KR20170018152A - Organic light emitting display device and the method for driving the same - Google Patents

Abstract

Embodiments of the present invention relate to an organic light emitting display device and a driving method thereof. The organic light emitting display device can eventually improve an image quality by monitoring an abnormality state of memory power supplied to a main memory in which sensing data are stored, and performing a sensing and compensating malfunction prevention function according to a monitoring result, thereby normally calculating compensation data by preventing an error of the sensing data.

Description

Technical Field [0001] The present invention relates to an organic light emitting diode (OLED) display device,

The present embodiments relate to an organic light emitting display and a driving method thereof.

2. Description of the Related Art [0002] In recent years, an organic light emitting diode (OLED) display device that has been widely known as an organic light emitting display device has advantages of high response speed, high luminous efficiency, luminance, and viewing angle by using an organic light emitting diode (OLED)

Each of the sub-pixels of the organic light emitting display may include an organic light emitting diode and a transistor necessary for driving the organic light emitting diode.

On the other hand, circuit elements such as transistors and organic light emitting diodes in each sub-pixel have unique characteristic values. For example, the transistor has a characteristic value such as a threshold voltage and a mobility, and the organic light emitting diode has a characteristic value such as a threshold voltage.

The circuit elements such as transistors and organic light emitting diodes in each sub-pixel may undergo degradation according to driving time, and unique characteristic values such as threshold voltage and mobility may be changed.

Because of these points, there is a difference in degree of deterioration between circuit elements depending on the difference in driving time between the circuit elements in each sub-pixel, and a characteristic value deviation between the circuit elements may also occur.

Such a characteristic value deviation (sub-pixel characteristic value deviation) between the circuit elements may cause a luminance deviation between each sub-pixel, which may become a main factor causing image quality degradation.

Accordingly, various techniques have been developed to compensate for the deviation of sub-pixel characteristic values.

On the other hand, in order to compensate for the deviation of the sub-pixel characteristic values, a process of sensing the sub-pixel characteristic values is indispensable.

Therefore, in order to compensate the sub-pixel characteristic value deviation without error to improve the image quality, accurate detection of the sub-pixel characteristic value without error must be assured.

However, at present, an error occurs in the sensing data obtained through the sensing drive of the subpixel characteristic values, and this has not been solved.

The purpose of these embodiments is to prevent erroneous sensing data on sub-pixel property values.

Another object of the present embodiments is to prevent the sensing and compensating malfunctions of the sub-pixel characteristic values.

Yet another object of the present invention is to prevent sensing and compensating malfunctions due to power supply anomalies in the main memory storing sensing data for sub-pixel characteristic values.

One embodiment of the present invention provides an organic light emitting display device capable of monitoring an abnormality of a memory power supplied to a main memory in which sensing data is stored and performing a sensing and compensating malfunction prevention function according to a result of the monitoring, have.

Another embodiment is an organic light emitting display device including an organic light emitting display panel in which a plurality of subpixels are arranged in a matrix type and in which two or more sensing lines are arranged and a plurality of subpixels A main memory for storing sensing data output from the sensing unit using a memory power source during a panel sensing period, and a control unit for supplying sensing data to the main memory during a panel sensing period And a malfunction prevention unit for outputting a panel sensing operation control signal according to a monitoring result of the memory power monitoring unit during a panel sensing period.

According to another embodiment of the present invention, there is provided a method of driving an organic light emitting display, comprising: sensing a voltage of a sensing line connected to a first subpixel through sensing driving for a first subpixel to generate sensing data for a first subpixel A sensing data storing step of storing sensed data of the first sub-pixel in the main memory, and a sensing data storing step of storing sensing data of the first sub-pixel in the main memory, And a sensing data error prevention step of controlling the sensing driving to be restarted.

According to the embodiments as described above, it is possible to prevent the error of the sensing data with respect to the sub-pixel characteristic values, thereby enabling accurate compensation value calculation and image quality improvement.

According to the embodiments, it is possible to prevent the sensing and compensating malfunctions of the sub-pixel characteristic values, thereby enabling accurate compensation value calculation and image quality improvement.

According to the embodiments of the present invention, it is possible to prevent sensing and compensating malfunction due to power supply anomaly in the main memory storing sensing data for the sub-pixel characteristic values, thereby enabling accurate compensation value calculation and image quality improvement have.

1 is a schematic system configuration diagram of an organic light emitting display according to the present embodiments.
FIG. 2 is a view illustrating an example of a sub-pixel structure of an OLED display according to an exemplary embodiment of the present invention. Referring to FIG.
FIG. 3 is a diagram illustrating an example of a compensation circuit of the OLED display according to the present embodiments. Referring to FIG.
4 is a view for explaining the threshold voltage sensing principle of the organic light emitting diode display according to the present embodiments.
5 is a view for explaining the principle of mobility sensing of the organic light emitting display according to the present embodiments.
6 is an exemplary diagram illustrating a sensing driving period of the organic light emitting diode display according to the exemplary embodiments of the present invention.
7 is a layout view of the sensing line of the OLED display according to the present embodiment.
8 is a view showing another sensing line arrangement of the OLED display according to the present embodiments.
FIG. 9 is a diagram illustrating a sensing and compensation system of an OLED display according to an embodiment of the present invention. Referring to FIG.
10 is a diagram illustrating a sensing and compensation malfunction prevention system included in the organic light emitting display according to the present embodiments.
11 is a view for explaining a method of monitoring the presence or absence of a memory power source in the OLED display according to the present embodiments.
12 is a schematic flowchart of a driving method for preventing sensing and compensating malfunction of the organic light emitting diode display according to the present embodiments.
13 is a specific flowchart illustrating a driving method for preventing sensing and compensation erroneous operation of the OLED display according to the present embodiments.

Hereinafter, some embodiments of the present invention will be described in detail with reference to exemplary drawings. In the drawings, like reference numerals are used to denote like elements throughout the drawings, even if they are shown on different drawings. In the following description of the present invention, a detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear.

In describing the components of the present invention, terms such as first, second, A, B, (a), and (b) may be used. These terms are intended to distinguish the components from other components, and the terms do not limit the nature, order, order, or number of the components. When a component is described as being "connected", "coupled", or "connected" to another component, the component may be directly connected or connected to the other component, Quot; intervening "or that each component may be" connected, "" coupled, "or " connected" through other components.

FIG. 1 is a schematic system configuration diagram of an organic light emitting diode display 100 according to the present embodiments.

1, the OLED display 100 according to the present embodiment includes a plurality of data lines DL1 to DLm and a plurality of gate lines GL1 to GLn, A data driver 120 for driving a plurality of data lines DL1 to DLm and a plurality of data lines DL1 to DLm for driving the plurality of gate lines GL1 to GLn, A gate driver 130, a controller 140 for controlling the data driver 120 and the gate driver 130, and the like.

The controller 140 supplies various control signals to the data driver 120 and the gate driver 130 to control the data driver 120 and the gate driver 130.

The controller 140 starts scanning according to the timing implemented in each frame, switches the input image data input from the outside according to the data signal format used by the data driver 120, and outputs the converted image data , And controls the data driving at a suitable time according to the scan.

The controller 140 may be a timing controller used in a conventional display technology or a control device including a timing controller to perform other control functions.

The data driver 120 drives the plurality of data lines DL1 to DLm by supplying data voltages to the plurality of data lines DL1 to DLm. Here, the data driver 120 is also referred to as a 'source driver'.

The gate driver 130 sequentially drives the plurality of gate lines GL1 to GLn by sequentially supplying scan signals to the plurality of gate lines GL1 to GLn. Here, the gate driver 130 is also referred to as a " scan driver ".

The gate driver 130 sequentially supplies a scan signal of an On voltage or an Off voltage to the plurality of gate lines GL1 to GLn under the control of the controller 140. [

When a specific gate line is opened by the gate driver 130, the data driver 120 converts the image data received from the controller 140 into analog data voltages and supplies them to the plurality of data lines DL1 to DLm .

1, the data driver 120 is located only on one side (e.g., on the upper side or the lower side) of the organic light emitting display panel 110, : Upper side and lower side).

1, the gate driver 130 is located only on one side (e.g., the left side or the right side) of the organic light emitting display panel 110. However, the gate driver 130 may be disposed on both sides of the organic light emitting display panel 110 For example, left and right).

The controller 140 described above is capable of outputting various kinds of signals including the vertical synchronization signal Vsync, the horizontal synchronization signal Hsync, the input data enable signal (DE), and the clock signal (CLK) Timing signals from the outside (e.g., the host system).

The controller 140 outputs the converted image data by switching the input image data inputted from the outside in accordance with the data signal format used by the data driver 120 and outputs the converted image data to the data driver 120 and the gate driver 130, A timing signal such as a vertical synchronization signal Vsync, a horizontal synchronization signal Hsync, an input DE signal and a clock signal and generates various control signals to control the data driver 120 and the gate driver 130, .

For example, in order to control the gate driver 130, the controller 140 generates a gate start pulse (GSP), a gate shift clock (GSC), a gate output enable signal GOE Gate Output Enable), and the like.

Here, the gate start pulse GSP controls the operation start timing of one or more gate driver integrated circuits constituting the gate driver 130. The gate shift clock GSC is a clock signal commonly input to one or more gate driver integrated circuits, and controls the shift timing of the scan signal (gate pulse). The gate output enable signal GOE specifies the timing information of one or more gate driver ICs.

In order to control the data driver 120, the controller 140 may further include a source start pulse (SSP), a source sampling clock (SSC), a source output enable signal (SOE) And outputs various data control signals (DCS: Data Control Signals).

Here, the source start pulse SSP controls the data sampling start timing of one or more source driver integrated circuits constituting the data driver 120. The source sampling clock SSC is a clock signal for controlling sampling timing of data in each of the source driver integrated circuits. The source output enable signal SOE controls the output timing of the data driver 120.

The data driver 120 may drive a plurality of data lines including at least one source driver integrated circuit (SDIC).

Each source driver integrated circuit (SDIC) is connected to a bonding pad of the organic light emitting display panel 110 by a tape automated bonding (TAB) method or a chip on glass (COG) Or may be directly disposed on the organic light emitting display panel 110, and may be integrated and disposed on the organic light emitting display panel 110, as the case may be. In addition, each source driver integrated circuit (SDIC) may be implemented by a chip on film (COF) method, which is mounted on a film connected to the organic light emitting display panel 110.

Each source driver integrated circuit (SDIC) may include a shift register, a latch circuit, a digital to analog converter (DAC), an output buffer, and the like.

Each source driver integrated circuit (SDIC) may further include an analog to digital converter (ADC), as the case may be.

The gate driver 130 may include at least one gate driver integrated circuit (GDIC).

Each gate driver integrated circuit GDIC may be connected to a bonding pad of the organic light emitting display panel 110 by a tape automated bonding (TAB) method or a chip on glass (COG) ) Type and may be directly disposed on the organic light emitting display panel 110 or may be integrated on the organic light emitting display panel 110 as the case may be. In addition, each gate driver IC (GDIC) may be implemented by a chip on film (COF) method, which is mounted on a film connected to the organic light emitting display panel 110.

Each gate driver IC (GDIC) may include a shift register, a level shifter, and the like.

The OLED display 100 according to the present embodiments includes at least one source printed circuit board (S-PCB) necessary for circuit connection to at least one source driver IC (SDIC) And a control printed circuit board (C-PCB) for mounting control components and various electric devices.

At least one source driver integrated circuit (SDIC) may be mounted on at least one source printed circuit board (S-PCB), or a film on which at least one source driver integrated circuit (SDIC) is mounted may be connected.

The control printed circuit board (C-PCB) is provided with a controller 140 for controlling the operation of the data driver 120 and the gate driver 130 and the like, and a controller 140 for controlling operations of the organic light emitting display panel 110, the data driver 120, A power controller for controlling various voltages or currents to supply or supply various voltages or currents to the battery 130, or the like.

The at least one source printed circuit board (S-PCB) and the control printed circuit board (C-PCB) may be circuitly connected via at least one connecting member.

Here, the connecting member may be a flexible printed circuit (FPC), a flexible flat cable (FFC), or the like.

At least one source printed circuit board (S-PCB) and a control printed circuit board (C-PCB) may be integrated into one printed circuit board.

The organic light emitting diode display 100 according to the exemplary embodiments of the present invention may be applied to a liquid crystal display device such as a liquid crystal display device, an organic light emitting display device, a plasma organic light emitting display device, But may be of various types.

Each sub-pixel SP disposed in the organic light emitting display panel 110 may include a circuit element such as a transistor.

For example, when the organic light emitting display panel 110 is an organic light emitting display panel, each sub pixel SP includes an organic light emitting diode (OLED) and a driving transistor for driving the organic light emitting diode Circuit elements.

The types and the number of the circuit elements constituting each subpixel SP can be variously determined depending on the providing function, the design method, and the like.

FIG. 2 is a view illustrating exemplary sub-pixel structures of the OLED display 100 according to the exemplary embodiments of the present invention.

Referring to FIG. 2, in the OLED display 100 according to the present embodiment, each sub-pixel basically includes an organic light emitting diode (OLED) and an organic light emitting diode (OLED) A switching transistor SWT for transmitting a data voltage to a second node N2 corresponding to a gate node of the driving transistor DRT; And a storage capacitor (Cstg) for maintaining a data voltage or a voltage corresponding to the data voltage for one frame time.

The organic light emitting diode OLED may include a first electrode (e.g., an anode electrode), an organic layer, and a second electrode (e.g., a cathode electrode).

The driving transistor DRT drives the organic light emitting diode OLED by supplying a driving current to the organic light emitting diode OLED.

The first node N1 of the driving transistor DRT may be electrically connected to the first electrode of the organic light emitting diode OLED and may be a source node or a drain node. The second node N2 of the driving transistor DRT may be electrically connected to the source node or the drain node of the switching transistor SWT and may be a gate node. The third node N3 of the driving transistor DRT may be electrically connected to a driving voltage line DVL for supplying a driving voltage EVDD and may be a drain node or a source node.

The driving transistor DRT and the switching transistor SWT may be implemented as an n-type or a p-type as illustrated in FIG.

The switching transistor SWT is electrically connected between the data line DL and the second node N2 of the driving transistor DRT and can be controlled by receiving the scan signal SCAN through the gate line to the gate node .

The switching transistor SWT may be turned on by the scan signal SCAN to transfer the data voltage Vdata supplied from the data line DL to the second node N2 of the driving transistor DRT.

The storage capacitor Cstg is electrically connected between the first node N1 and the second node N2 of the driving transistor DRT.

The storage capacitor Cstg is not a parasitic capacitor (e.g., Cgs, Cgd) that is an internal capacitor existing between the first node N1 and the second node N2 of the driving transistor DRT, And is an external capacitor intentionally designed outside the transistor DRT.

In the OLED display 100 according to the present embodiment, as the driving time of each sub-pixel SP becomes longer, the driving voltage of the organic light emitting diode OLED, the driving transistor DRT, Degradation can proceed.

Accordingly, inherent characteristic values (e.g., threshold voltage, mobility, etc.) of the circuit elements such as the organic light emitting diode OLED and the driving transistor DRT can be changed.

Such a change in the characteristic value of the circuit element causes the luminance change of the corresponding sub-pixel. Therefore, the change in the characteristic value of the circuit element can be used in the same concept as the change in luminance of the subpixel.

In addition, the degree of change in the characteristic value between the circuit elements may be different depending on the degree of deterioration of each circuit element.

Such a characteristic value deviation between the circuit elements causes a luminance deviation between the subpixels. Therefore, the characteristic value deviation between the circuit elements can be used in the same concept as the luminance deviation between the subpixels.

The above-described subpixel luminance variation and subpixel luminance variation may cause problems such as degradation of the accuracy with respect to the luminance expression power of the subpixels or occurrence of screen abnormal phenomenon.

Here, the characteristic value of a circuit element (hereinafter also referred to as a "subpixel characteristic value") may include, for example, a threshold voltage and a mobility of a driving transistor DRT, May include the threshold voltage of the transistor.

The OLED display 100 according to the present embodiment has a sensing function for sensing a sub-pixel luminance change and a sub-pixel luminance deviation (a characteristic value change of a circuit element and a characteristic value deviation between circuit elements) The compensation function for compensating the sub-pixel luminance variation and the sub-pixel luminance deviation can be provided.

The organic light emitting diode display 100 according to the present embodiments provides a subpixel structure to provide a sensing and compensating function for a subpixel luminance change and a luminance deviation between subpixels.

Referring to FIG. 2, each sub-pixel disposed in the organic light emitting display panel 110 according to the present exemplary embodiment includes an organic light emitting diode OLED, a driving transistor DRT, , A switching transistor (SWT), and a storage capacitor (Cstg), as well as a sensing transistor (SENT).

2, the sensing transistor SENT includes a first node N1 of the driving transistor DRT and s (s2) sensing lines SL for supplying a reference voltage Vref , SL # 1, ..., SL # s in FIG. 7 or FIG. 8), and may be controlled by receiving a sensing signal SENSE as a kind of a scan signal to the gate node .

The sensing transistor SENT is turned on by the sensing signal SENSE and applies the reference voltage Vref supplied through the sensing line SL to the first node N1 of the driving transistor DRT.

Also, the sensing transistor SENT may be utilized as one of the voltage sensing paths for the first node N1 of the driving transistor DRT.

Meanwhile, the scan signal SCAN and the sense signal SENSE may be separate gate signals. In this case, the scan signal SCAN and the sense signal SENSE may be respectively applied to the gate node of the switching transistor SWT and the gate node of the sensing transistor SENT through another gate line.

In some cases, the scan signal SCAN and the sense signal SENSE may be the same gate signal. In this case, the scan signal SCAN and the sense signal SENSE may be commonly applied to the gate node of the switching transistor SWT and the gate node of the sensing transistor SENT through the same gate line.

According to the above-described subpixel structure, it is possible to more accurately sense the characteristic value or the characteristic value change (characteristic value deviation) of the circuit elements (for example, driving transistor DRT, organic light emitting diode OLED) in the subpixel.

The organic light emitting diode display 100 according to the present embodiment includes a sensing and compensation structure as well as the subpixel structure described above in order to provide a sensing and compensating function for a subpixel luminance change and a luminance deviation between subpixels Can be provided.

3 is an exemplary view of a compensation circuit of the OLED display 100 according to the present embodiments.

Referring to FIG. 3, the organic light emitting display 100 according to the present embodiment senses a deviation between a sub-pixel characteristic value (a characteristic value of the driving transistor, a characteristic of the organic light emitting diode) and / A main memory 320 for storing sensing data, a compensation unit 320 for compensating a variation between sub-pixel characteristic values and / or sub-pixel characteristic values using sensing data, a sensing unit 310 for outputting sensing data, (330), and the like.

The sensing unit 310 may include at least one analog-to-digital converter (ADC).

Each analog-to-digital converter (ADC) may be included inside the source driver integrated circuit (SDIC) and, in some cases, may be included outside the source driver integrated circuit (SDIC).

The compensation unit 320 may be included inside the controller 140 and may be included outside the controller 140 in some cases.

The sensing data output from the sensing unit 310 may be, for example, a Low Voltage Differential Signaling (LVDS) data format.

The organic light emitting diode display 100 according to the present exemplary embodiment is configured to control the driving of the driving transistor DRT within the subpixel SP by controlling the voltage application state of the first node N1 in the subpixel SP, And may further include a first switch SW1 and a second switch SW2 in order to control a state required for sensing.

The supply of the reference voltage Vref to the sensing line SL can be controlled through the first switch SW1.

When the first switch SW1 is turned on, the reference voltage Vref is supplied to the sensing line SL and is supplied to the first node N1 of the driving transistor DRT through the sensing transistor SENT, Lt; / RTI >

Here, since the sensing line SL serves as a transfer line for the reference voltage Vref, it may be referred to as a reference voltage line.

On the other hand, when the voltage of the first node N1 of the driving transistor DRT becomes a voltage state reflecting the sub-pixel characteristic value, the sensing line SL (which may be of the same potential as the first node N1 of the driving transistor DRT) May also be a voltage state reflecting the sub-pixel characteristic value. At this time, the line capacitor formed on the sensing line SL may be charged with a voltage reflecting the sub-pixel characteristic value.

When the voltage of the first node N1 of the driving transistor DRT becomes a voltage state reflecting the sub pixel characteristic value, the second switch SW2 is turned on so that the sensing portion 310 and the sensing line SL Can be connected.

