KR900002509B1 - 화상 처리 장치 - Google Patents
화상 처리 장치 Download PDFInfo
- Publication number
- KR900002509B1 KR900002509B1 KR1019850001928A KR850001928A KR900002509B1 KR 900002509 B1 KR900002509 B1 KR 900002509B1 KR 1019850001928 A KR1019850001928 A KR 1019850001928A KR 850001928 A KR850001928 A KR 850001928A KR 900002509 B1 KR900002509 B1 KR 900002509B1
- Authority
- KR
- South Korea
- Prior art keywords
- dimensional
- contour
- image
- dimensional position
- boundary line
- Prior art date
Links
- 238000005520 cutting process Methods 0.000 claims description 12
- 238000001914 filtration Methods 0.000 claims description 8
- 230000000007 visual effect Effects 0.000 claims description 5
- 238000003702 image correction Methods 0.000 claims description 2
- 238000003384 imaging method Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 16
- 238000000034 method Methods 0.000 description 12
- 238000001514 detection method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000005530 etching Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000008451 emotion Effects 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T1/00—General purpose image data processing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V20/00—Scenes; Scene-specific elements
- G06V20/60—Type of objects
- G06V20/64—Three-dimensional objects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Image Analysis (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
Abstract
Description
Claims (3)
- 인식대상의 물체의 2차원 화상으로부터, 그 물체표면의 특정한 다각형 평면의 경계선상에 있어서의 적어도 3점의 3차원 위치를 측정하는 3차원 위치 측정수단과, 상기의 3차원 위치정보에 따라, 상기 경계선의 각 변의 방향 벡터 및 해당 다각형 평면의 법선 벡터를 구함과 동시에, 특정방향에 대한 상기 경계선의 각변의 경계각을 구하는 화상처리 수단과, 상기 방향 벡터 법선 벡터 및 경계각에서 상기 다각형 평면에 적합하고 필터를 선택하고, 그 필터링 처리에 의해, 상기 물체의 2차원 화상 데이터에서 해당 경계선의 검출을하는 윤곽선 절출수단으로 되도록한 화상처리장치.
- 특허청구의 범위 제 1 항 기재에 있어서 3차원 위치 측정수단은, 인식대상의 물체의 특정한 다각형 평면에 스릿트 광을 투사하고, 상기의 다각형 평면의 경계선과, 상기 스릿트광과의 교점을 촬상하여, 스릿트광의 방향과 촬상방향과의 상대위치 관계에서, 상기 교점의 적어도 3점에 대해서 3차원 위치를 측정하는 화상처리장치.
- 물체의 2차원적인 화상을 촬상하는 촬상장치와, 그 2차원화상을 해석하여 해당 윤곽선을 검출하는 화상처리장치와, 그 윤곽선상의 적어도 3점의 3차원위치를 측정할 수 있는 3차원 위치 측정장치와, 상기 윤곽선에 대해서 바라는 보정을 시행하는 화상보정장치와, 상기의 3차원 위치 측정결과 및 윤곽선 보정 결과에 따라, 상기 윤곽선의 3차원 좌표를 계산하여, 그 3차원 위치를 복원하는 3차원 위치 계산장치로 구성된 시각장치.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56196 | 1984-03-26 | ||
JP59056196A JPS60200111A (ja) | 1984-03-26 | 1984-03-26 | 3次元物体認識装置 |
JP59-56196 | 1984-03-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR850007132A KR850007132A (ko) | 1985-10-30 |
KR900002509B1 true KR900002509B1 (ko) | 1990-04-16 |
Family
ID=13020357
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019850001928A KR900002509B1 (ko) | 1984-03-26 | 1985-03-23 | 화상 처리 장치 |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0157299B1 (ko) |
JP (1) | JPS60200111A (ko) |
KR (1) | KR900002509B1 (ko) |
DE (1) | DE3566160D1 (ko) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH061164B2 (ja) * | 1985-01-31 | 1994-01-05 | 伍良 松本 | 立体形状測定装置 |
US4791482A (en) * | 1987-02-06 | 1988-12-13 | Westinghouse Electric Corp. | Object locating system |
