KR20040004403A - 마이크로리소그래피용 조성물 - Google Patents
마이크로리소그래피용 조성물 Download PDFInfo
- Publication number
- KR20040004403A KR20040004403A KR10-2003-7005196A KR20037005196A KR20040004403A KR 20040004403 A KR20040004403 A KR 20040004403A KR 20037005196 A KR20037005196 A KR 20037005196A KR 20040004403 A KR20040004403 A KR 20040004403A
- Authority
- KR
- South Korea
- Prior art keywords
- fluorine
- group
- containing polymer
- structural formula
- carbon atoms
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F232/00—Copolymers of cyclic compounds containing no unsaturated aliphatic radicals in a side chain, and having one or more carbon-to-carbon double bonds in a carbocyclic ring system
- C08F232/08—Copolymers of cyclic compounds containing no unsaturated aliphatic radicals in a side chain, and having one or more carbon-to-carbon double bonds in a carbocyclic ring system having condensed rings
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0046—Photosensitive materials with perfluoro compounds, e.g. for dry lithography
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0395—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having a backbone with alicyclic moieties
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
- Materials For Photolithography (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US69128000A | 2000-10-18 | 2000-10-18 | |
US09/691,280 | 2000-10-18 | ||
PCT/US2001/042743 WO2002033489A2 (en) | 2000-10-18 | 2001-10-16 | Compositions for microlithography |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20040004403A true KR20040004403A (ko) | 2004-01-13 |
Family
ID=24775897
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2003-7005196A KR20040004403A (ko) | 2000-10-18 | 2001-10-16 | 마이크로리소그래피용 조성물 |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP1326903A2 (de) |
JP (1) | JP2004512396A (de) |
KR (1) | KR20040004403A (de) |
CN (1) | CN1214054C (de) |
AU (1) | AU2002232383A1 (de) |
TW (1) | TW569079B (de) |
WO (1) | WO2002033489A2 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030130452A1 (en) * | 2001-10-12 | 2003-07-10 | Johnson Lynda Kaye | Copolymers of ethylene with various norbornene derivatives |
AU2003213568A1 (en) | 2002-03-01 | 2003-09-16 | E.I. Du Pont De Nemours And Company | Fluorinated copolymers for microlithography |
TWI307819B (en) | 2002-05-28 | 2009-03-21 | Arch Spec Chem Inc | Acetal protected polymers and photoresist compositions thereof |
KR20050069979A (ko) * | 2002-08-09 | 2005-07-05 | 이 아이 듀폰 디 네모아 앤드 캄파니 | 포토레지스트, 플루오르화 중합체 및 157 nm마이크로리소그래피법 |
KR100804251B1 (ko) * | 2003-02-20 | 2008-02-18 | 프로메러스, 엘엘씨 | 포토레지스트 조성물용 용해속도 개질제 |
JP4377174B2 (ja) | 2003-07-25 | 2009-12-02 | 富士フイルム株式会社 | ポジ型レジスト組成物 |
RU2669697C1 (ru) * | 2013-12-20 | 2018-10-15 | БАСФ Коатингс ГмбХ | Водные первичные дисперсии, способ их получения и их применение |
CN106444281A (zh) * | 2016-09-22 | 2017-02-22 | 京东方科技集团股份有限公司 | 一种光刻胶及刻蚀方法 |
JP6986986B2 (ja) * | 2018-01-30 | 2021-12-22 | 三井化学株式会社 | フッ素含有環状オレフィン系共重合体および成形体 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IL141803A0 (en) * | 1998-09-23 | 2002-03-10 | Du Pont | Photoresists, polymers and processes for microlithography |
-
2001
- 2001-10-16 AU AU2002232383A patent/AU2002232383A1/en not_active Abandoned
- 2001-10-16 JP JP2002536611A patent/JP2004512396A/ja active Pending
- 2001-10-16 EP EP01987900A patent/EP1326903A2/de not_active Withdrawn
- 2001-10-16 WO PCT/US2001/042743 patent/WO2002033489A2/en not_active Application Discontinuation
- 2001-10-16 KR KR10-2003-7005196A patent/KR20040004403A/ko not_active Application Discontinuation
- 2001-10-16 CN CNB01817583XA patent/CN1214054C/zh not_active Expired - Fee Related
- 2001-10-17 TW TW090125691A patent/TW569079B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
AU2002232383A1 (en) | 2002-04-29 |
JP2004512396A (ja) | 2004-04-22 |
WO2002033489A3 (en) | 2002-11-21 |
CN1484659A (zh) | 2004-03-24 |
EP1326903A2 (de) | 2003-07-16 |
CN1214054C (zh) | 2005-08-10 |
WO2002033489A2 (en) | 2002-04-25 |
TW569079B (en) | 2004-01-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |