KR20050046586A - 전류-전압 변환 회로 및 리세트 방법 - Google Patents

전류-전압 변환 회로 및 리세트 방법 Download PDF

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Publication number
KR20050046586A
KR20050046586A KR1020040092192A KR20040092192A KR20050046586A KR 20050046586 A KR20050046586 A KR 20050046586A KR 1020040092192 A KR1020040092192 A KR 1020040092192A KR 20040092192 A KR20040092192 A KR 20040092192A KR 20050046586 A KR20050046586 A KR 20050046586A
Authority
KR
South Korea
Prior art keywords
capacitor
current
switch
voltage
operational amplifier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020040092192A
Other languages
English (en)
Korean (ko)
Inventor
미야케야스히로
Original Assignee
애질런트 테크놀로지스, 인크.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 애질런트 테크놀로지스, 인크. filed Critical 애질런트 테크놀로지스, 인크.
Publication of KR20050046586A publication Critical patent/KR20050046586A/ko
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24—Arrangements for measuring quantities of charge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R22/00—Arrangements for measuring time integral of electric power or current, e.g. electricity meters
    • G01R22/06—Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Electronic Switches (AREA)
KR1020040092192A 2003-11-14 2004-11-12 전류-전압 변환 회로 및 리세트 방법 Withdrawn KR20050046586A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2003-00385098 2003-11-14
JP2003385098A JP4280915B2 (ja) 2003-11-14 2003-11-14 電流−電圧変換回路

Publications (1)

Publication Number Publication Date
KR20050046586A true KR20050046586A (ko) 2005-05-18

Family

ID=34567361

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020040092192A Withdrawn KR20050046586A (ko) 2003-11-14 2004-11-12 전류-전압 변환 회로 및 리세트 방법

Country Status (5)

Country Link
US (1) US7161817B2 (https=)
JP (1) JP4280915B2 (https=)
KR (1) KR20050046586A (https=)
CN (1) CN1616974A (https=)
TW (1) TW200530595A (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011108272A1 (de) * 2011-07-21 2013-01-24 Pfisterer Kontaktsysteme Gmbh Vorrichtung und Verfahren zum Prüfen des Vorhandenseins einer elektrischen Spannung
FR3025606B1 (fr) * 2014-09-10 2016-09-23 Commissariat Energie Atomique Dispositif pour la mesure de courant
KR102865499B1 (ko) * 2023-12-15 2025-09-26 한양대학교 산학협력단 오프 커런트 측정 회로

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1352600A1 (ru) * 1985-07-17 1987-11-15 Ставропольский политехнический институт Одноканальное устройство дл управлени вентильным преобразователем
US5179345A (en) 1989-12-13 1993-01-12 International Business Machines Corporation Method and apparatus for analog testing
JP3705423B2 (ja) 2001-01-25 2005-10-12 株式会社アドバンテスト 電流−電圧変換回路

Also Published As

Publication number Publication date
US7161817B2 (en) 2007-01-09
JP2005151112A (ja) 2005-06-09
CN1616974A (zh) 2005-05-18
JP4280915B2 (ja) 2009-06-17
TW200530595A (en) 2005-09-16
US20050105310A1 (en) 2005-05-19

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Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20041112

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid