KR20130090827A - 기판 반송 방법 및 기판 반송 장치 - Google Patents
기판 반송 방법 및 기판 반송 장치 Download PDFInfo
- Publication number
- KR20130090827A KR20130090827A KR1020130012729A KR20130012729A KR20130090827A KR 20130090827 A KR20130090827 A KR 20130090827A KR 1020130012729 A KR1020130012729 A KR 1020130012729A KR 20130012729 A KR20130012729 A KR 20130012729A KR 20130090827 A KR20130090827 A KR 20130090827A
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- wafer
- board
- temperature
- resin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0602—Temperature monitoring
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
- H10P72/3304—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber characterised by movements or sequence of movements of transfer devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/0198—Manufacture or treatment batch processes
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012023009A JP5959216B2 (ja) | 2012-02-06 | 2012-02-06 | 基板搬送方法および基板搬送装置 |
| JPJP-P-2012-023009 | 2012-02-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20130090827A true KR20130090827A (ko) | 2013-08-14 |
Family
ID=47721908
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020130012729A Ceased KR20130090827A (ko) | 2012-02-06 | 2013-02-05 | 기판 반송 방법 및 기판 반송 장치 |
Country Status (5)
| Country | Link |
|---|---|
| EP (1) | EP2624292B1 (https=) |
| JP (1) | JP5959216B2 (https=) |
| KR (1) | KR20130090827A (https=) |
| PT (1) | PT2624292E (https=) |
| TW (1) | TWI584404B (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20180124732A (ko) * | 2017-05-12 | 2018-11-21 | 캐논 가부시끼가이샤 | 임프린트 방법, 임프린트 장치, 임프린트 시스템 및 물품 제조 방법 |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101940580B1 (ko) * | 2012-05-24 | 2019-01-22 | 에이씨엠 리서치 (상하이) 인코포레이티드 | 로드록 챔버와, 그를 이용하여 기판을 처리하는 방법 |
| KR101455205B1 (ko) * | 2014-04-29 | 2014-10-27 | 주식회사 다이나테크 | 교정장치 |
| JP6322083B2 (ja) * | 2014-08-08 | 2018-05-09 | 日東電工株式会社 | 半導体ウエハの冷却方法および半導体ウエハの冷却装置 |
| JP6811951B2 (ja) * | 2017-02-03 | 2021-01-13 | 株式会社ディスコ | 搬送機構 |
| JP7061012B2 (ja) * | 2018-05-01 | 2022-04-27 | 株式会社ディスコ | 加工装置 |
| JP7282467B2 (ja) * | 2019-08-14 | 2023-05-29 | 株式会社ディスコ | 加工装置 |
| KR102235146B1 (ko) * | 2019-10-08 | 2021-04-02 | 리얼룩앤컴퍼니 주식회사 | 냉각 성능이 개선된 3d 포밍필름 제조 장치 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6378546A (ja) * | 1986-09-22 | 1988-04-08 | Hitachi Ltd | ウエハハンドリング装置 |
| JP2941505B2 (ja) * | 1991-08-08 | 1999-08-25 | 株式会社東芝 | 基板位置決め方法 |
| JP3442253B2 (ja) * | 1997-03-13 | 2003-09-02 | 東京エレクトロン株式会社 | 基板処理装置 |
| JPH11168131A (ja) * | 1997-12-04 | 1999-06-22 | Nec Kyushu Ltd | ウエハ搬送チャック |
| JP4403631B2 (ja) * | 2000-04-24 | 2010-01-27 | ソニー株式会社 | チップ状電子部品の製造方法、並びにその製造に用いる擬似ウエーハの製造方法 |
| JP4592270B2 (ja) | 2003-10-06 | 2010-12-01 | 日東電工株式会社 | 半導体ウエハの支持材からの剥離方法およびこれを用いた装置 |
| JP2007317822A (ja) * | 2006-05-25 | 2007-12-06 | Sony Corp | 基板処理方法及び半導体装置の製造方法 |
| JP2008053432A (ja) * | 2006-08-24 | 2008-03-06 | Disco Abrasive Syst Ltd | ウエーハ加工装置 |
| DE102008041250A1 (de) * | 2008-08-13 | 2010-02-25 | Ers Electronic Gmbh | Verfahren und Vorrichtung zum thermischen Bearbeiten von Kunststoffscheiben, insbesondere Moldwafern |
| CN102217055B (zh) * | 2008-11-21 | 2013-09-18 | 芝浦机械电子株式会社 | 衬底处理方法及衬底处理装置 |
| JP5549185B2 (ja) * | 2009-11-06 | 2014-07-16 | 株式会社ニコン | 半導体デバイスの製造方法および基板貼り合せ装置 |
| JP2011151149A (ja) | 2010-01-20 | 2011-08-04 | Tdk Corp | 積層型電子部品の製造方法 |
| JP5543813B2 (ja) * | 2010-03-23 | 2014-07-09 | 日東電工株式会社 | ワーク搬送方法およびワーク搬送装置 |
| JP2012186245A (ja) * | 2011-03-04 | 2012-09-27 | Tokyo Electron Ltd | 接合装置、接合システム、接合方法、プログラム及びコンピュータ記憶媒体 |
| JP2011223014A (ja) * | 2011-06-02 | 2011-11-04 | Furukawa Electric Co Ltd:The | チップ保護用フィルム |
-
2012
- 2012-02-06 JP JP2012023009A patent/JP5959216B2/ja active Active
-
2013
- 2013-01-23 EP EP20130000338 patent/EP2624292B1/en not_active Not-in-force
- 2013-01-23 PT PT130003387T patent/PT2624292E/pt unknown
- 2013-02-05 TW TW102104302A patent/TWI584404B/zh not_active IP Right Cessation
- 2013-02-05 KR KR1020130012729A patent/KR20130090827A/ko not_active Ceased
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20180124732A (ko) * | 2017-05-12 | 2018-11-21 | 캐논 가부시끼가이샤 | 임프린트 방법, 임프린트 장치, 임프린트 시스템 및 물품 제조 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2013161958A (ja) | 2013-08-19 |
| TWI584404B (zh) | 2017-05-21 |
| JP5959216B2 (ja) | 2016-08-02 |
| TW201351558A (zh) | 2013-12-16 |
| EP2624292A1 (en) | 2013-08-07 |
| PT2624292E (pt) | 2015-05-20 |
| EP2624292B1 (en) | 2015-04-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| D13-X000 | Search requested |
St.27 status event code: A-1-2-D10-D13-srh-X000 |
|
| D14-X000 | Search report completed |
St.27 status event code: A-1-2-D10-D14-srh-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |