KR20060132651A - 표면 프로파일을 측정하기 위한 장치 및 방법 - Google Patents

표면 프로파일을 측정하기 위한 장치 및 방법 Download PDF

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Publication number
KR20060132651A
KR20060132651A KR1020067014513A KR20067014513A KR20060132651A KR 20060132651 A KR20060132651 A KR 20060132651A KR 1020067014513 A KR1020067014513 A KR 1020067014513A KR 20067014513 A KR20067014513 A KR 20067014513A KR 20060132651 A KR20060132651 A KR 20060132651A
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KR
South Korea
Prior art keywords
sensor assembly
measuring
sensor
along
assembly
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KR1020067014513A
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English (en)
Korean (ko)
Inventor
저스틴 더블유. 빌헬름
Original Assignee
쓰리엠 이노베이티브 프로퍼티즈 컴파니
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Publication of KR20060132651A publication Critical patent/KR20060132651A/ko
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S33/00—Geometrical instruments
    • Y10S33/21—Geometrical instruments with laser

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Optical Distance (AREA)
KR1020067014513A 2003-12-24 2004-12-21 표면 프로파일을 측정하기 위한 장치 및 방법 Withdrawn KR20060132651A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US53249203P 2003-12-24 2003-12-24
US60/532,492 2003-12-24

Publications (1)

Publication Number Publication Date
KR20060132651A true KR20060132651A (ko) 2006-12-21

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ID=34748802

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020067014513A Withdrawn KR20060132651A (ko) 2003-12-24 2004-12-21 표면 프로파일을 측정하기 위한 장치 및 방법

Country Status (10)

Country Link
US (1) US7322229B2 (https=)
EP (1) EP1697695A1 (https=)
JP (1) JP5173195B2 (https=)
KR (1) KR20060132651A (https=)
CN (1) CN1898525A (https=)
AU (1) AU2004312851A1 (https=)
BR (1) BRPI0418101A (https=)
CA (1) CA2551395A1 (https=)
MX (1) MXPA06007221A (https=)
WO (1) WO2005066581A1 (https=)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005072314A2 (en) * 2004-01-22 2005-08-11 Regents Of The University Of Minnesota Method and apparatus for evaluation of standing timber
BRPI0514685B1 (pt) * 2004-08-26 2019-04-16 Monsanto Technology Llc Sistema de amostrador de semente automatizado e método de triar uma pluralidade de sementes para uma característica testável
CN100501315C (zh) * 2006-01-06 2009-06-17 鸿富锦精密工业（深圳）有限公司 一种表面轮廓检测方法
TWI464390B (zh) * 2008-02-06 2014-12-11 尼康股份有限公司 Surface inspection device and surface inspection method
GB0811076D0 (en) * 2008-06-17 2008-07-23 Renishaw Plc Scale track
US7908750B2 (en) * 2008-10-01 2011-03-22 Sharon Ree Goick System and method for decorating cakes and confections
US8887584B2 (en) * 2009-01-20 2014-11-18 Tohoku University Load measuring apparatus
KR101103354B1 (ko) * 2009-12-10 2012-01-05 주식회사 영화키스톤건축사사무소 자동제어기능을 갖는 측량장치
CN102135419B (zh) * 2010-01-23 2015-02-11 鸿富锦精密工业（深圳）有限公司 微动测量装置
CN102175167A (zh) * 2010-12-29 2011-09-07 吴江市博众精工科技有限公司 测量产品上下盖压合后是否合格的方法
JP5689035B2 (ja) * 2011-07-11 2015-03-25 公益財団法人鉄道総合技術研究所 かぶりコンクリートの剥落形状計測装置、及び、かぶりコンクリートの剥落形状計測方法
CN102628674A (zh) * 2012-03-30 2012-08-08 苏州筑邦测控科技有限公司 非接触式试件表面测试系统
CN103278080B (zh) * 2013-04-28 2015-08-19 哈尔滨工业大学 一种用于测试混凝土表面平整度的装置
EP2905422A1 (en) * 2014-02-07 2015-08-12 Caterpillar Global Mining Europe GmbH Device and method for longwall mining installation course determination
CN104180756B (zh) * 2014-08-27 2017-02-15 国家电网公司 激光位移传感器测对接件相对位移的方法
CN104457565A (zh) * 2014-10-27 2015-03-25 中冶建筑研究总院有限公司 一种缺陷尺寸测量装置和方法
CN105180829B (zh) * 2015-08-24 2018-07-03 恒瞻（新兴）科技有限公司 一种用于轮胎胶部件生产的在线轮廓测量装置
CN105066943A (zh) * 2015-08-31 2015-11-18 中国华能集团清洁能源技术研究院有限公司 一种便携式反射镜面型检测装置及方法
CN105526896A (zh) * 2015-12-04 2016-04-27 上海市地下空间设计研究总院有限公司 一种变形缝三向相对位移测量装置及方法
CN205593495U (zh) * 2016-02-02 2016-09-21 意力(广州)电子科技有限公司 一种基于距离感应的面板平整度测试仪
CN106123844A (zh) * 2016-06-22 2016-11-16 苏交科集团股份有限公司 一种钢构件变形检测仪器及使用方法
CN109752043A (zh) * 2017-11-08 2019-05-14 丹阳市日晟工业设备有限公司 一种简易金属铸件检验装置
CN108895992A (zh) * 2018-09-03 2018-11-27 大连理工大学 一种用于混凝土裂缝断裂面粗糙度的激光扫描装置及使用方法
CN109579675B (zh) * 2019-01-09 2023-09-08 山东太古飞机工程有限公司 一种用于测量飞机蒙皮凹凸程度的测量辅助工装
JP7157250B2 (ja) * 2019-07-09 2022-10-19 株式会社日本触媒 距離測定装置および距離測定方法
CN110440723A (zh) * 2019-08-05 2019-11-12 中国工程物理研究院材料研究所 一种异型结构零件内曲面表面粗糙度测量装置及测量方法
CN110729670B (zh) * 2019-08-27 2020-11-06 东莞理工学院 基于单点激光三角测距的电缆轴向切割系统及方法
US11788836B2 (en) * 2019-08-29 2023-10-17 Jpmorgan Chase Bank, N.A. Alignment tool
CN110530246B (zh) * 2019-09-09 2021-03-26 浙江创新工程检测有限公司 一种墙面平整度检测仪器
CN110779474B (zh) * 2019-10-16 2021-06-01 徐州市铜山区嘉量计量检测创新中心 一种工件磨损检测多点控制定位封闭式光束检测设备
CN110940299B (zh) * 2019-11-04 2020-11-13 浙江大学 一种混凝土表面三维粗糙度的测量方法
CN112129258B (zh) * 2020-08-24 2022-07-26 中车唐山机车车辆有限公司 划痕深度测量方法
US11656069B2 (en) * 2020-10-26 2023-05-23 Massimo Conte Grading tools
US20220356988A1 (en) * 2021-05-10 2022-11-10 Stanley Black & Decker Inc. Magnetic rail with laser
CN113310436B (zh) * 2021-05-31 2023-03-28 辽宁元创石化技术有限公司 塔式容器直线度的激光检测仪
US11828589B2 (en) * 2021-08-10 2023-11-28 United States Postal Service Length gauge
CN116538980A (zh) * 2022-01-26 2023-08-04 江苏集萃精凯高端装备技术有限公司 阶梯轴零件长度测量装置及使用其的测量方法
US12276495B2 (en) 2023-08-03 2025-04-15 Hamar Laser Instruments, Inc. Flatness measuring system, method and apparatus
CN116765931A (zh) * 2023-08-10 2023-09-19 浙江金火科技实业有限公司 一种数控机床的滑台检测装置及其检测方法
DE102024203132B4 (de) * 2024-04-05 2026-01-22 Sabahattin Alcioglu Verfahren und Messanordnung zum Bestimmen einer 3D-Position eines Werkstücks
CN119289929A (zh) * 2024-12-16 2025-01-10 中铁七局集团西安铁路工程有限公司 一种混凝土凿毛表面粗糙度测量装置及其测量方法

