KR20100083087A - Probe unit for inspecting display panel - Google Patents

Abstract

PURPOSE: A probe unit for display panel inspection which facilitates the exchange and repair of probes is provided to improve the simplicity, speediness and efficiency of work. CONSTITUTION: A first assembly(200) is installed in a main body and has a first probe. The first probes are touched with the electrode pads of the display panel. An electric signal is transferred. A second assembly(300) has second probes. The second probes are detachably installed in the main body in order not to put one upon another with second probe first probes. A pattern glass(400) is connected to a drive sheet equipped with a TAB IC(Tape Automated Bonding Integrated Circuit) and have a pattern terminal.

Description

Probe unit for inspecting display panel

The present invention relates to a probe unit for display panel inspection.

In general, TFT-LCD (Thin Film Transistor Liquid Crystal Display) is a kind of flat panel display. A plurality of thin film transistors (TFTs) and pixel electrodes are arranged to have a lower plate having a predetermined size, a color filter for displaying color, and a common The electrodes are sequentially formed to have a top plate spaced apart from the bottom plate by a predetermined distance, and a liquid crystal filled in a space between the top plate and the bottom plate.

Such a TFT-LCD includes a capacitor region and an auxiliary charge region formed by a liquid crystal between a TFT, which is a switching element, and an upper / lower electrode, and a gate driving electrode for driving on / off of the TFT and an external image. The predetermined screen is turned on by an image signal electrode or the like to which a signal is applied.

After the manufacturing of such a flat panel display device such as TFT-LCD is completed, the test tip of the probe device is applied to the pad electrode of the flat panel display device to apply an electrical signal to check whether the flat panel display device is normal or not. Test procedures are underway to remove the device prematurely.

It is an object of the present invention to provide a probe unit for inspecting a display panel that is easy to replace and repair a probe without disassembling the entire unit by an individual separation structure that can be assembled and disassembled.

In addition, an object of the present invention is to inspect the display panel to minimize scribing due to the overdrive (O / D;) when the probe contacts the pad electrode of the display panel, and to minimize the pad electrode damage of the display panel To provide a probe unit for.

In addition, an object of the present invention is to provide a probe unit for inspecting a display panel that can ensure the contact stability by adjusting the contact pressure between the patterned glass and the probe.

Another object of the present invention is to provide a probe unit for inspecting a display panel that can visually confirm the contact state of the probe of the patterned glass.

It is also an object of the present invention to provide a probe unit for inspecting a display panel in which the probes can be automatically aligned in a predetermined position.

It is also an object of the present invention to provide a probe unit for inspecting a display panel that can implement an ultra fine pitch between probes.

The object of the present invention is not limited thereto, and other objects not mentioned will be clearly understood by those skilled in the art from the following description.

Probe unit of the present invention for achieving the above object is a main body; A first assembly installed on the main body and having first probes contacting electrode pads of a display panel to transmit an electrical signal; A second assembly having second probes and detachably installed on the main body such that the second probes do not overlap with the first probes; And a patterned glass having pattern terminals (connection pads) connected to a driving sheet having a tape automated bonding integrated circuit (TAP) and connected to the first and second probes.

According to an embodiment of the present invention, the first assembly includes: first and second support blocks having slots in which front and rear ends of the first probes are positioned; A first position lock interposed between the first support block and the first probes and between the second support block and the first probes to prevent the first probes from being separated from the first and second support blocks Bars; And a first position alignment bar inserted into the through hole formed in the first probes arranged at a predetermined interval by the first and second support blocks.

According to an embodiment of the present invention, the first probe has a blade-shaped central body; A first inclined tension arm extending obliquely from one side of the central body to be inserted into the slot of the first support block, the first inclined tension arm having a first tip contacting the electrode pad of the display panel; And a second inclined tension arm extending obliquely from the other side of the central body to be inserted into the slot of the second support block and having a second tip contacting the pattern terminal (connection pad) of the patterned glass.

According to an embodiment of the present invention, the first inclined tension arm further includes a curved tension portion for preventing scribing due to an overdrive (O / D) when contacting the electrode pad of the display panel.

