KR20010089599A - 데이터 버스로 제어되는 패턴 발생기를 가진 집적 회로테스터 - Google Patents

데이터 버스로 제어되는 패턴 발생기를 가진 집적 회로테스터 Download PDF

Info

Publication number
KR20010089599A
KR20010089599A KR1020017008988A KR20017008988A KR20010089599A KR 20010089599 A KR20010089599 A KR 20010089599A KR 1020017008988 A KR1020017008988 A KR 1020017008988A KR 20017008988 A KR20017008988 A KR 20017008988A KR 20010089599 A KR20010089599 A KR 20010089599A
Authority
KR
South Korea
Prior art keywords
test
data
tester
host computer
interrupt
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020017008988A
Other languages
English (en)
Korean (ko)
Inventor
온크존마크
Original Assignee
오쿠모토 리차드
크레던스 시스템스 코포레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오쿠모토 리차드, 크레던스 시스템스 코포레이션 filed Critical 오쿠모토 리차드
Publication of KR20010089599A publication Critical patent/KR20010089599A/ko
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
KR1020017008988A 1999-01-29 2000-01-03 데이터 버스로 제어되는 패턴 발생기를 가진 집적 회로테스터 Withdrawn KR20010089599A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/240,182 US6202186B1 (en) 1999-01-29 1999-01-29 Integrated circuit tester having pattern generator controlled data bus
US09/240,182 1999-01-29
PCT/US2000/000055 WO2000045186A1 (en) 1999-01-29 2000-01-03 Integrated circuit tester having pattern generator controlled data bus

Publications (1)

Publication Number Publication Date
KR20010089599A true KR20010089599A (ko) 2001-10-06

Family

ID=22905466

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020017008988A Withdrawn KR20010089599A (ko) 1999-01-29 2000-01-03 데이터 버스로 제어되는 패턴 발생기를 가진 집적 회로테스터

Country Status (5)

Country Link
US (1) US6202186B1 (enExample)
EP (1) EP1149293A4 (enExample)
JP (1) JP2002535682A (enExample)
KR (1) KR20010089599A (enExample)
WO (1) WO2000045186A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018236080A1 (ko) * 2017-06-20 2018-12-27 김병규 피시험 디바이스를 테스트하기 위한 프로세서 기반의 계측 방법 및 이를 이용한 계측 장치

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4251707B2 (ja) * 1999-04-02 2009-04-08 株式会社アドバンテスト 半導体デバイス試験装置及び試験方法
US6445208B1 (en) * 2000-04-06 2002-09-03 Advantest Corp. Power source current measurement unit for semiconductor test system
US7490275B2 (en) * 2001-02-02 2009-02-10 Rambus Inc. Method and apparatus for evaluating and optimizing a signaling system
US7053648B2 (en) * 2003-06-09 2006-05-30 Credence Systems Corporation Distributed, load sharing power supply system for IC tester
US7913002B2 (en) * 2004-08-20 2011-03-22 Advantest Corporation Test apparatus, configuration method, and device interface
US7206710B2 (en) * 2005-01-14 2007-04-17 Verigy Pte. Ltd. Incremental generation of calibration factors for automated test equipment
US7292059B2 (en) * 2005-03-31 2007-11-06 Credence Systems Corporation Power supply assembly for a semiconductor circuit tester
US7434124B2 (en) * 2006-03-28 2008-10-07 National Instruments Corporation Reduced pattern memory in digital test equipment
KR100858651B1 (ko) * 2006-11-01 2008-09-16 주식회사 유니테스트 순차적 반도체 테스트 장치
KR100829402B1 (ko) * 2006-11-01 2008-05-15 주식회사 유니테스트 순차적 반도체 테스트 장치
US7620861B2 (en) * 2007-05-31 2009-11-17 Kingtiger Technology (Canada) Inc. Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels
JP2009025143A (ja) * 2007-07-19 2009-02-05 Yokogawa Electric Corp 半導体試験装置
US7983871B2 (en) * 2007-09-04 2011-07-19 Advanced Micro Devices, Inc. Method and apparatus for employing previous test insertion results for testing a device
US9026394B2 (en) * 2007-10-08 2015-05-05 Wurldtech Security Technologies Testing and mitigation framework for networked devices
US7802160B2 (en) * 2007-12-06 2010-09-21 Advantest Corporation Test apparatus and calibration method
EP2260385A4 (en) 2008-02-27 2017-08-30 Wurldtech Security Technologies Testing framework for control devices
WO2009105883A1 (en) 2008-02-27 2009-09-03 Wurldtech Security Technologies System and method for grammar based test planning
KR101640831B1 (ko) * 2010-03-16 2016-07-20 삼성전자주식회사 반도체 소자 및 이를 포함하는 테스트 장치
US8438442B2 (en) * 2010-03-26 2013-05-07 Freescale Semiconductor, Inc. Method and apparatus for testing a data processing system
US8335881B2 (en) * 2010-03-26 2012-12-18 Freescale Semiconductor, Inc. Method and apparatus for handling an interrupt during testing of a data processing system
US8918686B2 (en) 2010-08-18 2014-12-23 Kingtiger Technology (Canada) Inc. Determining data valid windows in a system and method for testing an integrated circuit device
CN112597049A (zh) * 2020-12-28 2021-04-02 济南浪潮高新科技投资发展有限公司 一种中断响应时间测试方法、设备及介质