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4361044A (en) * 1980-12-09 1982-11-30 The United States Of America As Represented By The United States Department Of Energy Scanning ultrasonic probe
US4434558A (en) * 1981-09-18 1984-03-06 Face Jr Samuel A Surface profile measuring apparatus and method
JPS58111708A (ja) * 1981-12-25 1983-07-02 Sumitomo Metal Ind Ltd 平担度測定装置
JPS60106107U (ja) * 1983-12-26 1985-07-19 株式会社フジタ 距離測定装置
GB2186976A (en) 1986-02-25 1987-08-26 Edwin Sidney Crossland Floor flatness measuring device
JPS6395307A (ja) * 1986-10-10 1988-04-26 Tokyo Keiki Co Ltd 路面凹凸計測装置
US5051933A (en) * 1988-05-20 1991-09-24 The Boeing Company Method and apparatus for measuring the waviness of an aerodynamic surface
JPH0725611Y2 (ja) * 1991-05-24 1995-06-07 花王株式会社 位置検出装置
JPH05126555A (ja) * 1991-10-18 1993-05-21 Kyowa Electron Instr Co Ltd 衝撃吸収装置の衝撃変位測定装置およびその衝撃変位測定方法
US5818061A (en) * 1992-06-24 1998-10-06 Robotic Vision Systems, Inc. Apparatus and method for obtaining three-dimensional data from objects in a contiguous array
US5392527A (en) * 1993-07-12 1995-02-28 Wheelabrator Engineered Systems, Inc. Annulus measuring device
JPH081444Y2 (ja) * 1993-12-28 1996-01-17 財団法人鉄道総合技術研究所 軌道の実形状測定装置
JPH08101018A (ja) * 1994-09-30 1996-04-16 Sintokogio Ltd レーザ測長器による鋳型および鋳型関連部品の寸法測定法
US5617645A (en) * 1995-05-02 1997-04-08 William R. W. Wick Non-contact precision measurement system
JPH08313223A (ja) * 1995-05-16 1996-11-29 Ls Electro Galvanizing Co 移動ストリップを監視する方法と装置
US5875559A (en) * 1995-10-27 1999-03-02 Applied Materials, Inc. Apparatus for measuring the profile of a polishing pad in a chemical mechanical polishing system
JPH09222318A (ja) * 1996-02-19 1997-08-26 Fanuc Ltd リニアモータ走行軸の位置検出機構
US6169290B1 (en) * 1997-08-22 2001-01-02 Valmet-Karlstad Ab Method and measuring device for measuring at an envelope surface
US6161429A (en) * 1998-10-13 2000-12-19 Paveset America, Llc Dual path profilograph
DE19859445C2 (de) * 1998-12-22 2001-01-11 Asm Automation Sensorik Messte Meßseil-Wegsensor mit einem Längsantrieb für die Seiltrommel
JP2000258153A (ja) * 1999-03-10 2000-09-22 Fujikoshi Mach Corp 平面平坦度測定装置
JP2001033247A (ja) 1999-07-16 2001-02-09 Sekisui Chem Co Ltd 不陸測定装置及び不陸測定方法
US6442857B1 (en) * 2000-11-10 2002-09-03 Toto Ltd. Portable surface inspector
GB0200949D0 (en) * 2002-01-16 2002-03-06 Ctex Seat Comfort Ltd Component position indicating apparatus

Also Published As

Publication number Publication date
US7322229B2 (en) 2008-01-29
JP2007517229A (ja) 2007-06-28
CN1898525A (zh) 2007-01-17
CA2551395A1 (en) 2005-07-21
AU2004312851A1 (en) 2005-07-21
BRPI0418101A (pt) 2007-04-17
EP1697695A1 (en) 2006-09-06
US20050138995A1 (en) 2005-06-30
WO2005066581A1 (en) 2005-07-21
MXPA06007221A (es) 2006-09-04
JP5173195B2 (ja) 2013-03-27

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Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20060719

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid