KR20170101427A - Current Sensors - Google Patents

Current Sensors Download PDF

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Publication number
KR20170101427A
KR20170101427A KR1020160023927A KR20160023927A KR20170101427A KR 20170101427 A KR20170101427 A KR 20170101427A KR 1020160023927 A KR1020160023927 A KR 1020160023927A KR 20160023927 A KR20160023927 A KR 20160023927A KR 20170101427 A KR20170101427 A KR 20170101427A
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KR
South Korea
Prior art keywords
bus bar
shield
length
current sensor
extending
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Application number
KR1020160023927A
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Korean (ko)
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KR101817957B1 (en
Inventor
이치우
황홍식
Original Assignee
부산대학교 산학협력단
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Priority to KR1020160023927A priority Critical patent/KR101817957B1/en
Publication of KR20170101427A publication Critical patent/KR20170101427A/en
Application granted granted Critical
Publication of KR101817957B1 publication Critical patent/KR101817957B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G01R15/202—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using Hall-effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/18—Screening arrangements against electric or magnetic fields, e.g. against earth's field
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
    • G01R31/043—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)

Abstract

A current sensor is provided. The current sensor includes a first bus bar, a second bus bar arranged to be spaced apart from the first bus bar in a first direction, a first current sensor for measuring a current flowing through the first bus bar, A second surface extending from the first surface and a third surface extending from the second surface and extending from the first surface and facing the first surface; And a second surface extending from the fourth surface and bent from the fourth surface, and a sixth surface extending from the fifth surface and extending from the fifth surface, the sixth surface facing the fourth surface, the second surface of the first shield Is disposed on the lower surface of the first bus bar and the fifth surface of the second shield is disposed on the upper surface of the second bus bar.

Description

Current Sensors

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to current sensors, and more particularly to the arrangement of current sensors for measuring current flowing in a bus-bar.

In the current measurement, it is important to accurately measure the physical quantity produced by the measured current. As the current sensor used for current measurement, a Hall sensor using a Hall effect can be used.

In order to accurately measure the current using a current sensor, a linear voltage must be measured on the current sensor. It is also important to shield an external magnetic field that may affect the current sensor and concentrate the internal magnetic field generated by the measured current in the current sensor. To do this, shields with appropriate widths and heights are required.

Furthermore, with the recent miniaturization of electronic devices, there is a need for a current sensor capable of increasing space utilization while improving accuracy and linearity.

SUMMARY OF THE INVENTION It is an object of the present invention to provide a current sensor capable of improving the external magnetic field shielding effect.

SUMMARY OF THE INVENTION It is an object of the present invention to provide a current sensor capable of increasing the linearity of a voltage measured by a current sensor.

The technical objects of the present invention are not limited to the technical matters mentioned above, and other technical subjects not mentioned can be clearly understood by those skilled in the art from the following description.

According to an aspect of the present invention, there is provided a current sensor comprising: a first bus bar; a first bus bar; a second bus bar spaced apart from the first bus bar in a first direction; A second current sensor for measuring a current flowing through the second bus bar; a second surface extending from the first surface, a second surface extending from the first surface and bending from the first surface, and a third surface extending from the second surface, And a second shield extending from the fifth surface and bent from the fourth surface, and a sixth surface extending from the fifth surface and extending from the fourth surface, the second shield comprising a first shield and a fourth surface, The second surface of the one shield is disposed on the lower surface of the first bus bar and the fifth surface of the second shield is disposed on the upper surface of the second bus bar.

In some embodiments, the second surface of the first shield contacts the lower surface of the first bus bar, and the fifth surface of the second shield contacts the upper surface of the second bus bar.

In some embodiments, the length of the second surface of the first shield in the second direction intersecting the first direction is equal to or less than the length of the first bus bar in the second direction, The length of the fifth surface of the shield in the second direction may be equal to or less than the length of the second bus bar in the second direction.

In some embodiments, the fifth surface of the second shield may be located below the distal end of the third surface of the first shield.

In some embodiments, the second bus bar may be located above the first bus bar.

In some embodiments, the third bus bar is spaced apart from the second bus bar in the first direction, the third current sensor measures a current flowing through the third bus bar, and the seventh surface is bent and extended from the seventh surface. Further comprising a third shield extending from the eighth surface and extending from the eighth surface and including a ninth surface facing the seventh surface, wherein the eighth surface of the third shield Can be placed on the lower surface.

In some embodiments, the eighth surface of the third shield may be in contact with the bottom surface of the third bus bar.

In some embodiments, the length of the eighth surface of the third shield in a second direction intersecting the first direction may be less than or equal to the length of the third bus bar in the second direction.

In some embodiments, the fifth surface of the second shield may be located below the distal end of the seventh surface of the third shield.

In some embodiments, the second bus bar may be located above the first bus bar and the third bus bar.

In some embodiments, a third bus bar is disposed spaced apart from the first bus bar and the second bus bar, a third current sensor and a seventh face that measure the current flowing through the third bus bar, And a third shield extending from the eighth surface and extending from the eighth surface and including a ninth surface facing the seventh surface, and the eighth surface of the third shield is connected to the third bus And the second bus bar and the third bus bar may be disposed on both sides of the first bus bar.