According to an embodiment of the present invention, the second assembly includes: third and fourth support blocks having slots in which front and rear ends of the second probes are positioned; A second position fixing bar inserted between the third support block and the second probes to prevent the second probes from being separated from the third and fourth support blocks; A pair of side covers to which the third and fourth support blocks are fixed and bolted to both sides of the main body; And a second position alignment bar inserted into the through hole formed in the second probes arranged at a predetermined interval by the third and fourth support blocks.

According to an embodiment of the present invention, the second probe has a blade-shaped central body; A first horizontal tension arm extending in a horizontal direction from one side of the central body to be inserted into the slot of the third support block, the first horizontal tension arm having a first tip contacting the electrode pad of the display panel; And a second horizontal tension arm extending in a horizontal direction from the other side of the central body to be inserted into the slot of the fourth support block, and having a second tip contacting the pattern terminal (connection pad) of the patterned glass. do.

According to an embodiment of the present invention, the first and second horizontal tension arms are horizontal with respect to the electrode pads of the display panel.

According to an embodiment of the present invention, the first probe pins of the first assembly and the second probe pins of the second assembly are alternately arranged in two rows before and after.

According to an embodiment of the invention, the probe unit is mounted to the main body; The pattern glass cover further includes a pattern glass cover for pressing the pattern glass so that the pattern terminals of the pattern glass are in contact with the first and second probes.

The pattern glass cover may be provided with a viewing window for visually confirming a contact state between the pattern terminals of the pattern glass and the first and second probes and the contact pressure between the pattern terminals of the pattern glass and the first and second probes. It further includes adjustable pressure bolts.

According to an embodiment of the present invention, the probe unit is fastened to the main body so as to be positioned at both ends of the second alignment bar, and pushes the second alignment bar in the correct position to automatically align the second probes. It further includes a pushblock having an inclined push surface to move.

According to the present invention, since the first assembly and the second assembly, which are provided in two stages in the main body, can be separated from each other, the probe can be easily replaced and repaired without disassembling the entire unit. And it is possible to improve productivity by increasing the efficiency of the work as well as speed.

Further, according to the present invention, the first probes of the first assembly and the second probes of the second assembly can be automatically aligned by the alignment bar and the push block. It can be effective.

In addition, according to the present invention, when the first tip of the first probe contacts the electrode pads of the display panel, the curved pressure portion absorbs the contact pressure, thereby gradually reducing the length of the scratches on the electrode pad formed of the thin film conductive layer. Of course, it does not occur, of course, does not leave the electrode pad, thereby minimizing contact failure, thereby maintaining a stable connection force, and increasing the reliability of inspection.

In addition, according to the present invention, the first probes and the second probes are alternately arranged in two rows before and after, so that the inspection terminals of the device under inspection gradually decrease in pitch, that is, the pitch, within a predetermined range. This will have the effect of further upgrading the product.

In addition, according to the present invention, as the see-through window is formed on the patterned glass cover, the contact state between the pattern terminals of the patterned glass and the first and second probes can be visually identified, thereby ensuring the rapidity and simplicity of defect detection. .

In addition, according to the present invention, when the contact state of the first and second probes to the pattern glass is unstable, there is also an advantage that the safety of the contact can be secured more quickly and simply by adjusting the pressure bolt installed on the pattern glass cover.

Hereinafter, a probe unit according to a preferred embodiment of the present invention will be described in detail with reference to the accompanying drawings. First of all, in adding reference numerals to the components of each drawing, it should be noted that the same reference numerals have the same reference numerals as much as possible even if displayed on different drawings. In the following description of the present invention, a detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear.

(Example)

1 is a view showing a probe assembly provided with a probe unit according to an embodiment of the present invention.

Referring to FIG. 1, the probe assembly 1 includes a probe unit 10 and a manipulator 20 supporting the probe unit 10. The manipulator 20 has an arm 22 fixed to a base plate (not shown), and a head 24 and a bottom surface of the head 24 fastened to each other by a fixing bolt at the tip of the arm 22. A fixing plate 26 detachably installed and a probe plate 10 installed thereon, and a linear guide 28 installed between the head 24 and the arm 22.

2 and 3 are a perspective view and an exploded perspective view of a probe unit according to an embodiment of the present invention. 4 is a cross-sectional view of the probe unit shown in FIG. 2.

