KR20150051926A - 도금 배쓰 및 방법 - Google Patents
도금 배쓰 및 방법 Download PDFInfo
- Publication number
- KR20150051926A KR20150051926A KR1020140153138A KR20140153138A KR20150051926A KR 20150051926 A KR20150051926 A KR 20150051926A KR 1020140153138 A KR1020140153138 A KR 1020140153138A KR 20140153138 A KR20140153138 A KR 20140153138A KR 20150051926 A KR20150051926 A KR 20150051926A
- Authority
- KR
- South Korea
- Prior art keywords
- tin
- alkyl
- acid
- crystal growth
- composition
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/30—Electroplating: Baths therefor from solutions of tin
- C25D3/32—Electroplating: Baths therefor from solutions of tin characterised by the organic bath constituents used
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
- C25D3/60—Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of tin
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
- C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electroplating And Plating Baths Therefor (AREA)
- Electroplating Methods And Accessories (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/071,677 | 2013-11-05 | ||
US14/071,677 US20150122661A1 (en) | 2013-11-05 | 2013-11-05 | Plating bath and method |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20150051926A true KR20150051926A (ko) | 2015-05-13 |
Family
ID=51932182
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020140153138A KR20150051926A (ko) | 2013-11-05 | 2014-11-05 | 도금 배쓰 및 방법 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20150122661A1 (zh) |
EP (1) | EP2868775A3 (zh) |
JP (1) | JP2015092021A (zh) |
KR (1) | KR20150051926A (zh) |
CN (1) | CN104674312A (zh) |
TW (1) | TW201533278A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200080615A (ko) * | 2018-12-27 | 2020-07-07 | 솔브레인 주식회사 | 도금 조성물 및 솔더 범프 형성 방법 |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5590259B1 (ja) * | 2014-01-28 | 2014-09-17 | 千住金属工業株式会社 | Cu核ボール、はんだペーストおよびはんだ継手 |
BR112018016802A2 (pt) * | 2016-02-16 | 2018-12-26 | Lumishield Tech Incorporated | deposição eletroquímica de elementos em meio aquoso |
US10879156B2 (en) | 2016-03-08 | 2020-12-29 | Washington State University | Mitigation of whisker growth in tin coatings by alloying with indium |
US20170321340A1 (en) * | 2016-03-08 | 2017-11-09 | Washington State University | Method of electroplating tin films with indium using an alkanesulfonic acid based electrolyte |
KR101757192B1 (ko) * | 2016-03-30 | 2017-07-12 | 주식회사 호진플라텍 | 웨이퍼 범프 도금을 위한 주석-은 합금 전기도금액 |
JP6818520B2 (ja) * | 2016-11-11 | 2021-01-20 | ローム・アンド・ハース電子材料株式会社 | 中性スズめっき液を用いたバレルめっきまたは高速回転めっき方法 |
WO2019082885A1 (ja) * | 2017-10-24 | 2019-05-02 | 三菱マテリアル株式会社 | 錫又は錫合金めっき液 |
JP6620859B2 (ja) * | 2017-10-24 | 2019-12-18 | 三菱マテリアル株式会社 | 錫又は錫合金めっき堆積層の形成方法 |
WO2019121092A1 (en) | 2017-12-20 | 2019-06-27 | Basf Se | Composition for tin or tin alloy electroplating comprising suppressing agent |
US20190259722A1 (en) * | 2018-02-21 | 2019-08-22 | Rohm And Haas Electronic Materials Llc | Copper pillars having improved integrity and methods of making the same |
KR20210002514A (ko) * | 2018-04-20 | 2021-01-08 | 바스프 에스이 | 억제제를 포함하는 주석 또는 주석 합금 전기도금을 위한 조성물 |