In some embodiments, the eighth surface of the third shield may be in contact with the top surface of the third bus bar.

In some embodiments, the length of the eighth surface of the third shield is equal to or smaller than the length of the third bus bar, and the length is a length in a direction intersecting the direction in which the first to third bus bars are spaced apart Lt; / RTI >

In some embodiments, the second surface of the first shield may be located above the distal end of the ninth surface of the third shield.

In some embodiments, the first bus bar may be located below the second bus bar and the third bus bar.

According to another aspect of the present invention, there is provided a current sensor including a first bus bar and a first current sensor for measuring a current flowing through the first bus bar, A third bus bar spaced apart in the first direction and a second bus bar spaced apart from the first bus bar in the first direction to measure a current flowing through the third bus bar; A second shield surrounding the upper surface of the second bus bar and exposing a lower surface of the second bus bar, and a second shield surrounding the lower surface of the first bus bar, And a third shield surrounding the lower surface of the third bus bar and exposing an upper surface of the third bus bar.

In some embodiments, the first shield includes a first surface, a second surface that bends and extends from the first surface, and a third surface that bends from the second surface and faces the first surface, The second shield includes a fourth surface, a fifth surface that bends and extends from the fourth surface, and a sixth surface that extends from the fifth surface to bend and faces the fourth surface, An eighth surface extending from the seventh surface and a ninth surface extending from the eighth surface and extending from the eighth surface and facing the seventh surface.

In some embodiments, the second surface of the first shield contacts a lower surface of the first bus bar, the fifth surface of the second shield contacts an upper surface of the second bus bar, and the third surface of the third shield The eighth surface can be in contact with the lower surface of the third bus bar.

In some embodiments, the fifth surface of the second shield may be located below the distal end of the third surface of the first shield and the seventh surface of the third shield.

In some embodiments, the second bus bar may be located above the first bus bar and the third bus bar.

In some embodiments, the length of the second surface of the first shield in the second direction intersecting the first direction is equal to or less than the length of the first bus bar in the second direction, The length of the fifth surface of the shield in the second direction is equal to or smaller than the length of the second bus bar in the second direction and the length of the eighth surface of the third shield in the second direction is , And may be equal to or less than the length of the third bus bar in the second direction.

According to an aspect of the present invention, there is provided a current sensor including a first bus bar and a first current sensor for measuring a current flowing through the first bus bar, A second current sensor for measuring a current flowing through the first bus bar and the second bus bar, a third bus bar spaced apart from the first bus bar and the second bus bar, and a third current sensor for measuring a current flowing through the third bus bar, A first shield surrounding the lower surface of the first bus bar and exposing an upper surface of the first bus bar, a second shield surrounding the upper surface of the second bus bar and exposing a lower surface of the second bus bar, And a third shield surrounding the upper surface of the bar and exposing the lower surface of the third bus bar.

In some embodiments, the second bus bar and the third bus bar may be disposed on both sides with respect to the first bus bar.

In some embodiments, the first shield includes a first surface, a second surface that bends and extends from the first surface, and a third surface that bends from the second surface and faces the first surface, The second shield includes a fourth surface, a fifth surface that bends and extends from the fourth surface, and a sixth surface that extends from the fifth surface to bend and faces the fourth surface, An eighth surface extending from the seventh surface and a ninth surface extending from the eighth surface and extending from the eighth surface and facing the seventh surface.

In some embodiments, the second surface of the first shield contacts a lower surface of the first bus bar, the fifth surface of the second shield contacts an upper surface of the second bus bar, and the third surface of the third shield The eighth surface may be in contact with the upper surface of the third bus bar.

In some embodiments, the second surface of the first shield may be located above the distal end of the fourth surface of the second shield and the ninth surface of the third shield.

In some embodiments, the first bus bar may be located below the second bus bar and the third bus bar.

In some embodiments, the length of the second face of the first shield is equal to or less than the length of the first bus bar, and the length of the fifth face of the second shield is equal to the length of the second bus bar And the length of the eighth surface of the third shield is equal to or smaller than the length of the third bus bar and the length is a length in a direction intersecting the direction in which the first to third bus bars are spaced apart .

The details of other embodiments are included in the detailed description and drawings.

1 is a perspective view of a current sensor according to some embodiments of the present invention.
2 is a front view of Fig.
3 is a perspective view of a current sensor according to some embodiments of the present invention.
4 to 7 are views for explaining the arrangement of current sensors according to some embodiments of the present invention.
Figs. 8 and 9 are top views of Figs. 4 and 5. Fig.
Figs. 10 and 11 are top views of Figs. 6 and 7. Fig.
12 to 16 are diagrams for explaining the effect of the current sensor according to the technical idea of the present invention.

BRIEF DESCRIPTION OF THE DRAWINGS The advantages and features of the present invention and the manner of achieving them will become apparent with reference to the embodiments described in detail below with reference to the accompanying drawings. The present invention may, however, be embodied in many different forms and should not be construed as being limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. Is provided to fully convey the scope of the invention to those skilled in the art, and the invention is only defined by the scope of the claims. The relative sizes of layers and regions in the figures may be exaggerated for clarity of illustration. Like reference numerals refer to like elements throughout the specification.