2 to 4, the probe unit 10 includes a main body 100, a first assembly 200, a second assembly 300, a pattern glass 400, a pattern glass cover 500, and a push. Block 600.

(Main body)

The main body 100 is fixed to the manipulator by bolts. The bottom surface of the main body 100 may be divided into a first bottom surface 102 that provides a concave space and a second flat bottom surface 104. The first bottom surface 102 may include a first assembly 200 and a second body. The assembly 300 is installed, and the pattern glass 400 is positioned on the second bottom surface 104. The second bottom 104 is provided with a rubber pad 106 to stably support the patterned glass 400. The first assembly and the second assembly are located in a two-stage structure at the bottom of the main body.

In addition, the main body 100 has a block mounting groove 110 to which the push block is fastened so that the side cover 380 and the push block 600 do not protrude to the outside by assembly, and a side mounting surface to which the side cover is fastened ( 120 is formed stepwise. In addition, a through hole 109 into which the pressure bolt 520 is inserted is formed in the main body 100. For reference, the pressure bolt 520 is inserted through the through hole 109 of the main body 100 and fastened to the screw hole 502 of the pattern glass cover 500.

(First assembly)

5A is a perspective view of the first assembly, and FIGS. 5B and 5C are cross-sectional views illustrating states before and after coupling of the first probe and the first and second support blocks.

The first assembly 200 includes first probes 210, first and second support blocks 230 and 240, first position fixing bars 250, and a first position alignment bar 260.

Looking at the structural features of the first assembly 200 in more detail, the first probe 210 is made of a blade type made of a thin conductive metal plate. The first probe 210 has a central body 212 positioned between the first support block 230 and the second support block 240, a first inclined tension arm 214 and a second inclined tension arm ( 216). The central body 212 has a through hole 213 into which the first alignment bar 260 is fitted.

The first inclined tension arm 214 extends obliquely from one side of the central body 212 and is fitted into the slot 232 of the first support block 230. A first tip 215 is formed at an end of the first inclined tension arm 214, and the first tip 215 is first inclined tension to be exposed from the slot 232 of the first support block 230. It has a structure bent downward from the end of the arm (214). The first tip 215 is a portion in contact with the electrode pad P1 (the electrode pad of any row of even-numbered electrode pads and odd-numbered electrode pads) of the display panel S, which is the object to be inspected (FIGS. 7A and FIG. 8).

In particular, the first inclined tension arm 214 has a tension portion 218 bent in a "U" shape at the intermediate point. The curved tension portion 218 is for preventing scribing due to an overdrive (O / D) when contacting the electrode pad P1 of the display panel S. The first tip 215 is in elastic contact with the electrode pad P1 of the display panel due to the curved tension portion 218 formed in the first inclined tension arm 214.

The second inclined tension arm 216 extends obliquely from the other side of the central body 212 and is fitted into the slot 242 of the second support block 240. A second tip 217 is formed at an end of the second inclined tension arm 216, and the second tip 217 is exposed from the slot 242 of the second support block 240 to the second inclined tension arm. It has a structure bent downward from the end of (216). The second tip 217 is in contact with the pattern terminal 402 of the pattern glass 400 formed to transmit an electrical signal.

The first support block 230 is a block having a predetermined length of a ceramic material, the inclined slot 232 formed at a predetermined interval so that the first inclined tension arm 214 of the first probe 210 can be fitted. Have them. The second support block 240 is also a block made of the same ceramic material as the first support block 230, and is inclined at regular intervals so that the second inclined tension arm 216 of the first probe 210 can be fitted thereto. With slots 242. The first probes 210 are aligned at regular intervals by the first support block 230 and the second support block 240. The first and second support blocks 230 and 240 are bonded to the bottom of the main body 100 with an adhesive such as epoxy.

The first position fixing bar 250 has a rod shape made of ceramic material having a rectangular cross section. One of the first position fixing bar 250 is sandwiched between the first support block 230 and the first probe 210, and the other is between the second support block 240 and the first probe 210. Is inserted into the first probe 210 to prevent the first and second support blocks 230 and 240 from being separated.