Accordingly, the sensing unit 310 senses the voltage of the sensing line SL, that is, the voltage of the first node N1 of the driving transistor DRT, which reflects the sub-pixel characteristic value.

One such sensing line SL may be arranged for each subpixel column or one for every two or more subpixel columns.

For example, when one pixel is composed of four subpixels (red subpixel, white subpixel, green subpixel, and blue subpixel), the sensing line SL includes four subpixel columns (red subpixel columns, A green subpixel column, a blue subpixel column, a white subpixel column, a green subpixel column, and a blue subpixel column).

When the sensing unit 310 is connected to the sensing line SL, the voltage of the first node N1 of the driving transistor DRT (the voltage of the sensing line SL or the potential of the line capacitor on the sensing line SL) Voltage) is sensed.

The voltage sensed by the sensing unit 310 may be a voltage value Vdata-Vth or Vdata-? Vth including the threshold voltage Vth or the threshold voltage variation? Vth of the driving transistor DRT, May be a voltage value for sensing the degree of mobility.

Referring to FIG. 3, the sensing unit 310 converts the sensed voltage to sensing data corresponding to a digital sensing value for threshold voltage sensing or mobility sensing, and outputs the sensed data.

The sensing data output from the sensing unit 310 may be stored in the main memory 320 or may be provided to the compensating unit 330.

The compensation unit 330 may store characteristic values (for example, threshold voltage, mobility) of the driving transistor DRT in the corresponding subpixel or a characteristic value (e.g., threshold voltage or mobility) of the driving transistor DRT based on the sensing data stored in the main memory 320 or provided by the sensing unit 310 (For example, a change in threshold voltage and a change in mobility), and perform a compensation process.

Here, the change in the characteristic value of the driving transistor DRT means that the current sensing data is changed based on the previous sensing data, or the current sensing data is changed based on the reference sensing data.

Here, when comparing the characteristic value or the characteristic value change between the driving transistors DRT, it is possible to grasp the characteristic value deviation between the driving transistors DRT. When the characteristic value change of the driving transistor DRT means that the current sensing data is changed based on the reference sensing data, the characteristic value deviation (i.e., the sub pixel luminance deviation) between the driving transistors DRT from the characteristic value change of the driving transistor DRT, .

The compensation unit 330 may perform at least one compensation process among the threshold voltage compensation process for compensating the threshold voltage of the driving transistor DRT and the mobility compensation process for compensating the mobility of the driving transistor DRT.

In the threshold voltage compensation process, compensation data for compensating a threshold voltage or a threshold voltage variation (threshold voltage variation) is generated through an operation process, the generated compensation data is stored in the main memory 320, (Data).

The mobility compensation process generates compensation data for compensating mobility or mobility deviation (mobility change) through an operation process, stores the generated compensation data in the main memory 320, (Data).

The compensation unit 330 may change the image data through the threshold voltage compensation process or mobility compensation process and supply the changed data to the corresponding source driver integrated circuit (SDIC) in the data driver 120.

Accordingly, the source driver integrated circuit (SDIC) converts the changed data into the data voltage (Vdata ') and supplies the data voltage to the corresponding subpixel, so that the subpixel characteristic value compensation (threshold voltage compensation, mobility compensation) is actually performed.

By compensating for the subpixel characteristic value, luminance deviation between the subpixels is reduced or prevented, thereby improving the image quality.

In the following, the threshold voltage sensing principle and the mobility sensing principle for the driving transistor DRT will be briefly described with reference to Figs. 4 and 5. Fig. 4 and 5, it is assumed that the first node N1 of the driving transistor DRT is the source node and the second node N2 of the driving transistor DRT is the gate node.

4 is a view for explaining the threshold voltage sensing principle of the OLED display 100 according to the present embodiments.

4, when the threshold voltage sensing operation of the driving transistor DRT is performed, the source node and the gate node of the driving transistor DRT respectively receive the threshold voltage sensing reference voltage Vref and the threshold voltage sensing data voltage Vdata ).

That is, at the time of initialization, the voltage Vs of the source node of the driving transistor DRT is the reference voltage Vref for sensing the threshold voltage, and the voltage Vg of the gate node of the driving transistor DRT is the threshold voltage sensing data voltage (Vdata).

Thereafter, the source node of the driving transistor DRT floats, and the voltage Vs of the source node of the driving transistor DRT rises due to the source following phenomenon. As the time elapses, the voltage Vs at the source node of the driving transistor DRT gradually decreases in width and saturates.

The saturated voltage Vs of the source node of the driving transistor DRT may correspond to the difference between the data voltage Vdata and the threshold voltage Vth or the difference between the data voltage Vdata and the threshold voltage variation Vth. Here, the threshold voltage Vth or the threshold voltage variation? Vth may be the positive threshold voltage Vth or the positive threshold voltage variation? Vth or may be the negative threshold voltage Vth or the negative threshold voltage variation? .

The sensing unit 310 senses the saturated voltage Vs of the source node of the driving transistor DRT when the voltage Vs of the source node of the driving transistor DRT becomes saturated.

The voltage Vsense sensed by the sensing unit 410 is a voltage (Vsense = Vdata-Vth) obtained by subtracting the threshold voltage Vth from the data voltage Vdata or a voltage Vdata minus the threshold voltage variation? (Vsense = Vdata -? Vth).

5 is a view for explaining the principle of the mobility sensing of the OLED display 100 according to the present embodiments.

 5, when the mobility sensing operation for the driving transistor DRT is performed, the source node and the gate node of the driving transistor DRT respectively receive the reference voltage Vref for sensing the mobility and the data voltage Vdata + DELTA Vsense).

That is, at the time of initialization, the voltage Vs of the source node of the driving transistor DRT is the reference voltage Vref for the mobility sensing, and the voltage Vg of the gate node of the driving transistor DRT is the data voltage (Vdata + DELTA Vsense). Here, if the threshold voltage compensation is performed before the mobility sensing operation,? Vsense corresponds to the threshold voltage compensation data (compensation value).

Thereafter, both the source node and the gate node of the driving transistor DRT float, and the voltage of the source node and the gate node of the driving transistor DRT can rise.

At this time, the voltage rising rate (voltage variation amount DELTA V with respect to time) means the current capability of the driving transistor DRT, that is, the mobility. Therefore, the voltage rise of the source node of the driving transistor DRT becomes more steep as the driving transistor DRT having a larger current capability (mobility) is.

The sensing unit 310 may sense the voltage Vs of the source node of the driving transistor DRT after the voltage has been increased for a predetermined period of time, that is, the voltage of the source node of the driving transistor DRT, And senses the voltage of the sensing line SL that has been raised.

6 is a diagram illustrating an example of a sensing driving period of the OLED display 100 according to the exemplary embodiments of the present invention.

Referring to FIG. 6, at least one of the threshold voltage sensing drive and the mobility sensing operation described above may be performed when a power off signal occurs.

In this manner, when the sensing driving (threshold voltage sensing driving and / or the movement degree sensing driving) progresses at the time of generating the power-off signal, this sensing driving is referred to as off-sensing driving.