WO2021193696A1 (ja) * | 2020-03-27 | 2021-09-30 | 三菱マテリアル株式会社 | 電解めっき液及び電解めっき方法 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL151449B (nl) * | 1966-09-14 | 1976-11-15 | Philips Nv | Werkwijze voor de bereiding van een zuur bad voor het elektrolytisch neerslaan van tin. |
US4384930A (en) * | 1981-08-21 | 1983-05-24 | Mcgean-Rohco, Inc. | Electroplating baths, additives therefor and methods for the electrodeposition of metals |
US4871429A (en) | 1981-09-11 | 1989-10-03 | Learonal, Inc | Limiting tin sludge formation in tin or tin/lead electroplating solutions |
JPH0233795B2 (ja) * | 1983-05-16 | 1990-07-30 | Matsugiin Rooko Inc | Metsukyokusoseibutsu |
US4582576A (en) * | 1985-03-26 | 1986-04-15 | Mcgean-Rohco, Inc. | Plating bath and method for electroplating tin and/or lead |
US5174887A (en) | 1987-12-10 | 1992-12-29 | Learonal, Inc. | High speed electroplating of tinplate |
US5061351A (en) * | 1990-07-23 | 1991-10-29 | Enthone-Omi, Inc. | Bright tin electrodeposition composition |
JP2001181889A (ja) * | 1999-12-22 | 2001-07-03 | Nippon Macdermid Kk | 光沢錫−銅合金電気めっき浴 |
US6578754B1 (en) * | 2000-04-27 | 2003-06-17 | Advanpack Solutions Pte. Ltd. | Pillar connections for semiconductor chips and method of manufacture |
JP4362568B2 (ja) * | 2000-06-02 | 2009-11-11 | 奥野製薬工業株式会社 | 錫−銅合金電気めっき液 |
US6818545B2 (en) | 2001-03-05 | 2004-11-16 | Megic Corporation | Low fabrication cost, fine pitch and high reliability solder bump |
TWI245402B (en) | 2002-01-07 | 2005-12-11 | Megic Corp | Rod soldering structure and manufacturing process thereof |
TWI240979B (en) | 2004-10-28 | 2005-10-01 | Advanced Semiconductor Eng | Bumping process |
KR100921919B1 (ko) | 2007-11-16 | 2009-10-16 | (주)화백엔지니어링 | 반도체 칩에 형성되는 구리기둥-주석범프 및 그의 형성방법 |
JP5554718B2 (ja) * | 2007-12-11 | 2014-07-23 | エンソン インコーポレイテッド | ナノ粒子を含む金属系複合コーティングの電解デポジット |
JP5583894B2 (ja) * | 2008-06-12 | 2014-09-03 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | 電気錫めっき液および電気錫めっき方法 |
US8507376B2 (en) * | 2008-10-21 | 2013-08-13 | Atotech Deutschland Gmbh | Method to form solder deposits on substrates |
JP5033979B1 (ja) * | 2011-09-29 | 2012-09-26 | ユケン工業株式会社 | スズからなるめっき用酸性水系組成物 |
US8888984B2 (en) * | 2012-02-09 | 2014-11-18 | Rohm And Haas Electronic Materials Llc | Plating bath and method |
-
2013
- 2013-11-05 US US14/071,677 patent/US20150122661A1/en not_active Abandoned
-
2014
- 2014-11-05 CN CN201410858388.9A patent/CN104674312A/zh active Pending
- 2014-11-05 EP EP14191882.1A patent/EP2868775A3/en not_active Withdrawn
- 2014-11-05 KR KR1020140153138A patent/KR20150051926A/ko not_active Application Discontinuation
- 2014-11-05 JP JP2014224805A patent/JP2015092021A/ja active Pending
- 2014-11-05 TW TW103138319A patent/TW201533278A/zh unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200080615A (ko) * | 2018-12-27 | 2020-07-07 | 솔브레인 주식회사 | 도금 조성물 및 솔더 범프 형성 방법 |
Also Published As
Publication number | Publication date |
---|---|
EP2868775A3 (en) | 2015-08-12 |
CN104674312A (zh) | 2015-06-03 |
US20150122661A1 (en) | 2015-05-07 |
JP2015092021A (ja) | 2015-05-14 |
TW201533278A (zh) | 2015-09-01 |
EP2868775A2 (en) | 2015-05-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E601 | Decision to refuse application |