JP4354361B2 - 粒径分布測定装置 - Google Patents
粒径分布測定装置 Download PDFInfo
- Publication number
- JP4354361B2 JP4354361B2 JP2004217911A JP2004217911A JP4354361B2 JP 4354361 B2 JP4354361 B2 JP 4354361B2 JP 2004217911 A JP2004217911 A JP 2004217911A JP 2004217911 A JP2004217911 A JP 2004217911A JP 4354361 B2 JP4354361 B2 JP 4354361B2
- Authority
- JP
- Japan
- Prior art keywords
- cell
- size distribution
- particle size
- light
- distribution measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000002245 particle Substances 0.000 title claims description 65
- 230000010365 information processing Effects 0.000 claims description 13
- 230000001678 irradiating effect Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 description 31
- 239000000523 sample Substances 0.000 description 11
- 230000003287 optical effect Effects 0.000 description 6
- 239000002612 dispersion medium Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 230000006870 function Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000013019 agitation Methods 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000010790 dilution Methods 0.000 description 1
- 239000012895 dilution Substances 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000007873 sieving Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/026—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having blocks or racks of reaction cells or cuvettes
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Sampling And Sample Adjustment (AREA)
Description
C1、C2、C3・・・セル
2・・・光源
31、32・・・光検出器
5・・・情報処理装置
51・・・作動制御プログラム格納部
52・・・プログラム切替手段
6・・・移動保持手段
7・・・セル識別手段
9・・・セル支持部材
10・・・軌道
11・・・レール
12・・・光軸
L・・・光
LS・・・回折及び/又は散乱光
P・・・光照射位置
Claims (5)
- セルと、そのセルに収容された粒子群に光を照射する光源と、光を照射された粒子群から発生する回折光及び/又は散乱光の光強度を検出する複数の光検出器と、前記各光検出器から出力される光強度信号に基づいて前記粒子群の粒径分布を算出する情報処理装置とを備えた粒径分布測定装置において、
タイプが異なり、内部の粒子群が流通することなく互いに独立した複数のセルを前記光が照射される光照射位置及びその光照射位置とは異なる位置に設定された退避位置間で移動可能に保持する移動保持手段と、
前記光照射位置でいずれか一のセルを選択的に停止させる停止手段と、
前記光照射位置にあるセルを識別してその識別信号を出力するセル識別手段とをさらに備え、
前記情報処理装置が、前記セル毎に対応する前記粒径分布測定装置の作動を制御するプログラムである作動制御プログラムを格納している作動制御プログラム格納部と、
前記セル識別手段から出力されるセル識別信号を受信し、そのセル識別信号が示すセルに対応する作動制御プログラムに自動的に切り替えるプログラム切替手段とを備えたことを特徴とする粒径分布測定装置。 - 前記セル識別手段が、前記光照射位置にあるセルを保持しているセルホルダを識別することにより前記セル識別信号を出力するものであることを特徴とする請求項1記載の粒径分布測定装置。
- 前記複数のセルを一体的に支持するセル支持部材をさらに備えており、前記移動保持手段が前記セル支持部材を所定の軌道に沿って移動させるものであることを特徴とする請求項1又は2記載の粒径分布測定装置。
- 前記移動保持手段が、軌道に沿って配置されたレールを備え、前記セルをそのレールに沿って移動させるものであることを特徴とする請求項1、2又は3記載の粒径分布測定装置。
- 前記停止手段が、ラッチ機構を利用したものであることを特徴とする請求項1、2、3又は4記載の粒径分布測定装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004217911A JP4354361B2 (ja) | 2004-07-26 | 2004-07-26 | 粒径分布測定装置 |
EP05016120A EP1621865A1 (en) | 2004-07-26 | 2005-07-25 | Particle size distribution analyzer |
US11/188,462 US7180592B2 (en) | 2004-07-26 | 2005-07-25 | Particle size distribution analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004217911A JP4354361B2 (ja) | 2004-07-26 | 2004-07-26 | 粒径分布測定装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008186300A Division JP5087486B2 (ja) | 2008-07-17 | 2008-07-17 | 回折/散乱式粒径分布測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006038601A JP2006038601A (ja) | 2006-02-09 |
JP4354361B2 true JP4354361B2 (ja) | 2009-10-28 |
Family
ID=34979868
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004217911A Expired - Lifetime JP4354361B2 (ja) | 2004-07-26 | 2004-07-26 | 粒径分布測定装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7180592B2 (ja) |
EP (1) | EP1621865A1 (ja) |
JP (1) | JP4354361B2 (ja) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5188758B2 (ja) * | 2007-07-17 | 2013-04-24 | 株式会社堀場製作所 | 粒径分布測定装置 |
JP2009063312A (ja) * | 2007-09-04 | 2009-03-26 | Shimadzu Corp | 粒度分布測定装置 |
GB2494734B (en) | 2011-09-14 | 2016-04-06 | Malvern Instr Ltd | Apparatus and method for measuring particle size distribution by light scattering |
US8813585B2 (en) | 2011-10-03 | 2014-08-26 | Saudi Arabian Oil Company | Automated method for quality control and quality assurance of sized bridging material |
JP2014035246A (ja) * | 2012-08-08 | 2014-02-24 | Azbil Corp | 粒子検出装置の光源情報記録装置及び粒子検出装置の光源情報記録方法 |
JP6218449B2 (ja) * | 2013-06-17 | 2017-10-25 | 株式会社堀場製作所 | 粒子径分布測定装置 |
