KR20180119400A - Handler for testing electronic components - Google Patents

Abstract

The present invention relates to a handler for testing an electronic component to support a test of an electronic component. According to the present invention, the handler for testing an electronic component has an operating device to automatically operate a setting interval between a pair of gripping levers provided in a gripping device to grip an electronic component. According to the present invention, a processing capacity of the handler is increased and a degree of freedom in designing is increased.

Description

[0001] HANDLER FOR TESTING ELECTRONIC COMPONENTS [0002]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a handler for testing electronic components, and more particularly to a technique for gripping electronic components of various specifications.

The produced electronic parts are tested by a tester and divided into good and defective parts, so only good parts are shipped.

The electrical connection between the tester and the electronic component during the testing of the electronic component is performed by a handler for testing the electronic component (hereinafter referred to as a "handler").

Related to the technology of the handler, various kinds have been proposed through a plurality of patent documents such as Korean Patent Laid-open Publication No. 10-2015-0117732. The present invention relates to a handler that handles various kinds of handlers, especially electronic components in the form of a board.

As shown in FIG. 1, the conventional handler TH for handling electronic components in the form of a substrate includes a loading device LA, a soak chamber SC, a test chamber TC, a connecting device CA, (UA), a supply stacker (SS), a recovery stacker (RS) and a transfer device (TA).

The loading device LA loads the electronic components to be tested from the transport tray CT at the supply position SP into the test tray TT at the loading position LP.

The soak chamber SC is provided for applying thermal stimulation to the electronic parts loaded on the testing tray TT from the loading position LP. Generated electronic components may be tested at room temperature, but they are usually tested at high or low temperatures, as they require consideration of the thermally harsh operating environment (high or low temperature). In order to apply such a thermal stimulus, a soak chamber SC is provided.

The test chamber TC provides a space through which the electronic components loaded in the test position (TP) on-test tray TT can be tested via the soak chamber SC. For this purpose, the tester (TESTER) is coupled to the test chamber (TC) side.

The connecting device CA presses the electronic components of the test tray TT in the test position TP in the test chamber TC toward the test socket side of the tester TERSTER so that the electronic components can be electrically connected to the test socket TP do.

The desorption chamber (DC) is provided to remove thermal stimuli from the electronic components loaded in the test tray (TT) from the test chamber (TC). Thus, the electronic component in which the thermal stimulus is removed in the deshook chamber DC can be appropriately unloaded from the test tray TT by the unloading apparatus UA.

The unloading apparatus UA moves the unloading position UP of the electronic components from the on-test tray TT to the empty transport tray CT in the recovery position RP.

For reference, the loading position LP, the test position TP and the unloading position UP are named based on the position of the test tray TT, and the test tray TT has a plurality of electronic components And is conveyed by a conveying device (not shown) to a closed circulating path C (not shown) leading to the loading position LP via the above loading position LP, test position TP and unloading position UP Lt; / RTI >

On the other hand, in the supply stacker SS, transport trays CT carrying electronic components to be tested are loaded.

In the recovery stackers (RS), transport trays (CT) carrying tested electronic components are loaded.

The transfer apparatus TA draws the transport tray CT from the supply stackers SS and supplies the transport tray CT to the supply position SP or the transport tray CT at the return position RP to the recovery stacker RS, . To this end, the transfer device TA has at least one transfer for transferring the transfer tray CT.

Electronic components to be tested in the handler TH having the above configuration are supplied from the supply stacker SS to the supply position SP along the transport tray CT and the tested electronic components are delivered to the return position RP, Is recovered from the recovery position (RP) to the recovery stacker (SS) along the transportation tray (CT) For reference, Applicants' technology, which has not yet been disclosed, implements such that all stackers can supply or retrieve a transport tray without distinguishing between a supply stacker and a recovery stacker.

Among the above configurations, the test chamber (TA) and the connection device (CA) can be bundled into a connection portion for electrically connecting the electronic component to the tester. The loading device LA, the soak chamber SC, the desock chamber DC, the unloading device UA, the supply stackers SS, the recovery stackers RS and the transfer device TA are connected The electronic parts can be bundled into a supply and recovery part for recovering the tested electronic parts from the connection part.

