CN114280091A - 加压分析用结构体、x射线衍射装置及加压分析系统 - Google Patents

加压分析用结构体、x射线衍射装置及加压分析系统 Download PDF

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CN114280091A
CN114280091A CN202111132714.4A CN202111132714A CN114280091A CN 114280091 A CN114280091 A CN 114280091A CN 202111132714 A CN202111132714 A CN 202111132714A CN 114280091 A CN114280091 A CN 114280091A
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sample
pressure
analysis
solid
ray
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池田俊幸
伊藤幸一郎
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Rigaku Corp
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Rigaku Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/2055—Analysing diffraction patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G01N23/20033—Sample holders or supports therefor provided with temperature control or heating means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G01N23/20041—Sample holders or supports therefor for high pressure testing, e.g. anvil cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/05—Accumulators with non-aqueous electrolyte
    • H01M10/056—Accumulators with non-aqueous electrolyte characterised by the materials used as electrolytes, e.g. mixed inorganic/organic electrolytes
    • H01M10/0561—Accumulators with non-aqueous electrolyte characterised by the materials used as electrolytes, e.g. mixed inorganic/organic electrolytes the electrolyte being constituted of inorganic materials only
    • H01M10/0562—Solid materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
    • H01M10/48—Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/307—Accessories, mechanical or electrical features cuvettes-sample holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/31—Accessories, mechanical or electrical features temperature control
    • G01N2223/3106—Accessories, mechanical or electrical features temperature control heating, furnaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/317—Accessories, mechanical or electrical features windows
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • General Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Inorganic Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Secondary Cells (AREA)
CN202111132714.4A 2020-09-28 2021-09-27 加压分析用结构体、x射线衍射装置及加压分析系统 Pending CN114280091A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020162284A JP7412770B2 (ja) 2020-09-28 2020-09-28 加圧分析用構造体、ｘ線回折装置及び加圧分析システム
JP2020-162284 2020-09-28

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US (1) US11913891B2 (enExample)
EP (1) EP3974820B1 (enExample)
JP (1) JP7412770B2 (enExample)
KR (1) KR102897370B1 (enExample)
CN (1) CN114280091A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20250094363A (ko) * 2023-12-18 2025-06-25 삼성에스디아이 주식회사 전고체 이차 전지의 검사 시스템 및 방법
JP2025143861A (ja) * 2024-03-19 2025-10-02 株式会社リガク 電池分析用構造体
WO2025248653A1 (ja) * 2024-05-29 2025-12-04 日産自動車株式会社 電池モジュールの検査方法及び検査装置

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09166528A (ja) * 1995-12-15 1997-06-24 Rigaku Corp Ｘ線装置の試料格納容器
US20020192121A1 (en) * 2001-06-19 2002-12-19 John Gural System structure for in situ x-ray study of electrochemical cell component performance
JP2004022206A (ja) * 2002-06-12 2004-01-22 Toshiba It & Control Systems Corp 電池検査装置
JP2012159311A (ja) * 2011-01-29 2012-08-23 Rigaku Corp Ｘ線測定用電池構造体及びその支持装置
JP2017072530A (ja) * 2015-10-09 2017-04-13 ソニー株式会社 分析用セル及び分析用セル組立体
CN209656593U (zh) * 2018-12-14 2019-11-19 深圳先进技术研究院 电池原位x射线衍射测试辅助装置
CN110806419A (zh) * 2019-11-29 2020-02-18 散裂中子源科学中心 一种用于中子散射的高压容器实验装置
CN111721752A (zh) * 2020-07-29 2020-09-29 中山大学 一种拉曼与质谱联用的原位检测密封电解池装置及方法
CN112436204A (zh) * 2020-11-25 2021-03-02 中山大学 一种可原位测试x射线衍射和质谱分析的电池装置与方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5220581B2 (ja) 2008-12-24 2013-06-26 本田技研工業株式会社 Ｘ線解析装置
JP2016143528A (ja) * 2015-01-30 2016-08-08 株式会社日立ハイテクサイエンス 試料搬送機構及び真空装置
TW201703064A (zh) * 2015-04-24 2017-01-16 Littelfuse Japan G K 保護元件

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09166528A (ja) * 1995-12-15 1997-06-24 Rigaku Corp Ｘ線装置の試料格納容器
US20020192121A1 (en) * 2001-06-19 2002-12-19 John Gural System structure for in situ x-ray study of electrochemical cell component performance
JP2004022206A (ja) * 2002-06-12 2004-01-22 Toshiba It & Control Systems Corp 電池検査装置
JP2012159311A (ja) * 2011-01-29 2012-08-23 Rigaku Corp Ｘ線測定用電池構造体及びその支持装置
JP2017072530A (ja) * 2015-10-09 2017-04-13 ソニー株式会社 分析用セル及び分析用セル組立体
CN209656593U (zh) * 2018-12-14 2019-11-19 深圳先进技术研究院 电池原位x射线衍射测试辅助装置
CN110806419A (zh) * 2019-11-29 2020-02-18 散裂中子源科学中心 一种用于中子散射的高压容器实验装置
CN111721752A (zh) * 2020-07-29 2020-09-29 中山大学 一种拉曼与质谱联用的原位检测密封电解池装置及方法
CN112436204A (zh) * 2020-11-25 2021-03-02 中山大学 一种可原位测试x射线衍射和质谱分析的电池装置与方法

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
QUENTIN LEMARIÉ等: "Sulfur-based electrode using a polyelectrolyte binder studied via coupled in situ synchrotron X-ray diffraction and tomography", 《ACS APPLIED ENERGY MATERIALS》, 23 March 2020 (2020-03-23), pages 2423 - 2425 *
SAMUEL TARDIF等: "Operando Raman Spectroscopy and Synchrotron X-ray Diffraction of Lithiation/Delithiation in Silicon Nanoparticle Anodes", 《ACS NANO》, 30 November 2017 (2017-11-30), pages 1, XP055891331, DOI: 10.1021/acsnano.7b05796 *
SUN FU等: "Visualizing the morphological and compositional evolution of the interface of InLi-anode thio-LISION electrolyte in an all-solid-state Li-S cell by in operando synchrotron X-ray tomography and energy dispersive diffraction", 《JOURNAL OF MATERIALS CHEMISTRY A》, 20 November 2018 (2018-11-20), pages 22490 *

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US11913891B2 (en) 2024-02-27
JP7412770B2 (ja) 2024-01-15
US20220099603A1 (en) 2022-03-31
KR102897370B1 (ko) 2025-12-08
EP3974820A1 (en) 2022-03-30
JP2022054974A (ja) 2022-04-07
KR20220043037A (ko) 2022-04-05
EP3974820B1 (en) 2025-02-26

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