The first alignment bar 260 has a rod shape made of ceramic material having a circular cross section. The first position alignment bar 260 is inserted into the circular through hole 213 formed in the first probes 210 arranged at regular intervals by the first and second support blocks 230 and 240, and the first probes Align the position.

(Second assembly)

6A is a perspective view of the second assembly, and FIGS. 6B and 6C are cross-sectional views illustrating states before and after coupling of the second probe and the third and fourth support blocks.

6A to 6C, the second assembly 300 includes second probes 310, third and fourth support blocks 330 and 340, a pair of side covers 380, and a second position fixing bar 350. ) And a second alignment bar 360.

Looking at the structural features of the second assembly 300 in more detail, the second probe 310 is made of a blade type made of a thin conductive metal plate like the first probe (210). The second probe 310 has a central body 312 positioned between the third support block 330 and the fourth support block 340, the first horizontal tension arm 314 and the second horizontal tension arm ( 316). The central body 312 has a through hole 313 into which the second alignment bar 360 is fitted.

The first horizontal tension arm 314 extends in a horizontal direction from one side of the central body 312 and is fitted into the slot 332 of the third support block 330. A first tip 315 is formed at the end of the first horizontal tension arm 314, the first horizontal tip 315 being exposed from the slot 332 of the third support block 330. It has a structure bent downward from the end of the arm 314. The first tip 315 is a part in contact with the electrode pad P2 (the electrode pad of any row of even-numbered electrode pads and odd-numbered electrode pads) of the display panel S, which is the object to be inspected (FIGS. 7A and FIG. 8).

The second horizontal tension arm 316 extends inclined from the other side of the central body 312 and is fitted into the slot 342 of the fourth support block 340. A second tip 317 is formed at an end of the second horizontal tension arm 316, and the second tip 317 is exposed from the slot 342 of the fourth support block 340. It has a structure bent downward from the end of 316. The second tip 317 is in contact with the pattern terminal 402 of the pattern glass 400 formed to transmit an electrical signal.

The third support block 330 is a block having a predetermined length of ceramic material, and the horizontal slots 332 formed at regular intervals so that the first horizontal tension arm 314 of the second probe 310 can be fitted thereto. Have The fourth support block 340 is also a block made of the same ceramic material as the third support block 330, and is formed at a predetermined interval so that the second horizontal tension arm 316 of the second probe 310 can be fitted thereto. With slots 342. The second probes 310 are aligned at regular intervals by the third and fourth support blocks 330 and 340. The third and fourth support blocks 330 and 340 are bonded to the pair of side covers 380 with an adhesive such as epoxy.

The side cover 380 is bolted to side mounting surfaces 120 formed on both side surfaces of the main body 100.

The second position fixing bar 350 has a rod shape having a rectangular cross section. The second position fixing bar 350 is interposed between the third support block 330 and the second probe 310 to interlock with the push block 600 so that the second probes 310 may be connected to the third and fourth support blocks. Prevent deviation from 330,340.

The second alignment bar 360 has a rod shape having a circular cross section. The second position alignment bar 360 is inserted into a circular through hole 313 formed in the second probes 310 arranged at regular intervals by the third and fourth support blocks 330 and 340, and the second probe ( 310 to align the position.

(Pattern glass)

The pattern glass 400 is positioned on the second flat bottom surface 104 of the main body 100. The pattern glass 400 is made of a transparent glass plate having a predetermined thickness, and pattern terminals (connection pads) 402 to which the first and second probes 210 and 310 are connected are formed on one surface thereof. The pattern terminals 402 are formed to be minutely protruded on one surface of the glass by using a metal deposition process (sputtering) used in the semiconductor manufacturing. The pattern glass 400 is connected to the tab IC (Tape Automated Bonding Integrated Circuit) 430, which is the same as the driving IC attached to the display panel to be inspected, by bonding bonding so as to connect terminals. ) And the driving seat 420 are connected by a bonding contact. The drive sheet 420 is a flexible substrate.