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4313200A (en) * 1978-08-28 1982-01-26 Takeda Riken Kogyo Kabushikikaisha Logic test system permitting test pattern changes without dummy cycles
EP0163267B1 (en) * 1984-05-28 1993-10-13 Advantest Corporation Logic analyzer
US4707834A (en) * 1985-09-17 1987-11-17 Tektronix, Inc. Computer-based instrument system
EP0432292A1 (en) * 1989-12-12 1991-06-19 Advantest Corporation Logic IC tester
US5592674A (en) * 1994-12-20 1997-01-07 International Business Machines Corporation Automatic verification of external interrupts
US5790563A (en) * 1996-02-05 1998-08-04 Lsi Logic Corp. Self test of core with unpredictable latency
US5790871A (en) * 1996-05-17 1998-08-04 Advanced Micro Devices System and method for testing and debugging a multiprocessing interrupt controller
JP3447035B2 (ja) * 1996-07-08 2003-09-16 株式会社アドバンテスト 試験パターン発生器
US5951705A (en) * 1997-10-31 1999-09-14 Credence Systems Corporation Integrated circuit tester having pattern generator controlled data bus
US6028439A (en) * 1997-10-31 2000-02-22 Credence Systems Corporation Modular integrated circuit tester with distributed synchronization and control

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018236080A1 (ko) * 2017-06-20 2018-12-27 김병규 피시험 디바이스를 테스트하기 위한 프로세서 기반의 계측 방법 및 이를 이용한 계측 장치
CN110785669A (zh) * 2017-06-20 2020-02-11 普适福了有限公司 用于测试被试设备的基于处理器的测量方法及利用其的测量装置
CN110785669B (zh) * 2017-06-20 2022-05-17 普适福了有限公司 用于测试被试设备的基于处理器的测量方法及利用其的测量装置
US11460502B2 (en) 2017-06-20 2022-10-04 Phosphil Inc. Processor-based measuring method for testing device under test, and measuring device using same

Also Published As

Publication number Publication date
WO2000045186A1 (en) 2000-08-03
US6202186B1 (en) 2001-03-13
EP1149293A1 (en) 2001-10-31
JP2002535682A (ja) 2002-10-22
EP1149293A4 (en) 2004-12-29

Similar Documents

Publication Publication Date Title
US5951705A (en) Integrated circuit tester having pattern generator controlled data bus
KR20010089599A (ko) 데이터 버스로 제어되는 패턴 발생기를 가진 집적 회로테스터
US6028439A (en) Modular integrated circuit tester with distributed synchronization and control
US6195772B1 (en) Electronic circuit testing methods and apparatus
US6339338B1 (en) Apparatus for reducing power supply noise in an integrated circuit
EP0070381B1 (en) Logic/array tester
US6567941B1 (en) Event based test system storing pin calibration data in non-volatile memory
JPH04218785A (ja) Ｉｃ試験装置
US20030110427A1 (en) Semiconductor test system storing pin calibration data in non-volatile memory
JPH0416752B2 (enExample)
KR100634991B1 (ko) 디스크 기반 데이터 스트리밍을 구비한 집적 회로 시험기
KR20090060772A (ko) 반도체 디바이스 테스트 시스템
KR20010020427A (ko) 단일 패스 이중 모드의 집적회로 테스터
US20040181731A1 (en) Semiconductor test system storing pin calibration data, commands and other data in non-volatile memory
US6321352B1 (en) Integrated circuit tester having a disk drive per channel
US20070024314A1 (en) Test system and single-chip tester capable of testing a plurality of chips simultaneously
US6393593B1 (en) Tester and method for testing LSI designed for scan method
JP3210236B2 (ja) Ｉｃ試験装置のパターン発生装置
US20250349380A1 (en) Semiconductor device, semiconductor device testing apparatus and semiconductor device testing method
JPS6329277A (ja) 論理集積回路の試験装置
JPH1026655A (ja) Ｌｓｉの試験装置
KR19990051358A (ko) 자체 리키지 테스트 기능을 갖는 반도체 장치
JPH05322979A (ja) 試験装置
JPS6140574A (ja) 試験条件設定装置
JPH1019999A (ja) Ｉｃ試験装置

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20010716

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid