KR20000035369A - 탄성 표면파 소자 - Google Patents
탄성 표면파 소자 Download PDFInfo
- Publication number
- KR20000035369A KR20000035369A KR1019990049630A KR19990049630A KR20000035369A KR 20000035369 A KR20000035369 A KR 20000035369A KR 1019990049630 A KR1019990049630 A KR 1019990049630A KR 19990049630 A KR19990049630 A KR 19990049630A KR 20000035369 A KR20000035369 A KR 20000035369A
- Authority
- KR
- South Korea
- Prior art keywords
- surface acoustic
- piezoelectric
- acoustic wave
- piezoelectric substrate
- wave device
- Prior art date
Links
- 238000010897 surface acoustic wave method Methods 0.000 title claims description 81
- 239000000919 ceramic Substances 0.000 claims abstract description 29
- 239000000463 material Substances 0.000 claims abstract description 10
- 239000000758 substrate Substances 0.000 claims description 107
- 230000008878 coupling Effects 0.000 claims description 42
- 238000010168 coupling process Methods 0.000 claims description 42
- 238000005859 coupling reaction Methods 0.000 claims description 42
- 239000000203 mixture Substances 0.000 claims description 22
- 238000010030 laminating Methods 0.000 claims description 7
- 229910010293 ceramic material Inorganic materials 0.000 claims description 3
- 238000009792 diffusion process Methods 0.000 claims description 3
- 230000000750 progressive effect Effects 0.000 claims description 2
- 238000005245 sintering Methods 0.000 claims description 2
- 239000012141 concentrate Substances 0.000 claims 1
- 239000010410 layer Substances 0.000 description 27
- 230000008859 change Effects 0.000 description 9
- 230000000694 effects Effects 0.000 description 6
- 230000007423 decrease Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000004088 simulation Methods 0.000 description 5
- 239000013078 crystal Substances 0.000 description 4
- 238000010304 firing Methods 0.000 description 4
- 230000010287 polarization Effects 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 238000007740 vapor deposition Methods 0.000 description 3
- 239000002131 composite material Substances 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000012854 evaluation process Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 230000000644 propagated effect Effects 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 101100513612 Microdochium nivale MnCO gene Proteins 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 239000002518 antifoaming agent Substances 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 239000002270 dispersing agent Substances 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000007606 doctor blade method Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 238000009766 low-temperature sintering Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 238000010298 pulverizing process Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02574—Characteristics of substrate, e.g. cutting angles of combined substrates, multilayered substrates, piezoelectrical layers on not-piezoelectrical substrate
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/25—Constructional features of resonators using surface acoustic waves
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
Abstract
Description
조성물명 | 조성식 |
압전 세라믹 조성물 A | Pb1.0(Mn1/2Nb2/3)0.06Zr0.43Ti0.51O3 |
압전 세라믹 조성물 B | Pb1.0(Mn1/3Nb2/3)0.10Zr0.41Ti0.49O3 |
압전 세라믹 조성물 C | Pb1.0(Ni1/6Mn1/6Nb2/3)0.10Zr0.43Ti0.47O3 |
시료 | 구조 | kBGS(%) | Za/Zr(dB) | QmBGS | fr/fr(%) |
A-1 | 도 2a | 22.5 | 46 | 940 | 0.12 |
A-2 | 도 2b | 22.0 | 45 | 910 | 0.12 |
A-3* | 도 2c | 21.0 | 35 | 650 | 0.11 |
C-1 | 도 2d | 47.0 | 50 | 870 | 0.25 |
C-2 | 도 2e | 46.5 | 50 | 850 | 0.22 |
C-3* | 도 2f | 48.5 | 53 | 870 | 0.52 |
Claims (11)
- 압전 기판; 및상기 압전 기판상에 형성되는 인터디지탈 트랜스듀서를 포함하는 탄성 표면파 소자로서,상기 압전 기판은, 다결정 재료로 이루어지며 또한 상기 압전 기판의 표면에 대하여 실질적으로 수직인 방향으로 전기적 특성 및 기계적 특성이 다르도록 적층되는 적어도 2개의 압전 세라믹층을 포함하는 것을 특징으로 하는 탄성 표면파 소자.
- 제 1항에 있어서, 상기 압전 기판은 전기적 특성 및 기계적 특성이 경사지도록 배치되는 압전 세라믹 재료를 포함하는 것을 특징으로 하는 탄성 표면파 소자.
- 제 1항에 있어서, 상기 압전 기판 및 상기 인터디지탈 트랜스듀서는 탄성 표면파로서 BGS파를 여진하도록 배치되는 것을 특징으로 하는 탄성 표면파 소자.
- 제 1항에 있어서, 상기 압전 기판은 조성이 다른 압전 세라믹 재료로 이루어지는 적어도 2장의 시트를 적층하여 소결함으로써 형성되는 적층 소결체를 포함하며, 상기 적어도 2개의 압전 세라믹층이 상기 적어도 2장의 시트에 상응하는 것을 특징으로 하는 탄성 표면파 소자.
