KR19980074036A - Replacement probe type probe of tester device - Google Patents

Abstract

The present invention relates to a probe replacement type probe structure of a tester device, the probe being connected to the probe body 44 through which the signal line 22 connected to the tester device 10 and the probe body 44 are measured. In the probe structure of the tester device having a probe, a conductive screw forming member 60 is formed at one end of the probe body 44 to be soldered to the signal line 22, and the measurement probe 26 ' , 26 is provided with a threaded portion 62 formed to have a different diameter and is electrically connected to the conductive screw forming member 60 formed at one end of the probe body 44 at one end thereof. It is possible to select and use different diameter measuring probes adaptively to the measuring object.

Description

Replacement probe type probe of tester device

The present invention relates to a probe replacement type probe structure of the tester device, and more particularly, having a plurality of probes having different diameters of the probe part, and selectively probes according to the shape or dimensions of the measurement target. The present invention relates to a replacement probe type probe of a tester device for mounting on a main body so that measurement can be performed.

In general, an electronic device or an electronic product is formed by integrating a plurality of components on a printed circuit board to realize a specific function, such as transistors or integrated circuits (ICs). And active components including resistors) and passive components including resistors and capacitors. For such components, rated voltage / current is applied or energized in the design of electronic devices or electronic products.

Therefore, if a functional error occurs during the use of such an electronic device or electronic product and normal operation is impossible, the error may be obtained by measuring the applied level or energization state of the rated voltage or rated current for each component integrated on the PCB board. For the generated components, replacement A / S is needed.

Multimeters or measurement results in which the measurement results from the measurement object are analog (ie, guided) or digitally displayed for measurement of the applied level or energized state of the rated voltage / current for a component integrated on such a PCB substrate. A tester device, such as an oscilloscope, is shown in which the first probe is connected to a common potential (GND) and a predetermined electrostatic potential for the measurement of the rating for a particular component integrated on a PCB substrate. A second probe connected to the level is provided and the result measured by the first and second probes is displayed by a guide (analog) or a number (digital) or displayed by a waveform (oscilloscope). From this, it is determined whether or not there is an abnormality of the component to be measured.

1 is a view for explaining a probe structure of a general tester device. According to the drawing, a first probe (for example, a digital multimeter) connected to a common potential (GND) is connected to a tester device (for example, a digital multimeter). 20) and the 2nd probe 30 connected to the static electric potential is comprised. The first and second probes 20 and 30 are connected to the common terminal 12 and the measurement terminal of the tester device 10 through a plurality of plugs 24 and 34 connected via signal lines 22 and 32. Corresponding to (14). In addition, the other ends of the first and second probes 20 and 30 are provided with measuring probes 26 and 36 having a constant diameter and length. Here, the measuring probes 26 and 36 are formed of a conductor and one end thereof is electrically connected to the signal lines 22 and 32 by soldering inside the corresponding first and second probes 20 and 30. .

Therefore, the tester apparatus 10 to which the first and second probes 20 and 30 are connected has a common stage by setting the measurement level for the voltage / current or resistance value to be measured by the measurement range adjusting knob 16. The first probe 20 connected to (12) is brought into contact with the ground terminal (eg, 42a) of the IC element (40 in FIG. 1) as the measurement object, and the second probe 30 is connected to the IC element 40. Is connected to the measurement target terminal (e.g., 42b), the measurement result of the input / output level or the voltage / current level of the signal for the IC element 40 is displayed on the LCD element 18 of the tester device 10. Will be.

2 is a view showing the structure of the representative probe 20 shown in Figure 1, the probe 20 is provided with a probe body 44 formed inside of a hollow shape, for example by a synthetic resin material bar One end of the probe body 44 has a threaded portion 46 formed therein, and the other end thereof has a through hole 48 through which the signal line 22 passes.

In addition, at one end of the measurement probe 26 formed at the tip of the probe 20, a threaded portion 50 corresponding to the threaded portion 46 formed inside one end of the probe body 44 is provided. The probe body 44 is formed on the end side of the threaded portion 50 of the measuring probe 26 (that is, the side facing the threaded portion 46 of the probe body 44). The signal line 22 penetrating from the through hole 48 through the hollow inside of the probe body 44 is bonded by, for example, solder 52. In addition, the other end of the measuring probe 26 is formed of a probe portion 54 extending by a certain length in a constant diameter.

In addition, the second probe 30 is also manufactured to have the same structure as the first probe 20.

However, when the IC device 40 to be measured is a switching ASIC device employed in an electronic switching system for switching call paths for a plurality of subscriber terminals, for example, the number of input / output terminal pins may be provided more than several hundred pins. Therefore, the spacing between the terminal pins of the switching ASIC element is designed to be about 0.5 ψmm, but according to the structure of the first and second probes 20 and 30 employed in the tester device shown in FIG. The diameter of the probe section 54 of Fig. 36 is larger than the terminal dimension of the switching ASIC element.

Therefore, in the case where the measurement target terminal of the switching ASIC element is to be measured using the probe structure of the tester apparatus 10 shown in FIG. 1, the measuring probes 26 and 20 of the first and second probes 20 and 30 are measured. The possibility that 36) is also in contact with the adjacent terminal pins becomes high, which makes it difficult to make a reliable contact between the probe portion 54 of the probes 20 and 30 and the terminal to be measured, which significantly affects accurate measurement.

In addition, the structure of the probes 20 and 30 shown in FIGS. 1 and 2 is that the signal lines 22 and 32 for providing a measurement signal to the tester device 10 are soldered to the measurement probes 26 and 36. Since the measurement probes 26 and 36 are almost impossible to replace, the measurement probes 26 and 36 are almost impossible to be measured, regardless of the shape and dimensions of the measurement target.

SUMMARY OF THE INVENTION The present invention has been made in view of the above-described circumstances. The purpose is to provide a probe replacement probe structure.

In order to achieve the above object, according to the first embodiment of the present invention of the tester device having a probe body which is connected to the signal line electrically connected to the tester device and a measuring probe coupled to one end of the probe body In the probe structure, one end of the probe body is fixed with a conductive screw forming member soldered to the signal line, and the measuring probe is prepared with a plurality of probe parts having different diameters from each other, and at one end of the probe body. Provided is a replacement probe type probe structure of a tester device having a threaded portion that is electrically connected upon mounting to the conductive thread-forming member formed at one end of the web body.

In addition, according to the second embodiment of the present invention, in the probe structure of the tester apparatus having a probe body through which a signal line electrically connected to the tester apparatus is penetrated and a measuring probe coupled to one end of the probe body, One end of the main body of the probe is formed with a screw-shaped portion for detachably receiving the measuring probe, the measuring probe has a first measuring probe having a small diameter probe portion to which the signal line is soldered at one end and the first measuring probe Comprising a second diameter measuring probe having a larger diameter than that of the measuring probe, there is provided a replacement probe structure of the measuring probe of the tester device to selectively use the first and second measuring probes.

Preferably, the first measuring probe and the second measuring probe are manufactured by injection molding of a conductive material as a whole, and one end of the first measuring probe facing the threaded portion of the probe body corresponds to the screw forming member. A first screw portion is provided, and a second screw portion is formed at a predetermined position of the other end of the first measuring probe.

In addition, one end of the second measuring probe having a diameter slightly larger than the diameter of the probe of the first measuring probe is formed with a thread corresponding to the second screw portion formed in the first measuring probe and the second measurement. The probe portion of the probe is formed in a hollow state so that the probe portion of the first measuring probe is accommodated when the screw portion is screwed to the second screw-shaped portion of the first measuring probe.

According to the probe replacement type probe structure of the tester device according to the present invention described above, it is possible to selectively use the measuring probes of different diameters according to the shape or dimensions of the measuring object.

