KR20190022366A - 조절계 및 열화 위치 검출 방법 - Google Patents

조절계 및 열화 위치 검출 방법 Download PDF

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Publication number
KR20190022366A
KR20190022366A KR1020180097888A KR20180097888A KR20190022366A KR 20190022366 A KR20190022366 A KR 20190022366A KR 1020180097888 A KR1020180097888 A KR 1020180097888A KR 20180097888 A KR20180097888 A KR 20180097888A KR 20190022366 A KR20190022366 A KR 20190022366A
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South Korea
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KR1020180097888A
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English (en)
Korean (ko)
Inventor
겐 이와키리
아츠시 다카하시
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아즈빌주식회사
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Publication of KR20190022366A publication Critical patent/KR20190022366A/ko

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0262—Confirmation of fault detection, e.g. extra checks to confirm that a failure has indeed occurred
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G05B19/0423—Input/output
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0235—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on a comparison with predetermined threshold or range, e.g. "classical methods", carried out during normal operation; threshold adaptation or choice; when or how to compare with the threshold
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0256—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults injecting test signals and analyzing monitored process response, e.g. injecting the test signal while interrupting the normal operation of the monitored system; superimposing the test signal onto a control signal during normal operation of the monitored system
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/25—Pc structure of the system
    • G05B2219/25257—Microcontroller
KR1020180097888A 2017-08-25 2018-08-22 조절계 및 열화 위치 검출 방법 KR20190022366A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017162392A JP2019040435A (ja) 2017-08-25 2017-08-25 調節計および劣化位置検出方法
JPJP-P-2017-162392 2017-08-25

Publications (1)

Publication Number Publication Date
KR20190022366A true KR20190022366A (ko) 2019-03-06

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020180097888A KR20190022366A (ko) 2017-08-25 2018-08-22 조절계 및 열화 위치 검출 방법

Country Status (4)

Country Link
JP (1) JP2019040435A (ja)
KR (1) KR20190022366A (ja)
CN (1) CN109426197A (ja)
TW (1) TWI676874B (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020187682A (ja) * 2019-05-17 2020-11-19 アズビル株式会社 温度調節計および異常判断方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017033140A (ja) 2015-07-30 2017-02-09 アズビル株式会社 アクチュエータ不具合検知装置、制御装置および方法

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JPH06231380A (ja) * 1993-02-03 1994-08-19 Toshiba Corp プロセス表示装置
JP4789277B2 (ja) * 2004-04-22 2011-10-12 横河電機株式会社 プラント運転支援装置
CN100385787C (zh) * 2005-12-12 2008-04-30 天津理工大学 基于dsp芯片的励磁控制器通讯系统及其usb协议实现的方法
US7970583B2 (en) * 2007-12-28 2011-06-28 United Technologies Corporation Degraded actuator detection
US8905371B2 (en) * 2011-06-30 2014-12-09 General Equipment And Manufacturing Company, Inc. Valve signature diagnosis and leak test device
JPWO2013153607A1 (ja) * 2012-04-09 2015-12-17 三菱電機株式会社 位置決め装置
KR101688749B1 (ko) * 2012-07-17 2016-12-21 미쓰비시덴키 가부시키가이샤 제어 장치 및 제어 방법
WO2015076173A1 (ja) * 2013-11-22 2015-05-28 日本精工株式会社 中途故障診断システム及びそれを搭載した電動パワーステアリング装置
JP6364800B2 (ja) * 2014-02-10 2018-08-01 オムロン株式会社 監視装置及び監視方法
JP2015207067A (ja) * 2014-04-18 2015-11-19 東芝機械株式会社 数値制御産業機械
JP6272548B2 (ja) * 2015-02-27 2018-01-31 三菱電機株式会社 電動機制御装置
JP6390475B2 (ja) * 2015-03-13 2018-09-19 オムロン株式会社 制御装置
JP2017091123A (ja) * 2015-11-09 2017-05-25 アズビル株式会社 調節計
JP6443311B2 (ja) * 2015-11-30 2018-12-26 オムロン株式会社 制御装置、制御プログラムおよび記録媒体
CN105607615B (zh) * 2015-12-08 2016-11-30 宁波如意股份有限公司 一种故障诊断系统
CN106774242A (zh) * 2016-12-01 2017-05-31 黄宏伟 一种发电机组模拟量控制系统的远程监测系统及方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017033140A (ja) 2015-07-30 2017-02-09 アズビル株式会社 アクチュエータ不具合検知装置、制御装置および方法

Also Published As

Publication number Publication date
CN109426197A (zh) 2019-03-05
JP2019040435A (ja) 2019-03-14
TWI676874B (zh) 2019-11-11
TW201913256A (zh) 2019-04-01

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