(Pattern glass cover)

The pattern glass cover 500 is bolted to the bottom of the main body 100. The pattern glass cover 500 presses the pattern glass 400 such that the pattern terminals 402 of the pattern glass 400 contact the second tips 217 and 317 of the first and second probes 210 and 310. In particular, as shown in FIG. 4, the pattern glass cover 500 may visually check the contact state between the pattern terminals 402 of the pattern glass 400 and the second tips 217 and 317 of the first and second probes. And a pressurizing bolt 520 capable of adjusting a contact pressure between the viewing window 510 and the pattern terminals 402 of the pattern glass 40 and the second tips 217 and 317 of the first and second probes. The pressure bolt 520 is fastened to the screw hole 502 formed in the pattern glass cover 500 through the through hole 109 of the main body 100. When the pressure bolt 520 is tightened, the contact pressure between the pattern glass 400 and the second tips 217 and 317 of the first and second probes increases as the pattern glass cover 500 is pulled toward the main body 100.

(Push block)

The pair of push blocks 600 are bolted in a direction perpendicular to the main body 100 to be located at both ends of the second position alignment bar 360. For example, the push block 600 may be bolted in the lateral direction of the main body 100. 9A and 9B show a state in which the second position alignment bar is aligned by the push block. Push block 600 is inclined pressing surface 610 for pushing the second position alignment bar 360 in the correct direction to prevent the automatic alignment and the down and falling of the second probe (310). Has

Arrangement structure of the first and second probes

7A, 7B and 8 are views showing a state in which the probes are alternately arranged in front and rear two columns.

As shown in FIGS. 7A and 7B and 8, the probe unit 10 of the present invention may implement the ultra-fine pitch between the probes by arranging the 1.2 probes 210 and 310 alternately in front and rear rows. The electrode pads P1 and P2 of the display panel S which are gradually increasing within the range have a special effect that can correspond to the test terminal pitch.

Next will be described the assembly and disassembly process of the probe unit according to an embodiment of the present invention configured as described above. Assembly and disassembly of the probe unit is performed while the unit is turned upside down.

(Assembling process of probe unit)

The assembly process consists of assembling the first assembly-> assembling the second assembly-> assembling the push block-> fixing the position of the pattern glass-> assembling the pattern glass cover.

First, in the assembling process of the first assembly 200, the first support block 230 and the second support block 240 are fixed with epoxy on the first bottom of the main body 100, and the first support block 230 The first and second inclined tension arms 214 and 216 of the first probes 210 are inserted into the inclined slots of the second support block 240. And the first probe 210 by inserting the first position fixing bar 250 between the first support block 230 and the first probe 210 and between the second support block 240 and the first probe 210. ) To prevent the first and second support blocks 230 and 240 from being separated, and inserting the first alignment bar 260 into the through 213 hole of the first probes 210 to complete the assembly of the first assembly. .

In the assembling process of the second assembly 300, the side cover 380 is bolted to the side seating surface of the main body 100, and the third support block 330 and the fourth support block 340 are attached to the side cover ( 380) with epoxy. The first and second horizontal tension arms 314 and 316 of the second probes 310 are inserted into the slots 332 and 342 of the third support block 330 and the fourth support block 340. The second position fixing bar 350 is inserted between the third support block 330 and the second probe 310 and the second position alignment bar 360 is inserted into the through hole 313 of the second probe 310. Insert the bolts to fasten the push block 600 to the block mounting groove of the main body 100, wherein both ends of the second position alignment bar 360 installed through the second probe 310 is push block 600 Along the inclined surface 610 of the) is moved to a predetermined position of the wide upper side is automatically aligned and completes the assembly of the second assembly 300. In this case, the second position alignment bar 360 may be formed longer than the first position alignment bar 260 to be aligned by the push block 600.

When the assembly of the first and second assemblies 200 and 300 is completed, the push block 600 is bolted to the block mounting groove of the main body 100, wherein the second position alignment is installed through the second probes 310. Both ends of the bar 360 are automatically aligned while moving to a predetermined position on the wide upper side along the inclined surface 610 of the push block 600.

When the assembly of the push block 600 is completed, the pattern glass 400 is placed on the second bottom of the main body 100, and the pattern glass cover 500 is fastened to the main body 100 using the fastening bolt and the pressure bolt 520. Fix and join to the bottom of). Here, when contact between the pattern terminals 402 of the pattern glass 400 and the second tips 215 and 315 of the first and second probes 210 and 310 is unstable, the pressing bolt 520 may be solved. have. As such, the contact pressure between the pattern terminals 402 of the pattern glass 400 and the second tips 215 and 315 of the first and second probes may be adjusted by tightening and loosening the pressure bolt 520.