On the other hand, the loading device LA and the unloading device UA grip and hold the electronic component at the gripping position to the arrival position, and then release the gripping of the electronic component at the arrival position, It is necessary to have an electronic component moving device for moving the electronic component, and furthermore, it may have a startup type mounting table capable of moving the loaded electronic component depending on the selection.

2 is a schematic view of a conventional electronic component moving apparatus 100. As shown in Fig.

Referring to FIG. 2, a conventional electronic component moving apparatus 100 includes a gripper 110, a lift 120, and a horizontal mover 130.

The gripper 110 is provided with a pair of grip levers 111a and 111b for gripping or releasing the grip of the electronic part D and for moving the plurality of electronic parts D together, A plurality of the grippers 110 may be provided in one electronic component moving apparatus 100 in consideration of the speed and the processing capacity. The present invention relates to a technique relating to such a gripper 110.

The elevator 120 moves the grippers 110 up and down.

The horizontal mover 130 moves the grippers 110 in the horizontal direction, the front-rear direction, the left-right direction, the front-rear direction, and the left-right direction.

Next, the conventional technique related to the above-mentioned gripper 110 will be described in more detail.

Conventionally, the pair of grip levers 111a and 111b formed on the gripper 110 are gripped or released by gripping the electronic component D while adjusting the gap therebetween by a motor. However, due to the tolerance of the width of the electronic component D and the design tolerances of the grip levers 111a and 111b, the electronic component D often is damaged in the gripping process. Accordingly, a technique for adjusting the distance between the grip levers 111a and 111b using a pneumatic cylinder as disclosed in Korean Patent Laid-Open No. 10-2003-0073802 (hereinafter referred to as 'prior art') has been proposed.

On the other hand, since electronic parts can be applied to the degree of development of manufacturing technology and various finished products, the produced electronic parts can have various specifications.

However, according to the related art, when the specifications of the electronic parts are changed, the grip levers must be replaced. This involves the problem of waste of resources and reduction of processing capacity due to replacement time input. This problem is more remarkable in view of the fact that not only a plurality of electronic component moving devices are provided in one handler but also a plurality of grippers are applied to one electronic component moving device.

Therefore, even when the width of the electronic part D to be tested is changed by allowing the operator to narrow or open the gap between the double-pneumatic cylinder and the grip levers 111a and 111b by a predetermined set interval in advance, The levers 111a and 111b can be used as they are. However, since this technique also requires a manual operation by the operator to manually perform the spacing operation for a plurality of holding devices, it takes time for the work, and it is not easy to secure the work space and design the equipment therefor. Particularly, when a plurality of grippers move adjacent to each other at a narrow interval and move like a lump, the work space is very narrow and it is very difficult to manually adjust the setting interval between the grip levers. Therefore, although the conventional technology is overcome in terms of recycling of resources, there is a problem in that it takes more time for work, reduction of processing capacity, suitability of work for adjusting setting interval, and securing work space. Furthermore, there is a possibility that the gap between the two grip levers 111a and 111b set by the operation shock or the like may be disturbed.

For this reason, it has been considered to apply a separate motor to adjust the setting interval between the two grip levers 111a and 111b. That is, a technique has been considered in which a motor is attached to each gripper 110 to adjust a setting interval between the grip levers 111a and 111b in the gripper 110. [

However, if the gap between the grip levers 111a and 111b is adjusted by using a motor, the manufacturing cost increases and the weight of the gripper 110 increases, so that the reinforcement of the rigidity of the peripheral structure or the design for precise control It becomes more difficult. Particularly, in the case of increasing the number of electronic parts that can be moved at one time by increasing the number of the grippers 110 to increase the processing capacity, the problem of the increase in production cost and the difficulty of control becomes greater.

Furthermore, since the motor has a limitation in reducing the minimum width of the grippers 110 due to the configuration of the motor, the equipment must be enlarged, and the gap between the electronic parts D held by the grippers 110 adjacent to each other It also acts as a limit and ultimately the equipment has to be bigger.

SUMMARY OF THE INVENTION An object of the present invention is to provide a technique relating to electronic component grasping which solves all the problems of the prior art described above.

A handler for testing electronic components according to the present invention comprises: a connecting portion for electrically connecting an electronic component to a tester; A supply and recovery section for supplying the electronic component to the connection section and for recovering the tested electronic component after being electrically connected to the tester by the connection section; A control device for controlling the connecting part and the feeding and collecting part; And an input device for inputting necessary information to the control device; Wherein the supplying and collecting portion includes at least one electronic component moving device for moving the electronic component while gripping or releasing the electronic component with a pair of grip levers at the time of supplying and recovering the electronic component; And At least one spacing manipulating device for manipulating a setting interval between a pair of grip levers provided in the electronic component moving device; Wherein the electronic component moving device comprises at least one gripping device for gripping or releasing the electronic component with the pair of grip levers; An elevator for elevating the at least one gripping device; And a horizontal moving unit moving the at least one gripping device in a horizontal direction; Wherein the gripping device comprises: a pair of grip levers; A lever moving device that narrows or opens the gap between the pair of grip levers so that the pair of grip levers can grip or release the electronic component; And an interval setting device for setting a setting interval between the pair of grip levers by being operated by the interval operation device; Wherein the control device controls the electronic component moving device and the interval operation device by information according to the specification of the electronic component inputted through the input device so that the interval operation device operates the interval setting device So that the setting interval between the pawl levers of the pair is automatically changed according to the specification of the electronic component.

The gripping device includes a locker for preventing arbitrary manipulation of the gap setting device; .

The interval operation device includes an operation member for operating the interval setting device; An operating member for providing an operating force for causing the operating member to operate the interval setting device; And a releasing device for releasing the locked state of the interval setting device by the locker; .

Wherein the distance controlling device releases the lock state of the distance setting device by the releasing device by advancing or retracting the operation member, the operation source and the releasing device toward the gripping device side so that the operating member can operate the interval setting device A retractor for causing the interval setter to be in a locked state; As shown in FIG.

The present invention has the following effects.

First, because the gap between the grip levers that correspond to each other by the gap manipulating device is automatically adjusted, the working time is short and the processing capacity is improved.

Second, since the interval operation device can be provided so as to perform a manipulation operation to adjust the setting interval between the grip levers with respect to the gripper at one point of the movement path, the necessity of securing a separate work space is greatly reduced Thereby improving the design freedom of the equipment.

Third, because the arbitrary operation of the interval setter is prohibited by the locker, the appropriateness of the setting interval is maintained and the reliability of the equipment is improved.

Fourth, since the setting interval of the plurality of grippers can be adjusted by one operator, it is possible to simplify the gripper, minimize the weight increase, and reduce the production cost.

1 is a conceptual plan view for explaining a conventional handler for testing electronic parts.
2 and 3 are schematic views for explaining a conventional electronic component moving apparatus.
4 is a schematic plan view of a handler for testing electronic components according to an embodiment of the present invention.
5 is a schematic view of an electronic part moving apparatus applied to the electronic part testing handler of Fig.
FIG. 6 is an excerpt of an essential part of the electronic component moving apparatus of FIG. 5; FIG.
7 is a schematic view of a spacing control device applied to the handler for testing electronic parts of Fig.
8 to 10 are reference views for explaining the operation of the main part of the handler for testing electronic parts according to the present invention.

Preferred embodiments according to the present invention will be described with reference to the accompanying drawings, but for the sake of brevity of description, descriptions of redundant or substantially identical configurations are omitted or compressed as much as possible.

<Schematic Description of Electronic Part Handler>

4 is a schematic plan view of a handler (hereinafter, referred to as a 'handler') for an electronic part test according to an embodiment of the present invention.

The handler TH includes a connection part (CAP), a supply and recovery part (SRP), a control device (400) and an input device (500).

The connection part (CAP) electrically connects the electronic part to a tester (TESTER), and may be configured to include a test chamber (TC) and a connection device (CA) as mentioned above.

The supply and recovery part (SRP) supplies the electronic part to the connection part (CAP) by placing the test tray (TT) and electrically connected to the tester (TESTER) by the connection part (CAP) And as described above, the loading device LA, the soak chamber SC, the desock chamber DC, the unloading device UA, the supply stackers SS, Recovery stackers (RSs) and a transfer device (TA). Here, the loading device LA and the unloading device UA may be constituted by one electronic component moving device, or may be configured to include a plurality of electronic component moving devices, a plurality of moving type loading tables, and the like have.

In addition, the handler TH according to the present invention includes two spacing devices 300 for operating the setting interval between the pair of grip levers provided in the gripper of the electronic part moving device at the supply and collection part SRP Respectively.

The above-described electronic component moving device and spacing control device 300 will be described later with different reference numerals. Since the remaining components of the connection part (CAP) and the supply and recovery part (SRP) have been described above, detailed description thereof will be omitted.

The control device 400 controls the connection part (CAP) and the recovery part (SRP).

The input device 500 is provided for inputting necessary information to the control device 400. Particularly, in the present invention, an administrator can input standard information of an electronic part to be tested through the input device 500.

&Lt; Description of Electronic Component Moving Device >

The electronic component moving device is configured to move the electronic component while gripping or releasing the electronic component with a pair of grip levers at the time of supplying and recovering the electronic component. To this end, electronic component moving apparatus 200 includes gripping devices 210, elevator 220, and horizontal mover 230, as shown in the schematic diagram of FIG. Here, the elevator 220 and the horizontal mover 230 have been described above, and a description thereof will be omitted.

The gripping devices 210 each include a pair of gripping levers 211a and 211b, a lever moving device 212, an interval setting device 213 and a lock device 214. [

 The pair of grip levers 211a and 211b are movably provided by the lever moving device 212 so that the distance therebetween can be narrowed or opened. And the gripping of the electronic component (D) is released when the gap therebetween is increased.

The pair of lever moving devices 212 move the grip levers 211a and 211b in opposite directions to narrow or open the gap between the pair of grip levers 211a and 211b. To this end, the lever moving device 212 includes a first moving device 212a for moving the left grip lever 211a and a second moving device 212b for moving the right grip lever 211b. Although the linear motor is used as the first mobile device 212a and the second mobile device 212b in this embodiment, the linear motor may be implemented as a moving means utilizing a cylinder or compressed air.

The interval setting device 213 is provided to set a setting interval between the holding levers 211a and 211b. To this end, the interval setter 213 includes a rotation bar 213a, a first moving member 213b-1 and a second moving member 213b-2 as in the excerpt of FIG. 6 extracting a main portion.

The rotation bar 213a is provided to move the first moving member 213b-1 and the second moving member 213b-2 in a direction approaching or moving away from each other. The left and right sides of the rotation bar 213a are formed with threads LG and RG having different directions from each other. The left end of the rotation bar 213a has an operation portion 213a-1 and a rotation bar 213a, A lock portion 213a-2 is provided to be operated so as to inhibit the rotation of the rotor 213a.

The operation portion 213a-1 is provided to be able to rotate the rotation rod 213a by being engaged with the operation member of the gap operation device 300 and operated to rotate in conjunction with rotation of the operation member.

The locking portion 213a-1 is a portion where locking is performed by the locker 214 to prevent arbitrary rotation of the rotation rod 213a, and is engaged in a circumferential direction to form locking protrusions in the rotation direction of the rotation rod 213a And the grooves hs are formed to be long in the lateral direction.

The locker 214 is provided to prevent arbitrary rotation of the rotation bar 213a and is configured to include a lock 214a and a lock spring 214b.

The lower end of the lock 214 is inserted into the lock grooves hs formed in the lock portion 213a-2 so that the lock tooth 214a-1 for locking the lock portion 213a-2 and the lock tooth 214a- 1 for releasing the locked state by coming out of the engaging groove hs. The slant surface sf1, which is lowered toward the right side, is formed in the releasing projection 214a-2 so as to obliquely look downward.

The lock spring 214b is provided to apply an elastic force to the lock 214a in a downward direction in which the lock tooth 214a-1 is inserted into the lock groove hs. Therefore, if an external external force is not applied, the catch 214a is kept in a state of preventing arbitrary rotation of the rotation rod 213a.

The upper end of the first moving member 213b-1 is screwed to the left thread of the rotating rod 213a and is moved in the left and right direction according to the rotation of the rotating rod 213a. 1) are combined. Accordingly, when the rotation rod 213a rotates, the first mobile unit 213b-1 coupled to the first moving member 213b-1 also moves, and the first mobile unit 213b-1 coupled to the first mobile unit 213b- (211a).

The upper end of the second moving member 213b-2 is screwed to the right side thread RG of the rotating rod 213a and is moved in the left-right direction according to the rotation of the rotating rod 213a. At the lower end of the second moving member 213b- 2) are combined. Accordingly, when the rotation rod 213a rotates, the second grip lever 211b coupled to the second mobile unit 213b-2 moves.

<Explanation of the interval control device>

7, the interval manipulating apparatus 300 includes an operating member 310, an operator 320, a releaser 330, and an advancing / retreating circle 340 for operating the interval setter 200. [

The operating member 310 is rotatably provided and can be engaged with the operating portion 213a-1 of the rotating rod 213a. To this end, in this embodiment, the operating member 310 is provided in the form of a wrench, and correspondingly, the operating portion 213a-1 of the rotating bar 213a is provided in the form of a wrench bolt. However, the manipulation member 213a-1 and the manipulation member 310 may be provided in the form of a bevel gear, such that the manipulation member 213a-1 and the manipulation member 310 rotate the manipulation member 213a Any form can be preferably considered.

The operation source 320 provides operation power for rotating operation of the operation member 310, and can be preferably composed of a motor.

The releaser 330 is provided to release the locked state by the locker 214. [ In this embodiment, the lock 214a is lifted upward so that the lock tooth 214a-1 inserted in the lock groove hs comes out of the lock groove hs. The releaser 330 has an inclined surface sf2 that contacts the inclined surface sf1 of the releasing projection 214a-2 and is inclined downward toward the direction of the releasing projection 314a-2 so as to obliquely face upward. When the release mechanism 330 advances toward the lock mechanism 214 and the slope sf1 of the release protrusion 214a-2 and the slope sf2 of the release device 330 are in contact with each other, the release protrusion 214a- The catch 214a is lifted by lifting up the slope sf1.

The advancing / retracting source 340 is moved by the releasing device 330 to the lock device 214 by advancing the operation member 310 to the gripping device 210 side so that the operation member 310 is engaged with the operation part 213a-1. Thereby releasing the locked state by the locking mechanism. The advancing / retracting circle 240 may be provided by a cylinder or a motor. For example, the gripping devices 210 may be configured to advance the gripping devices 210 toward the operation member 310. In this case, the gripping devices 210 are relatively larger than the operation member 310, The manipulation member 310 is moved toward the gripping device 210 in the direction of the gripping device 210 by the advancing / retreating source 340 because the movement of the gripping devices 210 becomes complicated, To be moved.

<Description of operation method>

When an electronic component D having a different specification from an electronic component that has been tested is to be tested, the administrator inputs information about the electronic component D to be newly tested through the input device 500. At this time, the information on the electronic part D includes, of course, the standard information on the electronic part D.

The controller 400 moves the electronic component moving apparatus 200 to the interval controlling apparatus 300 side as shown in FIG. 8 according to the inputted information and sequentially moves the apparatus controlling apparatus 400 from the one holding apparatus 210 to the interval controlling apparatus 300 So as to correspond to each other.

