KR102645397B1 - 레이저 가공 장치 및 방법, 칩 전사 장치 및 방법 - Google Patents

레이저 가공 장치 및 방법, 칩 전사 장치 및 방법 Download PDF

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Publication number
KR102645397B1
KR102645397B1 KR1020217040941A KR20217040941A KR102645397B1 KR 102645397 B1 KR102645397 B1 KR 102645397B1 KR 1020217040941 A KR1020217040941 A KR 1020217040941A KR 20217040941 A KR20217040941 A KR 20217040941A KR 102645397 B1 KR102645397 B1 KR 102645397B1
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KR
South Korea
Prior art keywords
target
chip
chips
processing
machining
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KR1020217040941A
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English (en)
Korean (ko)
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KR20220018980A (ko
Inventor
에이지 모리
쇼고 오카다
다케시 츠네요시
신이치 호시노
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토레이 엔지니어링 컴퍼니, 리미티드
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Application filed by 토레이 엔지니어링 컴퍼니, 리미티드 filed Critical 토레이 엔지니어링 컴퍼니, 리미티드
Publication of KR20220018980A publication Critical patent/KR20220018980A/ko
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Publication of KR102645397B1 publication Critical patent/KR102645397B1/ko

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36—Removing material
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/062—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/064—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
    • B23K26/066—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms by using masks
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/50—Working by transmitting the laser beam through or within the workpiece
    • B23K26/57—Working by transmitting the laser beam through or within the workpiece the laser beam entering a face of the workpiece from which it is transmitted through the workpiece material to work on a different workpiece face, e.g. for effecting removal, fusion splicing, modifying or reforming
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/52—Mounting semiconductor bodies in containers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00—Articles made by soldering, welding or cutting
    • B23K2101/36—Electric or electronic devices
    • B23K2101/40—Semiconductor devices

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Laser Beam Processing (AREA)
  • Die Bonding (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
KR1020217040941A 2019-06-17 2020-03-12 레이저 가공 장치 및 방법, 칩 전사 장치 및 방법 KR102645397B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JPJP-P-2019-111653 2019-06-17
JP2019111653 2019-06-17
JP2020011353A JP7307001B2 (ja) 2019-06-17 2020-01-28 レーザ加工装置および方法、チップ転写装置および方法
JPJP-P-2020-011353 2020-01-28
PCT/JP2020/010911 WO2020255497A1 (ja) 2019-06-17 2020-03-12 レーザ加工装置および方法、チップ転写装置および方法

Publications (2)

Publication Number Publication Date
KR20220018980A KR20220018980A (ko) 2022-02-15
KR102645397B1 true KR102645397B1 (ko) 2024-03-11

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Family Applications (1)

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KR1020217040941A KR102645397B1 (ko) 2019-06-17 2020-03-12 레이저 가공 장치 및 방법, 칩 전사 장치 및 방법

Country Status (5)

Country Link
JP (1) JP7307001B2 (zh)
KR (1) KR102645397B1 (zh)
CN (1) CN114007803B (zh)
TW (1) TWI822986B (zh)
WO (1) WO2020255497A1 (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10870226B2 (en) 2019-03-27 2020-12-22 Omachron Intellectual Property Inc. Apparatus and methods using multiple extruders
JP7387666B2 (ja) 2021-03-15 2023-11-28 東レエンジニアリング株式会社 チップ部品除去装置
JP7492478B2 (ja) 2021-03-23 2024-05-29 株式会社東海理化電機製作所 レーザリフトオフ装置およびレーザリフトオフ方法
WO2023101215A1 (ko) * 2021-11-30 2023-06-08 주식회사 프로텍 마이크로 led 칩 전사 장치

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101560722B1 (ko) 2014-04-09 2015-10-15 창원대학교 산학협력단 직선식 레이저가공 보조장치

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JPS46178Y1 (zh) 1966-07-15 1971-01-07
JPH08150487A (ja) * 1994-11-28 1996-06-11 Hajime Makita デポジション装置
JPH1119788A (ja) 1997-07-01 1999-01-26 Nikon Corp レーザ加工装置
JP3455102B2 (ja) * 1998-02-06 2003-10-14 三菱電機株式会社 半導体ウエハチップ分離方法
JP4078825B2 (ja) * 2001-10-30 2008-04-23 ソニー株式会社 回路基板の製造方法、並びに表示装置の製造方法
JP2003334683A (ja) * 2002-05-17 2003-11-25 Sangaku Renkei Kiko Kyushu:Kk レーザ加工装置とレーザ加工方法
US7119351B2 (en) * 2002-05-17 2006-10-10 Gsi Group Corporation Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system
JP2004330536A (ja) * 2003-05-06 2004-11-25 Fuji Photo Film Co Ltd 露光ヘッド
US7744770B2 (en) * 2004-06-23 2010-06-29 Sony Corporation Device transfer method
US20060013680A1 (en) * 2004-07-16 2006-01-19 Tessera, Inc. Chip handling methods and apparatus
JP4018096B2 (ja) * 2004-10-05 2007-12-05 松下電器産業株式会社 半導体ウェハの分割方法、及び半導体素子の製造方法
KR100694072B1 (ko) * 2004-12-15 2007-03-12 삼성전자주식회사 레이저 반점을 제거한 조명계 및 이를 채용한 프로젝션시스템
EP2239084A1 (en) * 2009-04-07 2010-10-13 Excico France Method of and apparatus for irradiating a semiconductor material surface by laser energy
JP5637526B2 (ja) * 2010-04-28 2014-12-10 株式会社ブイ・テクノロジー レーザ加工装置
TWI561327B (en) * 2013-10-16 2016-12-11 Asm Tech Singapore Pte Ltd Laser scribing apparatus comprising adjustable spatial filter and method for etching semiconductor substrate
JP6452490B2 (ja) * 2015-02-25 2019-01-16 キヤノン株式会社 半導体チップの生成方法
JP2018098441A (ja) * 2016-12-16 2018-06-21 株式会社ディスコ ダイボンダー
JP6720333B2 (ja) * 2017-06-12 2020-07-08 ユニカルタ・インコーポレイテッド 基板上に個別部品を並列に組み立てる方法
WO2021117557A1 (ja) * 2019-12-12 2021-06-17 東レエンジニアリング株式会社 光スポット像照射装置および転写装置
JP2021118284A (ja) * 2020-01-28 2021-08-10 東レエンジニアリング株式会社 チップ転写装置

Patent Citations (1)

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Publication number Priority date Publication date Assignee Title
KR101560722B1 (ko) 2014-04-09 2015-10-15 창원대학교 산학협력단 직선식 레이저가공 보조장치

Also Published As

Publication number Publication date
JP7307001B2 (ja) 2023-07-11
TWI822986B (zh) 2023-11-21
TW202112479A (zh) 2021-04-01
WO2020255497A1 (ja) 2020-12-24
JP2020203313A (ja) 2020-12-24
CN114007803B (zh) 2023-05-30
KR20220018980A (ko) 2022-02-15
CN114007803A (zh) 2022-02-01

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