JPH02310480A - Jig for measurement - Google Patents
Jig for measurementInfo
- Publication number
- JPH02310480A JPH02310480A JP13317489A JP13317489A JPH02310480A JP H02310480 A JPH02310480 A JP H02310480A JP 13317489 A JP13317489 A JP 13317489A JP 13317489 A JP13317489 A JP 13317489A JP H02310480 A JPH02310480 A JP H02310480A
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- printed wiring
- wiring board
- terminal
- terminals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 title claims abstract description 41
- 239000004020 conductor Substances 0.000 abstract description 4
- 239000000523 sample Substances 0.000 description 15
- 230000000694 effects Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000000615 nonconductor Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、電気回路のプリント配線基板上の信号を測
定するための測定用治具に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a measuring jig for measuring signals on a printed wiring board of an electric circuit.
従来、プリント配線基板上の信号を測定する場合に測定
用の信号を引き出す方法としては、本プリント配線基板
上に実装された部品の信号線を用いたり、
本プリント配線基板設計の際に予め測定用端子を実装す
るための配線を作っておいたり、中プリント配線基板完
成後に配線パターン上に測定用端子を半田付けしたり、
という手段を用いるのが通例である。Conventionally, when measuring signals on a printed wiring board, methods for extracting measurement signals include using signal lines of components mounted on the printed wiring board, or using pre-measured signals when designing the printed wiring board. It is customary to prepare wiring to mount measurement terminals in advance, or to solder measurement terminals onto the wiring pattern after the intermediate printed wiring board is completed.
前述のような方法を用いて被測定回路から測定用信号を
引き出す方法では、
*信号線が極端に′短くなったり小さくなった部品や、
部品実装時に信号線が露出しない部品の利用が増加し、
部品の信号線を測定用端子として利用できないことが多
く、
本プリント配線基板上に実装すべき部品の数が増加し、
部品と部品との間隔が狭くなってきたため、測定器のプ
ローブを各部品の信号線に当てたり、測定用の端子を別
に設けるだけの領域の確保が困難になり、
本プリント配線基板上に実装される部品の数の増加とと
もにプリント配線の線幅は、線密度は高くなっているた
め、測定信号を引き出すための信号線を手作業で後付け
することも難しくなっている。When using the method described above to extract measurement signals from the circuit under test, * components with extremely short or small signal lines,
The use of components that do not expose signal lines during component mounting is increasing,
In many cases, the signal lines of components cannot be used as measurement terminals, and the number of components to be mounted on this printed wiring board increases.
As the spacing between components has become narrower, it has become difficult to secure enough space to place measuring instrument probes on the signal lines of each component and to provide separate terminals for measurement. As the number of components increases, the line width and line density of printed wiring also increases, making it difficult to manually add signal lines for extracting measurement signals.
傘加えて、測定器のプローブを測定の度に被測定電子回
路に人手であてがう方法では、被測定電子回路の測定点
位置を間違えたり、測定器のプローブの先端などで被測
定電子回路の部品の端子やプリント配線を短絡したり損
傷したりする場合、測定の途中で測定器のプローブが被
測定電子回路から外れたりする場合が多い。In addition, with the method of manually applying the probe of the measuring instrument to the electronic circuit under test each time a measurement is made, it is possible to incorrectly place the measurement point on the electronic circuit under test, or the tip of the probe of the measuring instrument may touch the parts of the electronic circuit under test. If the terminals or printed wiring of the device are shorted or damaged, the probe of the measuring instrument often becomes detached from the electronic circuit under test during measurement.
本発明の測定用治具は、
被測定電子回路のプリント配線基板上の配線の測定すべ
き信号に対応させて測定用端子を配した端子板と、
この端子板を被測定電子回路のプリント配線基板上に固
定するための固定機構と、
被測定電子回路のプリント配線基板と端子板との間に挟
まれて、端子板の測定用端子と被測定電子回路とを電気
的に接続する接続機構とを具備することを特徴とする。The measurement jig of the present invention includes a terminal board on which measurement terminals are arranged corresponding to the signals to be measured on the wiring on the printed wiring board of the electronic circuit to be measured, and this terminal board is connected to the printed wiring of the electronic circuit to be measured. A fixing mechanism for fixing on the board, and a connecting mechanism that is sandwiched between the printed wiring board of the electronic circuit under test and the terminal board and electrically connects the measurement terminal of the terminal board and the electronic circuit under test. It is characterized by comprising the following.
次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図は本発明の実施例の構成図である。プリント配線
基板1には被測定電子回路が構成されており、端子板2
はプリント配線基板上に構成される電子回路の被測定信
号に対応させて測定用端子5を配し、固定機構3によっ
てプリント配線基板1に接続機構4をはさむ形で固定さ
れる。FIG. 1 is a block diagram of an embodiment of the present invention. A printed wiring board 1 includes an electronic circuit to be measured, and a terminal board 2
A measuring terminal 5 is arranged in correspondence with a signal to be measured of an electronic circuit configured on a printed wiring board, and the connecting mechanism 4 is fixed to the printed wiring board 1 by a fixing mechanism 3.
第2図は本発明の第1の実施例の断面図である。FIG. 2 is a sectional view of the first embodiment of the invention.
電気絶縁体で作られた端子板7にはこれを貫通するよう
に良導体の測定用端子6が実装される。図に示すように
、端子板7に突出した測定用端子6は測定器のプローブ
が接続しやすい形に形成される。端子板7とプリント配
線基板12の間には導電性ゴム1oと絶縁性ゴム9によ
って構成される接続機構と、端子板7とプリント配線基
板12との位置および間隔を一定に保ち固定するための
端子板固定用ピン8がある。導電性ゴム10によって測
定用端子6は他の測定用端子などと影響し合うことなく
被測定電子回路の測定対象とするプリント配線11の各
部に電気的に接続される。また、接続機構が可塑性のあ
る絶縁性ゴム9や導電性ゴム10によって構成されてい
ることにより、プリント配線基板12上に電子部品14
が実装され、これの取り付は端子15がプリント配線1
1の上に突出している場合や、プリント配線11の上に
面実装小型電子部品16が実装されているような場合に
も測定用端子6と被測定回路のプリント配線11は支障
なく接続される。端子板固定用ピン8は端子板取り付は
穴13に差し込まれ、固定されることによって端子板7
とプリント配線基板12との位置および間隔を一定に保
つ。A measurement terminal 6, which is a good conductor, is mounted on the terminal plate 7 made of an electrical insulator so as to pass through the terminal plate 7. As shown in the figure, the measurement terminals 6 protruding from the terminal plate 7 are formed in a shape that allows easy connection to a probe of a measuring instrument. Between the terminal board 7 and the printed wiring board 12, there is a connection mechanism composed of a conductive rubber 1o and an insulating rubber 9, and a connection mechanism for maintaining and fixing the terminal board 7 and the printed wiring board 12 at a constant position and interval. There is a pin 8 for fixing the terminal board. The measurement terminal 6 is electrically connected to each part of the printed wiring 11 to be measured in the electronic circuit to be measured by the conductive rubber 10 without interfering with other measurement terminals. Furthermore, since the connection mechanism is made of the plastic insulating rubber 9 and the conductive rubber 10, the electronic components 14 can be mounted on the printed wiring board 12.
is mounted, and the terminal 15 is attached to the printed wiring 1.
1 or when a small surface-mounted electronic component 16 is mounted on the printed wiring 11, the measurement terminal 6 and the printed wiring 11 of the circuit under test can be connected without any problem. . The terminal board fixing pin 8 is inserted into the hole 13 for terminal board installation, and is fixed to the terminal board 7.
The position and spacing between the printed wiring board 12 and the printed wiring board 12 are kept constant.
この第1の実施例によれば、被測定電子回路のプリント
配線基板の測定用治具取り付は面上に小型の電子部品が
実装されていたり1面上に電子部品の取り付は端子が露
出していたり、プリント配線基板が歪んでいるように場
合にも電気的、機械的に安定した測定用の信号の取り出
しができるという効果がある。 ゛
第3図は本発明の第2の実施例の断面図である。According to this first embodiment, when mounting a measuring jig on a printed wiring board of an electronic circuit to be measured, small electronic components are mounted on one surface, and terminals are mounted on one surface. Even in cases where the printed wiring board is exposed or distorted, it is possible to extract electrically and mechanically stable signals for measurement. 3 is a sectional view of a second embodiment of the present invention.
電気絶縁体で作られた端子板17にはこれを貫通するよ
うに良導体の測定用端子18と探針19が図に示すよう
に実装される。測定用端子18と探針19とは電気的に
接続されており、測定用端子18には探針19が接触し
ている被測定電子回路のプリント配線2oの電気信号が
取り出される。A measuring terminal 18 and a probe 19 made of a good conductor are mounted on the terminal plate 17 made of an electrical insulator so as to pass through the terminal plate 17 as shown in the figure. The measurement terminal 18 and the probe 19 are electrically connected, and the electrical signal from the printed wiring 2o of the electronic circuit to be measured, which the probe 19 is in contact with, is extracted from the measurement terminal 18.
