KR102518784B1 - 성형 장치 및 물품 제조 방법 - Google Patents

성형 장치 및 물품 제조 방법 Download PDF

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Publication number
KR102518784B1
KR102518784B1 KR1020190041201A KR20190041201A KR102518784B1 KR 102518784 B1 KR102518784 B1 KR 102518784B1 KR 1020190041201 A KR1020190041201 A KR 1020190041201A KR 20190041201 A KR20190041201 A KR 20190041201A KR 102518784 B1 KR102518784 B1 KR 102518784B1
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substrate
holding
mold
holding force
composition
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Korean (ko)
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KR20190118972A (ko
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다카히로 사토
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캐논 가부시끼가이샤
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16—Coating processes; Apparatus therefor
    • G03F7/168—Finishing the coated layer, e.g. drying, baking, soaking
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
    • G03F7/2012—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image using liquid photohardening compositions, e.g. for the production of reliefs such as flexographic plates or stamps
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
    • G03F7/70825—Mounting of individual elements, e.g. mounts, holders or supports

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Shaping Of Tube Ends By Bending Or Straightening (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
KR1020190041201A 2018-04-11 2019-04-09 성형 장치 및 물품 제조 방법 Active KR102518784B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018076246A JP7033994B2 (ja) 2018-04-11 2018-04-11 成形装置及び物品の製造方法
JPJP-P-2018-076246 2018-04-11

Publications (2)

Publication Number Publication Date
KR20190118972A KR20190118972A (ko) 2019-10-21
KR102518784B1 true KR102518784B1 (ko) 2023-04-07

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KR1020190041201A Active KR102518784B1 (ko) 2018-04-11 2019-04-09 성형 장치 및 물품 제조 방법

Country Status (5)

Country Link
US (1) US11372327B2 (https=)
JP (1) JP7033994B2 (https=)
KR (1) KR102518784B1 (https=)
CN (1) CN110361929B (https=)
TW (1) TWI736863B (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
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JP6762853B2 (ja) * 2016-11-11 2020-09-30 キヤノン株式会社 装置、方法、及び物品製造方法
JP7062049B2 (ja) * 2018-03-30 2022-05-02 富士フイルム株式会社 経皮吸収シート製造用のモールド、針状凸部を有する経皮吸収シートの製造装置及び方法
JP7507641B2 (ja) * 2020-09-08 2024-06-28 キヤノン株式会社 成形装置及び物品の製造方法
US11567417B2 (en) * 2021-01-20 2023-01-31 Applied Materials, Inc. Anti-slippery stamp landing ring
JP7620495B2 (ja) * 2021-05-07 2025-01-23 キヤノン株式会社 成形装置、および物品製造方法
US12282251B2 (en) * 2021-09-24 2025-04-22 Canon Kabushiki Kaisha Method of shaping a surface, shaping system, and method of manufacturing an article

Citations (2)

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Publication number Priority date Publication date Assignee Title
JP2010098310A (ja) 2008-10-17 2010-04-30 Asml Netherlands Bv インプリントリソグラフィ装置および方法
JP2017103399A (ja) * 2015-12-03 2017-06-08 キヤノン株式会社 インプリント装置および物品製造方法

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CN101573659A (zh) 2005-12-08 2009-11-04 分子制模股份有限公司 排除位于基板和模具之间的气体的方法
JP4845564B2 (ja) 2006-03-31 2011-12-28 株式会社東芝 パターン転写方法
WO2009151560A2 (en) 2008-06-09 2009-12-17 Board Of Regents, The University Of Texas System Adaptive nanotopography sculpting
JP2010067796A (ja) * 2008-09-11 2010-03-25 Canon Inc インプリント装置
JP5833636B2 (ja) * 2010-04-27 2015-12-16 モレキュラー・インプリンツ・インコーポレーテッド ナノインプリント・リソグラフィのテンプレート製作方法およびそのシステム
JP5744423B2 (ja) 2010-06-18 2015-07-08 キヤノン株式会社 インプリント装置、インプリント方法及びデバイスの製造方法
JP6004738B2 (ja) 2011-09-07 2016-10-12 キヤノン株式会社 インプリント装置、それを用いた物品の製造方法
JP6029494B2 (ja) 2012-03-12 2016-11-24 キヤノン株式会社 インプリント方法およびインプリント装置、それを用いた物品の製造方法
JP6120677B2 (ja) 2013-05-27 2017-04-26 キヤノン株式会社 インプリント装置、インプリント方法および物品の製造方法
KR102292465B1 (ko) 2013-08-19 2021-08-20 보드 오브 레젼츠, 더 유니버시티 오브 텍사스 시스템 나노미터 스케일 정확도를 갖는 사용자 정의 프로파일의 프로그램 가능한 박막 적층 방법
JP5745129B2 (ja) 2014-04-02 2015-07-08 キヤノン株式会社 インプリント装置及びインプリント方法
JP6333031B2 (ja) * 2014-04-09 2018-05-30 キヤノン株式会社 インプリント装置および物品の製造方法
JP2015220299A (ja) * 2014-05-16 2015-12-07 キヤノン株式会社 インプリント装置および物品の製造方法
JP6659104B2 (ja) * 2014-11-11 2020-03-04 キヤノン株式会社 インプリント方法、インプリント装置、型、および物品の製造方法
JP6437387B2 (ja) 2015-05-25 2018-12-12 東芝メモリ株式会社 基板平坦化方法
US11104057B2 (en) * 2015-12-11 2021-08-31 Canon Kabushiki Kaisha Imprint apparatus and method of imprinting a partial field
JP2017139268A (ja) 2016-02-01 2017-08-10 キヤノン株式会社 インプリント装置及び物品の製造方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010098310A (ja) 2008-10-17 2010-04-30 Asml Netherlands Bv インプリントリソグラフィ装置および方法
JP2017103399A (ja) * 2015-12-03 2017-06-08 キヤノン株式会社 インプリント装置および物品製造方法

Also Published As

Publication number Publication date
CN110361929A (zh) 2019-10-22
US11372327B2 (en) 2022-06-28
CN110361929B (zh) 2023-08-18
KR20190118972A (ko) 2019-10-21
US20190317397A1 (en) 2019-10-17
TW201943543A (zh) 2019-11-16
TWI736863B (zh) 2021-08-21
JP7033994B2 (ja) 2022-03-11
JP2019186404A (ja) 2019-10-24

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