EP2869056B1 (en) * | 2013-11-05 | 2020-05-20 | Malvern Panalytical Limited | Improvements relating to particle characterisation |
EP2869057A1 (en) * | 2013-11-05 | 2015-05-06 | Malvern Instruments Limited | Improvements Relating to Particle Characterisation |
EP2869058A1 (en) * | 2013-11-05 | 2015-05-06 | Malvern Instruments Limited | Improvements Relating to Particle Characterisation |
EP2869054A1 (en) * | 2013-11-05 | 2015-05-06 | Malvern Instruments Limited | Improvements relating to particle characterisation |
EP2869055A1 (en) * | 2013-11-05 | 2015-05-06 | Malvern Instruments Limited | Improvements relating to particle characterisation |
JP6958448B2 (ja) * | 2018-03-19 | 2021-11-02 | 株式会社島津製作所 | 粒子径分布測定装置 |
KR102138222B1 (ko) * | 2019-04-11 | 2020-07-27 | 주식회사 제이에스티앤랩 | 배출가스 입자 측정 장치 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
HUP0003903A1 (en) * | 1995-11-16 | 2000-10-28 | Process for settling down particles floating in liquid and for observing them optically | |
US20020110487A1 (en) * | 1998-03-19 | 2002-08-15 | Cme Telemetrix Inc. | Apparatus and method for handling fluids |
US6977723B2 (en) * | 2000-01-07 | 2005-12-20 | Transform Pharmaceuticals, Inc. | Apparatus and method for high-throughput preparation and spectroscopic classification and characterization of compositions |
JP3398121B2 (ja) * | 2000-05-16 | 2003-04-21 | 株式会社堀場製作所 | 粒度分布測定装置 |
JP3954801B2 (ja) | 2001-02-19 | 2007-08-08 | 株式会社堀場製作所 | 粒子径分布測定装置 |
JP2005017119A (ja) * | 2003-06-26 | 2005-01-20 | Horiba Ltd | 粒径分布測定装置 |
-
2004
- 2004-07-26 JP JP2004217911A patent/JP4354361B2/ja not_active Expired - Lifetime
-
2005
- 2005-07-25 US US11/188,462 patent/US7180592B2/en active Active
- 2005-07-25 EP EP05016120A patent/EP1621865A1/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
US7180592B2 (en) | 2007-02-20 |
US20060016968A1 (en) | 2006-01-26 |
EP1621865A1 (en) | 2006-02-01 |
JP2006038601A (ja) | 2006-02-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1621865A1 (en) | Particle size distribution analyzer | |
US20060133965A1 (en) | Monitoring function-equipped dispensing system and method of monitoring dispensing device | |
US9244086B2 (en) | Sample analyzing system, sample analyzer, and management method of sample analyzing system | |
JP2019506619A (ja) | 自動化分析のためのシステムおよび方法 | |
US20100001876A1 (en) | Analyzer and analysis method | |
US11054433B2 (en) | Automated analyzer and control method for same | |
US10241123B2 (en) | Laboratory instrument and method of using the same | |
JP2007322324A (ja) | 分析装置 | |
US20190049477A1 (en) | Automatic analyzer and cleaning method | |
CN110291405A (zh) | 自动分析装置和自动分析装置中的清洗机构 | |
JP5087486B2 (ja) | 回折/散乱式粒径分布測定装置 | |
WO2022264704A1 (ja) | 撮像装置 | |
EP2554998B1 (en) | Sample analysis system | |
JP7353392B2 (ja) | 自動分析装置 | |
JP2010169581A (ja) | 自動分析装置 | |
JP2005017119A (ja) | 粒径分布測定装置 | |
WO2010084627A1 (ja) | 自動分析装置、測光装置および測光方法 | |
JP4299212B2 (ja) | 粒径分布測定装置 | |
JP5134452B2 (ja) | 自動分析装置 | |
JP2010122177A (ja) | 自動分析装置および洗剤ポンプ異常判定方法 | |
JP4409489B2 (ja) | 薬液濃度モニタ | |
CN114174834A (zh) | 生物化学分析装置和生物化学分析方法 | |
JP2022137543A (ja) | 自動分析装置 | |
JP2024029635A (ja) | 分析装置および分析方法 | |
EP4042141B1 (en) | Turbidimeter cleaning |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070125 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20080606 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20081007 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20081208 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20090714 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20090729 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4354361 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120807 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120807 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120807 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120807 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130807 Year of fee payment: 4 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130807 Year of fee payment: 4 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
EXPY | Cancellation because of completion of term |