Considering the total sensing time for all the subpixels disposed in the organic light emitting display panel 110, the off-sensing driving is performed in a manner that the voltage saturation time of the first node N1 of the driving transistor DRT is required Therefore, the movement may be a threshold voltage sensing drive that takes a relatively long time compared to the sensing drive.

Referring to FIG. 6, at least one of the above-described threshold voltage sensing drive and mobility sensing drive may be performed before the power-off signal is generated, during image driving, or between image driving intervals.

In this way, when sensing driving (threshold voltage sensing driving and / or mobility sensing driving) progresses before the power-off signal is generated, this sensing driving is referred to as on-sensing driving.

Considering the total sensing time for all the subpixels arranged in the organic light emitting display panel 110, the on-sensing driving may be a mobility sensing driving with a relatively short time compared to the threshold voltage sensing driving .

7 and 8 are diagrams showing examples of arrangement of the s sensing lines SL # 1, ..., SL #s, s? 2 in the OLED display 100 according to the present embodiments.

7 and 8, the s sensing lines SL # 1, ..., SL #s, s? 2 are arranged in the subpixel column direction (corresponding to the arrangement direction of the data lines) As shown in FIG.

Referring to FIG. 7, one of the s sensing lines SL # 1, ..., SL # s may be arranged in one sub-pixel column. That is, the s sensing lines SL # 1, ..., SL # s may be electrically connected to the subpixels included in one subpixel column.

In this case, the total number of sensing lines (s) is equal to the total number of data lines (m).

Referring to FIG. 8, one of the s sensing lines SL # 1, ..., SL # s may be arranged for every two or more sub-pixel columns. That is, the s sensing lines SL # 1, ..., SL #s may be electrically connected to subpixels included in two subpixel columns.

For example, the s sensing lines SL # 1, ..., SL # s may be arranged for every four sub-pixel columns.

For example, when a red subpixel, a green subpixel, a blue subpixel, and a white subpixel constitute one pixel, as shown in FIG. 8, the s sensing lines SL # 1, ..., SL # ) May be arranged in four subpixel columns (a red subpixel column, a green subpixel column, a blue subpixel column, and a white subpixel column), i.e., one for each one pixel column.

In this case, the total number of sensing lines (s) is 1/4 of the total number of data lines (m).

As shown in FIG. 7, when one sensing line is arranged per one subpixel column, the sensing unit 310 can simultaneously sense all the subpixels included in one subpixel row.

That is, the sensing unit 310 senses the voltage of each of the two or more sensing lines SL # 1, ..., SL # s for each of the plurality of sub-pixel rows during the panel sensing period, Generates sensing data for subpixels electrically connected to each of the two or more sensing lines SL # 1, ..., SL # s, and outputs the generated sensing data. Here, the panel sensing period means a period in which sensing is performed on all the subpixels arranged in the organic light emitting display panel 110.

As a result, the speed of sensing one subpixel row is increased, and the speed of sensing all the subpixels arranged in the organic light emitting display panel 110 can be fast enough.

However, in this case, the total number of sensing lines increases, so that the aperture ratio of the organic light emitting display panel 110 can be reduced.

As shown in FIG. 8, when one sensing line is arranged for every four subpixel rows, the sensing unit 310 can not simultaneously sense all the subpixels included in one subpixel row.

For example, the sensing unit 310 senses voltages of two or more sensing lines SL # 1, ..., SL # s for each of a plurality of sub-pixel rows during a panel sensing period, Among the subpixels electrically connected to each of the two or more sensing lines (SL # 1, ..., SL # s) included in the pixel row, generates and outputs sensing data for subpixels emitting light of the same color .

Accordingly, in one subpixel row, only one subpixel among four subpixels (R, W, G, B) connected to one sensing line can be sensed, so that all In order to sense subpixels, four sensing operations are required.

Therefore, the time required to sense all the sub-pixels arranged in the organic light emitting display panel 110 is four times longer than in the case of FIG.

However, as shown in FIG. 8, when one sensing line is arranged for every four sub-pixel columns, the total number of sensing lines s becomes m / 4, which is reduced to 1/4 of the case of FIG.

The reduction of the total number of sensing lines has the advantage that the aperture ratio of the OLED display panel 110 can be increased.

While the sensing data stored in the main memory 320 is continuously stored during the panel sensing operation in the OLED display 100 according to the present embodiment, Erroneous sensing data is stored in the main memory 320, which may result in erroneous compensation data due to erroneous sensing data, resulting in erroneous compensation for the subpixel. This leads to image quality deterioration and can cause serious quality deterioration.

Accordingly, the OLED display 100 according to the present embodiment monitors whether there is an abnormality in the memory power supplied to the main memory 320 when the panel sensing operation is performed, By doing so, it is possible to prevent erroneous sensing data from being stored in the main memory 320, thereby providing a sensing and compensating malfunction prevention function that can prevent image quality degradation.

Hereinafter, the sensing and compensating malfunction prevention function of the organic light emitting diode display 100 according to the present embodiments will be described in more detail. 8, the s sensing lines SL # 1, ..., SL #s, s? 2 are arranged in the subpixel column direction (corresponding to the arrangement direction of the data lines) One subpixel column is arranged for each subpixel column.

9 is a diagram illustrating a sensing and compensation system of the OLED display 100 according to the present embodiments.

9, the sensing and compensation system of the OLED display 100 according to the present embodiment includes a sensing unit 310, a main memory 320, a compensation unit 330, a sensing drive control unit 900, And the like.

The sensing drive control unit 900 may perform panel sensing that senses characteristic values of all the subpixels disposed in the organic light emitting display panel 110 (e.g., threshold voltage or mobility of the driving transistor, threshold voltage of the organic light emitting diode, and the like) .

Such panel sensing may be an off-sensing operation that occurs after a power-off signal has been generated. Depending on the case, the panel sensing may be performed during image driving before the power-off signal is generated, - < / RTI > sensing (On-Sensing).

The sensing drive control unit 900 drives corresponding subpixels for each subpixel row (or each subpixel column) according to a predetermined sensing driving procedure during the panel sensing period, that is, For example, N1, N2, etc.) so that the characteristic value of the corresponding subpixel can be reflected in the voltage of the sensing line.

The sensing unit 310 senses two or more sensing lines SL # 1, ..., SL (for example, through sensing drive for each sub-pixel row) through sensing drive control of the sensing drive control unit 900 during a panel sensing period # s), the voltage of each of the two or more sensing lines SL # 1, ..., SL # s is sensed to generate and output sensing data.

The sensing unit 310 may include at least one analog-to-digital converter (ADC) electrically connected to two or more sensing lines SL # 1, ..., SL # s.

The analog-to-digital converter (ADC) senses the voltage of each electrically connected at least one sensing line, converts the sensed voltage into a sensing value in digital form, generates sensing data including sensing values converted into digital form And output it.

