KR20070082029A - 테스트 시스템 - Google Patents

테스트 시스템 Download PDF

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Publication number
KR20070082029A
KR20070082029A KR1020070014451A KR20070014451A KR20070082029A KR 20070082029 A KR20070082029 A KR 20070082029A KR 1020070014451 A KR1020070014451 A KR 1020070014451A KR 20070014451 A KR20070014451 A KR 20070014451A KR 20070082029 A KR20070082029 A KR 20070082029A
Authority
KR
South Korea
Prior art keywords
test
voltage
switch
liquid crystal
electrically connected
Prior art date
Application number
KR1020070014451A
Other languages
English (en)
Korean (ko)
Inventor
히데키 나가누마
Original Assignee
요코가와 덴키 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 요코가와 덴키 가부시키가이샤 filed Critical 요코가와 덴키 가부시키가이샤
Publication of KR20070082029A publication Critical patent/KR20070082029A/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
KR1020070014451A 2006-02-14 2007-02-12 테스트 시스템 KR20070082029A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2006-00035881 2006-02-14
JP2006035881A JP4635895B2 (ja) 2006-02-14 2006-02-14 テストシステム

Publications (1)

Publication Number Publication Date
KR20070082029A true KR20070082029A (ko) 2007-08-20

Family

ID=38496081

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020070014451A KR20070082029A (ko) 2006-02-14 2007-02-12 테스트 시스템

Country Status (3)

Country Link
JP (1) JP4635895B2 (ja)
KR (1) KR20070082029A (ja)
TW (1) TW200736634A (ja)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000165244A (ja) * 1998-11-27 2000-06-16 Sharp Corp 半導体集積回路装置
JP2002250754A (ja) * 2001-02-26 2002-09-06 Yokogawa Electric Corp 半導体テスト装置
JP2004294093A (ja) * 2003-03-25 2004-10-21 Seiko Epson Corp 半導体集積回路及びその検査方法
JP2005265756A (ja) * 2004-03-22 2005-09-29 Yokogawa Electric Corp Ｉｃテスタ

Also Published As

Publication number Publication date
JP4635895B2 (ja) 2011-02-23
TW200736634A (en) 2007-10-01
JP2007218585A (ja) 2007-08-30

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Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E90F Notification of reason for final refusal
E902 Notification of reason for refusal
E601 Decision to refuse application