KR102908723B1 - 부품 밀어올림 장치 및 부품 실장 장치 - Google Patents
부품 밀어올림 장치 및 부품 실장 장치Info
- Publication number
- KR102908723B1 KR102908723B1 KR1020247027365A KR20247027365A KR102908723B1 KR 102908723 B1 KR102908723 B1 KR 102908723B1 KR 1020247027365 A KR1020247027365 A KR 1020247027365A KR 20247027365 A KR20247027365 A KR 20247027365A KR 102908723 B1 KR102908723 B1 KR 102908723B1
- Authority
- KR
- South Korea
- Prior art keywords
- tool
- pushing
- head
- wafer
- component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7612—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by lifting arrangements, e.g. lift pins
-
- H01L21/68742—
-
- H01L21/67017—
-
- H01L21/67144—
-
- H01L21/67242—
-
- H01L21/67721—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0446—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
- H10P72/3212—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips or lead frames
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Die Bonding (AREA)
- Manipulator (AREA)
- Supply And Installment Of Electrical Components (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2022/019285 WO2023209953A1 (ja) | 2022-04-28 | 2022-04-28 | 部品突上げ装置及び部品実装装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20240130816A KR20240130816A (ko) | 2024-08-29 |
| KR102908723B1 true KR102908723B1 (ko) | 2026-01-07 |
Family
ID=88518099
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020247027365A Active KR102908723B1 (ko) | 2022-04-28 | 2022-04-28 | 부품 밀어올림 장치 및 부품 실장 장치 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP7712481B2 (https=) |
| KR (1) | KR102908723B1 (https=) |
| CN (1) | CN118743006A (https=) |
| WO (1) | WO2023209953A1 (https=) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008135431A (ja) * | 2006-11-27 | 2008-06-12 | Matsushita Electric Ind Co Ltd | 電子部品実装装置および電子部品実装装置におけるrfタグの情報の読取り・書込み方法 |
| JP2013105773A (ja) * | 2011-11-10 | 2013-05-30 | Fuji Mach Mfg Co Ltd | ダイ突き上げ動作管理システム |
| JP2013172122A (ja) * | 2012-02-23 | 2013-09-02 | Hitachi High-Tech Instruments Co Ltd | ダイボンダ |
| JP6049221B2 (ja) * | 2012-11-27 | 2016-12-21 | 富士機械製造株式会社 | ダイ供給装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6049221B2 (ja) * | 1979-01-05 | 1985-10-31 | 東洋紡績株式会社 | 熱硬化性射出成形材料 |
| JPS5959388A (ja) * | 1982-09-24 | 1984-04-05 | 富士通株式会社 | 支持装置 |
| JP2004066364A (ja) * | 2002-08-02 | 2004-03-04 | Ricoh Co Ltd | コンプライアンス機構 |
| JP4333769B2 (ja) | 2007-04-09 | 2009-09-16 | パナソニック株式会社 | チップ実装装置およびチップ実装装置における剥離促進ヘッドの交換方法 |
| JP5686469B2 (ja) * | 2011-01-28 | 2015-03-18 | 富士機械製造株式会社 | ダイ供給装置 |
-
2022
- 2022-04-28 WO PCT/JP2022/019285 patent/WO2023209953A1/ja not_active Ceased
- 2022-04-28 CN CN202280093112.9A patent/CN118743006A/zh active Pending
- 2022-04-28 JP JP2024517765A patent/JP7712481B2/ja active Active
- 2022-04-28 KR KR1020247027365A patent/KR102908723B1/ko active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008135431A (ja) * | 2006-11-27 | 2008-06-12 | Matsushita Electric Ind Co Ltd | 電子部品実装装置および電子部品実装装置におけるrfタグの情報の読取り・書込み方法 |
| JP2013105773A (ja) * | 2011-11-10 | 2013-05-30 | Fuji Mach Mfg Co Ltd | ダイ突き上げ動作管理システム |
| JP2013172122A (ja) * | 2012-02-23 | 2013-09-02 | Hitachi High-Tech Instruments Co Ltd | ダイボンダ |
| JP6049221B2 (ja) * | 2012-11-27 | 2016-12-21 | 富士機械製造株式会社 | ダイ供給装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20240130816A (ko) | 2024-08-29 |
| JP7712481B2 (ja) | 2025-07-23 |
| WO2023209953A1 (ja) | 2023-11-02 |
| JPWO2023209953A1 (https=) | 2023-11-02 |
| CN118743006A (zh) | 2024-10-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| D22 | Grant of ip right intended |
Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D22-EXM-PE0701 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U12-oth-PR1002 Fee payment year number: 1 |
|
| U12 | Designation fee paid |
Free format text: ST27 STATUS EVENT CODE: A-2-2-U10-U12-OTH-PR1002 (AS PROVIDED BY THE NATIONAL OFFICE) Year of fee payment: 1 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| Q13 | Ip right document published |
Free format text: ST27 STATUS EVENT CODE: A-4-4-Q10-Q13-NAP-PG1601 (AS PROVIDED BY THE NATIONAL OFFICE) |