KR200161680Y1 - Device transfer apparatus - Google Patents
Device transfer apparatus Download PDFInfo
- Publication number
- KR200161680Y1 KR200161680Y1 KR2019940002965U KR19940002965U KR200161680Y1 KR 200161680 Y1 KR200161680 Y1 KR 200161680Y1 KR 2019940002965 U KR2019940002965 U KR 2019940002965U KR 19940002965 U KR19940002965 U KR 19940002965U KR 200161680 Y1 KR200161680 Y1 KR 200161680Y1
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- KR
- South Korea
- Prior art keywords
- board
- loaded
- tray
- burn
- transfer
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
본 고안은 트레이에 적재된 디바이스를 번인보드의 소켓으로 이송시 별도의 공정없이 간격조정을 하여 작업시간을 단축시킬 수 있도록 한 것이다.The present invention is designed to shorten the working time by adjusting the interval without any process when transferring the device loaded on the tray to the socket of the burn-in board.
이를 위해 본 고안은 트레이(1)에 적재된 디바이스(2)를 로딩하여 변인보드(4)로 이송시키는 로드(3)를 이송중 번인보드(4)의 소켓(5)간격과 동일한 간격으로 조정할 수 있도록 이송암(6)에 설치하여서 된 것이다.To this end, the present invention adjusts the rod 3, which loads the device 2 loaded on the tray 1, and transfers it to the variable board 4 at intervals equal to the interval of the sockets 5 of the burn-in board 4 during transfer. It is to be installed on the transfer arm (6) so that.
Description
제1도는 종래의 평면도.1 is a conventional plan view.
제2도는 본 고안의 의한 평면도.2 is a plan view of the present invention.
* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings
1 : 트레이 2 : 디바이스1: tray 2: device
3 : 로더 4 : 변인보드3: loader 4: variable board
6 : 이송암6: transfer arm
본 고안은 QFP(Quad Flat Package)타입의 디바이스를 이송시키는 디바이스 이송장치에 관한 것으로서, 더욱 상세하게는 트레이의 디바이스를 로딩하여 이송간에 상기 디바이스의 간격을 조정하여 작업시간을 단축하기 위한 것이다.The present invention relates to a device transfer device for transferring a device of a QFP (Quad Flat Package) type, and more particularly, to reduce the working time by loading the device of the tray to adjust the interval of the device between transfers.
종래에는 제1도에 도시한 바와같이 베이스(7)의 일측에 프레임(8)이 설치되어 있고 상기 프레임(8)에는 이송암(6)이 이동가능하게 설치되어 있으며 상기 이송암(6)에는 1차로더(3)와 2차로더(3a)가 설치되어 있다.Conventionally, as shown in FIG. 1, a frame 8 is provided at one side of the base 7, and a transfer arm 6 is provided at the frame 8 so as to be movable, and at the transfer arm 6. The primary loader 3 and the secondary loader 3a are provided.
상기 베이스(7)에는 이송수단(도시는 생략함)에 의해 이송됨과 동시에 디바이스(2)가 적재된 트레이(1)가 설치되어 있고 그 일측으로는 상기 1차로더(3)에 의해 로딩된 디바이스(2)의 간격을 조정하기 위한 버퍼(9)가 설치되어 있으며 상기 트레이의 다른 일측에는 상기 버퍼에 의해 간격조정된 디바이스(2)를 테스트하기 위한 소켓(5)이 복수개 설치되어 있는 번인보드(4)가 설치되어 있다.The base 7 is provided with a tray 1 on which the device 2 is loaded at the same time as being conveyed by a conveying means (not shown), and on one side thereof, a device loaded by the primary loader 3. A buffer 9 for adjusting the spacing of (2) is provided, and on the other side of the tray, a burn-in board is provided with a plurality of sockets 5 for testing the device 2 spaced by the buffer. 4) is installed.
따라서 베이스(7)의 상부로 이송수단에 의해 디바이스(2)가 적재된 트레이(1)가 이송되면 프레임(8)에 설치된 이송암(6)이 이송되어 상기 트레이(1)에 적재된 디바이스(2)를 1차로더(3)로 로딩하여 버퍼(9)에 언로딩을 한다.Therefore, when the tray 1 on which the device 2 is loaded is transferred to the upper portion of the base 7, the transfer arm 6 installed on the frame 8 is transferred to the device loaded on the tray 1 ( 2) is loaded into the primary loader 3 and unloaded into the buffer 9.
이에따라 상기 버퍼(9)의 간격이 번인보드(4)의 소켓(5)간격과 일치되도록 조정되면 상기 이송암(6)의 2차로더(3a)로 디바이스(2)를 로딩하여 상기 이송암을 번인보드(4)의 상부로 이송시켜 2차로더에 로딩되어 있는 디바이스를 소켓(5)에 삽입 시키므로 상기 디바이스(2)의 번인-테스트를 실시하게 된다.Accordingly, when the gap of the buffer 9 is adjusted to match the gap of the socket 5 of the burn-in board 4, the device 2 is loaded by the secondary loader 3a of the transfer arm 6 so that the transfer arm can be removed. The burn-in test of the device 2 is performed by inserting the device loaded in the secondary loader to the upper part of the burn-in board 4 and inserting it into the socket 5.
그러나 이러한 종래의 장치는 트레이(1)에 적재된 디바이스(2)를 번인보드(4)의 소켓(5)에 로딩하여 테스트하기 위해 상기 디바이스(2)의 간격을 조정하기 위한 버퍼(9) 및 2차로더(3a)가 반드시 필요하였기 때문에 장비가 대형화되고 제작비가 상승되는 문제점이 있었다.However, such a conventional apparatus has a buffer 9 for adjusting the spacing of the device 2 for loading and testing the device 2 loaded in the tray 1 into the socket 5 of the burn-in board 4; Since the secondary loader 3a was necessary, there was a problem that the equipment was enlarged and the manufacturing cost was increased.
