KR102897370B1 - 가압 분석용 구조체, x선 회절 장치 및 가압 분석 시스템 - Google Patents

가압 분석용 구조체, x선 회절 장치 및 가압 분석 시스템

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Publication number
KR102897370B1
KR102897370B1 KR1020210126151A KR20210126151A KR102897370B1 KR 102897370 B1 KR102897370 B1 KR 102897370B1 KR 1020210126151 A KR1020210126151 A KR 1020210126151A KR 20210126151 A KR20210126151 A KR 20210126151A KR 102897370 B1 KR102897370 B1 KR 102897370B1
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sample
pressure
receiving unit
solid
ray
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KR20220043037A (ko
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코이치로 이토
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가부시키가이샤 리가쿠
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G01N23/20041—Sample holders or supports therefor for high pressure testing, e.g. anvil cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/2055—Analysing diffraction patterns
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/05—Accumulators with non-aqueous electrolyte
    • H01M10/056—Accumulators with non-aqueous electrolyte characterised by the materials used as electrolytes, e.g. mixed inorganic/organic electrolytes
    • H01M10/0561—Accumulators with non-aqueous electrolyte characterised by the materials used as electrolytes, e.g. mixed inorganic/organic electrolytes the electrolyte being constituted of inorganic materials only
    • H01M10/0562—Solid materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
    • H01M10/48—Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/307—Accessories, mechanical or electrical features cuvettes-sample holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/31—Accessories, mechanical or electrical features temperature control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/31—Accessories, mechanical or electrical features temperature control
    • G01N2223/3106—Accessories, mechanical or electrical features temperature control heating, furnaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/317—Accessories, mechanical or electrical features windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G01N23/20033—Sample holders or supports therefor provided with temperature control or heating means
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • General Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Inorganic Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Secondary Cells (AREA)
KR1020210126151A 2020-09-28 2021-09-24 가압 분석용 구조체, x선 회절 장치 및 가압 분석 시스템 Active KR102897370B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020162284A JP7412770B2 (ja) 2020-09-28 2020-09-28 加圧分析用構造体、ｘ線回折装置及び加圧分析システム
JPJP-P-2020-162284 2020-09-28

Publications (2)

Publication Number Publication Date
KR20220043037A KR20220043037A (ko) 2022-04-05
KR102897370B1 true KR102897370B1 (ko) 2025-12-08

Family

ID=77910632

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KR1020210126151A Active KR102897370B1 (ko) 2020-09-28 2021-09-24 가압 분석용 구조체, x선 회절 장치 및 가압 분석 시스템

Country Status (5)

Country Link
US (1) US11913891B2 (enExample)
EP (1) EP3974820B1 (enExample)
JP (1) JP7412770B2 (enExample)
KR (1) KR102897370B1 (enExample)
CN (1) CN114280091A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20250094363A (ko) * 2023-12-18 2025-06-25 삼성에스디아이 주식회사 전고체 이차 전지의 검사 시스템 및 방법
JP2025143861A (ja) * 2024-03-19 2025-10-02 株式会社リガク 電池分析用構造体
WO2025248653A1 (ja) * 2024-05-29 2025-12-04 日産自動車株式会社 電池モジュールの検査方法及び検査装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09166528A (ja) * 1995-12-15 1997-06-24 Rigaku Corp Ｘ線装置の試料格納容器
US7022290B2 (en) 2001-06-19 2006-04-04 Rutgers, The State University System structure for in situ x-ray study of electrochemical cell component performance
JP4128397B2 (ja) 2002-06-12 2008-07-30 東芝Ｉｔコントロールシステム株式会社 電池検査装置
JP5220581B2 (ja) 2008-12-24 2013-06-26 本田技研工業株式会社 Ｘ線解析装置
JP2012159311A (ja) 2011-01-29 2012-08-23 Rigaku Corp Ｘ線測定用電池構造体及びその支持装置
JP2016143528A (ja) * 2015-01-30 2016-08-08 株式会社日立ハイテクサイエンス 試料搬送機構及び真空装置
TW201703064A (zh) * 2015-04-24 2017-01-16 Littelfuse Japan G K 保護元件
JP2017072530A (ja) 2015-10-09 2017-04-13 ソニー株式会社 分析用セル及び分析用セル組立体
CN209656593U (zh) * 2018-12-14 2019-11-19 深圳先进技术研究院 电池原位x射线衍射测试辅助装置
CN110806419B (zh) 2019-11-29 2025-04-15 散裂中子源科学中心 一种用于中子散射的高压容器实验装置
CN111721752A (zh) * 2020-07-29 2020-09-29 中山大学 一种拉曼与质谱联用的原位检测密封电解池装置及方法
CN112436204B (zh) * 2020-11-25 2022-04-05 中山大学 一种可原位测试x射线衍射和质谱分析的电池装置与方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Quentin Lemarié 등, Sulfur-based electrode using a polyelectrolyte binder studied via coupled in situ synchrotron X-ray diffraction and tomography, ACS Applied Energy Materials, pp2422-2431, 2020.3.*

Also Published As

Publication number Publication date
US11913891B2 (en) 2024-02-27
CN114280091A (zh) 2022-04-05
JP7412770B2 (ja) 2024-01-15
US20220099603A1 (en) 2022-03-31
EP3974820A1 (en) 2022-03-30
JP2022054974A (ja) 2022-04-07
KR20220043037A (ko) 2022-04-05
EP3974820B1 (en) 2025-02-26

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