Such analog-to-digital converters (ADCs) may be external to the source driver integrated circuit (SDIC) or may be included within the source driver integrated circuit (SDIC).

For example, when one source driver IC (SDIC) includes one analog digital converter (ADC), depending on the number of data lines connected to one source driver IC (SDIC), one analog digital The number of sensing lines connected to the converter (ADC) can be determined.

As a concrete example, in the case where the number of data lines is 1920, the number of source driver integrated circuits (SDIC) is 10, and one sensing line is arranged for every four subpixel rows, one source driver integrated circuit (SDIC) One analog digital converter (ADC) connected to 192 (= 1920/10) data lines and one source driver integrated circuit (SDIC) can be connected to 48 (= 192/4) sensing lines.

As described above, by implementing the sensing unit 310 including at least one analog-to-digital converter (ADC), the subpixel characteristic value can be accurately grasped and compensated at the digital level.

In addition, each of the at least one analog-to-digital converter (ADC) implementing the sensing unit 310 is included in the source driver IC (SDIC), so that the number of parts can be reduced and the layout of the system can be designed.

Referring to FIG. 9, every time the sensing data is output from the sensing unit 310 during the panel sensing period, the output sensing data is stored in the main memory 320.

The main memory 320 may perform a storing operation by the memory power supplied from the power supply unit 910. [

Referring to FIG. 9, the compensation unit 330 may calculate a compensation value for each subpixel based on sensing data including a sensing value for each subpixel stored in the main memory 320. FIG.

The compensation unit 330 may change the image data for the corresponding subpixel using the calculated compensation value.

The changed image data is converted into a data voltage in the corresponding source driver integrated circuit (SDIC) and supplied to the corresponding subpixel, so that the subpixel characteristic value is compensated.

Meanwhile, when the main memory 320 stores the sensing data during the panel sensing period, if an error occurs in the memory power supplied to the main memory 320, an error may occur in the sensing data stored in the main memory 320 .

This error in the sensing data leads to an error in the compensation value, and ultimately, the subpixel characteristic value may be erroneously compensated, resulting in a problem of deteriorating the image quality.

Accordingly, the organic light emitting diode display 100 according to the present embodiment may include a sensing and compensation malfunction prevention system for monitoring an abnormality of a memory power source and preventing an error of sensing data according to a result of the monitoring.

10 is a diagram illustrating a sensing and compensation malfunction prevention system included in the OLED display 100 according to the present embodiment. FIG. 11 is a diagram illustrating a sensing and compensation malfunction prevention system included in the OLED display 100 according to the present embodiments. And a method for monitoring the presence or absence of abnormality.

Referring to FIG. 10, the sensing and compensation malfunction prevention system of the OLED display 100 according to the exemplary embodiments of the present invention includes sensing data output from the sensing unit 310 using a memory power supply during a panel sensing period A memory power monitoring unit 1000 for monitoring an abnormality of a memory power supplied to the main memory 320 during a panel sensing period and a memory power monitoring unit 1000 A malfunction prevention unit 1020 for outputting a panel sensing operation control signal according to a monitoring result of the panel sensing operation control signal.

The sensing and compensation malfunction prevention system described above can prevent errors in sensing data due to abnormality of the memory power by monitoring the abnormality of the memory power source and controlling the panel sensing operation according to the monitoring result. Accordingly, the compensation value for the subpixel can be prevented from being erroneously calculated, and ultimately, the subpixel characteristic value can be prevented from being erroneously compensated, thereby helping to improve the image quality.

Referring to FIG. 11, the memory power monitoring unit 1000 monitors the voltage of the memory power supplied to the main memory 320 during the panel sensing period, and when the monitored voltage is out of the predetermined normal range, It can be judged that there is an abnormality.

The memory power monitoring unit 1000 may be electrically connected to a point where memory power is applied in the main memory 320.

 The memory power monitoring unit 1000 may include an analog-to-digital converter (ADC) that senses the voltage of the memory power supplied to the main memory 320 and converts the sensed voltage into a digital value.

The above-mentioned normal range may be a voltage range that is equal to or lower than a predetermined lower limit value (MIN), or a digital value range for the voltage.

That is, the memory power monitoring unit 1000 may determine that there is an abnormality in the memory power when the monitored voltage or its digital value is less than the lower limit value MIN or is higher than the upper limit value MAX.

When the memory power monitoring unit 1000 described above is used, it is possible to accurately monitor the abnormality of the memory power supplied to the main memory 320 during the panel sensing period.

10, the sensing and compensation malfunction prevention system included in the OLED display 100 according to the exemplary embodiments of the present invention includes sensing data for each subpixel row stored in the main memory 320 during a panel sensing period, And a backup memory 1010 for backing up the data.

As described above, the same sensing data is stored in the backup memory 1010 every time the sensing data is stored in the main memory 320 during the panel sensing period.

The sensing data stored in the main memory 320 can be compared with the sensing data stored in the backup memory 1010 to detect errors in the sensing data stored in the main memory 320. If necessary, ) May be used for compensation value calculation.

The malfunction prevention unit 1020 detects abnormality in the memory power source of the monitoring result by the memory power monitoring unit 1000 during the panel sensing period by referring to the method using the backed up sensing data in order to prevent malfunctions related to sensing and compensation. The sensing data stored in the main memory 320 and the sensing data backed up (stored) in the backup memory 1010 are correlated with each other to determine whether or not they match.

If it is determined that there is an inconsistency as a result of the coincidence determination, the malfunction preventing unit 1020 regards that an error in the sensing data has occurred due to an abnormality in the memory power supply, and performs the control processing for obtaining the normal sensing data again .

For example, the erroneous operation prevention unit 1020 may include a sensing unit for sensing the sub-pixel row corresponding to the sensing data stored in the main memory 320 that is inconsistent with the sensing data backed up in the backup memory 1010, It is possible to output the re-progress control signal to the sensing drive control unit 900 as the panel sensing operation control signal.

If it is determined as a result of the coincidence determination during the panel sensing period, the malfunction preventing unit 1020 determines that no error occurs in the sensing data due to a memory power failure even if there is a memory power failure, The sensing operation can be controlled so as to continue according to the predetermined sensing operation procedure.

If it is determined that an error in the sensing data (that is, a discrepancy between the sensing data stored in the two memories 320 and 1010) occurs in the situation where the memory power supply abnormality is monitored, It is possible to obtain normal sensing data by controlling the sensing operation of the pixels again to obtain the sensing data again. This makes it possible to perform a normal compensation value calculation and consequently improve the image quality.

On the other hand, the malfunction prevention unit 1020 continuously measures the number of times of inconsistency between the sensing data stored in the main memory 320 and the sensing data backed up in the backup memory 1010 by a predetermined number (N times, N is a natural number equal to or greater than 1) When it occurs, it is determined that the current problem situation is not solved through the re-sensing driving, and the corresponding process other than the re-sensing driving is performed.

