KR20080031907A - 디지털 방사선용의 저 잡음 전자 데이터 캡쳐 및 리드아웃시스템과 이미징 패널 동작 방법 - Google Patents

디지털 방사선용의 저 잡음 전자 데이터 캡쳐 및 리드아웃시스템과 이미징 패널 동작 방법 Download PDF

Info

Publication number
KR20080031907A
KR20080031907A KR1020087002078A KR20087002078A KR20080031907A KR 20080031907 A KR20080031907 A KR 20080031907A KR 1020087002078 A KR1020087002078 A KR 1020087002078A KR 20087002078 A KR20087002078 A KR 20087002078A KR 20080031907 A KR20080031907 A KR 20080031907A
Authority
KR
South Korea
Prior art keywords
digital
charge
counter
pixel
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR1020087002078A
Other languages
English (en)
Korean (ko)
Inventor
스리람 드허제티
티모씨 존 워직
Original Assignee
케어스트림 헬스 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 케어스트림 헬스 인코포레이티드 filed Critical 케어스트림 헬스 인코포레이티드
Publication of KR20080031907A publication Critical patent/KR20080031907A/ko
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/30—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measurement Of Radiation (AREA)
KR1020087002078A 2005-07-28 2006-07-14 디지털 방사선용의 저 잡음 전자 데이터 캡쳐 및 리드아웃시스템과 이미징 패널 동작 방법 Ceased KR20080031907A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/191,537 US7456409B2 (en) 2005-07-28 2005-07-28 Low noise image data capture for digital radiography
US11/191,537 2005-07-28

Publications (1)

Publication Number Publication Date
KR20080031907A true KR20080031907A (ko) 2008-04-11

Family

ID=37440806

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020087002078A Ceased KR20080031907A (ko) 2005-07-28 2006-07-14 디지털 방사선용의 저 잡음 전자 데이터 캡쳐 및 리드아웃시스템과 이미징 패널 동작 방법

Country Status (6)

Country Link
US (1) US7456409B2 (https=)
EP (1) EP1907883A2 (https=)
JP (1) JP2009504004A (https=)
KR (1) KR20080031907A (https=)
CN (1) CN101389978A (https=)
WO (1) WO2007015756A2 (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100943237B1 (ko) * 2009-04-20 2010-02-18 실리콘 디스플레이 (주) 이미지 센서 및 그의 구동 방법
KR101006916B1 (ko) * 2008-06-13 2011-01-10 한국 천문 연구원 시간-디지털 변환기에 적용되는 ｘ－선 영상검출기용시뮬레이터
KR20120116873A (ko) * 2011-04-13 2012-10-23 세미-컨덕터 디바이스-언 엘벗 시스템즈-라파엘 파트너쉽 검출기 픽셀 신호 리드아웃 회로 및 상기 회로의 이미징 방법

