치에 의한 물체상의 스트릿광의 설명도.

Claims (3)

  1. 인식대상의 물체의 2차원 화상으로부터, 그 물체표면의 특정한 다각형 평면의 경계선상에 있어서의 적어도 3점의 3차원 위치를 측정하는 3차원 위치 측정수단과, 상기의 3차원 위치정보에 따라, 상기 경계선의 각 변의 방항 벡터 및 해당 다각형 평면의 법선 벡터를 구함과 동시에, 특정방항에 대한 상기 경계선의 각변의 경계각을 구하는 화상처리 수단과, 상기 방항벡터 법선 벡터 및 경계각에서 상기 다각형 평면에 적합하고 필터를 선택하고, 그 필터링 처리에 의해, 상기 물체의 2차원 화상데이터에서 해당 경계선의 검출을 하는 윤곽선 절출수단으로 되도록한 화상처리장치.
  2. 특허청구의 범위 제1항 기재에 있어서 3차원 위치 측정수단은, 인식대상의 물체의 특정한 다각형 평면의 경계선과, 상기 스릿트광과의 교점을 촬상하여, 스릿트광의 방항과 촬상방항과의 상대위치 관계에서 상기 교점의 적어도 3점에 대해서 3차원 위치를 측정하는 화상처리장치.
  3. 물체의 2차원적인 화상을 촬상하는 활상장치와, 그 2차원화상을 해석하여 해당 윤곽선을 검출하는 화상처리장치와, 그 윤곽선상의 적어도 3점의 3차원위치를 측정할수 있는 3차원 위치 측정장치와, 상기 윤곽선에 대하여 바라는 보정을 시행하는 화상보정 장치와, 상기의 3차원 위치측정 결과 및 윤곽선 보정결과에 따라, 상기 윤곽선의 3차원 좌표를 계산하여, 그 3차원 위치를 복원하는 3차원 위치계산장치로 구성된 시각장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019850001928A 1984-03-26 1985-03-23 화상 처리 장치 KR900002509B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP56196 1984-03-26
JP59056196A JPS60200111A (ja) 1984-03-26 1984-03-26 ３次元物体認識装置
JP59-56196 1984-03-26

Publications (2)

Publication Number Publication Date
KR850007132A true KR850007132A (ko) 1985-10-30
KR900002509B1 KR900002509B1 (ko) 1990-04-16

Family

ID=13020357

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019850001928A KR900002509B1 (ko) 1984-03-26 1985-03-23 화상 처리 장치

Country Status (4)

Country Link
EP (1) EP0157299B1 (ko)
JP (1) JPS60200111A (ko)
KR (1) KR900002509B1 (ko)
DE (1) DE3566160D1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100428604B1 (ko) * 1997-06-30 2004-06-16 주식회사 대우일렉트로닉스 3차원 데이터 취득시점 자동제어방법

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH061164B2 (ja) * 1985-01-31 1994-01-05 伍良 松本 立体形状測定装置
US4791482A (en) * 1987-02-06 1988-12-13 Westinghouse Electric Corp. Object locating system
US4891772A (en) * 1987-04-15 1990-01-02 Cyberoptics Corporation Point and line range sensors
JP2598413B2 (ja) * 1987-07-16 1997-04-09 マツダ株式会社 塗布高さの検出装置
EP0312046B1 (en) * 1987-10-14 1994-07-27 Hitachi, Ltd. Apparatus and method for inspecting defect of mounted component with slit light
FR2629198B1 (fr) * 1988-03-25 1994-07-08 Kreon Ingenierie Marketing Procede de determination et de reconstitution des coordonnees spatiales de chacun des points d'un ensemble de points echantillonnant une surface tridimensionnelle, et procede de realisation d'une image tridimensionnelle de cette surface a partir desdites coordonnees
DE58906804D1 (de) * 1988-08-05 1994-03-10 Siemens Ag Verfahren zur optischen Prüfung von Flachbaugruppen.
DE19618140A1 (de) * 1996-05-06 1997-11-13 Fraunhofer Ges Forschung 3D-Meßanordnung zur Ganzkörpererfassung und Einmessung einer entsprechenden Meßanordnung
EP1391688A1 (en) * 2002-08-14 2004-02-25 Metris N.V. Optical probe with laser scanner for generating crossed lines
CH697278B1 (de) * 2003-09-12 2008-07-31 Oerlikon Assembly Equipment Ag Einrichtung und Verfahren für die Montage oder Verdrahtung von Halbleiterchips.
JP4799216B2 (ja) 2006-03-03 2011-10-26 富士通株式会社 距離測定機能を有する撮像装置
EP2053348A1 (de) * 2007-10-23 2009-04-29 Texmag GmbH Vertriebsgesellschaft Verfahren und Vorrichtung zur optischen Erfassung eines Objekts
CN102425989A (zh) * 2011-08-22 2012-04-25 天津大学 基于图像检测的二维特征尺寸测量方法
DE202011051565U1 (de) * 2011-10-06 2011-11-03 Leuze Electronic Gmbh & Co. Kg Optischer Sensor
CN102607455B (zh) * 2012-02-27 2013-12-25 华中科技大学 基于光学显微镜和变化光照的微观形貌三维测量方法
JP5936039B2 (ja) * 2012-02-29 2016-06-15 三菱重工業株式会社 法線検出方法、法線検出装置および法線検出機能を備えた加工機
CN103926129B (zh) * 2014-05-04 2016-04-13 中南大学 一种用人工岩石材料复制节理起伏度及实验方法
CN107945443A (zh) * 2017-11-28 2018-04-20 佛山正能光电有限公司 一种脸部辨识安控系统
JP2021022807A (ja) 2019-07-26 2021-02-18 セイコーエプソン株式会社 プロジェクターの制御方法、及び、プロジェクター

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4316670A (en) * 1979-05-29 1982-02-23 Beta Industries, Inc. Apparatus and method for determining the configuration of a reflective surface
JPS58177295A (ja) * 1982-04-07 1983-10-17 株式会社日立製作所 ロボット制御装置
JPS58222383A (ja) * 1982-06-18 1983-12-24 Fujitsu Ltd 画像処理方式

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100428604B1 (ko) * 1997-06-30 2004-06-16 주식회사 대우일렉트로닉스 3차원 데이터 취득시점 자동제어방법

Also Published As

Publication number Publication date
JPH055041B2 (ko) 1993-01-21
DE3566160D1 (en) 1988-12-15
EP0157299B1 (en) 1988-11-09
EP0157299A1 (en) 1985-10-09
KR900002509B1 (ko) 1990-04-16
JPS60200111A (ja) 1985-10-09

Similar Documents

Publication Publication Date Title
KR850007132A (ko) 화상 처리장치
KR920010261A (ko) 3차원계측방법
JPS61110008A (ja) リアルタイム３次元アクテイブビジヨンセンサ装置
DE68926475D1 (de) Vorrichtung zur Ermittlung eines Bildbewegungsvektors
DE69019589D1 (de) Vorrichtung zur Ermittlung eines Bildbewegungsvektors.
KR880008906A (ko) 시각센서 시스템
KR840001347A (ko) 계내의 소자 동일화 장치
KR910017328A (ko) 위치인식장치
Ghilardi et al. A new approach for automatic detection of tactile paving surfaces in sidewalks
SE9700066D0 (sv) Method and arrangemant for determining the position of an object
ATE261154T1 (de) Verfahren und vorrichtung zur detektion eines gegenstandes in bezug auf eine oberfläche
KR910012673A (ko) 거리 측정장치
FR2295443A2 (fr) Procede et dispositif de determination photo-electrique de la position d'au moins un plan de nettete d'une image
KR960005908A (ko) 와이어 본딩부의 볼 검출방법 및 검출장치
FI891349A0 (fi) Automatisk reglering av bildskaorpa i bildroer.
Hacket et al. Segmentation using intensity and range data
JP2941322B2 (ja) 図面処理装置
KR940002619A (ko) 표적추적장치
KR960042009A (ko) 점군(点群)데이터의 곡면변환방법
KR100428604B1 (ko) 3차원 데이터 취득시점 자동제어방법
JPS5351875A (en) Method and apparatus for detecting position
JPS55164823A (en) Orthogonal projection image forming method of three-dimensional object
JPS5558408A (en) Input device
SU634312A1 (ru) Устройство дл нормализации изображений при распознавании образов
JPH0239381A (ja) ２次元透視図からの３次元座標抽出システム

Legal Events

Date Code Title Description
A201 Request for examination
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
LAPS Lapse due to unpaid annual fee