- 제 4항에 있어서, 상기 압전 기판은 상기 적어도 2장의 시트의 상호 확산에 의하여 형성되는 중간층에 상응하는 다른 압전층을 더 포함하는 것을 특징으로 하는 탄성 표면파 소자.
- 제 1항에 있어서, 전기기계 결합 계수 k가 상기 압전 기판의 두께 방향을 따라서 단차 방식으로 변화하는 것을 특징으로 하는 탄성 표면파 소자.
- 제 1항에 있어서, 전기기계 결합 계수 k가 상기 압전 기판의 두께 방향을 따라서 연속적으로 점차적인 방식으로 변화하는 것을 특징으로 하는 탄성 표면파 소자.
- 제 1항에 있어서, 상기 적어도 2개의 압전 세라믹층은 서로 다른 조성을 갖는 것을 특징으로 하는 탄성 표면파 소자.
- 제 1항에 있어서, 상기 압전 기판은 3개의 압전 세라믹층을 포함하며, 그들 사이에 중간층이 없는 것을 특징으로 하는 탄성 표면파 소자.
- 제 1항에 있어서, 상기 압전 기판은 3개의 압전 세라믹층 및 상기 3개의 압전 세라믹층 사이에 각각의 인터페이스가 형성된 2개의 중간층을 포함하는 것을 특징으로 하는 탄성 표면파 소자.
- 제 1항에 있어서, 상기 압전 기판 및 상기 인터디지탈 트랜스듀서는 BGS파를 여진하도록 배치되며, 상기 BGS파 에너지가 상기 인터디지탈 트랜스듀서가 배치되는 상기 기판의 표면 부근에 집중하도록 배치되는 것을 특징으로 하는 탄성 표면파 소자.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP31890298A JP3717034B2 (ja) | 1998-11-10 | 1998-11-10 | 弾性表面波素子 |
JP10-318902 | 1998-11-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20000035369A true KR20000035369A (ko) | 2000-06-26 |
KR100375863B1 KR100375863B1 (ko) | 2003-03-15 |
Family
ID=18104256
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-1999-0049630A KR100375863B1 (ko) | 1998-11-10 | 1999-11-10 | 탄성 표면파 소자 |
Country Status (6)
Country | Link |
---|---|
US (1) | US6208063B1 (ko) |
EP (1) | EP1001531A3 (ko) |
JP (1) | JP3717034B2 (ko) |
KR (1) | KR100375863B1 (ko) |
CN (1) | CN1122363C (ko) |
TW (1) | TW449966B (ko) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7301748B2 (en) | 1997-04-08 | 2007-11-27 | Anthony Anthony A | Universal energy conditioning interposer with circuit architecture |
US7336468B2 (en) | 1997-04-08 | 2008-02-26 | X2Y Attenuators, Llc | Arrangement for energy conditioning |
US9054094B2 (en) | 1997-04-08 | 2015-06-09 | X2Y Attenuators, Llc | Energy conditioning circuit arrangement for integrated circuit |
US7321485B2 (en) | 1997-04-08 | 2008-01-22 | X2Y Attenuators, Llc | Arrangement for energy conditioning |
US6018448A (en) * | 1997-04-08 | 2000-01-25 | X2Y Attenuators, L.L.C. | Paired multi-layered dielectric independent passive component architecture resulting in differential and common mode filtering with surge protection in one integrated package |
JP4679782B2 (ja) * | 1999-12-10 | 2011-04-27 | 富士通株式会社 | 温度センサ |
IL155402A0 (en) * | 2000-10-17 | 2003-11-23 | X2Y Attenuators Llc | Amalgam of shielding and shielded energy pathways and other elements for single or multiple circuitries with common reference node |
US7180718B2 (en) * | 2003-01-31 | 2007-02-20 | X2Y Attenuators, Llc | Shielded energy conditioner |
KR20060120683A (ko) | 2003-12-22 | 2006-11-27 | 엑스2와이 어테뉴에이터스, 엘.엘.씨 | 내부적으로 차폐된 에너지 컨디셔너 |
JP2008535207A (ja) | 2005-03-01 | 2008-08-28 | エックストゥーワイ アテニュエイターズ,エルエルシー | 共平面導体を有する調整器 |
WO2006093831A2 (en) | 2005-03-01 | 2006-09-08 | X2Y Attenuators, Llc | Energy conditioner with tied through electrodes |
EP1865311A4 (en) * | 2005-03-18 | 2012-03-14 | Ngk Insulators Ltd | PIEZOELECTRIC ELEMENT INSPECTION METHOD, INSPECTION DEVICE, AND POLARIZATION PROCESSING METHOD |
CN101395683A (zh) | 2006-03-07 | 2009-03-25 | X2Y衰减器有限公司 | 能量调节装置结构 |
KR101303881B1 (ko) | 2006-08-03 | 2013-09-04 | 삼성디스플레이 주식회사 | 터치 스크린, 그 제조 방법 및 이를 구비하는 표시 장치 |