One element is referred to as being "connected to " or" coupled to "another element, either directly connected or coupled to another element, One case. On the other hand, when one element is referred to as being "directly connected to" or "directly coupled to " another element, it does not intervene another element in the middle.

Like reference numerals refer to like elements throughout the specification. "And / or" include each and every combination of one or more of the mentioned items.

It is to be understood that when an element or layer is referred to as being "on" or " on "of another element or layer, All included. On the other hand, a device being referred to as "directly on" or "directly above " indicates that no other device or layer is interposed in between.

Although the first, second, etc. are used to describe various elements, components and / or sections, it is needless to say that these elements, components and / or sections are not limited by these terms. These terms are only used to distinguish one element, element or section from another element, element or section. Therefore, it goes without saying that the first element, the first element or the first section mentioned below may be the second element, the second element or the second section within the technical spirit of the present invention.

The terminology used herein is for the purpose of illustrating embodiments and is not intended to be limiting of the present invention. In the present specification, the singular form includes plural forms unless otherwise specified in the specification. It is noted that the terms "comprises" and / or "comprising" used in the specification are intended to be inclusive in a manner similar to the components, steps, operations, and / Or additions.

Unless defined otherwise, all terms (including technical and scientific terms) used herein may be used in a sense commonly understood by one of ordinary skill in the art to which this invention belongs. Also, commonly used predefined terms are not ideally or excessively interpreted unless explicitly defined otherwise.

Hereinafter, referring to Figs. 1 and 2, a current sensor according to some embodiments of the present invention will be described.

1 is a perspective view of a current sensor according to some embodiments of the present invention. 2 is a front view of Fig.

Referring to FIGS. 1 and 2, the first current sensor may measure a current flowing in the first bus bar 100. The first current sensor may include a first circuit substrate 120 and a first current sensor chip 130.

The first bus bar 100 may extend in a second direction D2. The first bus bar 100 may have the form of a bar. The first bus bar 100 may include an upper surface 100U and a lower surface 100L. The upper surface 100U and the lower surface 100L of the first bus bar 100 can be opposed to each other.

The first bus bar 100 may comprise a material having conductivity. The first bus bar 100 may be a conductor through which the current to be measured by the first current sensor flows.

The first circuit board 120 may be disposed on the first bus bar 100. Specifically, the first circuit board 120 may be disposed on the upper surface 100U of the first bus bar 100. The first circuit board 120 is mounted on the top surface 100U of the first bus bar 100 and more specifically on the top surface 100U of the first bus bar 100. In some embodiments, (Not shown).

The first circuit board 120 may be a printed circuit board (PCB) in some embodiments in accordance with the teachings of the present invention. The first circuit board 120 can drive the first current sensor chip 130 to be described later.

The first current sensor chip 130 may be disposed on the first bus bar 100 through which the measured current flows. More specifically, the first current sensor chip 130 may be disposed on the first circuit substrate 120, for example. The first current sensor chip 130 may be, for example, a hall sensor using a Hall effect. In some embodiments according to the teachings of the present invention, the first current sensor chip 130 may be an Integrated Magnetic Concentrator (IMC) chip. However, the present invention is not limited to this, and for example, the first current sensor chip may be a magnetic transistor including a Hall sensor, a magnetoresistive element, a magnetic sensor incorporating an amplification function, and the like. Here, the Hall effect refers to a physical phenomenon in which a potential difference is generated at both ends of the conductor when a magnetic field bridges a conductor through which current flows.

The first current sensor chip 130 may include a concentrator. The concentrator may comprise, for example, an amorphous or ferromagnetic material. The concentrator may serve to concentrate the magnetic field generated by the measured current to the first current sensor chip 120 when the measured current flows through the first bus bar 100, for example.

The first current sensor chip 130 can generate a voltage due to a Hall effect when a current to be measured flows through the first bus bar 100. The measured current can be measured by converting the generated voltage into a current.

The first shield 110 may be formed, for example, in such a manner that both edge portions of the quadrangular plate-like member are bent and extended symmetrically with respect to the center portion.

In the drawing, the first shields 110 are shown in such a manner that both edge portions of the rectangular plate-shaped member are vertically bent and extended symmetrically with respect to the center portion, but the present invention is not limited thereto. For example, both side edge portions of the first shield 110 can be bent and extended at an arbitrary angle from the center portion of the rectangular plate-shaped member.

The first shield 110 may be configured to surround the first bus bar 100, the first circuit substrate 120, and the first current sensor chip 130. At this time, both ends of the first shield 110 may be separated from each other.

For example, the first shield 110 may include a first side 111, a second side 112, and a third side 113. The first side 111 may extend in the positive direction D3 + in the third direction, for example, with respect to the first bus bar 100. That is, the first surface 111 may protrude from the upper surface 100U of the first bus bar 100.

The second surface 112 may be bent and extended from the first surface 111. In other words, the second surface 112 can be bent and extended from the first surface 111.

The third surface 113 can be bent and extended from the second surface 112. In other words, the third surface 113 can be bent and extended from the second surface 112. The third surface 113 may face the first surface 111. The third surface 113 may extend in the positive direction D3 + in the third direction, for example, with respect to the first bus bar 100. That is, the third surface 113 may protrude from the upper surface 100U of the first bus bar 100.

The first bus bar 100, the first circuit board 120 and the first current sensor chip 130 may be disposed on the second surface 112 of the first shield 110. The first side 111 and the third side 113 may be located on the side of the first bus bar 100.

The height h of the first surface 111 and the third surface 113 is equal to the height h of the first bus bar 100, the first circuit substrate 120 and the first current sensor chip 130 Height. The width W of the first shield 110 may be as wide as the first bus bar 100 can be stacked. Details of this will be described later with reference to Figs. 12 to 16. Fig.

The first shield 110 may surround the lower surface 100L of the first bus bar 100 and expose the upper surface 100U of the first bus bar 100. [

The first bus bar 100, the first circuit substrate 120 and the first current sensor chip 130 are electrically connected to the second surface 112 of the first shield 110 ), In the positive direction (D3 +) of the third direction. In other words, the second surface 112 of the first shield 110 may be disposed on the lower surface 100L of the first bus bar 100. [ The second surface 112 of the first shield 110 may be in contact with the bottom surface 100L of the first bus bar 100. In some embodiments according to the teachings of the present invention,

The length LS of the second surface 112 of the first shield 110 in the second direction D2 is greater than the length LS of the second surface 112 of the first bus bar 100 in the second direction D2 in some embodiments according to the teachings of the present invention. May be the same as the length LB1 in the direction D2.

The first shield 110 may comprise a metallic material or a ferromagnetic material. The first shield 110 can prevent disturbance that may be applied to the first current sensor chip 130. For example, in the case of a three-phase bus bar, an external magnetic field generated by a current flowing in a bus bar on an adjacent phase can be shielded from the first bus bar 100. In addition, the magnetic field generated by the current flowing through the first bus bar 100 can be concentrated on the first current sensor chip 130. The first shield 110 may allow a linear voltage to be measured on the first current sensor chip 130. The first shield 110 can increase the accuracy of the current sensor.

If the length of the bus bar in the second direction D2 is long, there is a space restriction and space utilization is also reduced. The current sensor according to the technical idea of the present invention improves space utilization by making the length LB1 of the first bus bar 100 equal to the length LS of the second surface 112 of the first shield 110 .

Hereinafter, referring to FIG. 3, a current sensor according to some embodiments of the present invention will be described. For the sake of clarity, except for those that overlap with those described above.

3 is a perspective view of a current sensor according to some embodiments of the present invention.

3, the length LB2 in the second direction D2 of the first bus bar 100 'is greater than the length LB2 in the second direction D2 of the second surface 112 of the first shield 110, May be different from the length (LS). For example, the length LB2 of the first bus bar 100 'in the second direction D2 is greater than the length LB2 of the first bus bar 100' in the second direction D2 of the second surface 112 of the first shield 110 May be less than the length LS.

Hereinafter, referring to Fig. 4, a current sensor according to some embodiments of the present invention will be described. For the sake of clarity, except for those that overlap with those described above.

4 is a diagram for explaining the arrangement of current sensors according to some embodiments of the present invention.

Referring to FIG. 4, the current sensor according to some embodiments of the present invention includes a first bus bar 100 and a second bus bar 200 spaced apart from each other in the first direction D1. (300).

The second current sensor can measure the current flowing in the second bus bar 200. The second current sensor may include a second circuit board 220 and a second current sensor chip 230.

The third current sensor can measure the current flowing in the third bus bar 300. The third current sensor may include a third circuit board 320 and a third current sensor chip 330.

The first bus bar 100, the second bus bar 200, and the third bus bar 300 may have currents having different phases from each other by 120 degrees, for example.

The first bus bar 100, the second bus bar 200, and the third bus bar 300 may be located, for example, on the same plane. That is, the first bus bar 100, the second bus bar 200, and the third bus bar 300 may be positioned parallel to each other, but the present invention is not limited thereto. For example, the first bus bar 100, the second bus bar 200, and the third bus bar 300 may be spaced apart from each other in the first direction.

The second circuit board 220 and the third circuit board 320 may be substantially the same as the first circuit board 120. The second current sensor chip 230 and the third current sensor chip 330 may be substantially the same as the first current sensor chip 130.

Although the first bus bar disposed on the second side 112 of the first shield 110 is shown as the first bus bar 100 described above with reference to Figure 1, However, the present invention is not limited thereto. The length in the second direction D2 of the first bus bar disposed on the second surface 112 of the first shield 110 is greater than the length in the second direction D2 of the second surface 112. [ Lt; RTI ID = 0.0 > and / or < / RTI >

The second shield 210 may be substantially the same as the first shield 110. That is, the second shield 210 may be configured to surround the second bus bar 200, the second circuit substrate 220, and the second current sensor chip 230. At this time, both ends of the second shield 210 may be separated from each other.

The second shield 210 may include, for example, a fourth surface 211, a fifth surface 212, and a sixth surface 213. The fourth surface 211 may extend in the negative direction D3- in the third direction with respect to the second bus bar 200, for example. That is, the fourth surface 211 may extend in a direction opposite to the first surface 111 and the third surface 113 of the first shield 110. The fourth surface 211 may protrude from the lower surface 200L of the second bus bar 200. [

The fifth surface 212 may be bent and extended from the fourth surface 211. The sixth surface 213 can be bent and extended from the fifth surface 212. The sixth surface 213 may face the fourth surface 211. The sixth surface 213 may extend in the negative direction D3- in the third direction with respect to the second bus bar 200, for example. That is, the sixth surface 213 may extend in a direction opposite to the first surface 111 and the third surface 113 of the first shield 110. The sixth surface 213 may protrude from the lower surface 200L of the second bus bar 200.

The second bus bar 200, the second circuit substrate 220 and the second current sensor chip 230 may be disposed on the fifth surface 212 of the second shield 210. The fourth surface 211 and the sixth surface 213 may be located on the side of the second bus bar 200.

The second shield 210 may surround the upper surface 200U of the second bus bar 200 and expose the lower surface 200L of the second bus bar 200. [

The second bus bar 200, the second circuit substrate 220 and the second current sensor chip 230 may be disposed on the fifth side 212 of the second shield 210. In some embodiments according to the teachings of the present invention, ) In the negative direction D3- in the third direction. In other words, the fifth surface 212 of the second shield 210 may be disposed on the upper surface 200U of the second bus bar 200. [ In some embodiments according to the teachings of the present invention, the fifth surface 212 of the second shield 210 may be in contact with the upper surface 200U of the second bus bar 200. The second shield 210 may be disposed, for example, in such a manner that the first shield 110 is turned upside down.

The length of the fifth surface 212 of the second shield 210 in the second direction D2 may be equal to or less than the length of the second bus bar 200 in the second direction D2.

The third shield 310 may be substantially the same as the first shield 110. That is, the third shield 310 may be configured to surround the third bus bar 300, the third circuit substrate 320, and the third current sensor chip 330. At this time, both ends of the third shield 310 may be separated from each other.

The third shield 310 may include, for example, a seventh surface 311, an eighth surface 312, and a ninth surface 313. The seventh surface 311 may extend in the positive direction D3 + in the third direction, for example, with respect to the third bus bar 300. [ That is, the seventh surface 311 may extend in a direction opposite to the fourth surface 211 and the sixth surface 213 of the second shield 210. The seventh face 311 may extend in the same direction as the first face 111 and the third face 113 of the first shield 110. The seventh surface 311 may protrude from the upper surface 300U of the third bus bar 300.

The eighth surface 312 may be bent and extended from the seventh surface 311. The ninth surface 313 can be bent and extended from the eighth surface 312. [ The ninth surface 313 may face the seventh surface 311. The ninth surface 313 may extend in the positive direction D3 + in the third direction, for example, with reference to the third bus bar 300. That is, the ninth surface 313 may extend in a direction opposite to the fourth surface 211 and the sixth surface 2130 of the second shield 210. The ninth surface 313 may protrude from the upper surface 300U of the third bus bar 300.

The third bus bar 300, the third circuit board 320 and the third current sensor chip 330 may be disposed on the eighth surface 312 of the third shield 310. The seventh surface 311 and the ninth surface 313 may be located on the side of the third bus bar 300.

The third shield 310 surrounds the lower surface 300L of the third bus bar 300 and exposes the upper surface 300L of the third bus bar 300. [

The third bus bar 300, the third circuit board 320 and the third current sensor chip 330 are connected to the eighth surface 312 of the third shield 310 ), In the positive direction (D3 +) of the third direction. In other words, the eighth surface 312 of the third shield 310 may be disposed on the lower surface 300L of the third bus bar 300. [ In some embodiments according to the teachings of the present invention, the eighth surface 312 of the third shield 310 may be in contact with the bottom surface 300L of the third bus bar 300. The third shield 310 may be disposed, for example, in such a manner that the second shield 210 is turned upside down. That is, the third shield 310 may be disposed in the same shape as the first shield 110.

The length of the eighth surface 312 of the third shield 310 in the second direction D2 may be equal to or less than the length of the third bus bar 300 in the second direction D2.

The fifth face 212 of the second shield 210 is positioned at a position between the distal end 111e of the first face 111 of the first shield 110 and the distal end 111e of the first face 111 of the first shield 110. In some embodiments according to the teachings of the present invention, 113). ≪ / RTI > The fifth surface 212 of the second shield 210 is located below the distal end 311e of the seventh surface 311 of the third shield 310 and the distal end 313e of the ninth surface 313 Can be located. Here, 'lower' may be, for example, the negative direction D3- in the third direction.

For example, the distal end 211e of the fourth surface 211 of the second shield 210 and the distal end 213e of the sixth surface 213 are located on the second surface 112 of the first shield 110, May be located below the eighth surface (312) of the third shield (310).

