KR20240135756A - 희석 기구, 입자 지름 분포 측정 시스템, 입자 지름 분포 측정 방법 및 입자 지름 분포 측정용 프로그램 - Google Patents

희석 기구, 입자 지름 분포 측정 시스템, 입자 지름 분포 측정 방법 및 입자 지름 분포 측정용 프로그램 Download PDF

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Publication number
KR20240135756A
KR20240135756A KR1020247022747A KR20247022747A KR20240135756A KR 20240135756 A KR20240135756 A KR 20240135756A KR 1020247022747 A KR1020247022747 A KR 1020247022747A KR 20247022747 A KR20247022747 A KR 20247022747A KR 20240135756 A KR20240135756 A KR 20240135756A
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KR
South Korea
Prior art keywords
sample
particle diameter
diameter distribution
dilution
concentration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020247022747A
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English (en)
Korean (ko)
Inventor
케이지로 사쿠라모토
테쯔야 모리
카즈노리 하부
Original Assignee
가부시키가이샤 호리바 세이사꾸쇼
가부시키가이샤 호리바 어드밴스트 테크노
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Publication date
Application filed by 가부시키가이샤 호리바 세이사꾸쇼, 가부시키가이샤 호리바 어드밴스트 테크노 filed Critical 가부시키가이샤 호리바 세이사꾸쇼
Publication of KR20240135756A publication Critical patent/KR20240135756A/ko
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G01N15/0656—Investigating concentration of particle suspensions using electric, e.g. electrostatic methods or magnetic methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/38—Diluting, dispersing or mixing samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1425—Optical investigation techniques, e.g. flow cytometry using an analyser being characterised by its control arrangement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/38—Diluting, dispersing or mixing samples
    • G01N2001/386—Other diluting or mixing processes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N2015/0038—Investigating nanoparticles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N2015/0042—Investigating dispersion of solids
    • G01N2015/0053—Investigating dispersion of solids in liquids, e.g. trouble
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G01N2015/0222—Investigating a scatter or diffraction pattern from dynamic light scattering, e.g. photon correlation spectroscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N2015/1493—Particle size

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1020247022747A 2022-01-21 2023-01-17 희석 기구, 입자 지름 분포 측정 시스템, 입자 지름 분포 측정 방법 및 입자 지름 분포 측정용 프로그램 Pending KR20240135756A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022007802 2022-01-21
JPJP-P-2022-007802 2022-01-21
PCT/JP2023/001142 WO2023140245A1 (ja) 2022-01-21 2023-01-17 希釈機構、粒子径分布測定システム、粒子径分布測定方法、及び粒子径分布測定用プログラム

Publications (1)

Publication Number Publication Date
KR20240135756A true KR20240135756A (ko) 2024-09-12

Family

ID=87348244

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020247022747A Pending KR20240135756A (ko) 2022-01-21 2023-01-17 희석 기구, 입자 지름 분포 측정 시스템, 입자 지름 분포 측정 방법 및 입자 지름 분포 측정용 프로그램

Country Status (6)

Country Link
US (1) US20250137902A1 (https=)
JP (1) JPWO2023140245A1 (https=)
KR (1) KR20240135756A (https=)
CN (1) CN118647850A (https=)
TW (1) TW202334633A (https=)
WO (1) WO2023140245A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN121187181A (zh) * 2025-09-23 2025-12-23 冠礼控制科技（上海）有限公司 一种研磨液自动稀释混合供应控制方法及控制系统

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002022644A (ja) 2000-07-10 2002-01-23 Horiba Ltd 工程管理用の粒径分布測定システム

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6246474B1 (en) * 1998-04-29 2001-06-12 Particle Measuring Systems, Inc. Method and apparatus for measurement of particle size distribution in substantially opaque slurries
US6122956A (en) * 1998-09-09 2000-09-26 University Of Florida Method and apparatus for monitoring concentration of a slurry flowing in a pipeline
US6211956B1 (en) * 1998-10-15 2001-04-03 Particle Sizing Systems, Inc. Automatic dilution system for high-resolution particle size analysis
AUPR692201A0 (en) * 2001-08-09 2001-08-30 Commonwealth Scientific And Industrial Research Organisation Online fluid contaminant detector
US6703819B2 (en) * 2001-12-03 2004-03-09 Board Of Regents, The University Of Texas System Particle impedance sensor
JP4143349B2 (ja) * 2002-07-22 2008-09-03 株式会社堀場製作所 粒径分布測定方法、粒径分布測定装置および粒径分布測定装置の測定プログラム
JP4354361B2 (ja) * 2004-07-26 2009-10-28 株式会社堀場製作所 粒径分布測定装置
JP4153987B2 (ja) * 2004-08-30 2008-09-24 株式会社堀場製作所 粒子径分布測定装置
JP2014215041A (ja) * 2013-04-22 2014-11-17 株式会社堀場製作所 粒子計数装置およびその製造方法
JP6539023B2 (ja) * 2014-07-18 2019-07-03 株式会社堀場製作所 粒子分析装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002022644A (ja) 2000-07-10 2002-01-23 Horiba Ltd 工程管理用の粒径分布測定システム

Also Published As

Publication number Publication date
JPWO2023140245A1 (https=) 2023-07-27
WO2023140245A1 (ja) 2023-07-27
CN118647850A (zh) 2024-09-13
US20250137902A1 (en) 2025-05-01
TW202334633A (zh) 2023-09-01

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PA0105 International application

Patent event date: 20240708

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application