KR850006653A - 집적회로 장치의 제조방법 - Google Patents

집적회로 장치의 제조방법 Download PDF

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Publication number
KR850006653A
KR850006653A KR1019850001040A KR850001040A KR850006653A KR 850006653 A KR850006653 A KR 850006653A KR 1019850001040 A KR1019850001040 A KR 1019850001040A KR 850001040 A KR850001040 A KR 850001040A KR 850006653 A KR850006653 A KR 850006653A
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KR
South Korea
Prior art keywords
transistor
integrated circuit
circuit device
manufacturing
region
Prior art date
Application number
KR1019850001040A
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English (en)
Other versions
KR890004453B1 (ko
Inventor
히로시 야스다 (외 2)
Original Assignee
사바 쇼오이찌
가부시끼 가이샤 도오시바
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 사바 쇼오이찌, 가부시끼 가이샤 도오시바 filed Critical 사바 쇼오이찌
Publication of KR850006653A publication Critical patent/KR850006653A/ko
Application granted granted Critical
Publication of KR890004453B1 publication Critical patent/KR890004453B1/ko

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356Bistable circuits
    • H03K3/3565Bistables with hysteresis, e.g. Schmitt trigger

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)

Abstract

내용 없음

Description

집적회로 장치의 제조방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제6도는 각각 본 발명의 일실시예에 관한 집적회로장치의 제조방법을 설명하는 단면도.
* 도면의 주요부분에 대한 부호의 설명
11 : 반도체기판 12 : 필드산화막
13 : 게이트산화막 14 : 레지스트(Resist)막
15A,15B : 게이트전극 16 : 확산층
A,B : 불순물 농도 프로파일(Profile)
VDD, VSS: 전원 Vin : 입력
Vout : 출력 Vh : 히스테리시스폭

Claims (2)

  1. 고임계전압 트랜지스터, 상기 고임계전압 트랜지스터와 동일형태로서 저임계전압 트랜지스터를 구비하는 집적회로장치의 제조방법에 있어서, 상기 저임계치의 트랜지스터 형성 예정영역상에 레지스트막을 피착한 상태로서 고임계치의 트랜지스터 형성 예정영역에 임계치제어를 위해 이온주입을 선택적으로 행하는 것을 특징으로 하는 집적회로장치의 제조방법.
  2. 제1항에 있어서, 게이트가 공통 접속되는 소오스, 드레인 사이에 직렬로 접속되는 제1~제3트랜지스터, 상기 제1트랜지스터 및 제2트랜지스터의 접속점과 제2트랜지스터 및 제3트랜지스터의 접속점에 각각 게이트 및 드레인이 접속되는 출력전위궤환용 제4트랜지스터로 부터 이루어진 입력회로용 슈미트트리거회로의 제2트랜지스터를 포함한 복수의 트랜지스터 제조방법에 있어서, 상기 제2트랜지스터 형성 예정영역상에 레지스트막을 피착한 상태로서 다른 트랜지스터형성 예정영역에 임계치 제어를 위해 채널이온주입공정을 실시하는 것을 특징으로 하는 집적회로장치의 제조방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019850001040A 1984-03-31 1985-02-19 집적회로장치의 제조방법 KR890004453B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP59063581A JPS60207364A (ja) 1984-03-31 1984-03-31 集積回路装置の製造方法
JP59-63581 1984-03-31

Publications (2)

Publication Number Publication Date
KR850006653A true KR850006653A (ko) 1985-10-14
KR890004453B1 KR890004453B1 (ko) 1989-11-04

Family

ID=13233370

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019850001040A KR890004453B1 (ko) 1984-03-31 1985-02-19 집적회로장치의 제조방법

Country Status (2)

Country Link
JP (1) JPS60207364A (ko)
KR (1) KR890004453B1 (ko)

Also Published As

Publication number Publication date
KR890004453B1 (ko) 1989-11-04
JPS60207364A (ja) 1985-10-18

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