探針19は良導体でかつ弾性のある素材で構成され、プ
リント配線20に接触する側を細くすることにより、端
子板17とプリント配線基板21との間隔が変化しても
この変化を吸収でき、なおかつ電子部品24や電子部品
25などが実装されていてもそれを避けるように探針を
配置することにより、微細なプリント配線のパターンに
接続のできる構造を持つ。また、プリント配線基板21
に開けられた端子板固定用ネジ22と端子板固定用ネジ
穴23によって、端子板17とプリント配線基板21と
の位置および間隔は一定に保たれる。The probe 19 is made of a good conductor and elastic material, and by making the side that contacts the printed wiring 20 thinner, even if the distance between the terminal plate 17 and the printed wiring board 21 changes, this change can be absorbed. Furthermore, even if electronic components 24, 25, etc. are mounted, by arranging the probe so as to avoid them, it has a structure that allows connection to fine printed wiring patterns. In addition, the printed wiring board 21
The position and spacing between the terminal board 17 and the printed wiring board 21 are kept constant by the terminal board fixing screws 22 and the terminal board fixing screw holes 23 drilled in the terminal board 17 and the printed wiring board 21 .
この第2の実施例によれば、被測定電子回路のプリント
配線基板の測定用治具取り付は面上に電子部品が実装さ
れていたり、被測定回路のプリント配線のパターンが極
めて微細にかつ高密度に描かれていても電気的、機械的
に安定した測定用の信号の取り出しができるという効果
がある。According to this second embodiment, the measurement jig can be attached to a printed wiring board of an electronic circuit under test when electronic components are mounted on the surface or when the printed wiring pattern of the circuit under test is extremely fine. This has the effect of being able to extract electrically and mechanically stable signals for measurement even when drawn with high density.
本発明によれば、信号線が極端に短くなったり小さくな
った部品や1部品実装時に信号線が露出しない部品の利
用時にも、プリント配線基板上に実装すべき部品の数が
増し、部品と部品との間隔が狭くなり、測定器のプロー
ブを各部品の信号線に当てたり、測定用の端子を別に設
けるだけの領域の確保が困難な場合にも、プリント配線
基板上のプリント配線の線幅が細く、線密度が高くなっ
て測定信号を引き出すための信号線を手作業で後付けす
ることが難しい場合にも、被測定電子回路から測定用信
号を引き出すことができることに加え、測定器のプロー
ブの被測定回路に人手であてがう必要がなく、被測定電
子回路の測定用信号引出し位置と測定器のプローブの接
続が機械的に固定されるため、測定点位置を間違えたり
、測定器のプローブの先端などで被測定電子回路の部品
の端子やプリント配線を短絡したり損傷したりする事故
、測定の途中で測定器のプローブが被測定電子回路から
外れたりすることがなくなるため、電気的、機械的に安
定した測定用の信号の取り出しができるという効果を奏
する。According to the present invention, even when using components with extremely short or small signal lines or components where signal lines are not exposed when mounting one component, the number of components to be mounted on the printed wiring board increases and the number of components increases. Printed wiring lines on a printed wiring board can also be used when the distance between components is narrow and it is difficult to place the measuring instrument probe on the signal line of each component or to secure enough space to provide separate measurement terminals. In addition to being able to extract the measurement signal from the electronic circuit under test, even in cases where it is difficult to manually add signal lines to extract the measurement signal due to the narrow width and high line density, There is no need to manually attach the probe to the circuit under test, and the connection between the measurement signal extraction position of the electronic circuit under test and the probe of the measuring instrument is mechanically fixed, so there is no need to manually attach the probe to the circuit under test. Electrical, This has the effect that a mechanically stable signal for measurement can be extracted.
第1図は本発明の実施例の斜視図、第2図は本発明の第
1の実施例の断面図、第3図は本発明の第2の実施例の
断面図である。
1・・・プリント配線基板、2・・・端子板、3・・・
固定機構、4・・・接続機構、5・・・測定用端子、6
・・・測定用端子、7・・・端子板、8・・・端子板固
定用ピン、9・・・絶縁性ゴム、10・・・導電性ゴム
、11・・・プリント配線、12・・・プリント配線基
板、13・・・端子板取り付は穴、14・・・電子部品
、15・・・電子部品取り付は端子、16・・・面実装
小型電子部品、17・・・端子板、18・・・測定用端
子、19・・・探針、20・・・プリント配線、21・
・・プリント配線基板、22・・・端子板固定用ネジ、
23・・・端子板固定用ネジ穴、24・・・電子部品、
25・・・電子部品。FIG. 1 is a perspective view of an embodiment of the invention, FIG. 2 is a sectional view of the first embodiment of the invention, and FIG. 3 is a sectional view of the second embodiment of the invention. 1... Printed wiring board, 2... Terminal board, 3...
Fixing mechanism, 4... Connection mechanism, 5... Measurement terminal, 6
...Measurement terminal, 7...Terminal board, 8...Terminal board fixing pin, 9...Insulating rubber, 10...Conductive rubber, 11...Printed wiring, 12...・Printed wiring board, 13... Hole for terminal board mounting, 14... Electronic component, 15... Terminal for electronic component mounting, 16... Small surface mount electronic component, 17... Terminal board , 18... Measurement terminal, 19... Probe, 20... Printed wiring, 21...
...Printed wiring board, 22...Terminal board fixing screw,
23...Screw hole for fixing terminal board, 24...Electronic component,
25...Electronic parts.
Claims (1)
べき信号に対応させて測定用端子を配した端子板と、 この端子板を被測定電子回路のプリント配線基板上に固
定するための固定機構と、 被測定電子回路のプリント配線基板と端子板との間に挟
まれて、端子板の測定用端子と被測定電子回路とを電気
的に接続する接続機構とを具備することを特徴とする測
定用治具。[Claims] A terminal board on which measurement terminals are arranged in correspondence with signals to be measured on wiring on a printed wiring board of an electronic circuit to be measured; It is equipped with a fixing mechanism for fixing, and a connecting mechanism that is sandwiched between the printed wiring board of the electronic circuit under test and the terminal board and electrically connects the measurement terminal of the terminal board and the electronic circuit under test. A measurement jig characterized by:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13317489A JPH02310480A (en) | 1989-05-26 | 1989-05-26 | Jig for measurement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13317489A JPH02310480A (en) | 1989-05-26 | 1989-05-26 | Jig for measurement |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02310480A true JPH02310480A (en) | 1990-12-26 |
Family
ID=15098406
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13317489A Pending JPH02310480A (en) | 1989-05-26 | 1989-05-26 | Jig for measurement |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02310480A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100395788B1 (en) * | 2001-04-04 | 2003-08-25 | 주식회사 아이에스시테크놀러지 | Structure and manufacturing method of silicon rubber spring pogo pin |
-
1989
- 1989-05-26 JP JP13317489A patent/JPH02310480A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100395788B1 (en) * | 2001-04-04 | 2003-08-25 | 주식회사 아이에스시테크놀러지 | Structure and manufacturing method of silicon rubber spring pogo pin |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH02310480A (en) | Jig for measurement | |
JPS612338A (en) | Inspection device | |
KR19980071445A (en) | Collective substrate and manufacturing method of electronic device using the aggregate substrate | |
JPH03124088A (en) | Printed board device | |
JP3815165B2 (en) | Electronic component measuring device | |
JPS61259176A (en) | Probe | |
JPS62188976A (en) | Contact probe for circuit board inspecting device | |
JP2759451B2 (en) | Printed circuit board inspection jig | |
JP2002318246A (en) | Pogo pin block of ic tester | |
KR950009876Y1 (en) | Test board for semiconductor test machine | |
JPS5914773Y2 (en) | ground plate | |
JP2601680Y2 (en) | Contact board for auto handler with ground board | |
JPH07159486A (en) | Integrated circuit testing device | |
JPH0648898Y2 (en) | Printed wiring board | |
JPH08306829A (en) | Socket for ic test | |
JPH0534573U (en) | Unit for characteristic inspection of surface mount components | |
JPH0733166Y2 (en) | Impedance matching mechanism for IC tester board | |
JPH04199535A (en) | Evaluation jig for characteristic of ic package | |
KR20070065152A (en) | A test point structure of pcb | |
JPH0474967A (en) | Substrate inspector | |
JPH03240252A (en) | Inspection equipment and inspection method of semiconductor element | |
JPH08110362A (en) | Method for inspecting continuity of printed wiring board containing fine pattern | |
JPH0259676A (en) | Probe device for board tester | |
JP2002064251A (en) | Printed circuit board | |
JPS628153B2 (en) |