본 고안은 상기한 문제점을 해결하기 위해 안출한 것으로서, 그 구조를 개량하여 트레이의 디바이스를 로딩한 상태에서 번인보드로 이송중 이송암에서 디바이스의 간격을 조정할 수 있도록 한 디바이스 이송장치를 제공하는데 그 목적이 있다.The present invention has been made to solve the above problems, to improve the structure of the device to provide a device transfer device that can adjust the distance of the device in the transfer arm during transfer to the burn-in board with the device of the tray loaded There is a purpose.
상기한 목적을 달성하기 위한 본 고안의 형태에 따르면, 트레이에 적재된 디바이스를 로딩하여 번인보드로 이송시키는 로드를 이송중 간격조정 할 수 있도록 이송암에 설치하여 구성된 디바이스 이송장치가 제공된다.According to an aspect of the present invention for achieving the above object, there is provided a device transfer device configured to be installed on the transfer arm so as to adjust the interval during transfer of the rod loading the device loaded in the tray to transfer to the burn-in board.
이하, 본 고안을 일실시예로 도시한 첨부도면 제2도를 참조하여 상세히 설명하면 다음과 같다.Hereinafter, with reference to Figure 2 of the accompanying drawings showing the present invention as an embodiment in detail as follows.
제2도는 본 고안에 의한 평면도로서, 본 고안은 트레이(1)에 적재된 디바이스(2)를 로딩하는 로더(3)의 간격이 이송중 번인보드(4)의 소켓(5)간격과 동일하게 조정할 수 있도록 이송암(6)에 설치하여서 구성된다.2 is a plan view according to the present invention, the present invention is the interval of the loader (3) for loading the device (2) loaded on the tray 1 is equal to the interval of the socket (5) of the burn-in board (4) during transport It is constructed by being installed on the transfer arm 6 so that it can be adjusted.
상기와 같이 구성된 본 고안은 이송수단(도시는 생략함)에 의해 베이스(7)의 상부로 디바이스(2)를 적재한 트레이(1)가 이송되면 프레임(8)에 이동가능하게 설치된 이송암(6)이 이송되므로 상기 이송암(6)의 일측에 설치된 로더(3)는 상기 디바이스(2)를 로딩하게 된다.The present invention configured as described above has a transfer arm installed to be movable on the frame 8 when the tray 1 on which the device 2 is loaded on the upper portion of the base 7 is transferred by a transfer means (not shown). Since 6) is transferred, the loader 3 installed on one side of the transfer arm 6 loads the device 2.
이때 로더(3)의 간격은 트레이(1)에 담겨진 디바이스(2)간격과 동일한 상태이다.At this time, the interval of the loader 3 is the same state as the interval of the device 2 contained in the tray (1).
상기 로더(3)에 로딩된 디바이스(2)를 번인보드(4)의 소켓(5)에 삽입시키기 위하여 이송암(6)을 번인보드(4)측으로 이송시키게 되면 상기 이송암이 이송중 로더(3)의 간격은 별도의 이송수단에 의해 소켓(5)의 간격과 동일하게 조정되므로 상기 번인보드(4)의 소켓(5)에 디바이스(2)를 삽입시켜 테스트하게 된다.When the transfer arm 6 is transferred to the burn-in board 4 in order to insert the device 2 loaded in the loader 3 into the socket 5 of the burn-in board 4, the transfer arm is transferred to the loader ( Since the spacing of 3) is adjusted in the same manner as the spacing of the socket 5 by a separate transfer means, the device 2 is inserted into the socket 5 of the burn-in board 4 to be tested.
이상에서와 같이 본 고안은 트레이(1)에 적재된 디바이스(2)를 테스트하기 위해 이송암(6)의 로드(3)에 로딩하여 이송중에 자동으로 소켓(5)의 간격과 동일하게 간격조정을 할 수 있게되므로 장비의 소형화는 물론 공정시간을 단축시킬 수 있는 매우 유용한 고안이다.As described above, the present invention loads the rod 3 of the transfer arm 6 to test the device 2 loaded on the tray 1, and automatically adjusts the interval equal to the interval of the socket 5 during transfer. It is a very useful design that can shorten the process and shorten the process time because it can be.
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2019940002965U KR200161680Y1 (en) | 1994-02-18 | 1994-02-18 | Device transfer apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2019940002965U KR200161680Y1 (en) | 1994-02-18 | 1994-02-18 | Device transfer apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR950025917U KR950025917U (en) | 1995-09-18 |
| KR200161680Y1 true KR200161680Y1 (en) | 1999-12-01 |
Family
ID=19377429
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR2019940002965U KR200161680Y1 (en) | 1994-02-18 | 1994-02-18 | Device transfer apparatus |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR200161680Y1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100861051B1 (en) | 2006-12-15 | 2008-09-30 | 세크론 주식회사 | Presizer for test handler, and method for transferring semiconductor device using the same |
-
1994
- 1994-02-18 KR KR2019940002965U patent/KR200161680Y1/en not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100861051B1 (en) | 2006-12-15 | 2008-09-30 | 세크론 주식회사 | Presizer for test handler, and method for transferring semiconductor device using the same |
Also Published As
| Publication number | Publication date |
|---|---|
| KR950025917U (en) | 1995-09-18 |
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