KR20250105456A - 분석 시스템, 정보 처리 장치, 및 소모품의 교환 추천일을 제공하는 제공 방법 - Google Patents
분석 시스템, 정보 처리 장치, 및 소모품의 교환 추천일을 제공하는 제공 방법 Download PDFInfo
- Publication number
- KR20250105456A KR20250105456A KR1020257019613A KR20257019613A KR20250105456A KR 20250105456 A KR20250105456 A KR 20250105456A KR 1020257019613 A KR1020257019613 A KR 1020257019613A KR 20257019613 A KR20257019613 A KR 20257019613A KR 20250105456 A KR20250105456 A KR 20250105456A
- Authority
- KR
- South Korea
- Prior art keywords
- recommended
- consumables
- time
- light source
- source lamp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00594—Quality control, including calibration or testing of components of the analyser
- G01N35/00613—Quality control
- G01N35/00663—Quality control of consumables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00871—Communications between instruments or with remote terminals
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N2035/00891—Displaying information to the operator
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Computer Hardware Design (AREA)
- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2022-201766 | 2022-12-19 | ||
| JP2022201766 | 2022-12-19 | ||
| PCT/JP2023/043116 WO2024135294A1 (ja) | 2022-12-19 | 2023-12-01 | 分析システム、情報処理装置、及び消耗品の交換推奨日を提供する提供方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20250105456A true KR20250105456A (ko) | 2025-07-08 |
Family
ID=91588243
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020257019613A Pending KR20250105456A (ko) | 2022-12-19 | 2023-12-01 | 분석 시스템, 정보 처리 장치, 및 소모품의 교환 추천일을 제공하는 제공 방법 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JPWO2024135294A1 (https=) |
| KR (1) | KR20250105456A (https=) |
| CN (1) | CN120693523A (https=) |
| WO (1) | WO2024135294A1 (https=) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2021060327A (ja) | 2019-10-09 | 2021-04-15 | 株式会社日立ハイテク | 自動分析装置 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3772125B2 (ja) * | 2002-03-20 | 2006-05-10 | オリンパス株式会社 | 分析システムの精度管理方法 |
| JP2004219352A (ja) * | 2003-01-17 | 2004-08-05 | Toshiba Corp | 分析装置及び管理システム |
| US10837974B2 (en) * | 2010-03-30 | 2020-11-17 | Sysmex Corporation | System, apparatus and method for auto-replenishment and monitoring of a medical instrument |
| JP6278199B2 (ja) * | 2014-08-20 | 2018-02-14 | 株式会社島津製作所 | 分析装置管理システム |
| JP6879871B2 (ja) * | 2017-09-07 | 2021-06-02 | 株式会社日立ハイテク | 自動分析装置 |
| CN111192665B (zh) * | 2018-11-14 | 2024-06-25 | 深圳迈瑞生物医疗电子股份有限公司 | 耗材管理方法、耗材管理装置及样本分析仪 |
-
2023
- 2023-12-01 JP JP2024565736A patent/JPWO2024135294A1/ja active Pending
- 2023-12-01 CN CN202380085394.2A patent/CN120693523A/zh active Pending
- 2023-12-01 WO PCT/JP2023/043116 patent/WO2024135294A1/ja not_active Ceased
- 2023-12-01 KR KR1020257019613A patent/KR20250105456A/ko active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2021060327A (ja) | 2019-10-09 | 2021-04-15 | 株式会社日立ハイテク | 自動分析装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN120693523A (zh) | 2025-09-23 |
| WO2024135294A1 (ja) | 2024-06-27 |
| JPWO2024135294A1 (https=) | 2024-06-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101498735B (zh) | 自动分析装置 | |
| JP5795268B2 (ja) | ネットワーク化された診断臨床分析装置の差し迫った分析故障を検出するための方法 | |
| US6512986B1 (en) | Method for automated exception-based quality control compliance for point-of-care devices | |
| US10775777B2 (en) | Method and system for performing quality control on a diagnostic analyzer | |
| Westgard et al. | Establishing evidence-based statistical quality control practices | |
| JP4584579B2 (ja) | バイオメトリック・クオリティ管理プロセス | |
| Kinns et al. | Internal quality control: best practice | |
| CN107407686B (zh) | 自动分析装置 | |
| JP5147906B2 (ja) | 精度管理システム | |
| US20160132375A1 (en) | Method for detecting the impending analytical failure of networked diagnostic clinical analyzers | |
| JP2009216705A (ja) | 自動分析装置 | |
| JP2008209329A (ja) | 自動分析装置 | |
| JP2004219352A (ja) | 分析装置及び管理システム | |
| CN113921128A (zh) | 对医疗检测数据软件自动的审核方法及电子设备 | |
| KR20250105456A (ko) | 분석 시스템, 정보 처리 장치, 및 소모품의 교환 추천일을 제공하는 제공 방법 | |
| JP4369313B2 (ja) | 臨床検査システム | |
| Naphade et al. | Quality control in clinical biochemistry laboratory-a glance | |
| US20230297046A1 (en) | Forecasting future laboratory performance | |
| JP2013083452A (ja) | 自動分析装置 | |
| WO2002052278A1 (en) | Clinical examination precision guarantee system | |
| CN111192665B (zh) | 耗材管理方法、耗材管理装置及样本分析仪 | |
| JP4853373B2 (ja) | 検査対象製品選定方法および検査対象製品選定プログラム | |
| Sioufi et al. | Full Blood Count–Internal QC Protocol: a review by the Royal College of Pathologists of Australasia Quality Assurance Programs (RCPAQAP) Pty Ltd–Haematology | |
| Wang et al. | A modified quality control protocol for infectious disease serology based on the Westgard rules | |
| JP7769808B2 (ja) | 部品管理システム、自動分析装置、部品の管理方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| Q12 | Application published |
Free format text: ST27 STATUS EVENT CODE: A-1-1-Q10-Q12-NAP-PG1501 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| P11 | Amendment of application requested |
Free format text: ST27 STATUS EVENT CODE: A-2-2-P10-P11-NAP-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13 | Application amended |
Free format text: ST27 STATUS EVENT CODE: A-2-2-P10-P13-NAP-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| R15 | Change to inventor requested |
Free format text: ST27 STATUS EVENT CODE: A-3-3-R10-R15-OTH-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| R15-X000 | Change to inventor requested |
St.27 status event code: A-3-3-R10-R15-oth-X000 |
|
| R16 | Change to inventor recorded |
Free format text: ST27 STATUS EVENT CODE: A-3-3-R10-R16-OTH-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| R16-X000 | Change to inventor recorded |
St.27 status event code: A-3-3-R10-R16-oth-X000 |