For example, the erroneous operation prevention unit 1020 may continuously detect whether the sensed data stored in the main memory 320 and the backed up sensing data in the backup memory 1010 do not coincide with each other for a predetermined number of times (N times, N is a natural number of 1 or more) The panel sensing abnormal state notification signal can be output to the power control unit 1030 as a panel sensing operation control signal.

After the malfunction prevention unit 1020 outputs the panel sensing abnormal state notification signal, the power source control unit 1030 performs power-off processing of the organic light emitting display 100. [

The power supply unit 910 and the main memory 320 may be reset according to the power-off of the OLED display 100. [

As described above, when the memory power failure and the sensing data error due to the memory power failure can not be solved through the re-sensing driving, the power supply unit 910 and the main memory 320 are reset through the power- The main memory 320 can be supplied with normal memory power and the main memory 320 can store normal sensing data.

On the other hand, if a power-on signal is generated after power-off processing has been performed, the compensating unit 330 performs a normal panel sensing drive before the panel sensing period immediately before the power- It is possible to compensate the characteristic value for the corresponding subpixel by using the sensing data stored in the device (not shown) or the backup memory 1010.

Even if the sensing data can not be completely obtained for all the subpixels on the organic light emitting display panel 110 because the panel sensing driving operation can not be normally completed by the sensing and compensation malfunction prevention process according to the present embodiments, It is possible to drive normal image sensing data previously obtained normally.

Meanwhile, the backup memory 1010 can back up sensing data for subpixels included in a certain number of subpixel rows.

Accordingly, the memory power monitoring unit 1000 can monitor the memory power supply abnormality for each sensing driving time for a predetermined number of (e.g., ten) subpixel rows.

In this case, the malfunction prevention unit 1020 compares the sensing data stored in the main memory 320 and the sensing data stored in the backup memory 1010 with respect to the subpixels included in a predetermined number of subpixel rows, A control signal can be output.

According to the above description, the capacity of the backup memory 1010 can be significantly reduced and the number of memory power monitoring times (memory power monitoring processing load) of the memory power monitoring unit 1000 can be significantly reduced. In addition, the load of the sensing data comparison processing of the malfunction prevention unit 1020 can be considerably reduced.

The memory power monitoring unit 1000, the malfunction prevention unit 1020 and the sensing driving unit 900 may be included outside the controller 140. The memory power monitoring unit 1000, At least one of the sensing unit 1020 and the sensing driver 900 may be included in the controller 140. [

The power control unit 1030 may be included inside or outside the controller 140, and may be included in the power controller or may be implemented as a separate power control unit.

FIG. 12 is a schematic flowchart of a driving method for preventing sensing and compensating malfunction of the organic light emitting display 100 according to the present embodiment. FIG. 13 is a flowchart illustrating a driving method of the organic light emitting display 100 according to the present embodiments. And a driving method for preventing sensing and compensating malfunction. However, for convenience of explanation, the following description will be made by way of example from the viewpoint of prevention of sensing and compensation malfunction for the first subpixel.

Referring to FIG. 12, a driving method for sensing and compensating malfunction of the organic light emitting display 100 according to the present invention includes sensing data generating step S1210, sensing data storing step S1220, Prevention step S1240, and the like.

In the sensing data generation step S1210, the sensing drive control unit 900 controls the sensing operation for the first subpixel. The sensing unit 310 senses the voltage of the sensing line connected to the first subpixel when the sensing operation is progressed to a desired sensing condition (e.g., a voltage saturation state of the first node N1 of the driving transistor DRT) To generate sensing data for the first subpixel.

In the sensed data storage step S1220, the sensing unit 310 outputs sensed data for the generated first sub-pixel, and stores sensing data for the first sub-pixel in the main memory 320. [

Using the sensing data for the first subpixel stored in the main memory 320,

In the sensing data error preventing step S1240, the malfunction preventing unit 1020 monitors the memory power supplied to the main memory 320 through the memory power monitoring unit 1000, So that the sensing operation for the pixel is performed again.

According to the above description, when the memory power abnormality is monitored, the first sub-pixel may be sensed and driven again to obtain normal sensing data for the first sub-pixel. Thus, it is possible to calculate the normal compensation value of the characteristic value for the first subpixel, and consequently to improve the image quality.

On the other hand, if the memory power is monitored as being abnormal, the sensing data for the first subpixel may be normal. In addition, a memory power abnormality phenomenon may also be a temporary phenomenon.

Therefore, it may be necessary to check whether the first sensing data is abnormal according to the memory power abnormality, instead of immediately proceeding to re-sensing the first subpixel even if a memory power failure occurs.

Hereinafter, a more detailed method will be described from this point of view.

12, after the sensing data storage step S1220, the sensing data backup step S1230 for backing up the sensing data of the first subpixel stored in the main memory 320 of the backup memory 1010 may be further performed have.

Referring to FIG. 13, the sensing data error prevention step S1240 includes a step S1310 of determining whether there is an abnormality in the memory power supplied to the main memory 320, A step S1320 of determining whether the sensing data for the first subpixel stored in the main memory 320 matches the sensing data for the first subpixel backed up in the backup memory 1010 before the power supply abnormality determination time, If it is determined that there is a mismatch, step S1360 may be performed to control re-sensing driving for the first sub-pixel to proceed again.

13, when it is determined that there is no abnormality in the memory power source in the step S1310 of determining whether there is an abnormality in the memory power source, the sensing drive control unit 900 controls all of the sub- Is sensed (S1330).

If it is determined that the sensing is completed, the compensation unit 330 may perform a compensation process for calculating compensation values for all the subpixels using all the sensing data stored in the main memory 320 (1340).

If it is determined that the sensing is not completed, the sensing drive control unit 900 proceeds to the sensing operation for the subpixel row or subpixel in the next sequence according to a predetermined sensing procedure, and the sensing unit 310 To generate the sensing data for the corresponding subpixels (S1210).

On the other hand, if it is determined in step S1320 that the sensing data for the first subpixel stored in the main memory 320 matches the sensing data for the first subpixel backed up in the backup memory 1010, The controller 900 determines whether the sensing of all the subpixels in the organic light emitting display panel 110 is completed (S1330).

If it is determined that the sensing is completed, the compensation unit 330 may perform a compensation process for calculating compensation values for all the subpixels using all the sensing data stored in the main memory 320 (1340).

If it is determined that the sensing is not completed, the sensing drive control unit 900 proceeds to the sensing operation for the subpixel row or subpixel in the next sequence according to a predetermined sensing procedure, and the sensing unit 310 To generate the sensing data for the corresponding subpixels (S1210).

On the other hand, if it is determined in step S1320 that the sensing data for the first subpixel stored in the main memory 320 matches the sensing data for the first subpixel backed up in the backup memory 1010, The sensing operation count value RESEN_COUNT and the initial value = 0 are incremented by 1 in operation S1350. In operation S1360, it is determined whether the number of consecutive re-sensing operation times RESEN_COUNT is equal to or greater than a predetermined N value.

If it is determined in step S1360 that the number of consecutive re-sensing driving times (RESEN_COUNT) increased by 1 is not equal to or greater than the predetermined N value, the malfunction prevention unit 1020 outputs a sensing re- 900 (S1370).

Accordingly, the sensing drive control unit 900 proceeds to the sensing operation for the subpixel row or subpixel in the next sequence according to a predetermined sensing procedure, and the sensing unit 310 performs sensing driving for the corresponding subpixels And generates sensing data (S1210).

If it is determined in step S1360 that the number of consecutive re-sensing driving times (RESEN_COUNT) increased by 1 is equal to or greater than the predetermined N value, that is, if the re-sensing operation for the first sub- If the process proceeds, the power-off process may proceed (S1380).

Herein, the continuous re-sensing drive count value (RESEN_COUNT) is a value indicating the number of times the sensing drive is continuously repeated for the same sub-pixel in any sub-pixel row.

Therefore, even if the sensing operation is resumed, if the memory power is not abnormal or there is no sensing data error after the sensing operation, the continuous resensening driving count value RESEN_COUNT is initialized to the initial value 0 (S1325) .

According to the embodiments as described above, it is possible to prevent the error of the sensing data with respect to the sub-pixel characteristic values, thereby enabling accurate compensation value calculation and image quality improvement.

According to the embodiments, it is possible to prevent the sensing and compensating malfunctions of the sub-pixel characteristic values, thereby enabling accurate compensation value calculation and image quality improvement.

According to the embodiments of the present invention, it is possible to prevent sensing and compensating malfunction due to power supply anomaly in the main memory storing sensing data for the sub-pixel characteristic values, thereby enabling accurate compensation value calculation and image quality improvement have.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the inventions. , Separation, substitution, and alteration of the invention will be apparent to those skilled in the art. Therefore, the embodiments disclosed in the present invention are intended to illustrate rather than limit the scope of the present invention, and the scope of the technical idea of the present invention is not limited by these embodiments. The scope of protection of the present invention should be construed according to the following claims, and all technical ideas within the scope of equivalents should be construed as falling within the scope of the present invention.

100: organic light emitting display
110: organic light emitting display panel
120: Data driver
130: gate driver
140: controller

Claims (15)

An organic light emitting display panel in which a plurality of subpixels are arranged in a matrix type and two or more sensing lines are arranged;
A sensing unit for sensing voltage of each of two or more sensing lines through a sensing drive for each subpixel row to generate and output sensing data during a panel sensing period;
A main memory for storing sensing data output from the sensing unit using the memory power during the panel sensing period;
A memory power monitoring unit for monitoring an abnormality of the memory power supplied to the main memory during the panel sensing period; And
And a malfunction prevention unit for outputting a panel sensing operation control signal according to a monitoring result of the memory power monitoring unit during the panel sensing period. The method according to claim 1,
Wherein each of the two or more sensing lines comprises:
And is electrically connected to the subpixels included in one subpixel column,
And is electrically connected to subpixels included in two or more subpixel columns. 3. The method of claim 2,
When each of the two or more sensing lines is electrically connected to subpixels included in one subpixel,
Sensing the voltage of each of the two or more sensing lines for each of a plurality of subpixel rows during the panel sensing period to generate sensing data for subpixels included in the corresponding subpixel row and electrically connected to each of the two or more sensing lines And outputs it,
When each of the two or more sensing lines is electrically connected to subpixels included in two or more subpixels,
A plurality of sensing lines for sensing a voltage of each of the two or more sensing lines for each of a plurality of subpixel rows during the panel sensing period and selecting one of subpixels electrically connected to the two or more sensing lines, And generating and outputting sensing data for the subpixels emitting light. The method according to claim 1,
The sensing unit includes:
At least one analog to digital converter electrically connected to the two or more sensing lines,
The analog-to-
Sensing the voltage of each of at least one sensing line electrically connected, converting the sensed voltage into a digital sensing value, and generating and outputting sensing data including the converted digital sensing value. The method according to claim 1,
Wherein the memory power monitoring unit comprises:
Monitors the voltage of the memory power supplied to the main memory during the panel sensing period and determines that the memory power is abnormal when the monitored voltage is out of a predetermined normal range. The method according to claim 1,
And a back-up memory for backing up sensing data for each sub-pixel row stored in the main memory during the panel sensing period. The method according to claim 6,
Wherein the backup memory backs up sensing data for subpixels included in a certain number of subpixel rows. 8. The method of claim 7,
Wherein the memory power monitoring unit comprises:
Monitors the presence or absence of a memory power source for each sensing driving time of the predetermined number of subpixel rows,
The malfunction-
And compares the sensing data stored in the main memory with the sensing data stored in the backup memory for the subpixels included in the predetermined number of subpixel rows and outputs the panel sensing operation control signal. The method according to claim 6,
The malfunction-
If it is determined that the memory power source is abnormal due to monitoring by the memory power monitoring unit during the panel sensing period,
Wherein the sensing data stored in the main memory and the sensing data backed up in the backup memory are compared with each other to determine whether or not the memory data is coincident with each other,
As a result of the determination, if it is determined that there is an inconsistency, a sensing replay progress control signal for causing the sensing drive for the subpixel row corresponding to the sensing data stored in the main memory to be inconsistent with the sensing data backed up in the backup memory, And outputs the panel sensing operation control signal as the panel sensing operation control signal. 8. The method of claim 7,
The malfunction-
When the sensing data stored in the main memory and the sensing data backed up in the backup memory are continuously inconsistent for a predetermined number of times or more,
And outputs a panel sensing abnormal state notification signal as the panel sensing operation control signal. 11. The method of claim 10,
And the power-off process is performed after the panel sensing abnormal condition notification signal is output. 12. The method of claim 11,
And a compensation unit for compensating a characteristic value of the corresponding subpixel using the sensing data stored in the main memory before the panel sensing period when the power-on signal is generated after the power- Device. A driving method of an organic light emitting display device,
A sensing data generation step of sensing a voltage of a sensing line connected to the first sub pixel through sensing driving for a first sub pixel to generate sensing data for the first sub pixel;
Storing sensing data for the first sub-pixel in a main memory; And
And a sensing data error prevention step of controlling the sensing operation of the first sub-pixel to proceed again according to a result of monitoring an abnormality of the memory power supplied to the main memory. 14. The method of claim 13,
After storing the sensing data,
Further comprising a sensing data backup step of backing up the sensing data for the first subpixel stored in the main memory to a backup memory,
In the sensing data error prevention step,
Determining whether there is an abnormality in the memory power supplied to the main memory;
Wherein the sensing data for the first subpixel stored in the main memory is the sensing data for the first subpixel backed up in the backup memory before the time when the memory power source is determined to be abnormal, And determining whether or not the received data matches with the received data. And
And controlling the re-sensing driving for the first sub-pixel to proceed again if it is determined that the first sub-pixel is not coincident with the first sub-pixel. 14. The method of claim 13,
And a power-off step of performing a power-off process when the re-sensing operation for the first sub-pixel is repeatedly and continuously performed N times or more.

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