US4891772A (en) * | 1987-04-15 | 1990-01-02 | Cyberoptics Corporation | Point and line range sensors |
JP2598413B2 (ja) * | 1987-07-16 | 1997-04-09 | マツダ株式会社 | 塗布高さの検出装置 |
DE3850840T2 (de) * | 1987-10-14 | 1995-02-09 | Hitachi Ltd | Vorrichtung und Verfahren zur Fehlerinspektion in befestigten Bauteilen, unter Verwendung eines Lichtschlitzes. |
FR2629198B1 (fr) * | 1988-03-25 | 1994-07-08 | Kreon Ingenierie Marketing | Procede de determination et de reconstitution des coordonnees spatiales de chacun des points d'un ensemble de points echantillonnant une surface tridimensionnelle, et procede de realisation d'une image tridimensionnelle de cette surface a partir desdites coordonnees |
DE58906804D1 (de) * | 1988-08-05 | 1994-03-10 | Siemens Ag | Verfahren zur optischen Prüfung von Flachbaugruppen. |
DE19618140A1 (de) * | 1996-05-06 | 1997-11-13 | Fraunhofer Ges Forschung | 3D-Meßanordnung zur Ganzkörpererfassung und Einmessung einer entsprechenden Meßanordnung |
KR100428604B1 (ko) * | 1997-06-30 | 2004-06-16 | 주식회사 대우일렉트로닉스 | 3차원 데이터 취득시점 자동제어방법 |
EP1391688A1 (en) * | 2002-08-14 | 2004-02-25 | Metris N.V. | Optical probe with laser scanner for generating crossed lines |
CH697278B1 (de) * | 2003-09-12 | 2008-07-31 | Oerlikon Assembly Equipment Ag | Einrichtung und Verfahren für die Montage oder Verdrahtung von Halbleiterchips. |
JP4799216B2 (ja) | 2006-03-03 | 2011-10-26 | 富士通株式会社 | 距離測定機能を有する撮像装置 |
EP2053348A1 (de) * | 2007-10-23 | 2009-04-29 | Texmag GmbH Vertriebsgesellschaft | Verfahren und Vorrichtung zur optischen Erfassung eines Objekts |
CN102425989A (zh) * | 2011-08-22 | 2012-04-25 | 天津大学 | 基于图像检测的二维特征尺寸测量方法 |
DE202011051565U1 (de) * | 2011-10-06 | 2011-11-03 | Leuze Electronic Gmbh & Co. Kg | Optischer Sensor |
CN102607455B (zh) * | 2012-02-27 | 2013-12-25 | 华中科技大学 | 基于光学显微镜和变化光照的微观形貌三维测量方法 |
JP5936039B2 (ja) * | 2012-02-29 | 2016-06-15 | 三菱重工業株式会社 | 法線検出方法、法線検出装置および法線検出機能を備えた加工機 |
CN103926129B (zh) * | 2014-05-04 | 2016-04-13 | 中南大学 | 一种用人工岩石材料复制节理起伏度及实验方法 |
CN107945443A (zh) * | 2017-11-28 | 2018-04-20 | 佛山正能光电有限公司 | 一种脸部辨识安控系统 |
JP2021022807A (ja) | 2019-07-26 | 2021-02-18 | セイコーエプソン株式会社 | プロジェクターの制御方法、及び、プロジェクター |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4316670A (en) * | 1979-05-29 | 1982-02-23 | Beta Industries, Inc. | Apparatus and method for determining the configuration of a reflective surface |
JPS58177295A (ja) * | 1982-04-07 | 1983-10-17 | 株式会社日立製作所 | ロボット制御装置 |
JPS58222383A (ja) * | 1982-06-18 | 1983-12-24 | Fujitsu Ltd | 画像処理方式 |
-
1984
- 1984-03-26 JP JP59056196A patent/JPS60200111A/ja active Granted
-
1985
- 1985-03-21 DE DE8585103292T patent/DE3566160D1/de not_active Expired
- 1985-03-21 EP EP85103292A patent/EP0157299B1/en not_active Expired
- 1985-03-23 KR KR1019850001928A patent/KR900002509B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JPS60200111A (ja) | 1985-10-09 |
KR850007132A (ko) | 1985-10-30 |
EP0157299B1 (en) | 1988-11-09 |
EP0157299A1 (en) | 1985-10-09 |
JPH055041B2 (ko) | 1993-01-21 |
DE3566160D1 (en) | 1988-12-15 |
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