KR20100003688A - 액정 패널의 결함 검사 장치 - Google Patents

액정 패널의 결함 검사 장치 Download PDF

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Publication number
KR20100003688A
KR20100003688A KR1020090015587A KR20090015587A KR20100003688A KR 20100003688 A KR20100003688 A KR 20100003688A KR 1020090015587 A KR1020090015587 A KR 1020090015587A KR 20090015587 A KR20090015587 A KR 20090015587A KR 20100003688 A KR20100003688 A KR 20100003688A
Authority
KR
South Korea
Prior art keywords
liquid crystal
crystal panel
moving
rail
pressing
Prior art date
Application number
KR1020090015587A
Other languages
English (en)
Korean (ko)
Inventor
왕 성-장
추안 쿠오-핀
첸 치엔-민
Original Assignee
유테크존 컴퍼니 리미티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 유테크존 컴퍼니 리미티드 filed Critical 유테크존 컴퍼니 리미티드
Publication of KR20100003688A publication Critical patent/KR20100003688A/ko

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Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Nonlinear Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
KR1020090015587A 2008-07-01 2009-02-25 액정 패널의 결함 검사 장치 KR20100003688A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW097124705 2008-07-01
TW097124705A TWI432824B (zh) 2008-07-01 2008-07-01 Panel pressing detection device and pressing mechanism

Publications (1)

Publication Number Publication Date
KR20100003688A true KR20100003688A (ko) 2010-01-11

Family

ID=41700921

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020090015587A KR20100003688A (ko) 2008-07-01 2009-02-25 액정 패널의 결함 검사 장치

Country Status (3)

Country Link
JP (1) JP5133912B2 (zh)
KR (1) KR20100003688A (zh)
TW (1) TWI432824B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102202033B1 (ko) * 2020-09-03 2021-01-12 주식회사 프로이천 캠승강식 오토 프로브장치

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9585071B2 (en) 2010-01-26 2017-02-28 Kyocera Corporation Radio relay station and control method
US8881598B2 (en) * 2012-10-23 2014-11-11 Shenzhen China Star Optoelectronics Technology Co., Ltd Pressure point inspection device
CN102914887B (zh) * 2012-10-23 2015-03-25 深圳市华星光电技术有限公司 一种压力点检查装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3407341B2 (ja) * 1993-07-26 2003-05-19 ソニー株式会社 表示デバイス検査装置
KR100397080B1 (ko) * 1995-02-22 2004-11-08 포톤 다이나믹스, 인코포레이티드 평면디스플레이검사시스템
JP2002333725A (ja) * 2001-05-08 2002-11-22 Ntn Corp パターン修正装置
JP4254085B2 (ja) * 2001-08-28 2009-04-15 株式会社日立プラントテクノロジー 液晶パネル基板の検査装置及び検査方法
JP2006275547A (ja) * 2005-03-28 2006-10-12 Seiko Epson Corp マトリクス構造の欠陥検出装置およびマトリクス構造の欠陥検出方法
JP2007178913A (ja) * 2005-12-28 2007-07-12 Sharp Corp 異物検出方法及び異物検出装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102202033B1 (ko) * 2020-09-03 2021-01-12 주식회사 프로이천 캠승강식 오토 프로브장치

Also Published As

Publication number Publication date
JP2010014696A (ja) 2010-01-21
TWI432824B (zh) 2014-04-01
JP5133912B2 (ja) 2013-01-30
TW201003174A (en) 2010-01-16

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Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E601 Decision to refuse application