CN101777884B (zh) * | 2009-12-30 | 2011-12-07 | 哈尔滨理工大学 | 叠片式微电子机械系统压电振子的制造方法 |
CN102025340B (zh) * | 2010-10-21 | 2013-05-08 | 张�浩 | 声波谐振器及其加工方法 |
US8952863B2 (en) | 2010-12-17 | 2015-02-10 | Nokia Corporation | Strain-tunable antenna and associated methods |
JP6361829B2 (ja) * | 2015-06-15 | 2018-07-25 | 株式会社村田製作所 | 圧電振動子の製造方法 |
TWI811431B (zh) * | 2018-08-22 | 2023-08-11 | 美商天工方案公司 | 多層壓電基板 |
CN111623917B (zh) * | 2020-06-10 | 2022-03-04 | 北京遥测技术研究所 | 一种高灵敏度的声表面波绝压压力传感器 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3943389A (en) * | 1974-07-02 | 1976-03-09 | Motorola, Inc. | Temperature stabilization of surface acoustic wave substrates |
JPS5264700A (en) * | 1975-11-25 | 1977-05-28 | Murata Manufacturing Co | Piezooelectric ceramic for elastic surface wave element |
JPS5631213A (en) | 1979-08-24 | 1981-03-30 | Matsushita Electric Ind Co Ltd | Surface elastic wave element |
JPS59218028A (ja) | 1983-05-23 | 1984-12-08 | Sumitomo Chem Co Ltd | 多結晶アルミナ焼結体,電極薄膜,圧電性薄膜から成る層状構造物 |
JPS59231911A (ja) * | 1983-06-14 | 1984-12-26 | Clarion Co Ltd | 表面弾性波素子 |
US4564782A (en) * | 1983-09-02 | 1986-01-14 | Murata Manufacturing Co., Ltd. | Ceramic filter using multiple thin piezoelectric layers |
US4967113A (en) * | 1988-03-24 | 1990-10-30 | Clarion Co., Ltd. | Surface-acoustic-wave convolver |
US4952832A (en) * | 1989-10-24 | 1990-08-28 | Sumitomo Electric Industries, Ltd. | Surface acoustic wave device |
JPH04336708A (ja) | 1991-05-13 | 1992-11-24 | Res Dev Corp Of Japan | 傾斜機能圧電材の製造法 |
JP3163679B2 (ja) * | 1991-09-27 | 2001-05-08 | 株式会社村田製作所 | 弾性表面波基板 |
DE69413280T2 (de) | 1993-03-15 | 1999-04-22 | Matsushita Electric Ind Co Ltd | Akustische Oberflächenwellenanordnung mit laminierter Struktur |
JP3282645B2 (ja) * | 1994-06-16 | 2002-05-20 | 住友電気工業株式会社 | 表面弾性波素子 |
JP3204290B2 (ja) * | 1995-02-09 | 2001-09-04 | 住友電気工業株式会社 | 表面弾性波素子 |
JPH09312546A (ja) * | 1996-05-22 | 1997-12-02 | Kyocera Corp | 弾性表面波装置 |
JP3416470B2 (ja) * | 1996-07-18 | 2003-06-16 | 三洋電機株式会社 | 弾性表面波素子 |
JP3321369B2 (ja) | 1996-09-27 | 2002-09-03 | 日本碍子株式会社 | 表面弾性波装置およびその基板およびその製造方法 |
JP3233087B2 (ja) * | 1997-01-20 | 2001-11-26 | 株式会社村田製作所 | 弾性表面波フィルタ |
JP3880150B2 (ja) * | 1997-06-02 | 2007-02-14 | 松下電器産業株式会社 | 弾性表面波素子 |
-
1998
- 1998-11-10 JP JP31890298A patent/JP3717034B2/ja not_active Expired - Lifetime
-
1999
- 1999-10-26 TW TW088118433A patent/TW449966B/zh not_active IP Right Cessation
- 1999-11-03 US US09/433,517 patent/US6208063B1/en not_active Expired - Lifetime
- 1999-11-10 CN CN99123496A patent/CN1122363C/zh not_active Expired - Lifetime
- 1999-11-10 EP EP99402795A patent/EP1001531A3/en not_active Withdrawn
- 1999-11-10 KR KR10-1999-0049630A patent/KR100375863B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
US6208063B1 (en) | 2001-03-27 |
KR100375863B1 (ko) | 2003-03-15 |
JP2000151351A (ja) | 2000-05-30 |
CN1122363C (zh) | 2003-09-24 |
CN1254986A (zh) | 2000-05-31 |
EP1001531A2 (en) | 2000-05-17 |
EP1001531A3 (en) | 2000-06-14 |
JP3717034B2 (ja) | 2005-11-16 |
TW449966B (en) | 2001-08-11 |
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