KR20190036472A - 저항 측정 장치, 기판 검사 장치, 및 저항 측정 방법 - Google Patents

저항 측정 장치, 기판 검사 장치, 및 저항 측정 방법 Download PDF

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Publication number
KR20190036472A
KR20190036472A KR1020180107833A KR20180107833A KR20190036472A KR 20190036472 A KR20190036472 A KR 20190036472A KR 1020180107833 A KR1020180107833 A KR 1020180107833A KR 20180107833 A KR20180107833 A KR 20180107833A KR 20190036472 A KR20190036472 A KR 20190036472A
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KR
South Korea
Prior art keywords
current
probe
resistance
ground
voltage
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KR1020180107833A
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English (en)
Korean (ko)
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KR102680359B1 (ko
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무네히로 야마시타
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니혼덴산리드가부시키가이샤
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Publication of KR20190036472A publication Critical patent/KR20190036472A/ko
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Publication of KR102680359B1 publication Critical patent/KR102680359B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
KR1020180107833A 2017-09-27 2018-09-10 저항 측정 장치, 기판 검사 장치, 및 저항 측정 방법 KR102680359B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017186641A JP6765125B2 (ja) 2017-09-27 2017-09-27 抵抗測定装置、基板検査装置、及び抵抗測定方法
JPJP-P-2017-186641 2017-09-27

Publications (2)

Publication Number Publication Date
KR20190036472A true KR20190036472A (ko) 2019-04-04
KR102680359B1 KR102680359B1 (ko) 2024-07-01

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ID=65864627

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KR1020180107833A KR102680359B1 (ko) 2017-09-27 2018-09-10 저항 측정 장치, 기판 검사 장치, 및 저항 측정 방법

Country Status (4)

Country Link
JP (1) JP6765125B2 (ja)
KR (1) KR102680359B1 (ja)
CN (1) CN109557376B (ja)
TW (1) TWI793179B (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102017211476A1 (de) * 2017-07-05 2019-01-10 Robert Bosch Gmbh Vorrichtung und Verfahren zum Überprüfen einer Funktionsfähigkeit eines Systemwiderstands eines Batteriesystems
TWI716106B (zh) * 2019-09-16 2021-01-11 力成科技股份有限公司 封裝基板之電阻量測方法及其封裝基板
US11346883B2 (en) * 2019-11-05 2022-05-31 Formfactor, Inc. Probe systems and methods for testing a device under test
TWI824686B (zh) * 2022-08-31 2023-12-01 牧德科技股份有限公司 檢測電路
WO2024106052A1 (ja) * 2022-11-17 2024-05-23 三菱電機株式会社 半導体試験装置、半導体試験方法および半導体装置の製造方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004184374A (ja) 2002-12-06 2004-07-02 Hioki Ee Corp インピーダンス測定装置
JP3638697B2 (ja) * 1996-01-22 2005-04-13 株式会社アドバンテスト ドライバｉｃの出力抵抗測定器
JP2007333598A (ja) 2006-06-15 2007-12-27 Nidec-Read Corp 基板検査装置
JP2017075860A (ja) * 2015-10-15 2017-04-20 日置電機株式会社 抵抗測定装置および検査装置

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Publication number Priority date Publication date Assignee Title
GB2341246A (en) * 1998-09-03 2000-03-08 Ericsson Telefon Ab L M Differential level shifting circuit
TW200638812A (en) * 2004-11-18 2006-11-01 Matsushita Electric Ind Co Ltd Wiring board, method for manufacturing same and semiconductor device
JP4798618B2 (ja) * 2006-05-31 2011-10-19 ルネサスエレクトロニクス株式会社 出力回路および半導体集積回路装置
CN101047383B (zh) * 2007-03-20 2011-05-04 湖南大学 电流控制全平衡差分式电流传输器
SK288245B6 (sk) * 2010-09-03 2015-03-03 Ivan Baĺ¤Ko Prúdový zdroj s aktívnym potláčaním súčtového napätia
CN103956982B (zh) * 2014-05-05 2017-04-12 华侨大学 一种用于两级差分放大器的连续时间共模反馈电路
CN107104673A (zh) * 2017-04-01 2017-08-29 唯捷创芯(天津)电子技术股份有限公司 一种低增益误差电流舵型数模转换器、芯片及通信终端

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3638697B2 (ja) * 1996-01-22 2005-04-13 株式会社アドバンテスト ドライバｉｃの出力抵抗測定器
JP2004184374A (ja) 2002-12-06 2004-07-02 Hioki Ee Corp インピーダンス測定装置
JP2007333598A (ja) 2006-06-15 2007-12-27 Nidec-Read Corp 基板検査装置
JP2017075860A (ja) * 2015-10-15 2017-04-20 日置電機株式会社 抵抗測定装置および検査装置

Also Published As

Publication number Publication date
KR102680359B1 (ko) 2024-07-01
TW201915500A (zh) 2019-04-16
TWI793179B (zh) 2023-02-21
JP2019060768A (ja) 2019-04-18
CN109557376B (zh) 2023-05-16
CN109557376A (zh) 2019-04-02
JP6765125B2 (ja) 2020-10-07

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