(Disassembly process for maintenance of the first and second probes)

Referring to FIG. 10A, when the fastening bolt and the pressure bolt 520 are released to separate the pattern glass cover 500, the replacement for maintenance of the second probes 310 may be performed.

As shown in FIG. 10B, maintenance of the first probes 210 is possible by loosening the bolts securing the side cover 380 and separating the second assembly 300 from the main body 100. In this case, since the third and fourth support blocks 330 and 340 supporting the second probes 310 are fixed to the side cover 380, when the side cover 380 is separated from the main body 100, the second assembly is installed. The whole 300 is separated from the main body 100. As such, when the second assembly 300 is separated, the first probes 210 may be exposed to the outside, and thus a replacement operation for the maintenance of the damaged first probes 210 may be performed.

As described above, the probe unit 10 of the present invention is arranged in alternating two front and rear rows of probes, and separate separation of the first probes 210 and the second probes 310 makes it easier to replace damaged probes. Can be done. In addition, when assembling the second assembly, the second probes may be automatically aligned, thereby ensuring ease and speed of assembly.

The foregoing description is merely illustrative of the technical idea of the present invention, and various changes and modifications may be made by those skilled in the art without departing from the essential characteristics of the present invention. Therefore, the embodiments disclosed in the present invention are not intended to limit the technical idea of the present invention but to describe the present invention, and the scope of the technical idea of the present invention is not limited by these embodiments. The protection scope of the present invention should be interpreted by the following claims, and all technical ideas within the equivalent scope should be interpreted as being included in the scope of the present invention.

1 is a view showing a probe assembly provided with a probe unit according to an embodiment of the present invention.

2 and 3 are a perspective view and an exploded perspective view of a probe unit according to an embodiment of the present invention.

4 is a cross-sectional view of the probe unit shown in FIG. 2.

5A is a perspective view of the first assembly.

5B and 5C are cross-sectional views illustrating states before and after coupling of the first probe and the first and second support blocks.

6A is a perspective view of a second assembly.

6B and 6C are cross-sectional views illustrating states before and after coupling of the second probe and the third and fourth support blocks.

7A, 7B, and 8 are views showing a state in which the probes are alternately arranged in two columns before and after.

 9A and 9B are views illustrating a state in which the second alignment bar is aligned by a push block.

10A and 10B are diagrams for describing a disassembly process for maintenance of the first and second probes.

<Description of Symbols for Main Parts of Drawings>

100: main body

200: first assembly

300: second assembly

400: patterned glass

500: patterned glass cover

600: Push Block

Claims (19)

