KR20110069552A - 시편 검사장치 - Google Patents
시편 검사장치 Download PDFInfo
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- KR20110069552A KR20110069552A KR1020090126332A KR20090126332A KR20110069552A KR 20110069552 A KR20110069552 A KR 20110069552A KR 1020090126332 A KR1020090126332 A KR 1020090126332A KR 20090126332 A KR20090126332 A KR 20090126332A KR 20110069552 A KR20110069552 A KR 20110069552A
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- 238000007689 inspection Methods 0.000 claims description 32
- 239000002184 metal Substances 0.000 claims description 10
- 230000002265 prevention Effects 0.000 claims description 9
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 4
- 238000000926 separation method Methods 0.000 claims description 3
- 239000000696 magnetic material Substances 0.000 claims description 2
- 238000000034 method Methods 0.000 claims 8
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 230000003287 optical effect Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 229910001208 Crucible steel Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000003760 hair shine Effects 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 238000007726 management method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/36—Embedding or analogous mounting of samples
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/1012—Calibrating particle analysers; References therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N2021/4776—Miscellaneous in diffuse reflection devices
- G01N2021/4783—Examining under varying incidence; Angularly adjustable head
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
Claims (9)
- 상측에 시편을 거치하는 시편 안착부;상기 시편 안착부의 상부에 배치되어 시편을 스캔하며 이미지를 획득하는 스캔헤드; 및상기 시편 안착부와 상기 스캔헤드가 설치되는 하우징;을 포함하는 시편 검사장치.
- 청구항 1에 있어서,상기 하우징은 밀폐되는 경우 암실을 형성하는 시편 검사장치.
- 청구항 1에 있어서,상기 스캔헤드를 일방향으로 이동시키는 스캔헤드 구동부 및 상기 스캔헤드 구동부의 구동을 제어하는 구동제어부를 포함하는 시편 검사장치.
- 청구항 3에 있어서,상기 스캔헤드 구동부는상기 하우징 내부에 상기 일방향으로 배치되는 구동축과, 상기 스캔헤드의 일측에 배치되는 링커를 포함하고,상기 구동축과 링커가 축결합하여 스캔헤드가 구동축을 따라 이동하도록 하 는 시편 검사장치.
- 청구항 3에 있어서,상기 시편 안착부를 상기 일방향과 교차하는 방향으로 이동하도록 하는 활주 구동부 및 상기 활주 구동부의 구동을 제어하는 활주 구동제어부를 포함하는 시편 검사장치.
- 청구항 5에 있어서,상기 활주 구동부는시편 안착부를 지지하는 지지 플레이트;상기 지지 플레이트 양측에 배치되는 한 쌍의 가이드홈; 및하우징 내부의 양측에 배치되며, 상기 가이드홈에 삽입되도록 형성되는 한 쌍의 가이드부;를 포함하는 시편 검사장치.
- 청구항 1에 있어서,상기 시편 안착부는 상면에 배치되는 소켓부 및 상기 소켓부에 안착되는 볼 베어링으로 이루어지는 복수개의 시편 받침대를 포함하는 시편 검사장치.
- 청구항 1에 있어서,상기 시편 안착부의 상면 일측에는 시편의 이탈을 방지하도록 이탈방지부를 포함하는 시편 검사장치.
- 청구항 8에 있어서,상기 시편이 금속 시편인 경우, 상기 이탈방지부의 일측에는 금속 시편을 고정하도록 자성체를 포함하는 시편 검사장치.
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KR1020090126332A KR101120522B1 (ko) | 2009-12-17 | 2009-12-17 | 시편 검사장치 |
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KR1020090126332A KR101120522B1 (ko) | 2009-12-17 | 2009-12-17 | 시편 검사장치 |
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KR20110069552A true KR20110069552A (ko) | 2011-06-23 |
KR101120522B1 KR101120522B1 (ko) | 2012-03-05 |
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KR1020090126332A KR101120522B1 (ko) | 2009-12-17 | 2009-12-17 | 시편 검사장치 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101880626B1 (ko) * | 2017-03-17 | 2018-07-20 | 주식회사 포스코 | 주편 지지 구조물 |
CN112469993A (zh) * | 2019-05-15 | 2021-03-09 | 株式会社Lg化学 | 用于电池的xrd测试的载物台装置 |
KR20210051051A (ko) * | 2019-10-29 | 2021-05-10 | 주식회사 포스코 | 시편의 냉각 및 운반 장치 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102125272B1 (ko) * | 2018-05-14 | 2020-06-23 | 주식회사 포스코 | 금속시편 지지장치 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR200347781Y1 (ko) * | 2004-01-09 | 2004-04-14 | 주식회사 금창 | 비전시스템을 이용한 자동차부품 검사장치 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101880626B1 (ko) * | 2017-03-17 | 2018-07-20 | 주식회사 포스코 | 주편 지지 구조물 |
CN112469993A (zh) * | 2019-05-15 | 2021-03-09 | 株式会社Lg化学 | 用于电池的xrd测试的载物台装置 |
KR20210051051A (ko) * | 2019-10-29 | 2021-05-10 | 주식회사 포스코 | 시편의 냉각 및 운반 장치 |
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KR101120522B1 (ko) | 2012-03-05 |
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