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4041040B2 (ja) * 2003-09-08 2008-01-30 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線断層撮影装置
US7825370B2 (en) * 2005-06-23 2010-11-02 General Electric Company Method and system for calibrating a computed tomography system
PT103370B (pt) * 2005-10-20 2009-01-19 Univ Do Minho Matriz de imagem de raios-x com guias de luz e sensores de pixel inteligentes, dispositivos detectores de radiação ou de partículas de alta energia que a contém, seu processo de fabrico e sua utilização
US7477727B1 (en) * 2006-01-26 2009-01-13 Karl Adolf Malashanko Digital X-ray image detector array
US8679293B2 (en) * 2007-05-04 2014-03-25 Centre De Recherche Industrielle Du Quebec System and method for optimizing lignocellulosic granular matter refining
US7639073B2 (en) * 2007-11-16 2009-12-29 Omnivision Technologies, Inc. Switched-capacitor amplifier with improved reset phase
EP2651119B1 (en) * 2010-12-09 2017-02-22 Rigaku Corporation Radiation detector
DE102011080656B4 (de) * 2011-08-09 2013-11-14 Siemens Aktiengesellschaft Verfahren zur Homogenisierung der Schwellenwerte eines mehrkanaligen quantenzählenden Strahlungsdetektors
CN102495824B (zh) * 2011-11-15 2015-03-18 上海卫星工程研究所 在同一模拟输出卡上产生多路不同频率模拟信号的方法
US8643168B1 (en) * 2012-10-16 2014-02-04 Lattice Semiconductor Corporation Integrated circuit package with input capacitance compensation
KR20150053159A (ko) * 2013-11-07 2015-05-15 삼성전자주식회사 서로 다른 시점에 입력된 전하 패킷에 기초하여 전압을 획득하는 방법 및 장치
EP3059613A1 (en) * 2015-02-23 2016-08-24 Institut de Física d'Altes Energies Photon counting
US10007009B2 (en) 2015-04-07 2018-06-26 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor X-ray detector
EP3281041B1 (en) 2015-04-07 2020-06-10 Shenzhen Xpectvision Technology Co., Ltd. Methods of making semiconductor x-ray detector
EP3281039B1 (en) 2015-04-07 2020-03-11 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor x-ray detector
EP3320371B1 (en) 2015-06-10 2025-05-21 Shenzhen Xpectvision Technology Co., Ltd. A detector for x-ray fluorescence
CN107710021B (zh) 2015-07-09 2019-09-27 深圳帧观德芯科技有限公司 制作半导体x射线检测器的方法
US10705031B2 (en) 2015-08-27 2020-07-07 Shenzhen Xpectvision Technology Co., Ltd. X-ray imaging with a detector capable of resolving photon energy
EP3347741B1 (en) 2015-09-08 2020-05-20 Shenzhen Xpectvision Technology Co., Ltd. Methods for making an x-ray detector
CN107224293B (zh) * 2016-03-25 2020-08-18 群创光电股份有限公司 X射线图像检测系统及其控制方法
JP2017223525A (ja) * 2016-06-15 2017-12-21 コニカミノルタ株式会社 放射線画像撮影装置
EP3385756A1 (en) * 2017-04-06 2018-10-10 Koninklijke Philips N.V. Pulse shaper
JP6987603B2 (ja) * 2017-10-26 2022-01-05 ブリルニクス シンガポール プライベート リミテッド 固体撮像装置、固体撮像装置の駆動方法、および電子機器
EP4679812A1 (en) * 2017-10-30 2026-01-14 Shenzhen Xpectvision Technology Co., Ltd. Dark noise compensation in radiation detector
EP3821274A4 (en) 2018-07-12 2022-02-23 Shenzhen Xpectvision Technology Co., Ltd. HIGH TIME RESOLUTION LIDAR
CN110393549A (zh) * 2019-05-27 2019-11-01 聚融医疗科技(杭州)有限公司 一种自动调节超声图像增益的方法及装置
CN110531404B (zh) * 2019-06-03 2021-07-09 中国科学技术大学 核脉冲电荷时间转换方法与系统
US10910432B1 (en) * 2019-07-23 2021-02-02 Cyber Medical Imaging, Inc. Use of surface patterning for fabricating a single die direct capture dental X-ray imaging sensor
US11064141B2 (en) * 2019-07-24 2021-07-13 Semiconductor Components Industries, Llc Imaging systems and methods for reducing dark signal non-uniformity across pixels
US11503242B2 (en) * 2020-02-06 2022-11-15 Novatek Microelectronics Corp. Readout integrated circuit

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3679826A (en) * 1970-07-06 1972-07-25 Philips Corp Solid state image sensing device
DE3635687A1 (de) * 1986-10-21 1988-05-05 Messerschmitt Boelkow Blohm Bildaufnahmesensor
JPS63127622A (ja) * 1986-11-18 1988-05-31 Jeol Ltd Ａ／ｄ変換器
JP2566006B2 (ja) * 1989-03-10 1996-12-25 日本電子株式会社 放射線検出器用波高検出回路
US5084639A (en) * 1990-09-17 1992-01-28 General Electric Company Low frequency noise canceling photodetector preamplifier useful for computerized tomography
JPH0548460A (ja) * 1991-06-05 1993-02-26 Matsushita Electric Ind Co Ltd Ａ／ｄ変換器とこれを用いたセンサ及び３次元集積回路
US5466892A (en) * 1993-02-03 1995-11-14 Zycon Corporation Circuit boards including capacitive coupling for signal transmission and methods of use and manufacture
JPH07221260A (ja) * 1994-02-02 1995-08-18 Fujitsu Ltd 集積回路装置とその製造方法
US5461425A (en) * 1994-02-15 1995-10-24 Stanford University CMOS image sensor with pixel level A/D conversion
DE69511292T2 (de) * 1995-04-28 1999-12-02 Sunnybrook Hospital, North York Aktive röntgenbildmatrix
JP3893181B2 (ja) * 1996-02-26 2007-03-14 キヤノン株式会社 放射線撮像装置及び該装置の駆動方法
JPH1168033A (ja) * 1997-08-15 1999-03-09 Matsushita Electric Ind Co Ltd マルチチップモジュール
EP0936660A1 (en) 1998-02-10 1999-08-18 Interuniversitair Microelektronica Centrum Vzw An imager or particle or radiation detector and method of manufacturing the same
US6271785B1 (en) * 1998-04-29 2001-08-07 Texas Instruments Incorporated CMOS imager with an A/D per pixel convertor
US6292529B1 (en) * 1999-12-15 2001-09-18 Analogic Corporation Two-dimensional X-ray detector array for CT applications
FI111759B (fi) 2000-03-14 2003-09-15 Planmed Oy Anturijärjestelmä ja menetelmä digitaalisessa röntgenkuvantamisessa
JP3549841B2 (ja) * 2001-01-30 2004-08-04 日本電信電話株式会社 データ変換・出力装置
WO2003001567A2 (en) * 2001-06-20 2003-01-03 R3 Logic, Inc. High resolution, low power, wide dynamic range imager with embedded pixel processor and dram storage
DE10140863A1 (de) 2001-08-21 2003-03-13 Siemens Ag CT-Datenaufnehmer
JP2004239708A (ja) * 2003-02-05 2004-08-26 Mitsubishi Electric Corp 赤外線検出装置およびその製造方法
DE10307752B4 (de) 2003-02-14 2007-10-11 Siemens Ag Röntgendetektor
US20060011853A1 (en) * 2004-07-06 2006-01-19 Konstantinos Spartiotis High energy, real time capable, direct radiation conversion X-ray imaging system for Cd-Te and Cd-Zn-Te based cameras