The probe unit for display panel inspection is: Main body; A first assembly installed on the main body and having first probes contacting electrode pads of a display panel to transmit an electrical signal; A second assembly having second probes and detachably installed on the main body such that the second probes do not overlap with the first probes; And And a pattern glass having a pattern terminal connected to a driving sheet having a tape automated bonding integrated circuit (TAP) and connected to the first and second probes. The method of claim 1, The first assembly is First and second support blocks having slots in which leading and trailing ends of the first probes are positioned; A first position lock interposed between the first support block and the first probes and between the second support block and the first probes to prevent the first probes from being separated from the first and second support blocks Bars; And And a first position alignment bar inserted into a through hole formed in the first probes arranged at predetermined intervals by the first and second support blocks. The method of claim 2, The first probe is A central body of blade shape; A first inclined tension arm extending obliquely from one side of the central body to be inserted into the slot of the first support block, the first inclined tension arm having a first tip contacting the electrode pad of the display panel; And And a second inclined tension arm extending inclined from the other side of the central body to be inserted into the slot of the second support block and having a second tip contacting the pattern terminal of the pattern glass. Probe unit for The method of claim 3, wherein The first inclined tension arm is And a curved tension unit for preventing scribing due to an overdrive (O / D) when contacting an electrode pad of the display panel. The method of claim 1, The first probe is A first inclined tension arm having a first tip in contact with an electrode pad of the display panel to be inclined with respect to the electrode pad of the display panel, the first inclined tension arm inclined with respect to the electrode pad of the display panel; The first inclined tension arm is The probe unit for a display panel inspection, characterized in that the first tip further comprises a curved tension portion to have elasticity. The method of claim 1, The second assembly is Third and fourth support blocks having slots in which front and rear ends of the second probes are positioned; A second position fixing bar inserted between the third support block and the second probes to prevent the second probes from being separated from the third and fourth support blocks; A pair of side covers to which the third and fourth support blocks are fixed and bolted to both sides of the main body; And And a second position alignment bar inserted into a through hole formed in the second probes arranged at predetermined intervals by the third and fourth support blocks. The method of claim 6, The second probe is A central body of blade shape; A first horizontal tension arm extending in a horizontal direction from one side of the central body to be inserted into the slot of the third support block, the first horizontal tension arm having a first tip contacting the electrode pad of the display panel; And And a second horizontal tension arm extending in a horizontal direction from the other side of the central body to be inserted into the slot of the fourth support block and having a second tip contacting the pattern terminal of the patterned glass. Probe unit for display panel inspection. The method of claim 7, wherein And the first and second horizontal tension arms are horizontal with respect to the electrode pads of the display panel. The method of claim 1, The probe unit of claim 1, wherein the first probe pins of the first assembly and the second probe pins of the second assembly are alternately arranged in two rows. The method of claim 1, The probe unit Mounted to the main body; And a pattern glass cover for pressing the pattern glass so that the pattern terminals of the pattern glass are in contact with the first and second probes. The method of claim 10, The pattern glass cover And a viewing window for visually confirming a contact state between the pattern terminals of the pattern glass and the first and second probes. The method according to claim 10 or 11, The pattern glass cover Further comprising pressure bolts for adjusting the contact pressure between the pattern terminal of the pattern glass and the first and second probes, The pressing bolt is a probe unit for inspecting the display panel, characterized in that fastening to the screw hole formed in the pattern glass through the through-hole formed in the main body. The method of claim 1, The probe unit A push block which is fastened to the main body so as to be positioned at both ends of the second alignment bar, and has an inclined push surface for pushing the second alignment bar in the correct direction for automatic alignment of the second probes; Probe unit for inspecting the display panel comprising a. The probe unit for display panel inspection is: Main body; A first assembly installed on the main body and transferring an electrical signal to electrode pads of any one row of even-numbered electrode pads and odd-numbered electrode pads of a display panel; And a second assembly that transmits an electrical signal to electrode pads of the other row of the display panel and is detachably installed on the main body so as not to overlap with the first assembly. Probe unit. The method of claim 14, The probe unit A patterned glass having a pattern terminal connected to a driving sheet having a tape automated bonding integrated circuit (IC) and transferring electrical signals to the first and second assemblies; And Mounted to the main body; And a pattern glass cover for pressing the pattern glass so that the pattern terminals of the pattern glass are in contact with the first and second assemblies. The method of claim 15, The pattern glass cover A viewing window for visually confirming a contact state between the pattern terminals of the pattern glass and the first and second assemblies; And Probe unit for inspecting a display panel, characterized in that it comprises a pressing bolt for adjusting the contact pressure between the pattern terminal of the pattern glass and the first and second assemblies. The method according to claim 14 or 15, The first assembly is First probes comprising a first inclined tension arm having a first tip and a second inclined tension arm having a second tip; A first support block having inclined slots into which the first inclined tension arm of the first probe is fitted; And a second support block having inclined slots into which the second inclined tension arm of the first probe is fitted. The second assembly is Second probes comprising a first horizontal tension arm having a first tip and a second horizontal tension arm having a second tip; A third support block having horizontal slots into which the first horizontal tension arm of the second probe is fitted; And a fourth support block having horizontal slots into which the second horizontal tension arm of the second probe is fitted. The method of claim 17, The first inclined tension arm is The probe unit for a display panel inspection, characterized in that the first tip further comprises a curved tension portion to have elasticity. The method of claim 17, The probe unit And a push block coupled to the main body and having an inclined push surface for pushing and moving the first alignment bar fitted in the second probes in the correct direction for automatic alignment of the second probes. Probe unit for display panel inspection.

Images