KR20230133375A - 초음파 검사 장치 - Google Patents

초음파 검사 장치 Download PDF

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Publication number
KR20230133375A
KR20230133375A KR1020237028772A KR20237028772A KR20230133375A KR 20230133375 A KR20230133375 A KR 20230133375A KR 1020237028772 A KR1020237028772 A KR 1020237028772A KR 20237028772 A KR20237028772 A KR 20237028772A KR 20230133375 A KR20230133375 A KR 20230133375A
Authority
KR
South Korea
Prior art keywords
probe
unit
incident
receiving probe
receiving
Prior art date
Application number
KR1020237028772A
Other languages
English (en)
Korean (ko)
Inventor
무쯔미 스즈끼
유우스께 고우라이
시게루 오오노
Original Assignee
가부시키가이샤 히타치 파워 솔루션즈
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 히타치 파워 솔루션즈 filed Critical 가부시키가이샤 히타치 파워 솔루션즈
Publication of KR20230133375A publication Critical patent/KR20230133375A/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2437—Piezoelectric probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/48—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by amplitude comparison
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/015—Attenuation, scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/0289—Internal structure, e.g. defects, grain size, texture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/052—Perpendicular incidence, angular propagation

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
KR1020237028772A 2021-02-26 2021-11-30 초음파 검사 장치 KR20230133375A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2021-029814 2021-02-26
JP2021029814A JP7489345B2 (ja) 2021-02-26 2021-02-26 超音波検査装置
PCT/JP2021/043849 WO2022180972A1 (ja) 2021-02-26 2021-11-30 超音波検査装置

Publications (1)

Publication Number Publication Date
KR20230133375A true KR20230133375A (ko) 2023-09-19

Family

ID=83047948

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020237028772A KR20230133375A (ko) 2021-02-26 2021-11-30 초음파 검사 장치

Country Status (5)

Country Link
JP (1) JP7489345B2 (ja)
KR (1) KR20230133375A (ja)
CN (1) CN116917730A (ja)
TW (1) TWI813121B (ja)
WO (1) WO2022180972A1 (ja)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008128965A (ja) 2006-11-24 2008-06-05 Japan Probe Kk 空中超音波探傷システム

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57110932A (en) * 1980-12-27 1982-07-10 Toyota Motor Corp Leakage detection of sealed container and device thereof
JP3367841B2 (ja) * 1996-03-06 2003-01-20 三菱重工業株式会社 超音波センサ
JP4538629B2 (ja) 2004-04-27 2010-09-08 国立大学法人東北大学 閉じたき裂の定量評価法、及び閉じたき裂の定量評価装置
JP4726983B2 (ja) 2009-10-30 2011-07-20 住友化学株式会社 欠陥検査システム、並びに、それに用いる、欠陥検査用撮影装置、欠陥検査用画像処理装置、欠陥検査用画像処理プログラム、記録媒体、および欠陥検査用画像処理方法
JP2012013447A (ja) 2010-06-29 2012-01-19 Hitachi Cable Ltd 半導体単結晶中の欠陥検査方法
FR2963443B1 (fr) * 2010-07-28 2012-08-17 Commissariat Energie Atomique Procede de commande de transducteurs d'une sonde a ultrasons, programme d'ordinateur correspondant et dispositif de sondage a ultrasons
WO2013023987A1 (en) 2011-08-17 2013-02-21 Empa, Eidgenössische Materialprüfungs- Und Forschungsanstalt Air coupled ultrasonic contactless method for non-destructive determination of defects in laminated structures
JP5873773B2 (ja) * 2012-07-19 2016-03-01 株式会社日立パワーソリューションズ 測定周波数可変超音波映像装置
CN104374828A (zh) * 2014-11-18 2015-02-25 上海岩土工程勘察设计研究院有限公司 一种隐患探测的超声波层析成像方法
TWI539152B (zh) * 2015-05-14 2016-06-21 Univ Chang Gung Biological sensor and the method of detecting the concentration of the analyte in the sample
US20190361103A1 (en) 2018-05-25 2019-11-28 Pva Tepla Analytical Systems Gmbh Ultrasonic Microscope and Carrier for carrying an acoustic Pulse Transducer
JP2020143938A (ja) 2019-03-04 2020-09-10 中道鉄工株式会社 超音波式漏れ検査装置
JP7214560B2 (ja) 2019-05-09 2023-01-30 株式会社日立パワーソリューションズ 超音波検査装置及び超音波検査システム
TWI699525B (zh) * 2019-05-21 2020-07-21 中華學校財團法人中華科技大學 三維相位移瑕疵檢測方法及系統

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008128965A (ja) 2006-11-24 2008-06-05 Japan Probe Kk 空中超音波探傷システム

Also Published As

Publication number Publication date
WO2022180972A1 (ja) 2022-09-01
CN116917730A (zh) 2023-10-20
JP2022131075A (ja) 2022-09-07
JP7489345B2 (ja) 2024-05-23
TW202234059A (zh) 2022-09-01
TWI813121B (zh) 2023-08-21

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