KR20110010632A - 집적회로 캐리어에 대한 위치분석 수행을 위한 측정장치 - Google Patents

집적회로 캐리어에 대한 위치분석 수행을 위한 측정장치 Download PDF

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Publication number
KR20110010632A
KR20110010632A KR1020107027782A KR20107027782A KR20110010632A KR 20110010632 A KR20110010632 A KR 20110010632A KR 1020107027782 A KR1020107027782 A KR 1020107027782A KR 20107027782 A KR20107027782 A KR 20107027782A KR 20110010632 A KR20110010632 A KR 20110010632A
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KR
South Korea
Prior art keywords
integrated circuit
assembly
carrier
control system
camera
Prior art date
Application number
KR1020107027782A
Other languages
English (en)
Korean (ko)
Inventor
조셉 타리온
일리엄 그렌저
롤프 르위스 레인저
그래임 케네쓰 보우여
제이슨 마크 써랜더
Original Assignee
실버브룩 리서치 피티와이 리미티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 실버브룩 리서치 피티와이 리미티드 filed Critical 실버브룩 리서치 피티와이 리미티드
Publication of KR20110010632A publication Critical patent/KR20110010632A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30204—Marker

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1020107027782A 2008-08-19 2008-08-19 집적회로 캐리어에 대한 위치분석 수행을 위한 측정장치 KR20110010632A (ko)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/AU2008/001194 WO2010019980A1 (fr) 2008-08-19 2008-08-19 Appareil de mesure pour analyse de position sur un support de circuits intégrés

Publications (1)

Publication Number Publication Date
KR20110010632A true KR20110010632A (ko) 2011-02-01

Family

ID=41706745

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020107027782A KR20110010632A (ko) 2008-08-19 2008-08-19 집적회로 캐리어에 대한 위치분석 수행을 위한 측정장치

Country Status (3)

Country Link
EP (1) EP2326916A4 (fr)
KR (1) KR20110010632A (fr)
WO (1) WO2010019980A1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105514009A (zh) * 2015-12-14 2016-04-20 重庆远创光电科技有限公司 用于芯片视觉检测的芯片载运装置
CN105428279B (zh) * 2015-12-14 2018-06-26 重庆远创光电科技有限公司 适用于获取芯片图像的控制方法
CN105513992A (zh) * 2015-12-14 2016-04-20 重庆远创光电科技有限公司 一种用于芯片视觉检测的芯片载运装置
CN105513991B (zh) * 2015-12-14 2018-07-20 重庆远创光电科技有限公司 利用芯片运动像机静止方式来获取芯片图像的控制方法
DE202018101018U1 (de) 2017-05-11 2018-03-05 Haprotec Gmbh Bauteil-Belegungserkennungsvorrichtung eines Werkstückträgers
CN114147664A (zh) * 2021-12-09 2022-03-08 苏州华星光电技术有限公司 一种治具更换方法以及电子设备的制备方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1483755A (fr) * 1966-01-17 1967-06-09 Dev D App Electro Mecaniques S Perfectionnement aux dispositifs de sécurité pour machines comportant une partie tournante
US5148600A (en) * 1991-09-17 1992-09-22 Advanced Robotics (A.R.L.) Ltd. Precision measuring apparatus
DE4339715C1 (de) * 1993-11-22 1995-04-20 Helmut A Kappner Verfahren zur Messung der Lage eines Objekts
US6710798B1 (en) * 1999-03-09 2004-03-23 Applied Precision Llc Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card
JP4649704B2 (ja) * 2000-05-25 2011-03-16 株式会社ニコン 形状測定機
DE112004000766T5 (de) * 2003-05-22 2007-01-25 Tokyo Seimitsu Co., Ltd. Chipschneidvorrichtung
US7574035B2 (en) * 2006-04-07 2009-08-11 United Technologies Corporation System and method for inspection of hole location on turbine airfoils

Also Published As

Publication number Publication date
WO2010019980A1 (fr) 2010-02-25
EP2326916A4 (fr) 2014-07-02
EP2326916A1 (fr) 2011-06-01

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