JPWO2023140245A5 - - Google Patents

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Publication number
JPWO2023140245A5
JPWO2023140245A5 JP2023575251A JP2023575251A JPWO2023140245A5 JP WO2023140245 A5 JPWO2023140245 A5 JP WO2023140245A5 JP 2023575251 A JP2023575251 A JP 2023575251A JP 2023575251 A JP2023575251 A JP 2023575251A JP WO2023140245 A5 JPWO2023140245 A5 JP WO2023140245A5
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JP
Japan
Prior art keywords
conductivity
sample
concentration
particle size
size distribution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023575251A
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English (en)
Japanese (ja)
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JPWO2023140245A1 (https=
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Publication date
Application filed filed Critical
Priority claimed from PCT/JP2023/001142 external-priority patent/WO2023140245A1/ja
Publication of JPWO2023140245A1 publication Critical patent/JPWO2023140245A1/ja
Publication of JPWO2023140245A5 publication Critical patent/JPWO2023140245A5/ja
Pending legal-status Critical Current

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JP2023575251A 2022-01-21 2023-01-17 Pending JPWO2023140245A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022007802 2022-01-21
PCT/JP2023/001142 WO2023140245A1 (ja) 2022-01-21 2023-01-17 希釈機構、粒子径分布測定システム、粒子径分布測定方法、及び粒子径分布測定用プログラム

Publications (2)

Publication Number Publication Date
JPWO2023140245A1 JPWO2023140245A1 (https=) 2023-07-27
JPWO2023140245A5 true JPWO2023140245A5 (https=) 2024-10-02

Family

ID=87348244

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023575251A Pending JPWO2023140245A1 (https=) 2022-01-21 2023-01-17

Country Status (6)

Country Link
US (1) US20250137902A1 (https=)
JP (1) JPWO2023140245A1 (https=)
KR (1) KR20240135756A (https=)
CN (1) CN118647850A (https=)
TW (1) TW202334633A (https=)
WO (1) WO2023140245A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN121187181A (zh) * 2025-09-23 2025-12-23 冠礼控制科技(上海)有限公司 一种研磨液自动稀释混合供应控制方法及控制系统

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6246474B1 (en) * 1998-04-29 2001-06-12 Particle Measuring Systems, Inc. Method and apparatus for measurement of particle size distribution in substantially opaque slurries
US6122956A (en) * 1998-09-09 2000-09-26 University Of Florida Method and apparatus for monitoring concentration of a slurry flowing in a pipeline
US6211956B1 (en) * 1998-10-15 2001-04-03 Particle Sizing Systems, Inc. Automatic dilution system for high-resolution particle size analysis
JP2002022644A (ja) * 2000-07-10 2002-01-23 Horiba Ltd 工程管理用の粒径分布測定システム
AUPR692201A0 (en) * 2001-08-09 2001-08-30 Commonwealth Scientific And Industrial Research Organisation Online fluid contaminant detector
US6703819B2 (en) * 2001-12-03 2004-03-09 Board Of Regents, The University Of Texas System Particle impedance sensor
JP4143349B2 (ja) * 2002-07-22 2008-09-03 株式会社堀場製作所 粒径分布測定方法、粒径分布測定装置および粒径分布測定装置の測定プログラム
JP4354361B2 (ja) * 2004-07-26 2009-10-28 株式会社堀場製作所 粒径分布測定装置
JP4153987B2 (ja) * 2004-08-30 2008-09-24 株式会社堀場製作所 粒子径分布測定装置
JP2014215041A (ja) * 2013-04-22 2014-11-17 株式会社堀場製作所 粒子計数装置およびその製造方法
JP6539023B2 (ja) * 2014-07-18 2019-07-03 株式会社堀場製作所 粒子分析装置

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