1 is a schematic diagram illustrating a probe structure of a general tester apparatus;

FIG. 2 is a schematic cross-sectional view of an internal cross section of the representative probe shown in FIG. 1;

Figure 3 is a view showing a probe replacement type probe structure of the tester according to the first embodiment of the present invention,

Figure 4 is a view showing a probe replacement type probe structure of the tester according to the second embodiment of the present invention.

* Description of the symbols for the main parts of the drawings *

10: tester device, 12: common stage,

14: measuring stage, 20,30: first and second probes,

22: signal line, 26,26 ', 26,26a, 26b, 36: measuring probe,

44: probe body, 60, 70: screw forming member,

62, 72, 74a: threaded portion, 64, 74b, 78: probe,

76: screw part.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

3 is a view illustrating a replacement probe type probe structure of a tester device according to a first embodiment of the present invention, in which the same components as those of FIGS. 1 and 2 are denoted by the same reference numerals.

And, according to the embodiment shown in Figure 3, the first probe 20 is typically formed of a synthetic resin material, for example provided with a probe body 44 of the hollow form, the probe body ( One end 44a of the 44 is closed with a through hole 44b through which the signal line 22 penetrates, and on the outer surface of the one end 44a, measuring probes 26 'and 26' of different diameters are formed. ) As a structure for exchanging the desorption method, the screw forming member 60 of conductive (that is, metal material) is recessed and formed, and the signal line 22 is joined to the bottom of the screw forming member 60 by soldering. At the other end of the probe body 44, a through hole 48 for penetrating the signal line 22 is formed.

In addition, the measuring probes 26 'and 26 are entirely injection molded by a conductive material (for example, a metal material), and at one end thereof, a thread forming member 60 formed on an outer surface of the one end 44a of the probe body 44. ) Is provided with a threaded portion 62 of conductive (i.e., metal). In addition, if the diameter of the probe 64 of the other end in contact with the measurement object is formed differently in the form illustrated in Fig. 3, the switching ASIC employed in the measurement object, in particular the electronic switching system, or the configuration of a conventional electronic device Optionally, the measuring probes 26 'and 26 can be exchanged for the device.

That is, according to the present invention, when the diameters of the probes 64 of the measurement probes 26 'and 26 are set differently from each other and prepared in large numbers, the measurement probes 26' are adaptively adapted to the size or shape of the measurement target. 26 is rotated so that the threaded portion 62 is separated from the threaded member 60 formed on one end 44a of the probe body 44, and the probe 64 having a different diameter in this state is removed. The threaded portion 62 of the measuring probe 26; 26 ′ is fastened so as to be electrically connected to the screw forming member 60 formed at one end 44 a of the probe body 44.

Therefore, the signal measured from the other end 64 of the measuring probe 26 '; 26 is passed from the screw portion 62 to the tester device 10 through the signal line 22 soldered to the screw forming member 60. Is applied, and thus the measurement level is displayed on the LCD display of the tester apparatus 10.

4 is a view showing the probe structure of the tester device according to the second embodiment of the present invention. The first embodiment shown in FIG. 3 is a structure in which measuring probes 26 'having different diameters are replaced. The probe according to the second embodiment shown in FIG. 4 is formed of a dual structure of a small diameter measuring probe and a measuring probe having a small diameter measuring probe embedded therein.

That is, according to the representative probe 20 shown in FIG. 4, the probe body 44 is provided with a through hole 48 through which the signal line 22 penetrates, and at one end thereof, a threaded portion 70 is provided. The measuring probe 26 'is formed in a double structure by a first measuring probe 26a having a relatively small diameter and a second measuring probe 26b having a diameter slightly larger than that of the first measuring probe 26a. Will have

The first measuring probe 26a and the second measuring probe 26b are manufactured by injection molding of a conductive material (ie, metal / alloy) as a whole, and are formed on the threaded portion 70 of the probe body 44. One end of the first measuring probe 26a facing is provided with a first screw portion 72 corresponding to the screw portion 70, and the signal line 22 is provided on the first screw portion 72. ) Is connected by soldering. Further, a second screw portion 74a is formed at a predetermined position of the other end of the first measuring probe 26a, and the length of the probe portion 74b is relatively small in diameter from the second screw portion 74a. Is formed to extend.