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101006916B1 (ko) * 2008-06-13 2011-01-10 한국 천문 연구원 시간-디지털 변환기에 적용되는 ｘ－선 영상검출기용시뮬레이터
KR100943237B1 (ko) * 2009-04-20 2010-02-18 실리콘 디스플레이 (주) 이미지 센서 및 그의 구동 방법
KR20120116873A (ko) * 2011-04-13 2012-10-23 세미-컨덕터 디바이스-언 엘벗 시스템즈-라파엘 파트너쉽 검출기 픽셀 신호 리드아웃 회로 및 상기 회로의 이미징 방법

Also Published As

Publication number Publication date
WO2007015756A2 (en) 2007-02-08
US20070023668A1 (en) 2007-02-01
CN101389978A (zh) 2009-03-18
US7456409B2 (en) 2008-11-25
EP1907883A2 (en) 2008-04-09
WO2007015756A3 (en) 2007-04-12
JP2009504004A (ja) 2009-01-29

Similar Documents

Publication Publication Date Title
KR20080031907A (ko) 디지털 방사선용의 저 잡음 전자 데이터 캡쳐 및 리드아웃시스템과 이미징 패널 동작 방법
US6163029A (en) Radiation detector, radiation detecting method and X-ray diagnosing apparatus with same radiation detector
KR101701365B1 (ko) 이차원 어레이의 픽셀들을 갖는 광자/에너지 식별 엑스선 및 감마선 이미징 디바이스
EP1966996B1 (en) Event detection for digital radiography detector
US7436444B2 (en) Radiation image pick-up apparatus having reading element, drive circuit for driving reading element, and control circuit for controlling drive circuit
US20030001080A1 (en) Time domain sensing technique and system architecture for image sensor
US8199236B2 (en) Device and pixel architecture for high resolution digital
US10473798B2 (en) Counting and integrating pixels, detectors, and methods
US20100329421A1 (en) Suppression of direct detection events in x-ray detectors
EP1661183A1 (en) Multi-mode digital imaging apparatus and system
TW435041B (en) Image sensors generating digital signals from light integration processes
US20080217546A1 (en) Pixel Implemented Current to Frequency Converter
EP1233612B1 (en) CMOS image sensor with extended dynamic range
US20220395239A1 (en) Ultra-fast scanning x-ray imaging device
US20190132531A1 (en) Solid-state imaging element, method of operating solid-state imaging element, imaging apparatus, and electronic device
Jo et al. A tileable CMOS X-ray line detector using time-delay-integration with pseudomultisampling for large-sized dental X-ray imaging systems
EP2873228B1 (en) Circuitry and method for collecting image array data with separate addressing and dynamic clamping of pixels to allow for faster pixel data readout and full removal of pixel charges
KR101026923B1 (ko) 가변 해상도 광자 계수형 엑스선 독출 방법, 독출 집적 회로 및 이미지 센서
JP7098288B2 (ja) 放射線撮像システム
US7528876B2 (en) Image sensing device, process for driving such a device and electrical signal generated in such a device
JP2001074552A (ja) 光電変換装置及びその駆動方法
JP2001169193A (ja) 撮像装置
JPH0937022A (ja) 多素子センサの校正方法及びその装置
CN117857942A (zh) 读出电路、图像传感器及摄像系统
JPH022792A (ja) 赤外線撮像素子とその駆動方法

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

A201 Request for examination
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

E601 Decision to refuse application
PE0601 Decision on rejection of patent

St.27 status event code: N-2-6-B10-B15-exm-PE0601

R18 Changes to party contact information recorded

Free format text: ST27 STATUS EVENT CODE: A-3-3-R10-R18-OTH-X000 (AS PROVIDED BY THE NATIONAL OFFICE)

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000