KR950025917U - Device transfer device - Google Patents

Device transfer device

Info

Publication number
KR950025917U
KR950025917U KR2019940002965U KR19940002965U KR950025917U KR 950025917 U KR950025917 U KR 950025917U KR 2019940002965 U KR2019940002965 U KR 2019940002965U KR 19940002965 U KR19940002965 U KR 19940002965U KR 950025917 U KR950025917 U KR 950025917U
Authority
KR
South Korea
Prior art keywords
transfer
transfer device
device transfer
Prior art date
Application number
KR2019940002965U
Other languages
Korean (ko)
Other versions
KR200161680Y1 (en
Inventor
손제명
Original Assignee
현대반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 현대반도체주식회사 filed Critical 현대반도체주식회사
Priority to KR2019940002965U priority Critical patent/KR200161680Y1/en
Publication of KR950025917U publication Critical patent/KR950025917U/en
Application granted granted Critical
Publication of KR200161680Y1 publication Critical patent/KR200161680Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019940002965U 1994-02-18 1994-02-18 Device transfer apparatus KR200161680Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940002965U KR200161680Y1 (en) 1994-02-18 1994-02-18 Device transfer apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940002965U KR200161680Y1 (en) 1994-02-18 1994-02-18 Device transfer apparatus

Publications (2)

Publication Number Publication Date
KR950025917U true KR950025917U (en) 1995-09-18
KR200161680Y1 KR200161680Y1 (en) 1999-12-01

Family

ID=19377429

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940002965U KR200161680Y1 (en) 1994-02-18 1994-02-18 Device transfer apparatus

Country Status (1)

Country Link
KR (1) KR200161680Y1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100861051B1 (en) 2006-12-15 2008-09-30 세크론 주식회사 Presizer for test handler, and method for transferring semiconductor device using the same

Also Published As

Publication number Publication date
KR200161680Y1 (en) 1999-12-01

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20080820

Year of fee payment: 10

EXPY Expiration of term