8, when the advancing and retreating source 340 is operated and the operation member 310 is advanced to the gripping device 210 side, the release device 330 operates the lock device 214 to rotate the rotation bar 213a The wrench-shaped operating member 310 is caught by the operating portion 212a-1 in the form of a wrench bolt.

The operation source 320 is operated in the state of FIG. 8 to rotate the rotating rod 213a by the calculated value so that the gap between the pair of grip levers 211a and 211b is adjusted to the size of the electronic component D to be tested in the future, Or by narrowing the gap between the pair of grip levers 211a and 211b. When the advancing / retreating source 340 retracts the operating member 310 in the leftward direction in the drawing, the releasing unit 330 is also retracted, and the locker 214 is locked by engaging the rotating rod 213a. The electronic component moving apparatus 200 moves the gripping apparatuses 210 in the forward or backward direction as shown in FIG. 10 so that the gripping apparatuses 210 of the next turn correspond to the gap adjusting apparatuses 300. The set intervals between the pair of grip levers 211a and 211b provided in all the gripping devices 210 configured in the electronic part moving apparatus 200 are sequentially set.

For example, a plurality of electronic component moving apparatuses 200 may correspond to one interval controlling apparatus 300. In this case, the handler TH may be operated by performing the above operation on all the electronic component moving apparatuses 200. In this case, Is ready to support the test operation for the new electronic component D.

Although the present invention has been fully described by way of example only with reference to the accompanying drawings, it is to be understood that the present invention is not limited thereto. It is to be understood that the scope of the invention is to be construed as being limited only by the following claims and their equivalents.

TH: Handler for testing electronic components
CAP: Connection part
SRP: Supply and recovery part
200: Electronic component moving device
210: Phaser devices
211a and 211b:
212: Lever mobile device
213: Spacer
214: Locking device
220: Lift
230: Horizontal mover
300:
310: Operation member
320: Operator
330: Releaser
340: Retraction circle
400: control device
500: input device

Claims (4)

A connecting portion for electrically connecting the electronic component to the tester;
A supply and recovery section for supplying the electronic component to the connection section and for recovering the tested electronic component after being electrically connected to the tester by the connection section;
A control device for controlling the connecting part and the feeding and collecting part; And
An input device for inputting necessary information to the control device; Lt; / RTI &gt;
The feeding and withdrawing portion comprises:
At least one electronic component moving device for moving the electronic component while gripping or releasing the electronic component with a pair of grip levers at the time of supplying and recovering the electronic component; And
At least one spacing manipulating device for manipulating a setting interval between a pair of grip levers provided in the electronic component moving device; / RTI &gt;
The electronic component moving device includes:
At least one gripping device for gripping or releasing the electronic component with the pair of grip levers;
An elevator for elevating the at least one gripping device; And
A horizontal shifter for moving the at least one gripping device in a horizontal direction; Lt; / RTI &gt;
The gripping device comprises:
The pair of grip levers described above;
A lever moving device that narrows or opens the gap between the pair of grip levers so that the pair of grip levers can grip or release the electronic component; And
An interval setting device for setting a setting interval between the pair of grip levers by being operated by the interval operation device; Lt; / RTI &gt;
Wherein the control device controls the electronic component moving device and the interval controlling device by information according to the specification of the electronic component input through the input device so that the interval controlling device operates the interval setting device, So that the setting interval between the electronic components is automatically changed according to the specification of the electronic component
Handler for testing electronic components. The method according to claim 1,
The gripping device
A locker for preventing an arbitrary operation of the interval setting device; Further comprising
Handler for testing electronic components. 3. The method of claim 2,
The above-
An operating member for operating the interval setting device;
An operating member for providing an operating force for causing the operating member to operate the interval setting device; And
A releasing device for releasing the locked state of the interval setting device by the locker; Containing
Handler for testing electronic components. The method of claim 3,
Wherein the distance controlling device releases the lock state of the distance setting device by the releasing device by advancing or retracting the operation member, the operation source and the releasing device toward the gripping device side so that the operating member can operate the interval setting device A retractor for causing the interval setter to be in a locked state; Further comprising
Handler for testing electronic components.

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