In addition, a second screw type formed on one end of the second measuring probe 26b having a diameter slightly larger than that of the probe portion 74b of the first measuring probe 26a is formed on the first measuring probe 26a. When the screw portion 76 corresponding to the upper portion 74a is formed and the screw portion 76 is screwed into the second screw portion 74a of the first measuring probe 26a, the first measurement is performed. It is formed in a hollow state so that the probe portion 74b of the probe 26a is accommodated.

Accordingly, the first measuring probe (1) is attached to the threaded portion (70) of the probe body (44) while the signal line (22) is soldered to the first threaded portion (72) of the first measuring probe (26a0). The first threaded portion 72 of 26a) is screwed to fasten the threaded portion 76 of the second measuring probe 26b to the second threaded portion 74a of the first measuring probe 26a. In this case, the second screw portion 74a of the first measuring probe 26a of the conductive material and the screw portion 76 of the second measuring probe 26b are electrically connected to the signal line 22. Therefore, the signal measured by the probe section 78 of the second measurement probe 26b is transmitted to the second threaded portion 74a of the first measurement probe 26a and the threaded portion of the second measurement probe 26b. It is transmitted to the signal line 22 through 76 and applied to the tester device 10 so that the measurement result is displayed on the LCD panel of the tester device 10.

For example, in order to measure the switching IC of the electronic switching system, the second measuring probe 26b is rotated and separated from the first measuring probe 26a. The measurement result measured by the measuring section 74b of the first measuring probe 26a having a smaller diameter than that of 78 is applied to the tester device 10 via the signal line 22, and thus the tester. The measurement results are displayed on the LCD panel of the device 10.

On the other hand, the present invention is not limited to the above-described embodiments, and various changes and modifications are possible without departing from the gist of the invention.

As described above, according to the replacement probe type probe structure of the tester device according to the present invention, since it is possible to replace the measuring probe having a variety of probe diameters according to the measurement object, the contact rate for the minute measurement target This is drastically reduced, whereby accurate measurement results can be obtained.

Claims (4)

The probe body 44 which is electrically connected to the tester device 10 via the signal line 22 and the signal probe 22 penetrates therein, and a measuring probe coupled to one end of the probe body 44. In the probe structure of the equipped tester device, One end of the probe body 44 is fixed with a conductive screw forming member 60, which is soldered to the signal line 22, and the measuring probe has a plurality of measuring probes 26 whose diameters are different from each other. ', 26, and the conductive screw-shaped portion 62 that is electrically connected / disconnected upon mounting / detaching with respect to the conductive screw forming member 60 formed at one end of the probe body 44 at one end thereof. And a measuring probe (26 ') for the probe body (44) to be used to replace the measuring probe replacement type probe structure of the tester device. In the probe structure of a tester apparatus having a probe body 44 through which a signal line 22 electrically connected to the tester apparatus 10 penetrates, and a measuring probe coupled to one end of the probe body 44, One end of the probe body 44 is formed with a threaded portion 70 for detachably receiving the measurement probe 26 ', and the signal probe 22 is soldered at one end of the probe 26. A conductive first measuring probe 26a having a small diameter probe portion 74b at the other end thereof and a conductive second measuring probe 26b having a larger diameter than the first measuring probe 26a. And a measurement probe replacement type probe structure of the tester device configured to selectively use the first and second measurement probes (26a, 26b). 3. The first screw of claim 2, wherein one end of the first measuring probe (26a) facing the threaded portion (70) of the first probe body (44) corresponds to the threaded portion (70). And a second screw portion (74a) formed at a predetermined position of the other end of the first measuring probe (26a). 3. The screw portion 76 corresponding to the second threaded portion 74a formed in the first measuring probe 26a is formed inside one end of the second measuring probe 26b. The inside of the probe section 78 of the measurement probe 26b is formed in a hollow shape so that the first measurement probe 26a is embedded in the coupling with the first measurement probe 26a. Replaceable probe structure.