Hereinafter, referring to Fig. 5, a current sensor according to some embodiments of the present invention will be described. For the sake of clarity, except for those that overlap with those described above.

5 is a view for explaining the arrangement of current sensors according to some embodiments of the present invention.

Referring to FIG. 5, the second bus bar 200 may be positioned above the first bus bar 100 and the third bus bar 300. Here, 'up' may be the positive direction (D3 +) in the third direction.

The fifth surface 212 of the second shield 210 is positioned at a position similar to the end 111e of the first surface 111 of the first shield 110 and the end 113e of the third surface 113 can do. The fifth surface 212 of the second shield 210 is positioned at a position similar to the distal end 311e of the seventh face 311 and the distal end 313e of the ninth face 313 of the third shield 310 Lt; / RTI >

For example, the distal end 211e of the fourth surface 211 of the second shield 210 and the distal end 213e of the sixth surface 213 are located on the second surface 112 of the first shield 110, And may be located at a position similar to the eighth surface 312 of the third shield 310.

Hereinafter, referring to Fig. 6, a current sensor according to some embodiments of the present invention will be described. For the sake of clarity, except for those that overlap with those described above.

6 is a view for explaining the arrangement of current sensors according to some embodiments of the present invention.

Referring to FIG. 6, the second bus bar 200 and the third bus bar 300 of the current sensor according to some embodiments of the present invention are disposed on both sides of the first bus bar 100 . The first bus bar 100, the second bus bar 200, and the third bus bar 300 may be spaced apart from each other in the first direction D1.

The third shield 310 may be disposed in substantially the same form as the second shield 210. [ That is, the eighth surface 312 of the third shield 310 may be disposed on the upper surface of the third bus bar 300. For example, the eighth surface 312 of the third shield 310 may be in contact with the top surface of the third bus bar 300. The third shield 310 can expose the bottom surface 300L of the third bus bar 300. [

For example, the second surface 112 of the first shield 110 may be positioned above the distal end 313e of the ninth surface 313 of the third shield 310.

Hereinafter, referring to Fig. 7, a current sensor according to some embodiments of the present invention will be described. For the sake of clarity, except for those that overlap with those described above.

7 is a view for explaining the arrangement of current sensors according to some embodiments of the present invention.

Referring to FIG. 7, the first bus bar 100 may be positioned below the second bus bar 200 and the third bus bar 300.

Hereinafter, referring to Figs. 8 and 9, a current sensor according to some embodiments of the present invention will be described. For the sake of clarity, except for those that overlap with those described above. Figs. 8 and 9 are top views of Figs. 4 and 5. Fig. 8 and 9, any one of the plurality of shields may be disposed in a form opposite to that in which the remaining shields are disposed. For example, in the case of measuring the current of a three-phase bus bar, two shields may be arranged in the same shape and the other shield may be arranged in the form of two shields arranged in the same shape .

In some embodiments according to the technical concept of the present invention, the configurations of the first shield 110 and the third shield 310 may be the same. The arrangement of the second shield 210 may be reversed from the arrangement of the first shield 110 and the third shield 310. The distance between the first shield 110 and the third shield 310 may be greater than the distance between the first shield 110 and the second shield 210.

8 and 9, due to the arrangement of the first shield 110, the top surface 100U of the first bus bar 100, the first circuit substrate 120, and the first current sensor chip 130 are exposed . The third circuit board 320 and the third current sensor chip 330 of the third bus bar 300 may be exposed due to the arrangement of the third shield 310. [

On the other hand, the second shield 210 can expose the fourth surface 211, the fifth surface 212, and the sixth surface 213.

Hereinafter, referring to Figs. 10 and 11, a current sensor according to some embodiments of the present invention will be described. For the sake of clarity, except for those that overlap with those described above.

In some embodiments according to the technical idea of the present invention, the arrangement form of the second shield 210 and the third shield 310 may be the same. The arrangement of the first shield 110 may be opposite to the arrangement of the second shield 210 and the third shield 310. The distance between the first shield 110 and the third shield 310 may be smaller than the distance between the third shield 310 and the second shield 210.

10 and 11, due to the arrangement of the first shield 110, the upper surface 100U of the first bus bar 100, the first circuit substrate 120, and the first current sensor chip 130 are exposed .

On the other hand, the second shield 210 can expose the fourth surface 211, the fifth surface 212, and the sixth surface 213. The third shield 310 may expose the seventh surface 311, the eighth surface 312, and the ninth surface 313.

Hereinafter, referring to Figs. 2, 12 to 16, a current sensor according to some embodiments of the present invention will be described. For the sake of clarity, except for those that overlap with those described above.

12 to 16 are views for explaining the effect of the current sensor according to the technical idea of the present invention. Specifically, Fig. 12 is a view for explaining a current and a magnetic field flowing through the bus bar. 13 is a view for explaining a magnetic field inside the shield and an external magnetic field. 14 is a view for explaining an external magnetic field shielding effect of the shield. 15 is a graph for explaining nonlinearity depending on the magnitude of the magnetic flux density of the magnetic field in the shield. 16 is a graph for explaining the effect of the current sensor according to the technical idea of the present invention.

Referring to FIG. 12, when a current I flows through the bus bar, a magnetic field can be formed around the bus bar. In the three-phase system, when measuring the current of the three-phase bus bar, as shown in FIG. 9, not only the internal field of the shield but also the influence of the external field generated from the bus bar of the adjacent phase Can also receive.

13 and 14, the shield can function as an external magnetic field shielding function. Further, the shield can function to concentrate the magnetic field generated due to the measured current into the shield. At this time, the width (W in Fig. 2) and the height (h in Fig. 2) of the shield can affect the function of the shield.

Referring to FIG. 15, when the magnetic flux density of the magnetic field in the shield is about 25 mT or more, the nonlinearity can be increased. The nonlinearity can be increased when the concentrator included in the current sensor chip is saturated. As the nonlinearity increases, the accuracy of measuring the current magnitude across the bus bar can be reduced. In the graph of FIG. 15, the horizontal axis may be a magnetic field density (unit: mT), and the vertical axis may be nonlinearity (unit:% FS).

Referring to Equation (1), it can be seen that the magnetic flux density of the magnetic field in the shield is inversely proportional to the width W of the shield.

Figure pat00001

In other words, in order to decrease the magnetic flux density of the magnetic field in the shield to increase the linearity, the width W of the shield must be widened. On the other hand, when the width W of the shield increases, the shielding ability against the external magnetic field can be reduced, and the accuracy of the current measurement can be reduced.

In order to reduce the influence of the external magnetic field due to the increase in the width W of the shield, the height h of the shield must be high enough to shield the external magnetic field. However, if the height h of the shield increases, space may be limited.

Referring to FIG. 16, the first measurement 401 shows the error rate of the current measurement under a conventional current sensor arrangement in a three-phase system. The second measured value 402 shows the error rate of the current measured value under the current sensor arrangement of FIG. The third measured value 403 shows the error rate of the current measurement value under the current sensor arrangement of FIG. The horizontal axis of the graph may be a distance (unit: mm), and the vertical axis may be an error rate (unit:%). In the graph, the current sensor according to the technical idea of the present invention can measure the current relatively accurately with an error rate of about 1%.

In the current sensor according to the technical idea of the present invention, when the shields of the bus bars adjacent to each other are arranged opposite to each other, the magnetic fields generated in the bus bars can be generated in mutually independent paths. Therefore, the effect of invasion of the external magnetic field into the shields of other adjacent phases can be remarkably reduced. In other words, even if the height h of the shield is relatively low, the effect of shielding the external magnetic field can be improved. As a result, the width W of the shield can have a width such that the concentrator of the current sensor chip is not saturated, and the linearity of the voltage measured by the current sensor can be increased.

While the present invention has been described in connection with what is presently considered to be practical exemplary embodiments, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, You will understand. It is therefore to be understood that the above-described embodiments are illustrative in all aspects and not restrictive.

100: first bus bar 110: first shield
120: first circuit board 130: first current sensor chip

Claims (28)

A first bus bar;
A second bus bar spaced apart from the first bus bar in a first direction;
A first current sensor for measuring a current flowing through the first bus bar;
A second current sensor for measuring a current flowing through the second bus bar;
A first shield comprising a first side, a second side extending from the first side and a third side extending from the second side and bent and facing the first side; And
A fourth surface, a fifth surface extending bending from the fourth surface, and a sixth shield extending from the fifth surface and including a sixth surface facing the fourth surface,
A second surface of the first shield is disposed on a lower surface of the first bus bar,
And a fifth surface of the second shield is disposed on an upper surface of the second bus bar. The method according to claim 1,
The second surface of the first shield contacts the lower surface of the first bus bar,
And the fifth surface of the second shield contacts the upper surface of the second bus bar. The method according to claim 1,
The length of the second surface of the first shield in the second direction intersecting with the first direction is equal to or smaller than the length of the first bus bar in the second direction,
And the length of the fifth surface of the second shield in the second direction is equal to or less than the length of the second bus bar in the second direction. The method according to claim 1,
And the fifth surface of the second shield is located below the end of the third surface of the first shield. The method according to claim 1,
And the second bus bar is located above the first bus bar. The method according to claim 1,
A third bus bar spaced apart from the second bus bar in the first direction;
A third current sensor for measuring a current flowing through the third bus bar; And
A seventh surface, an eighth surface extending bending from the seventh surface, and a ninth surface extending bending from the eighth surface and facing the seventh surface,
And an eighth surface of the third shield is disposed on a lower surface of the third bus bar. The method according to claim 6,
And the eighth surface of the third shield contacts the bottom surface of the third bus bar. The method according to claim 6,
The length of the eighth surface of the third shield in the second direction intersecting with the first direction is equal to or less than the length of the third bus bar in the second direction. The method according to claim 6,
And the fifth surface of the second shield is located below the distal end of the seventh surface of the third shield. The method according to claim 6,
Wherein the second bus bar is located above the first bus bar and the third bus bar. The method according to claim 1,
A third bus bar spaced apart from the first bus bar and the second bus bar;
A third current sensor for measuring a current flowing through the third bus bar; And
A seventh surface, an eighth surface extending bending from the seventh surface, and a ninth surface extending bending from the eighth surface and facing the seventh surface,
The eighth surface of the third shield is disposed on the upper surface of the third bus bar,
And the second bus bar and the third bus bar are disposed on both sides with respect to the first bus bar. 12. The method of claim 11,
And the eighth surface of the third shield contacts the top surface of the third bus bar. 12. The method of claim 11,
The length of the eighth surface of the third shield is equal to or smaller than the length of the third bus bar,
Wherein the length is a length in a direction intersecting with a direction in which the first to third bus bars are spaced apart. 12. The method of claim 11,
And the second surface of the first shield is positioned above the end of the ninth surface of the third shield. 12. The method of claim 11,
Wherein the first bus bar is located below the second bus bar and the third bus bar. A first current sensor for measuring a current flowing through the first bus bar and the first bus bar;
A second bus bar spaced apart from the first bus bar in a first direction and a second current sensor for measuring a current flowing through the second bus bar;
A third bus bar spaced apart from the second bus bar in the first direction and a third current sensor for measuring a current flowing through the third bus bar;
A first shield surrounding the lower surface of the first bus bar and exposing an upper surface of the first bus bar;
A second shield surrounding the upper surface of the second bus bar and exposing the lower surface of the second bus bar; And
And a third shield surrounding the bottom surface of the third bus bar and exposing an upper surface of the third bus bar. 17. The method of claim 16,
Wherein the first shield includes a first surface, a second surface that bends and extends from the first surface, and a third surface that bends from the second surface and faces the first surface,
The second shield includes a fourth surface, a fifth surface extending from the fourth surface and extending from the fifth surface, and a sixth surface extending from the fifth surface and facing the fourth surface,
The third shield includes a seventh surface, an eighth surface extending bending from the seventh surface, and a ninth surface bent and extending from the eighth surface and facing the seventh surface. 18. The method of claim 17,
The second surface of the first shield contacts the lower surface of the first bus bar,
The fifth surface of the second shield contacts an upper surface of the second bus bar,
And the eighth surface of the third shield contacts the bottom surface of the third bus bar. 18. The method of claim 17,
And the fifth surface of the second shield is located below the distal end of the third surface of the first shield and the seventh surface of the third shield. 18. The method of claim 17,
Wherein the second bus bar is located above the first bus bar and the third bus bar. 17. The method of claim 16,
The length of the second surface of the first shield in the second direction intersecting with the first direction is equal to or smaller than the length of the first bus bar in the second direction,
The length of the fifth surface of the second shield in the second direction is equal to or smaller than the length of the second bus bar in the second direction,
And the length of the eighth surface of the third shield in the second direction is equal to or less than the length of the third bus bar in the second direction. A first current sensor for measuring a current flowing through the first bus bar and the first bus bar;
A second bus bar spaced apart from the first bus bar and a second current sensor for measuring a current flowing through the second bus bar;
A third bus bar spaced apart from the first bus bar and the second bus bar, and a third current sensor for measuring a current flowing through the third bus bar;
A first shield surrounding the lower surface of the first bus bar and exposing an upper surface of the first bus bar;
A second shield surrounding the upper surface of the second bus bar and exposing the lower surface of the second bus bar; And
And a third shield surrounding the top surface of the third bus bar and exposing the bottom surface of the third bus bar. 23. The method of claim 22,
And the second bus bar and the third bus bar are disposed on both sides with respect to the first bus bar. 23. The method of claim 22,
Wherein the first shield includes a first surface, a second surface that bends and extends from the first surface, and a third surface that bends from the second surface and faces the first surface,
The second shield includes a fourth surface, a fifth surface extending from the fourth surface and extending from the fifth surface, and a sixth surface extending from the fifth surface and facing the fourth surface,
The third shield includes a seventh surface, an eighth surface extending bending from the seventh surface, and a ninth surface bent and extending from the eighth surface and facing the seventh surface. 25. The method of claim 24,
The second surface of the first shield contacts the lower surface of the first bus bar,
The fifth surface of the second shield contacts an upper surface of the second bus bar,
And the eighth surface of the third shield contacts the top surface of the third bus bar. 25. The method of claim 24,
Wherein the second surface of the first shield is positioned above the terminal end of the fourth surface of the second shield and the ninth surface of the third shield. 25. The method of claim 24,
Wherein the first bus bar is located below the second bus bar and the third bus bar. 23. The method of claim 22,
The length of the second surface of the first shield is equal to or smaller than the length of the first bus bar,
The length of the fifth surface of the second shield is equal to or smaller than the length of the second bus bar,
The length of the eighth surface of the third shield is equal to or smaller than the length of the third bus bar,
Wherein the length is a length in a direction intersecting with a direction in which the first to third bus bars are spaced apart.
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KR20190124762A (en) * 2017-03-08 2019-11-05 하르팅 에렉트릭 게엠베하 운트 코우. 카게 Current sensor assembly and method

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