EP2326916A4 - Appareil de mesure pour analyse de position sur un support de circuits intégrés - Google Patents

Appareil de mesure pour analyse de position sur un support de circuits intégrés

Info

Publication number
EP2326916A4
EP2326916A4 EP08782942.0A EP08782942A EP2326916A4 EP 2326916 A4 EP2326916 A4 EP 2326916A4 EP 08782942 A EP08782942 A EP 08782942A EP 2326916 A4 EP2326916 A4 EP 2326916A4
Authority
EP
European Patent Office
Prior art keywords
integrated circuit
measuring apparatus
circuit carrier
performing positional
positional analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP08782942.0A
Other languages
German (de)
English (en)
Other versions
EP2326916A1 (fr
Inventor
Joseph Tharion
William Granger
Ralph Lewis Ranger
Graeme Kenneth Bowyer
Jason Mark Thelander
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Memjet Technology Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of EP2326916A1 publication Critical patent/EP2326916A1/fr
Publication of EP2326916A4 publication Critical patent/EP2326916A4/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30204—Marker

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
EP08782942.0A 2008-08-19 2008-08-19 Appareil de mesure pour analyse de position sur un support de circuits intégrés Withdrawn EP2326916A4 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/AU2008/001194 WO2010019980A1 (fr) 2008-08-19 2008-08-19 Appareil de mesure pour analyse de position sur un support de circuits intégrés

Publications (2)

Publication Number Publication Date
EP2326916A1 EP2326916A1 (fr) 2011-06-01
EP2326916A4 true EP2326916A4 (fr) 2014-07-02

Family

ID=41706745

Family Applications (1)

Application Number Title Priority Date Filing Date
EP08782942.0A Withdrawn EP2326916A4 (fr) 2008-08-19 2008-08-19 Appareil de mesure pour analyse de position sur un support de circuits intégrés

Country Status (3)

Country Link
EP (1) EP2326916A4 (fr)
KR (1) KR20110010632A (fr)
WO (1) WO2010019980A1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105513991B (zh) * 2015-12-14 2018-07-20 重庆远创光电科技有限公司 利用芯片运动像机静止方式来获取芯片图像的控制方法
CN105514009A (zh) * 2015-12-14 2016-04-20 重庆远创光电科技有限公司 用于芯片视觉检测的芯片载运装置
CN105428279B (zh) * 2015-12-14 2018-06-26 重庆远创光电科技有限公司 适用于获取芯片图像的控制方法
CN105513992A (zh) * 2015-12-14 2016-04-20 重庆远创光电科技有限公司 一种用于芯片视觉检测的芯片载运装置
DE202018101018U1 (de) 2017-05-11 2018-03-05 Haprotec Gmbh Bauteil-Belegungserkennungsvorrichtung eines Werkstückträgers
CN114147664B (zh) * 2021-12-09 2024-08-09 苏州华星光电技术有限公司 一种治具更换方法以及电子设备的制备方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5148600A (en) * 1991-09-17 1992-09-22 Advanced Robotics (A.R.L.) Ltd. Precision measuring apparatus
US6710798B1 (en) * 1999-03-09 2004-03-23 Applied Precision Llc Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card
US20070276629A1 (en) * 2006-04-07 2007-11-29 United Technologies Corporation System and method for inspection of hole location on turbine airfoils

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1483755A (fr) * 1966-01-17 1967-06-09 Dev D App Electro Mecaniques S Perfectionnement aux dispositifs de sécurité pour machines comportant une partie tournante
DE4339715C1 (de) * 1993-11-22 1995-04-20 Helmut A Kappner Verfahren zur Messung der Lage eines Objekts
JP4649704B2 (ja) * 2000-05-25 2011-03-16 株式会社ニコン 形状測定機
WO2004105109A1 (fr) * 2003-05-22 2004-12-02 Tokyo Seimitsu Co., Ltd. Dispositif de decoupage en des

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5148600A (en) * 1991-09-17 1992-09-22 Advanced Robotics (A.R.L.) Ltd. Precision measuring apparatus
US6710798B1 (en) * 1999-03-09 2004-03-23 Applied Precision Llc Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card
US20070276629A1 (en) * 2006-04-07 2007-11-29 United Technologies Corporation System and method for inspection of hole location on turbine airfoils

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2010019980A1 *

Also Published As

Publication number Publication date
EP2326916A1 (fr) 2011-06-01
WO2010019980A1 (fr) 2010-02-25
KR20110010632A (ko) 2011-02-01

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Legal Events

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PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

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Effective date: 20110316

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DAX Request for extension of the european patent (deleted)
A4 Supplementary search report drawn up and despatched

Effective date: 20140602

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: ZAMTEC LIMITED

RIC1 Information provided on ipc code assigned before grant

Ipc: G01C 11/02 20060101AFI20140526BHEP

Ipc: G06T 7/60 20060101ALI20140526BHEP

Ipc: G01R 31/311 20060101ALI20140526BHEP

Ipc: G01B 11/00 20060101ALI20140526BHEP

Ipc: H01L 21/66 20060101ALI20140526BHEP

Ipc: H05K 13/08 20060101ALI20140526BHEP

Ipc: G01R 31/28 20060101ALI20140526BHEP

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: MEMJET TECHNOLOLGY LIMITED

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: MEMJET TECHNOLOGY LIMITED

STAA Information on the status of an ep patent application or granted ep patent

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18W Application withdrawn

Effective date: 20141222